JPS62129760U - - Google Patents
Info
- Publication number
- JPS62129760U JPS62129760U JP1653386U JP1653386U JPS62129760U JP S62129760 U JPS62129760 U JP S62129760U JP 1653386 U JP1653386 U JP 1653386U JP 1653386 U JP1653386 U JP 1653386U JP S62129760 U JPS62129760 U JP S62129760U
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- outer cylinder
- introduction port
- port
- beam introduction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010894 electron beam technology Methods 0.000 claims description 12
- 238000000605 extraction Methods 0.000 claims description 2
- 150000002500 ions Chemical class 0.000 claims 2
- 239000003153 chemical reaction reagent Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1653386U JPS62129760U (US08066781-20111129-C00013.png) | 1986-02-07 | 1986-02-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1653386U JPS62129760U (US08066781-20111129-C00013.png) | 1986-02-07 | 1986-02-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62129760U true JPS62129760U (US08066781-20111129-C00013.png) | 1987-08-17 |
Family
ID=30808475
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1653386U Pending JPS62129760U (US08066781-20111129-C00013.png) | 1986-02-07 | 1986-02-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62129760U (US08066781-20111129-C00013.png) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01281651A (ja) * | 1988-05-09 | 1989-11-13 | Jeol Ltd | 質量分析装置用イオン源 |
| JP2000057989A (ja) * | 1998-06-18 | 2000-02-25 | Micromass Ltd | 質量分析計及び質量分析方法 |
| WO2007102204A1 (ja) * | 2006-03-07 | 2007-09-13 | Shimadzu Corporation | 質量分析装置 |
| WO2019155530A1 (ja) * | 2018-02-06 | 2019-08-15 | 株式会社島津製作所 | イオン化装置及び質量分析装置 |
-
1986
- 1986-02-07 JP JP1653386U patent/JPS62129760U/ja active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01281651A (ja) * | 1988-05-09 | 1989-11-13 | Jeol Ltd | 質量分析装置用イオン源 |
| JP2000057989A (ja) * | 1998-06-18 | 2000-02-25 | Micromass Ltd | 質量分析計及び質量分析方法 |
| JP4560656B2 (ja) * | 1998-06-18 | 2010-10-13 | マイクロマス・ユーケー・リミテッド | 質量分析計及び質量分析方法 |
| WO2007102204A1 (ja) * | 2006-03-07 | 2007-09-13 | Shimadzu Corporation | 質量分析装置 |
| WO2019155530A1 (ja) * | 2018-02-06 | 2019-08-15 | 株式会社島津製作所 | イオン化装置及び質量分析装置 |
| CN111656483A (zh) * | 2018-02-06 | 2020-09-11 | 株式会社岛津制作所 | 离子化装置和质谱分析装置 |
| US11495447B2 (en) | 2018-02-06 | 2022-11-08 | Shimadzu Corporation | Ionizer and mass spectrometer |
| CN111656483B (zh) * | 2018-02-06 | 2023-08-29 | 株式会社岛津制作所 | 离子化装置和质谱分析装置 |
