JPS62112844U - - Google Patents

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Publication number
JPS62112844U
JPS62112844U JP128386U JP128386U JPS62112844U JP S62112844 U JPS62112844 U JP S62112844U JP 128386 U JP128386 U JP 128386U JP 128386 U JP128386 U JP 128386U JP S62112844 U JPS62112844 U JP S62112844U
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JP
Japan
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP128386U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP128386U priority Critical patent/JPS62112844U/ja
Publication of JPS62112844U publication Critical patent/JPS62112844U/ja
Pending legal-status Critical Current

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  • Electron Tubes For Measurement (AREA)
JP128386U 1986-01-08 1986-01-08 Pending JPS62112844U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP128386U JPS62112844U (enExample) 1986-01-08 1986-01-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP128386U JPS62112844U (enExample) 1986-01-08 1986-01-08

Publications (1)

Publication Number Publication Date
JPS62112844U true JPS62112844U (enExample) 1987-07-18

Family

ID=30779047

Family Applications (1)

Application Number Title Priority Date Filing Date
JP128386U Pending JPS62112844U (enExample) 1986-01-08 1986-01-08

Country Status (1)

Country Link
JP (1) JPS62112844U (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002532844A (ja) * 1998-12-17 2002-10-02 フィリップス エレクトロン オプティクス ビー ヴィ オージェ電子の検出を含む粒子光学装置
JP2007504606A (ja) * 2003-08-28 2007-03-01 シマヅ リサーチ ラボラトリー（ヨーロッパ）リミティド 粒子光学装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6062045A (ja) * 1983-09-14 1985-04-10 Hitachi Ltd イオンマイクロビ−ム打込み装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6062045A (ja) * 1983-09-14 1985-04-10 Hitachi Ltd イオンマイクロビ−ム打込み装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002532844A (ja) * 1998-12-17 2002-10-02 フィリップス エレクトロン オプティクス ビー ヴィ オージェ電子の検出を含む粒子光学装置
JP2007504606A (ja) * 2003-08-28 2007-03-01 シマヅ リサーチ ラボラトリー（ヨーロッパ）リミティド 粒子光学装置

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