JPS62152274U - - Google Patents
Info
- Publication number
- JPS62152274U JPS62152274U JP3912286U JP3912286U JPS62152274U JP S62152274 U JPS62152274 U JP S62152274U JP 3912286 U JP3912286 U JP 3912286U JP 3912286 U JP3912286 U JP 3912286U JP S62152274 U JPS62152274 U JP S62152274U
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- opening
- abnormality detection
- resistor
- detection circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005856 abnormality Effects 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims description 6
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986039122U JPH0424457Y2 (pt) | 1986-03-19 | 1986-03-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986039122U JPH0424457Y2 (pt) | 1986-03-19 | 1986-03-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62152274U true JPS62152274U (pt) | 1987-09-26 |
| JPH0424457Y2 JPH0424457Y2 (pt) | 1992-06-09 |
Family
ID=30852003
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986039122U Expired JPH0424457Y2 (pt) | 1986-03-19 | 1986-03-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0424457Y2 (pt) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004257812A (ja) * | 2003-02-25 | 2004-09-16 | Sharp Corp | 制御装置およびそれを備えた電気機器 |
| JP2004257810A (ja) * | 2003-02-25 | 2004-09-16 | Sharp Corp | 制御装置およびそれを備えた電気機器 |
| JP2012093261A (ja) * | 2010-10-27 | 2012-05-17 | Lapis Semiconductor Co Ltd | 半導体回路、半導体装置、故障診断方法、及び故障診断プログラム |
| WO2022181705A1 (ja) * | 2021-02-25 | 2022-09-01 | いすゞ自動車株式会社 | 断線検出装置および制御装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5556U (pt) * | 1973-08-30 | 1980-01-05 | Toyo Kogyo Co | |
| JPS5778218A (en) * | 1980-10-31 | 1982-05-15 | Matsushita Electric Ind Co Ltd | Discrimination system |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5556B2 (pt) * | 1973-05-28 | 1980-01-05 |
-
1986
- 1986-03-19 JP JP1986039122U patent/JPH0424457Y2/ja not_active Expired
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5556U (pt) * | 1973-08-30 | 1980-01-05 | Toyo Kogyo Co | |
| JPS5778218A (en) * | 1980-10-31 | 1982-05-15 | Matsushita Electric Ind Co Ltd | Discrimination system |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004257812A (ja) * | 2003-02-25 | 2004-09-16 | Sharp Corp | 制御装置およびそれを備えた電気機器 |
| JP2004257810A (ja) * | 2003-02-25 | 2004-09-16 | Sharp Corp | 制御装置およびそれを備えた電気機器 |
| JP2012093261A (ja) * | 2010-10-27 | 2012-05-17 | Lapis Semiconductor Co Ltd | 半導体回路、半導体装置、故障診断方法、及び故障診断プログラム |
| WO2022181705A1 (ja) * | 2021-02-25 | 2022-09-01 | いすゞ自動車株式会社 | 断線検出装置および制御装置 |
| JP2022129855A (ja) * | 2021-02-25 | 2022-09-06 | いすゞ自動車株式会社 | 断線検出装置および制御装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0424457Y2 (pt) | 1992-06-09 |