JPS62127618A - 表面形状測定装置 - Google Patents
表面形状測定装置Info
- Publication number
- JPS62127618A JPS62127618A JP26854185A JP26854185A JPS62127618A JP S62127618 A JPS62127618 A JP S62127618A JP 26854185 A JP26854185 A JP 26854185A JP 26854185 A JP26854185 A JP 26854185A JP S62127618 A JPS62127618 A JP S62127618A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- surface shape
- measured
- shape measuring
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Microscoopes, Condenser (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26854185A JPS62127618A (ja) | 1985-11-29 | 1985-11-29 | 表面形状測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP26854185A JPS62127618A (ja) | 1985-11-29 | 1985-11-29 | 表面形状測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62127618A true JPS62127618A (ja) | 1987-06-09 |
| JPH0422443B2 JPH0422443B2 (enExample) | 1992-04-17 |
Family
ID=17459957
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP26854185A Granted JPS62127618A (ja) | 1985-11-29 | 1985-11-29 | 表面形状測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62127618A (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6416904A (en) * | 1987-07-10 | 1989-01-20 | Fujitsu Ltd | Inspection instrument for surface waviness |
| JPH02140608A (ja) * | 1988-11-21 | 1990-05-30 | Fujitsu Ltd | 表面形状測定装置 |
| US5278635A (en) * | 1990-03-28 | 1994-01-11 | Konica Corporation | Surface defect detection apparatus |
| KR100488305B1 (ko) * | 2002-03-21 | 2005-05-11 | 주식회사 새 미 | 비접촉식 휴대용 표면거칠기 측정장치 |
-
1985
- 1985-11-29 JP JP26854185A patent/JPS62127618A/ja active Granted
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6416904A (en) * | 1987-07-10 | 1989-01-20 | Fujitsu Ltd | Inspection instrument for surface waviness |
| JPH02140608A (ja) * | 1988-11-21 | 1990-05-30 | Fujitsu Ltd | 表面形状測定装置 |
| US5278635A (en) * | 1990-03-28 | 1994-01-11 | Konica Corporation | Surface defect detection apparatus |
| KR100488305B1 (ko) * | 2002-03-21 | 2005-05-11 | 주식회사 새 미 | 비접촉식 휴대용 표면거칠기 측정장치 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0422443B2 (enExample) | 1992-04-17 |
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