JPS62102178U - - Google Patents
Info
- Publication number
- JPS62102178U JPS62102178U JP1985194505U JP19450585U JPS62102178U JP S62102178 U JPS62102178 U JP S62102178U JP 1985194505 U JP1985194505 U JP 1985194505U JP 19450585 U JP19450585 U JP 19450585U JP S62102178 U JPS62102178 U JP S62102178U
- Authority
- JP
- Japan
- Prior art keywords
- casing
- electronic component
- component handler
- featuring
- housed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001816 cooling Methods 0.000 claims 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Sorting Of Articles (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
- Cooling Or The Like Of Electrical Apparatus (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985194505U JPH0639338Y2 (ja) | 1985-12-18 | 1985-12-18 | 電子部品ハンドラ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985194505U JPH0639338Y2 (ja) | 1985-12-18 | 1985-12-18 | 電子部品ハンドラ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62102178U true JPS62102178U (US06623731-20030923-C00052.png) | 1987-06-29 |
| JPH0639338Y2 JPH0639338Y2 (ja) | 1994-10-12 |
Family
ID=31151540
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985194505U Expired - Lifetime JPH0639338Y2 (ja) | 1985-12-18 | 1985-12-18 | 電子部品ハンドラ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0639338Y2 (US06623731-20030923-C00052.png) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0573561U (ja) * | 1992-03-12 | 1993-10-08 | タバイエスペック株式会社 | 空冷装置付き蒸気加圧式耐環境試験器 |
| CN105797977A (zh) * | 2016-04-01 | 2016-07-27 | 开平帛汉电子有限公司 | 电子元件检测装置 |
| JP2023005282A (ja) * | 2021-06-28 | 2023-01-18 | 株式会社 東京ウエルズ | 電子部品の試験システム |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59181629A (ja) * | 1983-03-31 | 1984-10-16 | Fujitsu Ltd | 集積回路試験装置 |
| JPS6039573A (ja) * | 1983-08-12 | 1985-03-01 | Mitsubishi Electric Corp | 電子部品温度試験装置 |
| JPS60106123A (ja) * | 1983-11-14 | 1985-06-11 | ローム株式会社 | 電子部品ハンドラ |
-
1985
- 1985-12-18 JP JP1985194505U patent/JPH0639338Y2/ja not_active Expired - Lifetime
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59181629A (ja) * | 1983-03-31 | 1984-10-16 | Fujitsu Ltd | 集積回路試験装置 |
| JPS6039573A (ja) * | 1983-08-12 | 1985-03-01 | Mitsubishi Electric Corp | 電子部品温度試験装置 |
| JPS60106123A (ja) * | 1983-11-14 | 1985-06-11 | ローム株式会社 | 電子部品ハンドラ |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0573561U (ja) * | 1992-03-12 | 1993-10-08 | タバイエスペック株式会社 | 空冷装置付き蒸気加圧式耐環境試験器 |
| CN105797977A (zh) * | 2016-04-01 | 2016-07-27 | 开平帛汉电子有限公司 | 电子元件检测装置 |
| JP2023005282A (ja) * | 2021-06-28 | 2023-01-18 | 株式会社 東京ウエルズ | 電子部品の試験システム |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0639338Y2 (ja) | 1994-10-12 |
