JPS6214067A - ２つの低値容量の比を測定するためのデバイス - Google Patents

２つの低値容量の比を測定するためのデバイス

Info

Publication number
JPS6214067A
JPS6214067A JP61159513A JP15951386A JPS6214067A JP S6214067 A JPS6214067 A JP S6214067A JP 61159513 A JP61159513 A JP 61159513A JP 15951386 A JP15951386 A JP 15951386A JP S6214067 A JPS6214067 A JP S6214067A
Authority
JP
Japan
Prior art keywords
switch
integrator
output
voltage
capacitor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61159513A
Other languages
English (en)
Japanese (ja)
Inventor
ジヨエル・シヨワズネ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Publication of JPS6214067A publication Critical patent/JPS6214067A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/10—Measuring sum, difference or ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP61159513A 1985-07-09 1986-07-07 ２つの低値容量の比を測定するためのデバイス Pending JPS6214067A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR8510481A FR2584822B1 (fr) 1985-07-09 1985-07-09 Dispositif de mesure du rapport de deux capacites de faibles valeurs
FR8510481 1985-07-09

Publications (1)

Publication Number Publication Date
JPS6214067A true JPS6214067A (ja) 1987-01-22

Family

ID=9321109

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61159513A Pending JPS6214067A (ja) 1985-07-09 1986-07-07 ２つの低値容量の比を測定するためのデバイス

Country Status (5)

Country Link
US (1) US4797603A (en, 2012)
JP (1) JPS6214067A (en, 2012)
DE (1) DE3623136A1 (en, 2012)
FR (1) FR2584822B1 (en, 2012)
GB (1) GB2177806B (en, 2012)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7335604B2 (en) 2002-02-22 2008-02-26 Seiko Epson Corporation Thin-film coating apparatus

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5136251A (en) * 1988-09-23 1992-08-04 John Fluke Mfg. Co., Inc. Capacitance measurement
DE4107366C1 (en, 2012) * 1991-03-08 1992-04-23 Leica Heerbrugg Ag, Heerbrugg, Ch
FR2682768A1 (fr) * 1991-10-21 1993-04-23 Otic Fischer & Porter Methodes de conversion de rapports d'impedances applicables aux appareils de mesure, notamment aux transmetteurs de pression industriels, et leurs dispositifs de mise en óoeuvre.
DE19513022C1 (de) * 1995-04-06 1996-08-14 Siemens Ag Schaltungsanordnung und Verfahren zur Bestimmung von Kapazitätsdifferenzen
FR2768122B1 (fr) * 1997-09-09 1999-11-19 Sextant Avionique Dispositif optique de detection de conditions givrantes sur aeronef
FR2791144B1 (fr) 1999-03-19 2001-11-30 Sextant Avionique Dispositif de surveillance de la circulation d'un courant sensiblement continu dans une charge et procede pour la mise en oeuvre de ce dispositif
FR2791773B1 (fr) 1999-04-02 2001-06-15 Sextant Avionique Girouette destinee a s'orienter dans l'axe d'un ecoulement d'air ambiant
FR2793022B1 (fr) 1999-04-30 2001-07-13 Sextant Avionique Sonde multifonctions fixe pour aeronef
FR2802647B1 (fr) 1999-12-17 2002-03-01 Thomson Csf Sextant Sonde pour aeronef
FR2802636B1 (fr) 1999-12-17 2002-03-22 Thomson Csf Sextant Sonde multifonctions pour aeronef
FR2817044B1 (fr) * 2000-11-17 2003-02-14 Thomson Csf Procede de determination de parametres aerodynamiques et procede de detection de panne d'une sonde utilisee pour determiner les parametres aerodynamiques
FR2823846B1 (fr) 2001-04-24 2003-06-27 Thomson Csf Dispositif de mesure de la pression totale d'un ecoulement
WO2003071233A1 (de) * 2002-02-21 2003-08-28 Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung Et Al Vorrichtung und verfahren zum auslesen einer differentialkapazität mit einer ersten und zweiten teilkapazität
EP2795350B1 (en) * 2011-12-23 2015-11-25 Imec Method and system for measuring capacitance difference between capacitive elements

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS539542B2 (en, 2012) * 1972-09-21 1978-04-06
US4054833A (en) * 1976-06-11 1977-10-18 Setra Systems, Inc. Capacitance measuring system
US4039940A (en) * 1976-07-30 1977-08-02 General Electric Company Capacitance sensor
FR2436399A2 (fr) * 1978-09-13 1980-04-11 Testut Aequitas Perfectionnement a l'inhibition des capacites parasites dans un dispositif de mesure de capacite
FR2404229A1 (fr) * 1977-09-23 1979-04-20 Testut Aequitas Dispositif de mesure de capacite d'un condensateur
US4187459A (en) * 1978-02-13 1980-02-05 Automatic Systems Laboratories Limited Digital measurement of impedance ratios
GB2020434B (en) * 1978-05-02 1982-09-29 Matsushita Electric Ind Co Ltd Apparatus for humidity detection
GB2036982B (en) * 1978-10-04 1982-12-01 Automatic Systems Lab Ltd Electrical impedance ratios
GB2058364B (en) * 1979-09-01 1983-03-23 Ferranti Ltd Capacitance measuring apparatus
US4404481A (en) * 1980-10-20 1983-09-13 Matsushita Electric Industrial Co., Ltd. Capacitance to voltage conversion apparatus
US4636714A (en) * 1984-01-18 1987-01-13 Wystron, Inc. Capacitive transducer and method
GB2155644B (en) * 1984-03-09 1988-04-20 Automatic Syst Lab Ltd Improvements in the measurement of impedance ratios

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7335604B2 (en) 2002-02-22 2008-02-26 Seiko Epson Corporation Thin-film coating apparatus

Also Published As

Publication number Publication date
GB2177806B (en) 1989-01-18
GB2177806A (en) 1987-01-28
GB8614836D0 (en) 1986-07-23
DE3623136A1 (de) 1987-01-22
DE3623136C2 (en, 2012) 1990-02-15
FR2584822B1 (fr) 1988-06-17
FR2584822A1 (fr) 1987-01-16
US4797603A (en) 1989-01-10

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