JPS62126358A - Apparatus for measuring temperature characteristic - Google Patents

Apparatus for measuring temperature characteristic

Info

Publication number
JPS62126358A
JPS62126358A JP26634285A JP26634285A JPS62126358A JP S62126358 A JPS62126358 A JP S62126358A JP 26634285 A JP26634285 A JP 26634285A JP 26634285 A JP26634285 A JP 26634285A JP S62126358 A JPS62126358 A JP S62126358A
Authority
JP
Japan
Prior art keywords
temperature
temp
measured
wave device
acoustic wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26634285A
Other languages
Japanese (ja)
Inventor
Toshikazu Matsushita
松下 敏和
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP26634285A priority Critical patent/JPS62126358A/en
Publication of JPS62126358A publication Critical patent/JPS62126358A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To make it possible to accurately measure a temp. characteristic within a short time, by simple equipment constituted so that electronic parts to be measured and standard electronic parts of which the temp. characteristic is known are mounted in a casing to provide a predetermined temp. condition. CONSTITUTION:An elastic surface wave device 12a being a standard product of which the temp. characteristic of resonance frequency is known and an elastic surface wave device 12b to be measured 12b are mounted to the sockets 13a, 13b of a base stand 11a and a lid body 11b is mounted to the base stand 11a. A cooling agent is sealed in the space of the base stand 11a and the lid body 11b from a blowing part 15 at a cooling time and hot air is sealed therein at a heating time by a dryer to adjust measuring temp. The resonance frequency of the elastic surface wave device 12a is measured by a frequency-measuring device 25 to measure temp. and, when predetermined temp. is obtained, the electrical characteristic value of the device 12b is measured at the predetermined temp. analyzed by a network analyser 21 by a phase amplitude display device 22.

Description

【発明の詳細な説明】 [発明の技術分野] 本発明は、たとえば弾性表面波デバイスの温度特性を測
定する温度特性測定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a temperature characteristic measuring device that measures the temperature characteristics of, for example, a surface acoustic wave device.

[発明の技術的背景] 一般に弾性表面波デバイスは、テレビ受像機、ビデオテ
ープレコーダ等のフィルタ、共振子等として広く用いら
れている。
[Technical Background of the Invention] Generally, surface acoustic wave devices are widely used as filters, resonators, etc. in television receivers, video tape recorders, etc.

従来からこのような弾性表面波デバイスの特性として周
波数トラップ減衰量、挿入目失、共振特性、スプリアス
特性、?!T遅延特性、電極間容量、温度特性等があり
、製造時においてこれらの特性を測定する必要がある。
Conventionally, the characteristics of such surface acoustic wave devices include frequency trap attenuation, insertion loss, resonance characteristics, and spurious characteristics. ! There are T delay characteristics, interelectrode capacitance, temperature characteristics, etc., and these characteristics must be measured during manufacturing.

また上述したテレビ受像機、ビデオテープレコーダ等の
電化製品は、一般に一20℃〜+70℃の使用温度範囲
が要求されており、また特殊な環境条件下での使用に対
しては、寒冷地向けでは一40℃、暑熱地面けでは+8
5゜Cまでの使用温度範囲が要求されている。
Furthermore, electrical appliances such as the above-mentioned television receivers and videotape recorders are generally required to be used in a temperature range of -20°C to +70°C, and for use under special environmental conditions, they are required to be used in cold regions. So -40 degrees Celsius, +8 on hot ground.
A working temperature range of up to 5°C is required.

このような使用温度範囲内で弾性表面波デバイスの温度
特性も安定していることが必要とざれ、製造時において
この使用温度範囲内の温度特性を測定する必要がある。
It is necessary that the temperature characteristics of the surface acoustic wave device be stable within such a usage temperature range, and it is necessary to measure the temperature characteristics within this usage temperature range during manufacturing.

従来からこのような弾性表面波デバイスの温度特性の測
定は、第6図〜第8図に示す温度特性測定装置により行
なわれている。
Conventionally, measurement of the temperature characteristics of such surface acoustic wave devices has been carried out using a temperature characteristic measuring apparatus shown in FIGS. 6 to 8.

この温度特性測定装置は、第6図および第7図に示すよ
うに、基台1に弾性表面波デバイス2が装着されるソケ
ット3が設けられており、基台1に設Cブられたコネク
タ4により外部と弾性表面波デバイス2とが電気的に接
続されるようになっている。
As shown in FIGS. 6 and 7, this temperature characteristic measuring device includes a base 1 provided with a socket 3 into which a surface acoustic wave device 2 is mounted, and a C-shaped connector provided on the base 1. 4 electrically connects the surface acoustic wave device 2 to the outside.

第8図において、5は掃引発振器、6は分離器、7は恒
)B槽、8は掃引発振器5の発振周波数を指定するデジ
タルマーカ、9は弾性表面波デバイス2の電気的特性1
直を解析するネットワークアナライ1ア、10はこのネ
ットワークアナライFf9より出力された値を表示する
位相振幅表示器でおる。
In FIG. 8, 5 is a sweep oscillator, 6 is a separator, 7 is a constant) B tank, 8 is a digital marker that specifies the oscillation frequency of the sweep oscillator 5, and 9 is an electrical characteristic 1 of the surface acoustic wave device 2.
The network analyzers 1a and 10 that analyze the directivity are phase and amplitude indicators that display the values output from the network analyzer Ff9.

このように構成された装置により以下のように弾性表面
波デバイス2の温度特性の測定が行なわれる。
The temperature characteristics of the surface acoustic wave device 2 are measured as follows using the apparatus configured as described above.

基台1のソケット3に弾性表面波デバイス2を装着する
The surface acoustic wave device 2 is attached to the socket 3 of the base 1.

恒温槽7内にこの基台1を入れ、恒温槽7の外部と内部
とを電気的に導通させる同軸ケーブル7aを基台1の]
ネクタ4に接続する。
This base 1 is placed in a thermostatic oven 7, and a coaxial cable 7a that electrically connects the outside and the inside of the thermostatic oven 7 is connected to the base 1.
Connect to connector 4.

恒温槽7内を所定の温度に設定し、この温度に達してさ
らに15分以上経過した後、(吊用発振器5の発振器ツ
ノを分離器6を介して恒温槽7内の弾性表面波デバイス
2に入力させる。
After setting the temperature in the thermostatic chamber 7 to a predetermined temperature and after 15 minutes or more have passed after reaching this temperature, (the oscillator horn of the hanging oscillator 5 is connected to the surface acoustic wave device 2 input.

その出力をネットワークアナライリ゛9に入力させ、位
相(膜幅表示器10によりこの温度での電気的特性を測
定する。
The output is input to the network analyzer 9, and the phase (film width indicator 10) measures the electrical characteristics at this temperature.

異なる温度での電気的特性を測定するとき、恒温槽7を
その温度に設定し、その温度に達してさらに15分以上
経過した後、上)里と同様に測定を行なう。
When measuring electrical characteristics at different temperatures, set the constant temperature bath 7 to that temperature, and after 15 minutes or more have passed since the temperature reached that temperature, perform measurements in the same manner as above.

通常このような測定を一40’C1−20°C,0℃、
25°C140’C155℃、70’C,85°Cで行
ない、この特性を温度特性としている。
Usually, such measurements are carried out at -40'C1-20°C, 0°C,
Testing was carried out at 25°C, 140'C, 155°C, 70'C, and 85°C, and these characteristics are taken as temperature characteristics.

[背景技術の問題点] ところで上述したように弾性表面波デバイス2の温度特
性を測定するために、゛恒温槽7を所定の温度に設定し
、恒温槽7がこの温度に達してからさらに15分以上経
過した後、電気的+2j性を測定しているので、1つの
温度での電気的特性の測定時間を30分程度要し、上述
した8点の指定温度をすべて測定するためには4時間以
上もの長時間を要している。
[Problems with the Background Art] As described above, in order to measure the temperature characteristics of the surface acoustic wave device 2, the thermostatic chamber 7 is set at a predetermined temperature, and after the thermostatic chamber 7 reaches this temperature, Since the electrical characteristics are measured after more than a minute has passed, it takes about 30 minutes to measure the electrical characteristics at one temperature, and it takes about 40 minutes to measure all the specified temperatures at the 8 points mentioned above. It takes more than an hour.

このように弾性表面波デバイス2の温度特性を測定する
時間が長時間となることは、基台1か恒温槽7内に長時
間放置されることになり、特に高温においてこの基台1
が長時間放置されることは基台1.のソケット3やコネ
クタ4の接続部分の電気的接触が劣化することがあり、
このことにより測定値が不正確なものとなることがたび
たびある。
The long time it takes to measure the temperature characteristics of the surface acoustic wave device 2 means that the surface acoustic wave device 2 is left in the base 1 or the thermostatic chamber 7 for a long time, and this base
If it is left unattended for a long period of time, it is the base 1. The electrical contact at the connection part of the socket 3 and connector 4 may deteriorate.
This often results in inaccurate measurements.

また重量、体積の大きい恒温槽7を常温で測定している
測定器の近くに移!!J設置さける必要がある。
Also, move the constant temperature bath 7, which has a large weight and volume, to a place near the measuring device that measures at room temperature! ! It is necessary to avoid installing J.

さらに恒温槽7にこの外部と内部とを電気的に導通させ
る同軸ケーブル7aを設けるために、この恒温槽7に8
龍φ程度の孔を最低2本穿設する必要があり、ざらにこ
の孔から外気が入らないように封止する必要がある。
Furthermore, in order to provide a coaxial cable 7a that electrically connects the outside and the inside of the thermostatic oven 7,
It is necessary to drill at least two holes about the size of a dragon φ, and it is necessary to roughly seal the holes to prevent outside air from entering.

このため専用の恒温槽7を必要としている。For this reason, a dedicated constant temperature bath 7 is required.

し発明の目的] 本発明はかかる事情に対処してなされたもので、被測定
電子部品の湿度特性が、簡1iな設備で短時間にかつ正
確に測定される温度特性測定装置を提供することを目的
としている。
OBJECT OF THE INVENTION] The present invention has been made in response to such circumstances, and an object of the present invention is to provide a temperature characteristic measuring device that can accurately measure the humidity characteristics of an electronic component to be measured in a short time using simple equipment. It is an object.

[発明の概要1 寸なわら本発明の温度特性測定装置は、ケーシングと、
このケーシング内に装着された温度特性が測定される被
測定電子部品と、前記ケーシング内に装着されたあらか
じめ温度特性が既知の標準電子部品と、前記ケーシング
内に装着された各電子部品に所定の温度条件を与える変
温手段とを備えたことにより、被測定電子部品の温度特
性が、簡単な設備で短時間にかつ正確に測定されるよう
にしたものである。
[Summary of the Invention 1 The temperature characteristic measuring device of the present invention includes a casing,
The electronic components to be measured whose temperature characteristics are to be measured are mounted inside the casing, the standard electronic components whose temperature characteristics are known in advance are mounted inside the casing, and the electronic components mounted inside the casing are By providing temperature changing means for providing temperature conditions, the temperature characteristics of the electronic component to be measured can be measured accurately in a short time with simple equipment.

[発明の実施例] 以下、本発明の実施例の詳細を図面に基づいて説明する
[Embodiments of the Invention] Hereinafter, details of embodiments of the present invention will be described based on the drawings.

第1図〜第4図は本発明の一実施例の温度特性測定装置
を説明するための図でおる。
1 to 4 are diagrams for explaining a temperature characteristic measuring device according to an embodiment of the present invention.

この温度特性測定装置は、これらの図に示すように、ケ
ーシング11が基台11aおよび器体11bにより構成
され、基台11aに蓋体11bが装着されるようになっ
ている。
As shown in these figures, in this temperature characteristic measuring device, a casing 11 is composed of a base 11a and a container body 11b, and a lid 11b is attached to the base 11a.

基台11a上に共振周波数の温度特性が確認されている
標準品である弾性表面波デバイス12aが装着されるソ
ケット13aが設けられており、このソケット13aに
近接するように温度特性が測定される弾性表面波デバイ
ス12bが装着されるソケット13bが8堪プられてい
る。
A socket 13a is provided on the base 11a, into which a surface acoustic wave device 12a, which is a standard product whose temperature characteristics of resonance frequency have been confirmed, is mounted, and the temperature characteristics are measured close to this socket 13a. There are eight sockets 13b into which surface acoustic wave devices 12b are attached.

基台11aの外側面にはソケット13a、13bのそれ
ぞれの接続端子と外部とを電気的に接続さセルコネクタ
14a、14a’ 、14b、14b′がδ堪ブられて
いる。
Cell connectors 14a, 14a', 14b, and 14b' are provided on the outer surface of the base 11a to electrically connect the connection terminals of the sockets 13a and 13b to the outside.

蓋体11bには送風口15が設けられてあり、この送風
口15よりケーシング11内を冷却さけるときたとえば
冷却剤が封入され、加熱させるときたとえばドライヤで
熱風が封入されるようになっている。
The lid body 11b is provided with an air outlet 15, through which a coolant, for example, is sealed when the inside of the casing 11 is to be cooled, and hot air, for example, from a dryer, is sealed through this air outlet 15 when the inside of the casing 11 is to be heated.

蓋体11bには押し板16が内戚されており、この押し
板16と蓋体11bの内壁との間には弾性部材17が介
挿されており、基台11aのソケット13a、13bに
弾性表面波デバイス12a、12bを装着して蓋体11
b@塁台11aに装着したとぎ、押し板16が弾性表面
波デバイス12a、12bの両方の上面がソケット13
a、13b方向に押圧され、接続が確実に行なわれるよ
うになっている。
A push plate 16 is included in the cover 11b, and an elastic member 17 is inserted between the push plate 16 and the inner wall of the cover 11b, and an elastic member 17 is inserted into the sockets 13a and 13b of the base 11a. The surface wave devices 12a and 12b are attached to the lid body 11.
b @ When installed on the base 11a, the push plate 16 connects the top surfaces of both surface acoustic wave devices 12a and 12b to the sockets 13.
It is pressed in the directions a and 13b to ensure a secure connection.

またこの押し板16は、銅材質の薄板であり、熱伝導性
の良いものとされてあり、このことによりソケット13
a、13bに装着された弾性表面波デバイス12a、1
2bの2つがより正確に同一の温度とされるようになっ
ている。
Further, this push plate 16 is a thin plate made of copper material and is considered to have good thermal conductivity.
Surface acoustic wave devices 12a, 1 attached to a, 13b
2b are set to have the same temperature more accurately.

また第5図に示すように、(吊引発(辰器1Bから発振
された所定の周波数の電気信号か分離器19、同軸ケー
ブル20、コネクタ14b、ソケット13bを介して弾
性表面波デバイス12bに入力されるようになっている
In addition, as shown in FIG. It is now entered.

その出力信号はコネクタ14b’ 、同軸ケーブル20
’を介してネットワークアナライ1f21に入力される
ようになっている。
The output signal is connected to the connector 14b' and the coaxial cable 20.
' is input to the network analyzer 1f21.

このような信号が入力されたネットワークアナライザ2
1において、電気的特性値が解析され、その値が位相振
幅表示器22により表示されるようになっている。
Network analyzer 2 to which such a signal is input
1, the electrical characteristic values are analyzed and the values are displayed by the phase amplitude display 22.

また掃引発振器18の発振周波数はデジタルマーカ23
により指定されるようなっている。
Furthermore, the oscillation frequency of the sweep oscillator 18 is determined by the digital marker 23.
It is specified by

ケーシング11のコネクタ14a、14a′には同軸ケ
ーブル24.24′ により周波数測定器25が接続さ
れており、ソケット13aに装着される弾性表面波デバ
イス12aの共振周波数が測定されるようになっている
A frequency measuring device 25 is connected to the connectors 14a, 14a' of the casing 11 by coaxial cables 24, 24', and is adapted to measure the resonant frequency of the surface acoustic wave device 12a attached to the socket 13a. .

このように構成された温度特性測定装置により、以下に
示すように弾性表面波デバイス12bの温度特性の測定
が行なわれる。
The temperature characteristic measuring device configured as described above measures the temperature characteristics of the surface acoustic wave device 12b as described below.

基台11aの各ソケット13a、13bに共振周波数の
温度特性か既知の標準品である弾性表面波デバイス12
aおよび温度特性が測定される弾性表面波デバイス12
bを装着し、蓋体11bを基台11aを装着する。
Each socket 13a, 13b of the base 11a is equipped with a surface acoustic wave device 12, which is a standard product with known temperature characteristics of resonance frequency.
a surface acoustic wave device 12 whose temperature characteristics are measured
b, and then the lid 11b and the base 11a are attached.

コネクタ14a、14a’  、14b、14b′に各
同軸ケーブル20.20’ 、24.24′を接続する
Each coaxial cable 20.20', 24.24' is connected to the connector 14a, 14a', 14b, 14b'.

送風口15より冷却させる温度のとき冷却剤を封入し、
加熱さける温度のときドライ1アで熱風を封入させ、測
定温度を調整する。
When the temperature is such that it is cooled from the air outlet 15, a coolant is sealed,
When the temperature is such that heating should be avoided, hot air is sealed in Dry 1A to adjust the measurement temperature.

共振周波数の温度特性が既知の弾性表面波デバイス12
aの共振周波数を周波数測定器25により測定し、この
共振周波数から弾性表面波デバイス12aの温度を設定
し、この弾性表面デバイス12aの温度を同一条件の弾
性表面波デバイス12bの温度とする。
Surface acoustic wave device 12 with known temperature characteristics of resonance frequency
The resonant frequency of the surface acoustic wave device 12a is measured by the frequency measuring device 25, and the temperature of the surface acoustic wave device 12a is set from this resonant frequency, and the temperature of the surface acoustic wave device 12a is set as the temperature of the surface acoustic wave device 12b under the same conditions.

このような測定により所定の温度となったとき、ネット
ワークアナライザ21により解析されたその所定の温度
での電気的特性値を位相振幅表示器22により測定する
When a predetermined temperature is reached through such measurements, the electrical characteristic value at the predetermined temperature analyzed by the network analyzer 21 is measured by the phase amplitude indicator 22.

このような測定を一40℃、−20’C,0℃、25°
C140’C155°C170℃、85°Cで行ない、
この特性を温度特性とする。
Such measurements were carried out at -40°C, -20'C, 0°C, 25°
C140'C155°C170°C, carried out at 85°C,
This characteristic is referred to as a temperature characteristic.

このように共振周波数の温度特性が既知の弾性表面波デ
バイス12aの共振周波数を周波数測定器25により測
定し、この共振周波数から弾性表面波デバイス12aの
温度を設定し、この弾性表面波デバイス12aの温度を
同一条件である温度特性が測定される弾性表面波デバイ
ス12bの温度とすることかできるので、ケーシング1
1のような簡単な構造のものの中で測定することができ
、ざらに測定時間が非常に短くなる。
In this way, the resonant frequency of the surface acoustic wave device 12a whose temperature characteristics of the resonant frequency are known is measured by the frequency measuring device 25, and the temperature of the surface acoustic wave device 12a is set from this resonant frequency. Since the temperature can be the temperature of the surface acoustic wave device 12b whose temperature characteristics are measured under the same conditions, the casing 1
It can be measured in a simple structure like 1, and the measurement time is generally very short.

このことにより、測定系の熱的劣化がなくなり、接触不
良等による測定エラーが防止でき、正確な温1哀特性か
測定される。
This eliminates thermal deterioration of the measurement system, prevents measurement errors due to poor contact, etc., and allows accurate temperature characteristics to be measured.

[発明の効果] 以上説明したように本発明の温度特性測定装置によれば
、ケーシング内に被測定および標準電子部品を装着し、
変温手段によりこれらに所定の温度条11を与えること
により、電子部品の温度特性か簡単な設備で短時間にか
つ正確に測定できる。
[Effects of the Invention] As explained above, according to the temperature characteristic measuring device of the present invention, the measured and standard electronic components are mounted in the casing,
By applying a predetermined temperature range 11 to these components using a variable temperature means, the temperature characteristics of electronic components can be measured accurately in a short time with simple equipment.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例の温度特性測定装置の斜視図
、第2図はその平面図、第3図はその縦断正面図、第4
図はその横断平面図、第5図はこの実施例の温度特性測
定装置のブロック図、第6図は従来の温度特性測定装置
の縦断正面図、第7図はその平面図、第8図はそのブロ
ック図である。 11・・・・・・・・・・・・・・・・・・ケーシング
11a・・・・・・・・・・・・・・・基台11b・・
・・・・・・・・・・・・・蓋体12a・・・・・・・
・・・・・・・・共振周波数の温度特性か既知の弾性表
面波デバイス 12b・・・・・・・・・・・・・・・温度特性が測定
される弾性表面波デバイス 13a、13b・・・ソケット 14a、14a’ 、14b、14b′・・・・・・・
・・・・・・・・コネクタ15・・・・・・・・・・・
・・・・・・・送風口出願人      株式会社 東
芝 代理人 弁理士  須 山 佐 − 第1日 第2図 第3図 苑4 図 第5 図 第7図
FIG. 1 is a perspective view of a temperature characteristic measuring device according to an embodiment of the present invention, FIG. 2 is a plan view thereof, FIG. 3 is a longitudinal sectional front view thereof, and FIG.
5 is a block diagram of the temperature characteristic measuring device of this embodiment, FIG. 6 is a longitudinal sectional front view of the conventional temperature characteristic measuring device, FIG. 7 is a plan view thereof, and FIG. It is a block diagram. 11...Casing 11a...Base 11b...
・・・・・・・・・・・・Lid body 12a・・・・・・・
....Surface acoustic wave device 12b whose temperature characteristic of resonance frequency is known...Surface acoustic wave device 13a, 13b whose temperature characteristic is measured. ...Sockets 14a, 14a', 14b, 14b'...
・・・・・・・・・Connector 15・・・・・・・・・・・・
...Air vent applicant Toshiba Corporation Patent attorney Sasa Suyama - Day 1 Figure 2 Figure 3 Figure 4 Figure 5 Figure 7

Claims (1)

【特許請求の範囲】[Claims] ケーシングと、このケーシング内に装着された温度特性
が測定される被測定電子部品と、前記ケーシング内に装
着されたあらかじめ温度特性が既知の標準電子部品と、
前記ケーシング内に装着された各電子部品に所定の温度
条件を与える変温手段とを備えたことを特徴とする温度
特性測定装置。
a casing, an electronic component to be measured whose temperature characteristics are to be measured, which is installed inside the casing, and a standard electronic component whose temperature characteristics are known in advance and which is installed inside the casing;
A temperature characteristic measuring device comprising: a temperature changing means for applying a predetermined temperature condition to each electronic component installed in the casing.
JP26634285A 1985-11-27 1985-11-27 Apparatus for measuring temperature characteristic Pending JPS62126358A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26634285A JPS62126358A (en) 1985-11-27 1985-11-27 Apparatus for measuring temperature characteristic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26634285A JPS62126358A (en) 1985-11-27 1985-11-27 Apparatus for measuring temperature characteristic

Publications (1)

Publication Number Publication Date
JPS62126358A true JPS62126358A (en) 1987-06-08

Family

ID=17429598

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26634285A Pending JPS62126358A (en) 1985-11-27 1985-11-27 Apparatus for measuring temperature characteristic

Country Status (1)

Country Link
JP (1) JPS62126358A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006313075A (en) * 2005-05-06 2006-11-16 Kyocera Corp Waveguide and temperature characteristic measuring instrument

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006313075A (en) * 2005-05-06 2006-11-16 Kyocera Corp Waveguide and temperature characteristic measuring instrument

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