JPS62114373U - - Google Patents
Info
- Publication number
- JPS62114373U JPS62114373U JP39586U JP39586U JPS62114373U JP S62114373 U JPS62114373 U JP S62114373U JP 39586 U JP39586 U JP 39586U JP 39586 U JP39586 U JP 39586U JP S62114373 U JPS62114373 U JP S62114373U
- Authority
- JP
- Japan
- Prior art keywords
- movable
- plate
- contact probe
- guide
- fixed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 8
- 238000000605 extraction Methods 0.000 claims description 4
- 238000007689 inspection Methods 0.000 claims description 2
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第１図は、本考案の両面回路基板検査装置の一
実施例の正面縦断面図であり、第２図は、第１図
に示す装置の一部切欠き側面図であり、第３図は
、第１図のＡ―Ａ矢視断面図である。
１：基台、２：案内支柱、３：下側コンタクト
プローブ、４：位置決め突起、７：固定上板、９
：シリンダー、１１：可動上板、１３：上側コン
タクトプローブ、１７：可動下板、２２：抽出板
、２４：両面回路基板、２５：基板位置決め部材
、２７：位置決め嵌合孔。
FIG. 1 is a front vertical sectional view of an embodiment of the double-sided circuit board inspection device of the present invention, FIG. 2 is a partially cutaway side view of the device shown in FIG. 1, and FIG. , is a sectional view taken along the line A--A in FIG. 1. 1: Base, 2: Guide post, 3: Lower contact probe, 4: Positioning protrusion, 7: Fixed upper plate, 9
: Cylinder, 11: Movable upper plate, 13: Upper contact probe, 17: Movable lower plate, 22: Extraction plate, 24: Double-sided circuit board, 25: Board positioning member, 27: Positioning fitting hole.
Claims (1)
柱の上部に固定上板を固定し、可動上板を前記案
内支柱をガイドとして前記固定上板に固定された
シリンダーにより上下動自在となし、この可動上
板に下に向けて上側コンタクトプローブを配設し
、この可動上板の下に、可動下板を前記案内支柱
をガイドとして上下動自在となし、この可動下板
の上面に水平方向に左右に横動自在で左右の２つ
の位置で位置決めされる抽出板を設け、前記基台
に前記上側コンタクトプローブに対向して上向き
に下側コンタクトプローブを配設し、位置決めさ
れる前記抽出板の前記上側コンタクトプローブに
臨む２つの位置に両面回路基板を位置決めする基
板位置決め部材をそれぞれに設け、さらに前記可
動下板と位置決めされる前記抽出板の２つの位置
に前記下側コンタクトプローブに臨んで前記下側
コンタクトプローブが遊貫できる透孔をそれぞれ
に設けたことを特徴とする両面回路基板検査装置
。 Guide columns are planted in the corners of the base, a fixed upper plate is fixed to the upper part of these guide columns, and the movable upper plate is made to be vertically movable using the guide columns as a guide by a cylinder fixed to the fixed upper plate. None, an upper contact probe is arranged facing downward on this movable upper plate, a movable lower plate is placed under this movable upper plate so that it can move up and down using the guide column as a guide, and a movable lower plate is placed on the upper surface of this movable lower plate An extraction plate is provided which is horizontally movable to the left and right and is positioned at two positions, right and left, and a lower contact probe is disposed on the base facing upward facing the upper contact probe, and the board positioning members for positioning the double-sided circuit board at two positions facing the upper contact probe of the extraction plate, and further provided for the lower contact probe at two positions of the extraction plate positioned with the movable lower plate; A double-sided circuit board inspection device characterized in that each side is provided with a through hole through which the lower contact probe can freely pass.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986000395U JPH0413666Y2 (en) | 1986-01-08 | 1986-01-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986000395U JPH0413666Y2 (en) | 1986-01-08 | 1986-01-08 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62114373U true JPS62114373U (en) | 1987-07-21 |
| JPH0413666Y2 JPH0413666Y2 (en) | 1992-03-30 |
Family
ID=30777328
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986000395U Expired JPH0413666Y2 (en) | 1986-01-08 | 1986-01-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0413666Y2 (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5018590A (en) * | 1973-05-10 | 1975-02-27 | ||
| JPS6057269A (en) * | 1983-09-09 | 1985-04-03 | Matsushita Electric Ind Co Ltd | Positioning and inspecting device of both faces of printed board |
-
1986
- 1986-01-08 JP JP1986000395U patent/JPH0413666Y2/ja not_active Expired
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5018590A (en) * | 1973-05-10 | 1975-02-27 | ||
| JPS6057269A (en) * | 1983-09-09 | 1985-04-03 | Matsushita Electric Ind Co Ltd | Positioning and inspecting device of both faces of printed board |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0413666Y2 (en) | 1992-03-30 |