JPS62106104U - - Google Patents
Info
- Publication number
- JPS62106104U JPS62106104U JP19744885U JP19744885U JPS62106104U JP S62106104 U JPS62106104 U JP S62106104U JP 19744885 U JP19744885 U JP 19744885U JP 19744885 U JP19744885 U JP 19744885U JP S62106104 U JPS62106104 U JP S62106104U
- Authority
- JP
- Japan
- Prior art keywords
- signal
- detected object
- certain distance
- distortion
- signal source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Description
第1図は本考案の一実施例を示す図、第2図は
偏心がある製品の測定状態図、第3図は平面度誤
差がある製品の測定状態図、第4図、第5図は他
の実施例における偏心量及び平面度誤差量測定図
、第6図は従来の検出装置である。
1……光学センサー(CCD)、2……被測定
円板、3a,3b……光源、4a,4b……光量
調整スリツト、5……近接スイツチ。
Fig. 1 is a diagram showing an embodiment of the present invention, Fig. 2 is a measurement state diagram of a product with eccentricity, Fig. 3 is a measurement state diagram of a product with flatness error, and Figs. 4 and 5 are FIG. 6, which is a measurement diagram of the amount of eccentricity and flatness error in another embodiment, shows a conventional detection device. 1... Optical sensor (CCD), 2... Disc to be measured, 3a, 3b... Light source, 4a, 4b... Light amount adjustment slit, 5... Proximity switch.
Claims (1)
号源と、前記被検出物から一定の距離の位置に設
けられこの信号源からの信号を前記被検出物が遮
断又は反射する量を測定する検出部と、この検出
部からの信号により前記被検出物の歪を算出する
処理部とを具備することを特許とする歪検出装置
。 A signal source provided at a certain distance from the detected object, and a detection method that measures the amount by which the detected object blocks or reflects the signal from the signal source, which is provided at a certain distance from the detected object. A distortion detection device that is patented as having a processing section that calculates the distortion of the object to be detected based on a signal from the detection section.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19744885U JPS62106104U (en) | 1985-12-24 | 1985-12-24 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19744885U JPS62106104U (en) | 1985-12-24 | 1985-12-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62106104U true JPS62106104U (en) | 1987-07-07 |
Family
ID=31157194
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19744885U Pending JPS62106104U (en) | 1985-12-24 | 1985-12-24 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62106104U (en) |
-
1985
- 1985-12-24 JP JP19744885U patent/JPS62106104U/ja active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS62106104U (en) | ||
JPS6232309U (en) | ||
JPS63128411U (en) | ||
JPS63135107U (en) | ||
JPS61105805U (en) | ||
JPS6068408U (en) | Rotation angle measuring device | |
JPS6065612U (en) | infrared thickness gauge | |
JPS61170012U (en) | ||
JPS6246358U (en) | ||
JPH02140308U (en) | ||
JPH0319906U (en) | ||
JPS61140915U (en) | ||
JPS5971108U (en) | Optical high-precision dimension measuring device | |
JPS6244207U (en) | ||
JPH0457729U (en) | ||
JPH0316017U (en) | ||
JPS623050U (en) | ||
JPS6148383U (en) | ||
JPS61132783U (en) | ||
JPH0390006U (en) | ||
JPS61149808U (en) | ||
JPH0468536U (en) | ||
JPS6156575U (en) | ||
JPS63174014U (en) | ||
JPS61163980U (en) |