JPS62116355U - - Google Patents

Info

Publication number
JPS62116355U
JPS62116355U JP187986U JP187986U JPS62116355U JP S62116355 U JPS62116355 U JP S62116355U JP 187986 U JP187986 U JP 187986U JP 187986 U JP187986 U JP 187986U JP S62116355 U JPS62116355 U JP S62116355U
Authority
JP
Japan
Prior art keywords
pinhole plate
atmospheric pressure
ion source
pinhole
pressure ion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP187986U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP187986U priority Critical patent/JPS62116355U/ja
Publication of JPS62116355U publication Critical patent/JPS62116355U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

添付図面は本考案の一実施例の構成を示す断面
図である。 1:大気圧イオン源、2:質量分析部、7,8
:ピンホール板、9:押え金具。
The accompanying drawing is a sectional view showing the configuration of an embodiment of the present invention. 1: Atmospheric pressure ion source, 2: Mass spectrometry section, 7, 8
: Pinhole plate, 9: Holder metal fitting.

補正 昭61.4.25 図面の簡単な説明を次のように補正する。 明細書第6頁第3行に「添付図面は」とあるを
「第1図は」と補正する。
Amendment April 25, 1981 The brief description of the drawing is amended as follows. On page 6, line 3 of the specification, the phrase "as shown in the attached drawings" is amended to read as "as shown in Figure 1."

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 大気圧イオン源と、該大気圧イオン源で生成さ
れた試料イオンを質量分析するための質量分析部
と、該質量分析部と大気圧イオン源との間の圧力
差を維持すると共に試料イオンを質量分析部へ導
入するための両者の間に配置される第1のピンホ
ール板と、該第1のピンホール板の大気圧イオン
源側に該第1のピンホール板とピンホールを一致
させて取外し可能に配置される第2のピンホール
板とを備え、前記第1のピンホール板のピンホー
ルを前記第2のピンホール板のピンホールよりも
大きくしたことを特徴とする質量分析装置。
an atmospheric pressure ion source; a mass spectrometer for mass spectrometry of sample ions generated by the atmospheric pressure ion source; A first pinhole plate disposed between the two for introduction into the mass spectrometer, and aligning the first pinhole plate and the pinhole on the atmospheric pressure ion source side of the first pinhole plate. a second pinhole plate that is removably arranged, and the pinholes in the first pinhole plate are larger than the pinholes in the second pinhole plate. .
JP187986U 1986-01-10 1986-01-10 Pending JPS62116355U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP187986U JPS62116355U (en) 1986-01-10 1986-01-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP187986U JPS62116355U (en) 1986-01-10 1986-01-10

Publications (1)

Publication Number Publication Date
JPS62116355U true JPS62116355U (en) 1987-07-24

Family

ID=30780198

Family Applications (1)

Application Number Title Priority Date Filing Date
JP187986U Pending JPS62116355U (en) 1986-01-10 1986-01-10

Country Status (1)

Country Link
JP (1) JPS62116355U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS607054A (en) * 1984-05-23 1985-01-14 Hitachi Ltd Mass spectrometer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS607054A (en) * 1984-05-23 1985-01-14 Hitachi Ltd Mass spectrometer

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