JPS62121351A - Inspecting device - Google Patents

Inspecting device

Info

Publication number
JPS62121351A
JPS62121351A JP60262174A JP26217485A JPS62121351A JP S62121351 A JPS62121351 A JP S62121351A JP 60262174 A JP60262174 A JP 60262174A JP 26217485 A JP26217485 A JP 26217485A JP S62121351 A JPS62121351 A JP S62121351A
Authority
JP
Japan
Prior art keywords
ultrasonic probe
cylindrical body
gear
probe
guide part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60262174A
Other languages
Japanese (ja)
Inventor
Hideo Yoshioka
吉岡 英生
Takehiro Saito
斎藤 剛裕
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP60262174A priority Critical patent/JPS62121351A/en
Publication of JPS62121351A publication Critical patent/JPS62121351A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

PURPOSE:To set a distance between an ultrasonic probe and a material to be inspected, by rotating a guide part for moving up and down continuously the ultrasonic probe. CONSTITUTION:The titled device is provided with an ultrasonic probe 10, a guide part 11, a gear part, and a fixture 14, etc. In this state, in case the outside diameter of a material to be inspected 1 is changed and it is desired to obtain a prescribed distance between the material to be inspected 1 and the probe 10, when a guide part 11 is rotated, a gear part 12 having a spur gear which has been engaged with an internal gear of the guide part 11 is rotated. Subsequently, the probe 10 moves up and down continuously in the central direction of a cylindrical body through a pinion provided ion a different end of the gear part 12. Next, after the prescribed distance has been obtained between the probe 10 and the material to be inspected 1, the guide part 11 is fixed by the fixture 14. Accordingly, in case the outside diameter of the material to be inspected 1 has been changed, the guide part 11 is slid by a prescribed angle so that a prescribed distance is obtained between the probe 10 and the material to be inspected 1. In this way, a distance of the probe 10 can be set easily and in a short period.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は1回転せずに直進搬送される管状あるいは丸
棒状の被検材の回りを回転する超音波探触子によって被
検材の外周をスパイラル状に走査し、探傷する検査装置
において、超音波探触子と被検材との距離を簡単に短時
間に設定することに関するものである。
[Detailed Description of the Invention] [Industrial Application Field] This invention uses an ultrasonic probe that rotates around a tubular or round bar-shaped test material that is transported straight without making one revolution to measure the outer periphery of the test material. This invention relates to easily setting the distance between an ultrasonic probe and a material to be inspected in a short time in an inspection device that performs flaw detection by scanning spirally.

〔従来の技術〕[Conventional technology]

第3図は従来の検査装置を示す断面図であり。 FIG. 3 is a sectional view showing a conventional inspection device.

第4図は回転せずに直進搬送される管状あるいは丸棒状
の被検材(1)を搬送方向Aから見た図である。
FIG. 4 is a view of a tubular or round rod-shaped test material (1) that is transported straight without rotation, as seen from the transport direction A.

(2)は被検材(1)の回りを回転する超音波探触子、
(3)は超音波探触子が挿入されている円筒体、 (4
1kj被検材(1)と超音波探触子(2)を所定の距離
に設定するために超音波探触子(2)と円筒体(3)の
間に&′!さみ込むスペーサ、(5)は超音波探触子(
2)とスペーサ(4)全同時に円筒体(3)に固定する
ネジ、 (6)t’:!円筒体(3)の両端に設けられ
、上記被検材(1)の外周に内接するリング、 (78
’! IJソング6)を円筒体(3)K固定するカバ−
181に’!被検材(1)と円筒体(3)とリング(6
)とによって囲まれている超音波媒質、(9)は超音波
媒質を送り込む導入口である。
(2) is an ultrasonic probe that rotates around the test material (1);
(3) is a cylindrical body into which an ultrasound probe is inserted, (4
1kj To set the test material (1) and the ultrasonic probe (2) at a predetermined distance, place &'! between the ultrasonic probe (2) and the cylindrical body (3). The spacer to be inserted, (5) is the ultrasonic probe (
2) and spacer (4), screws to fix them all to the cylinder (3) at the same time, (6) t':! rings provided at both ends of the cylindrical body (3) and inscribed in the outer periphery of the test material (1);
'! Cover for fixing IJ song 6) to cylindrical body (3)K
To 181'! Test material (1), cylindrical body (3), and ring (6
), and (9) is an inlet for feeding the ultrasonic medium.

従来の検査装置は上記の様に構成され、被検材(11の
回りを回転する超音波探触子(2)は、被検材(11が
搬送方向AKて搬送されると導入口(9)から導かれた
超音波媒質(8:を介して被検材(IIK超音波を伝播
し探傷検査する。
The conventional inspection apparatus is configured as described above, and the ultrasonic probe (2) rotating around the specimen material (11) is inserted into the inlet port (9) when the specimen material (11) is transported in the transport direction AK. ) The specimen material (IIK ultrasonic waves are propagated through the ultrasonic medium (8:) and inspected for flaws.

ところで、被検材(11の外径が変る場合は、カバー(
7)を取外し、リング(6)を所定の外径のもの匠交換
し、ネジ(5)を取外し超音波探触子(2)を引き抜き
スペーサ(4)を所定の厚みのものに交換し、交換した
スペーサと超音波探触子(2)をネジ(5)で固定し。
By the way, if the outer diameter of the test material (11) changes, the cover (
7), remove the ring (6), replace it with the specified outer diameter, remove the screw (5), pull out the ultrasonic probe (2), and replace the spacer (4) with one of the specified thickness. Fix the replaced spacer and ultrasonic probe (2) with screws (5).

外径の変わった被検材+11 K対応した所定の距離に
設定する。
Set to a predetermined distance corresponding to the specimen material with a different outer diameter +11K.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上記のような従来の検査装置では、被検材(1)の外径
が変わった場合、被検材(1)と超音波探触子(2)の
間に健全な超音波媒質(8)を保持するため、まずリン
グ(6)を交換し、ついで、超音波探触子(2)が円筒
体(3)Kスペーサ(4)を介して直接固定されている
ネジ(5)ヲ全て取外してスペーサ(4)を全て所定の
厚みのものに取換えろという手間のかかる作業があり、
この時間が長いために被検材+11の外径がたびたび変
わる場合VCは探傷検査の効率が下がり、ひいては生産
の効率の低下を招くという問題点があった。
In the conventional inspection equipment as described above, when the outer diameter of the material to be inspected (1) changes, a healthy ultrasonic medium (8) is placed between the material to be inspected (1) and the ultrasonic probe (2). To hold the ring (6), first replace the ring (6), then remove all the screws (5) that directly fix the ultrasonic probe (2) via the cylindrical body (3) and the K spacer (4). There is a time-consuming task of replacing all the spacers (4) with ones of the specified thickness.
If the outer diameter of the test material +11 changes frequently due to this long time, VC has a problem in that the efficiency of flaw detection decreases, which in turn leads to a decrease in production efficiency.

この発明は、かかる問題点を解決するためになされたも
ので、ガイド部を回転させろことによって超音波探触子
を簡単に短時間で、被検材との間の所定の距離設定がで
きる検査装置を得ることを目的とする。
This invention was made to solve this problem, and by rotating the guide part, the ultrasonic probe can be easily and quickly set at a predetermined distance from the specimen. The purpose is to obtain equipment.

〔問題点を解決するための手段〕[Means for solving problems]

この発明に係る検査装置は1円筒体周囲のガイド部を回
転させ、ガイド部の内歯車とかみ合っている平歯車を有
するギア部を回転させ、ギア部異端のビニオを介して超
音波探触子のラックが連続的に上下動することKより9
円筒体中心方向に向けて挿入された超音波探触子を動か
し、被検材との間に所定の距離設定ができろようにした
ものである。
The inspection device according to the present invention rotates a guide section around a cylindrical body, rotates a gear section having a spur gear that meshes with an internal gear of the guide section, and transmits an ultrasonic probe through a pinion of the gear section. 9 from K that the rack moves up and down continuously.
The ultrasonic probe inserted toward the center of the cylindrical body is moved to set a predetermined distance between the probe and the specimen.

〔作用〕[Effect]

この発明においては2円筒体周囲のガイド部を回転させ
ろと、ガイド部の内歯車とかみ合っている平歯車を有す
るギア部が回転し、ギア部異端のピニオンを介して超音
波探触子のラックが連続的に上下動することにより、超
音波探触子は上下動し、一方では超音波探触子は円筒体
にその中心に向けて挿入されていて、常に円筒体の中心
方向にのみ動くので、超音波探触子と被検材との間に所
定の距離設定が簡単に短時間にできる。
In this invention, when the guide part around the two cylindrical bodies is rotated, a gear part having a spur gear that meshes with an internal gear of the guide part rotates, and a rack of the ultrasonic probe is rotated via a pinion on the other side of the gear part. Continuously moves up and down, causing the ultrasound probe to move up and down.On the other hand, the ultrasound probe is inserted into the cylindrical body toward its center, and always moves only toward the center of the cylindrical body. Therefore, it is possible to easily set a predetermined distance between the ultrasonic probe and the specimen in a short time.

〔実捲例〕[Real example]

第1図は、この発明の一実施例を示す断面図であり、 
+1>、 (31は上記従来装置と全く同一のものであ
る。α0は外面にラックを有した超音波探触子。
FIG. 1 is a sectional view showing an embodiment of the present invention.
+1>, (31 is exactly the same as the conventional device described above. α0 is an ultrasonic probe having a rack on the outer surface.

++1)は上記円筒体(3)にスライドガイドし内歯車
を有するガイド部、α2は一端て上記超音波探触子a値
のランクとかん合するピニオンを有し、他の一端に上記
ガイド部αDの内歯車とかん合する平歯車を有して軸で
連結されたギア部、αJは上記ギア部σX5を回転支持
するとともに上記円筒体(3)に固定された支持部、a
←了上記ガイド部α11を上記支持部(13VC対して
所定の位置で固定する固定具である。
++1) is a guide part that slides into the cylindrical body (3) and has an internal gear; α2 has a pinion that engages with the rank of the a value of the ultrasonic probe at one end; and the guide part at the other end. αJ is a gear portion that has a spur gear that meshes with the internal gear of αD and is connected by a shaft; αJ is a support portion that rotatably supports the gear portion σX5 and is fixed to the cylindrical body (3);
←This is a fixture that fixes the guide portion α11 at a predetermined position with respect to the support portion (13VC).

上記のように構成された検査装置において&コ。In the inspection device configured as above, &co.

被検材(1)の外径が変わり被検材filと超音波探触
子00との間に所定の距離を得ようとする場合、ガイド
部+111を回転させるとガイド部αυの内歯車にかみ
合った平歯車を有するギア部α2が回転し、ギア部α2
の異端に有するピニオンを介して超音波探触子01は連
続的に円筒体の中心方向へ上下動する。ついで超音波探
触子部と被検材(1)との間に所定の距離が得られた後
に、固定具α4によってガイド部αυを固定する。
When the outer diameter of the test material (1) changes and you want to obtain a predetermined distance between the test material fil and the ultrasonic probe 00, rotating the guide part +111 causes the internal gear of the guide part αυ to Gear part α2 having meshed spur gears rotates, and gear part α2
The ultrasonic probe 01 continuously moves up and down toward the center of the cylindrical body via a pinion provided at the opposite end of the cylindrical body. Next, after a predetermined distance is obtained between the ultrasonic probe section and the material to be inspected (1), the guide section αυ is fixed with the fixture α4.

したがって、被検材(1)の外径が変わった場合。Therefore, when the outer diameter of the test material (1) changes.

カイト部Ql)を超音波探触子α1と被検材(1)との
間が所定の距離になる様に所定の角度だけスライドさせ
ろという簡単な作業のみ行えばよく、超音波探触子(1
1を簡単に短時間に距離設定できることになる。
All you need to do is simply slide the kite part Ql) by a predetermined angle so that the distance between the ultrasonic probe α1 and the test material (1) is a predetermined distance. 1
1 can be easily set in a short time.

〔発明の効果〕〔Effect of the invention〕

この発明は以上説明したとおり、超音波探触子を連続的
に上下動させるのにガイド部を回転させるという簡単な
操作で、超音波探触子と被検材の距離設定かできるとい
う効果がある。また超音波探触子が同一断面上に多く並
んでいればいる程。
As explained above, this invention has the advantage that the distance between the ultrasonic probe and the material to be examined can be set by a simple operation of rotating the guide part to continuously move the ultrasonic probe up and down. be. Also, the more ultrasound probes are lined up on the same cross section.

ひとつあたりの超音波探触子の距離設定時間が短くなる
のはいうまでもない。
Needless to say, the distance setting time for each ultrasonic probe becomes shorter.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実晦例を示す断面図、第2図は第
1図を搬送方向Aから見た図、第3図は従来の検査装置
を示す断面図、第4図は第3図を搬送方向Aから見た図
である。 図において、(1)は被検材、 (31&2円筒体、α
Gは超音波探触子、 ttllはガイド部、α2はギア
部、α3は支持部、041は固定具である。 なお、各図中同一符号は同一または相当部分を示す。
FIG. 1 is a sectional view showing an example of the present invention, FIG. 2 is a view of FIG. 1 viewed from the transport direction A, FIG. 3 is a sectional view showing a conventional inspection device, and FIG. FIG. 3 is a view of FIG. 3 viewed from the conveying direction A. In the figure, (1) is the test material, (31 & 2 cylindrical body, α
G is an ultrasonic probe, ttll is a guide part, α2 is a gear part, α3 is a support part, and 041 is a fixture. Note that the same reference numerals in each figure indicate the same or corresponding parts.

Claims (1)

【特許請求の範囲】[Claims] 回転せずに直進搬送される管状あるいは丸棒状の被検材
の回りを回転する外面にラツクを有した超音波探触子に
よつて、上記被検材の外周をスパイラル状に走査し探傷
する検査装置において、上記超音波探触子が挿入されて
いる円筒体と、上記円筒体にスライドガイドし内歯車を
有するガイド部と、一端に上記超音波探触子のラツクと
かみ合うピニオンを有し、他の一端に上記ガイド部の内
歯車とかみ合う平歯車を有して軸で連結されたギア部と
、上記ギア部を回転支持するとともに上記円筒体に固定
した支持部と、上記ガイド部を上記支持部に対して所定
の位置で固定する固定具と、上記円筒体の両端に設けら
れ、上記被検材の外周に内接するリングと、上記被検材
と上記円筒体と上記リングにより囲まれて形成される超
音波媒質とを備えたことを特徴とする検査装置。
An ultrasonic probe with an outer surface that rotates around a tubular or round bar-shaped test material that is transported straight without rotating, scans the outer circumference of the test material in a spiral pattern for flaw detection. The inspection device includes a cylindrical body into which the ultrasonic probe is inserted, a guide portion that slides into the cylindrical body and has an internal gear, and a pinion that engages with the rack of the ultrasonic probe at one end. , a gear part having a spur gear meshing with an internal gear of the guide part at the other end and connected by a shaft, a support part that rotatably supports the gear part and is fixed to the cylindrical body, and the guide part. a fixture that fixes the supporting part at a predetermined position; a ring that is provided at both ends of the cylindrical body and inscribed in the outer periphery of the specimen; and a ring that is surrounded by the specimen, the cylindrical body, and the ring. An inspection device characterized by comprising: an ultrasonic medium formed by
JP60262174A 1985-11-21 1985-11-21 Inspecting device Pending JPS62121351A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60262174A JPS62121351A (en) 1985-11-21 1985-11-21 Inspecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60262174A JPS62121351A (en) 1985-11-21 1985-11-21 Inspecting device

Publications (1)

Publication Number Publication Date
JPS62121351A true JPS62121351A (en) 1987-06-02

Family

ID=17372092

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60262174A Pending JPS62121351A (en) 1985-11-21 1985-11-21 Inspecting device

Country Status (1)

Country Link
JP (1) JPS62121351A (en)

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