JPS62141756U - - Google Patents

Info

Publication number
JPS62141756U
JPS62141756U JP2827386U JP2827386U JPS62141756U JP S62141756 U JPS62141756 U JP S62141756U JP 2827386 U JP2827386 U JP 2827386U JP 2827386 U JP2827386 U JP 2827386U JP S62141756 U JPS62141756 U JP S62141756U
Authority
JP
Japan
Prior art keywords
flaw detection
magnetic field
rotating magnetic
field type
type flaw
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2827386U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2827386U priority Critical patent/JPS62141756U/ja
Publication of JPS62141756U publication Critical patent/JPS62141756U/ja
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図および第３図は、それぞれ本考案の各実
施例の構成を示す図、第２図は第１図および第３
図の電気回路図、第４図および第５図は従来例を
示すための図である。 １……被検面、２，３，４……コイル、５……
磁極、６……スイツチ。 1 and 3 are diagrams showing the configuration of each embodiment of the present invention, and FIG. 2 is a diagram showing the configuration of each embodiment of the present invention, and FIG.
The electrical circuit diagrams shown in the figure, FIGS. 4 and 5, are diagrams for showing conventional examples. 1... Test surface, 2, 3, 4... Coil, 5...
Magnetic pole, 6... switch.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 磁粉探傷試験において使用する３相交流電源を
用いる回転磁界型探傷装置において、磁極を３極
とし、各極が三角形をなすように配置することに
より回転磁界を形成するようにしてなることを特
徴とする回転磁界型探傷装置。 A rotating magnetic field type flaw detection device using a three-phase AC power supply used in magnetic particle flaw detection tests is characterized by having three magnetic poles and arranging each pole in a triangular shape to form a rotating magnetic field. Rotating magnetic field type flaw detection equipment.
JP2827386U 1986-02-28 1986-02-28 Pending JPS62141756U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2827386U JPS62141756U (en) 1986-02-28 1986-02-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2827386U JPS62141756U (en) 1986-02-28 1986-02-28

Publications (1)

Publication Number Publication Date
JPS62141756U true JPS62141756U (en) 1987-09-07

Family

ID=30831081

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2827386U Pending JPS62141756U (en) 1986-02-28 1986-02-28

Country Status (1)

Country Link
JP (1) JPS62141756U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015155877A1 (en) * 2014-04-10 2015-10-15 株式会社日立製作所 Test probe, testing system, and testing method
KR200492382Y1 (en) * 2020-06-11 2020-09-29 (주)아이텍기술 Dual Type Magnetic Particle Detection Inspection System

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4979584A (en) * 1972-12-07 1974-08-01
JPS5420786A (en) * 1977-07-15 1979-02-16 Nippon Steel Corp Magnetizing device for magnetic inspecter

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4979584A (en) * 1972-12-07 1974-08-01
JPS5420786A (en) * 1977-07-15 1979-02-16 Nippon Steel Corp Magnetizing device for magnetic inspecter

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015155877A1 (en) * 2014-04-10 2015-10-15 株式会社日立製作所 Test probe, testing system, and testing method
JPWO2015155877A1 (en) * 2014-04-10 2017-04-13 株式会社日立製作所 Inspection probe, inspection system, and inspection method
KR200492382Y1 (en) * 2020-06-11 2020-09-29 (주)아이텍기술 Dual Type Magnetic Particle Detection Inspection System

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