JPS62134082U - - Google Patents

Info

Publication number
JPS62134082U
JPS62134082U JP2259986U JP2259986U JPS62134082U JP S62134082 U JPS62134082 U JP S62134082U JP 2259986 U JP2259986 U JP 2259986U JP 2259986 U JP2259986 U JP 2259986U JP S62134082 U JPS62134082 U JP S62134082U
Authority
JP
Japan
Prior art keywords
test
runway
downward
stopper
releasing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2259986U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2259986U priority Critical patent/JPS62134082U/ja
Publication of JPS62134082U publication Critical patent/JPS62134082U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Chutes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2259986U 1986-02-18 1986-02-18 Pending JPS62134082U (en:Method)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2259986U JPS62134082U (en:Method) 1986-02-18 1986-02-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2259986U JPS62134082U (en:Method) 1986-02-18 1986-02-18

Publications (1)

Publication Number Publication Date
JPS62134082U true JPS62134082U (en:Method) 1987-08-24

Family

ID=30820135

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2259986U Pending JPS62134082U (en:Method) 1986-02-18 1986-02-18

Country Status (1)

Country Link
JP (1) JPS62134082U (en:Method)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03158773A (ja) * 1989-09-22 1991-07-08 Internatl Business Mach Corp <Ibm> 電子部品のテスト装置及び方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03158773A (ja) * 1989-09-22 1991-07-08 Internatl Business Mach Corp <Ibm> 電子部品のテスト装置及び方法

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