JPS62100646A - Method and apparatus for evaluating surface-treated plate - Google Patents

Method and apparatus for evaluating surface-treated plate

Info

Publication number
JPS62100646A
JPS62100646A JP60240318A JP24031885A JPS62100646A JP S62100646 A JPS62100646 A JP S62100646A JP 60240318 A JP60240318 A JP 60240318A JP 24031885 A JP24031885 A JP 24031885A JP S62100646 A JPS62100646 A JP S62100646A
Authority
JP
Japan
Prior art keywords
light
tape
transparent tape
infrared light
powder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60240318A
Other languages
Japanese (ja)
Inventor
Bunpei Matoba
的場 文平
Yoshiro Matsumoto
松本 義朗
Tadashi Sakane
正 坂根
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP60240318A priority Critical patent/JPS62100646A/en
Publication of JPS62100646A publication Critical patent/JPS62100646A/en
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To enable accurate measurement of light transmissivity continuously in a short time, by employing infrared rays as transmission light while a filter circuit is attached to allow only the passage of electrical signals corresponding to the modulation frequency on the side of a light receiving section. CONSTITUTION:A molded material 5 to be inspected is adhered to a sticky transparent tape 10 and powder falling from the material 5 being inspected attaches to the tape 10. The tape 10 is carried until the powder-attached part thereof is positioned on a tape-holding plate 9 and a modulation infrared rays are projected through a lens 6a from an infrared-ray emitting diode 6b. A photoelectric element 7a senses light transmitted through the tape 10 and after the photoelectric conversion thereof, a bandpass filter 7b transmits only a signal component corresponding to the modulation frequency. Then, based on the quantity of light passing through the filter 7b, a light transmissivity measuring device 7c in which the quantity of light transmitted through a tape having no powder attached is preset determines light transmissivity by a specified formula. In addition, an attachment value converter 7d calculates the amount of missed powder by a specified conversion method from the resultant light transmissivity.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は表面処理を施j7た金属板の成形加圧の際の表
面被成粉状脱落現象(パウダリング)の程度を、成形部
位に接着した粘着透明テープに付着する脱落松伏被M’
A (パウダー)の9を光学的に測定することにより、
定量的に評価する方法ルびW置に関するものである。
[Detailed Description of the Invention] [Industrial Field of Application] The present invention aims to reduce the degree of shedding of powder on the surface (powdering) during forming and pressurizing a metal plate that has been surface-treated. Fallen pine cover M' attached to adhesive transparent tape
By optically measuring 9 of A (powder),
This relates to a quantitative evaluation method and W position.

〔従来技術〕[Prior art]

表面処理を施した金属板(以下表面処理板という)を成
形加工する場合、張出し成形の如き伸び変形に対しては
、表面処理板の被膜は基板の変形に追従できるが、縮み
変形が含まれる絞り成形においては、被膜の崩壊または
剥離を生じやすいのでその程度を評価することは重要で
ある。そこで従来から表面処理仮の成形加工時における
パウダリングの程度を評価する方法として、透明テープ
に付着したパウダー量を光学的に測定する方法が種々用
いられている。
When forming a surface-treated metal plate (hereinafter referred to as a surface-treated plate), the coating on the surface-treated plate can follow the deformation of the substrate against elongation deformation such as in stretch molding, but it also includes shrinkage deformation. In drawing forming, it is important to evaluate the degree of collapse or peeling of the coating because it tends to occur. Therefore, various methods of optically measuring the amount of powder adhering to a transparent tape have been conventionally used to evaluate the degree of powdering during surface treatment temporary molding.

第6図は従来の評価方法を実施するための装置の模式図
であり、41は集光レンズ、42はフィルター、43は
透明プラスチック板である。透明テープ45aを透明プ
ラスチック板43に貼り付けて、光源46より集光レン
ズ41.フィルター42を通過させた光を該透明テープ
45aを貼付した透明プラスチック板43に照射し、受
光部44にてその透過光it A aを計測してこの場
合の透過率1oを100%としておく。次に被検査成形
加工材の測定部位に前記透明テープ45aと同種の透明
テープ45bを接着させ、それをはがして透明プラスチ
ック板43に貼り付り、上述した方法と同様の方法で透
過光量Aを計7.lJして透過率rを算出しく f =
 □ X100 ) 、咳透O 過早■と前記透過率1G (=100)との差を具化率
として求める(黒化率(%) −100−1)。そうす
るとテープに脱落物付着が多いほど具化率が高くなるの
で、黒化率を算出することによってパウダリングの程度
を評価できる。
FIG. 6 is a schematic diagram of an apparatus for carrying out the conventional evaluation method, in which 41 is a condenser lens, 42 is a filter, and 43 is a transparent plastic plate. A transparent tape 45a is attached to the transparent plastic plate 43, and the condenser lens 41. The light passed through the filter 42 is irradiated onto the transparent plastic plate 43 to which the transparent tape 45a is attached, and the transmitted light itAa is measured by the light receiving section 44, and the transmittance 1o in this case is set as 100%. Next, a transparent tape 45b of the same type as the transparent tape 45a is adhered to the measurement site of the molded material to be inspected, and it is peeled off and affixed to the transparent plastic plate 43, and the amount of transmitted light A is measured in the same manner as described above. Total 7. Calculate the transmittance r by lJ f =
□X100), the difference between cough transmission O premature ■ and the transmittance 1G (=100) is determined as a concrete rate (blackening rate (%) -100-1). In this case, the degree of powdering can be evaluated by calculating the blackening rate, since the more fallen matter adheres to the tape, the higher the solidification rate becomes.

また上述した方法とは別に、分光光度計を用いて、被検
査成形加工材に接着してその後取除いた剥離透明テープ
と未使用の透明テープとに同波長の光を同時に照射して
、未使用の透明テープの透過率を100とした場合の〃
11!1iIl透明テープの透過率を測定して、その測
定値に基づいてパウダリングの程度を評価する方法もあ
る。
In addition to the method described above, a spectrophotometer is used to simultaneously irradiate light of the same wavelength to the removable transparent tape that was adhered to the molded material to be inspected and then removed, and to the unused transparent tape. When the transmittance of the transparent tape used is 100
There is also a method of measuring the transmittance of the 11!1iIl transparent tape and evaluating the degree of powdering based on the measured value.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上述した従来方法ではテープのパウダー付谷量とX3過
光量とは相関関係があるので、パウダリングの程度を評
価することは可能であるが、投光部の電源装置のために
測定器が大型となって、生産現場でのポータプル型とし
ての使用が困難であり、また正確な測定のためには電灯
光、蛍光灯光、太陽光等の環境光を遮断する遮断材が必
要であるが、遮断材を使用した場合、測定部位の肉眼に
よる確認が困難であるという欠点があった。
In the conventional method described above, it is possible to evaluate the degree of powdering because there is a correlation between the amount of powdered valleys on the tape and the amount of X3 excess light, but the measuring device is large due to the power supply of the light projecting part. Therefore, it is difficult to use as a portaple type at production sites, and for accurate measurements, a shielding material is required to block environmental light such as electric light, fluorescent light, sunlight, etc. However, when a material is used, it has the disadvantage that it is difficult to confirm the measurement area with the naked eye.

また従来方法では被検査成形加工材の特定部位にテープ
を密着させ、それを引きはがしてパウダーが付着された
テープを測定試料として得るわけであるが、この作業が
すべて手作業であるので、被検査成形加工材に対するテ
ープの密着度及びテープの引きはがし力を一定に保つこ
とは、実際上不可能となって正確な評価ができず、また
手作業のため測定するのに多くの手間及び時間を要する
という難点があった。
In addition, in the conventional method, a tape is closely attached to a specific part of the molded material to be inspected, and then the tape is peeled off to obtain the powder-coated tape as a measurement sample. It is practically impossible to keep the adhesion of the tape to the inspected molded material and the peeling force of the tape constant, making accurate evaluation impossible, and it takes a lot of effort and time to measure manually. The problem was that it required

〔問題点を解決するための手段〕[Means for solving problems]

本発明は斯かる事情に鑑みてなされたものであり、その
目的とするところは、発光強度を適当な周波数で変Sj
Mを施した赤外光を透過光として使用し、受光部側で変
調周波数に応じた電気信号のみを通過させるフィルター
回路を付加し、更にテープの接着、剥離を自動的に行う
構成とすることにより、測定器が小型であって、特別な
遮光材が不必要であるので測定部位が肉眼にて確認可能
であり、しかも光透過率の測定が連続的に短時間で可能
となる表面処理板の評価方法及び装置を提供することに
ある。
The present invention has been made in view of the above circumstances, and its purpose is to change the luminous intensity at an appropriate frequency.
Infrared light subjected to M is used as transmitted light, a filter circuit is added on the light receiving part side to pass only the electrical signal according to the modulation frequency, and the tape is further configured to be automatically bonded and peeled off. The surface-treated plate allows the measuring device to be small and does not require any special light-shielding material, allowing the measurement area to be confirmed with the naked eye, and making it possible to measure light transmittance continuously in a short time. The purpose of the present invention is to provide an evaluation method and apparatus for

本発明に係る表面処理板の評価方法は、成形加工を施し
た表面処理仮に粘着力を有する透明テープを接着押圧後
、該透明テープをはがし、表明被IFJ粉が付着した該
透明テープに光を透過させ、その光透過率を測定するこ
とにより、表面処理仮の成形加工の際の表面被膜粉状脱
落の状態を評1i11iする方法において、発光強度を
一定周期にて変じる変調を施した赤外光を透過して、該
赤外光透過率を測定することを特徴とする。
The method for evaluating a surface-treated board according to the present invention involves adhesively pressing a surface-treated transparent tape with adhesive strength, peeling off the transparent tape, and shining light onto the transparent tape to which the surface-treated IFJ powder has adhered. In this method, by measuring the light transmittance of the light transmittance, the state of powdery shedding of the surface coating during temporary surface treatment molding processing is evaluated. It is characterized by transmitting external light and measuring the infrared light transmittance.

〔実施例〕〔Example〕

以下本発明をその実施状態を示す図面に基づき具体的に
説明する。第1図は本発明に係る評1i11i装置の模
式図であり、図中1は粘着透明テープ巻戻しリール、2
は粘@祷明テープ巻取りリールである。粘着透明テープ
10が粘着透明テープ巻戻しリール1より繰出され、前
記21−ル間に設置されているテープ圧着ロール3.ガ
イド[]−ル4.テープ保持板9及びガイドロール41
を通って、図中矢符にて示す方向に1般送され、粘着透
明テープ巻取リリール2に巻き取られるようになってい
る。
The present invention will be specifically described below based on drawings showing its implementation state. FIG. 1 is a schematic diagram of the evaluation 1i11i device according to the present invention, in which 1 is an adhesive transparent tape rewinding reel, 2 is an adhesive transparent tape rewinding reel;
is a sticky tape take-up reel. An adhesive transparent tape 10 is unwound from an adhesive transparent tape rewind reel 1, and a tape pressure bonding roll 3 installed between the 21 and 21 reels. Guide[]-le4. Tape holding plate 9 and guide roll 41
The tape is generally fed through the tape in the direction indicated by the arrow in the figure, and is wound onto a take-up reel 2 of the adhesive transparent tape.

ここで活着透明テープ10の粘着面は図中上方向である
から、何れも下側に設けであるテープ圧着ロール3.ガ
イドロール4.テープ保持板9には接着しない。
Here, since the adhesive surface of the adhesive transparent tape 10 is upward in the figure, both tape pressure rollers 3 and 3 are provided on the lower side. Guide roll 4. It is not adhered to the tape holding plate 9.

粘着透明テープ10を挾んでテープ圧着ロール3対向側
には、帽子状に膨出成形加工された被検査1.45 (
第1図に斜視図を併せて示す)がロール(図示せず)に
支持されており、粘着1明テープ10が被検査材5とテ
ープ圧着ロール3との間をIM送される際に、テープ圧
着ロール3に圧接されて連動回転し、テープ圧着ロール
3の押圧力により粘;?7透明テープ10にvc検査材
5被股の脱落わ)末が付着する。また被検査(,15は
粘着透明テープ10に接着開始(多、任、汀の回・転数
だけ回転1−た時点でロール(図示せず)から外される
よう乙、ニなっており、被検査材5の全周面から重複な
く或いは仔Ωの回転数だけ重複させて試料が取れる。ま
たテープ保持板9は透明板であって、検査部位において
テープがしわにならないように粘着透明テープ10を支
持している。
On the opposite side of the tape pressure roll 3 sandwiching the adhesive transparent tape 10, there is a test object 1.45 (
(a perspective view is also shown in FIG. 1) is supported by a roll (not shown), and when the adhesive tape 10 is IM-fed between the material to be inspected 5 and the tape pressure roll 3, It is pressed against the tape pressure roll 3 and rotates in conjunction with it, and the pressure of the tape pressure roll 3 causes it to become sticky. 7) The fallen pieces of the VC test material 5 are attached to the transparent tape 10. In addition, the inspected transparent tape 10 is designed so that it is removed from the roll (not shown) when it starts adhering to the adhesive transparent tape 10 and rotates for the number of rotations. Samples are taken from the entire circumferential surface of the material to be inspected 5 without overlapping or overlapping by a rotational speed of Ω.The tape holding plate 9 is a transparent plate, and an adhesive transparent tape is used to prevent the tape from wrinkling at the inspection site. 10 is supported.

ガイドロール4,4間には、赤外光投光部6と赤外光受
光部7.、!:が活着透明テープ10を挾んで夫々対向
する位置に設置されている。赤外光投光部6はレンズ6
a+赤外発光ダイオード6I〕1発光ダ、イオード変調
装置6cを具備しており、発光ダイオード変調装置6c
ば乾電池である電源8に接続されている。そして発光ダ
イオード変調装置6cの(りJきにより、赤外発光ダイ
オード6bから適当な周波数で変じる変調を施した赤外
光がレンズ6aを通して活着透明テープ10上に投射さ
れるようにな−2ている。
Between the guide rolls 4, 4, there is an infrared light emitter 6 and an infrared light receiver 7. ,! : are installed at positions facing each other with the adhesive transparent tape 10 in between. The infrared light projecting section 6 is a lens 6
a + infrared light emitting diode 6I] 1 light emitting diode, equipped with an iode modulation device 6c, and a light emitting diode modulation device 6c.
For example, it is connected to a power source 8, which is a dry battery. Then, as a result of the light emitting diode modulation device 6c, the infrared light modulated at an appropriate frequency is projected from the infrared light emitting diode 6b onto the bonded transparent tape 10 through the lens 6a. ing.

一方赤外光受光部7は受光周波数帯域が赤外威である受
光素子7a、バンドパスフィルター7b、光透過不測定
器7c及び付着量換算器7dを具備している。
On the other hand, the infrared light receiving section 7 includes a light receiving element 7a whose light receiving frequency band is infrared light, a bandpass filter 7b, a light transmission measurement device 7c, and a coating amount converter 7d.

そして赤外発光ダイオード6bを出た赤外光はテープ保
持板9上に1般送された粘着透明テープ10に投射し、
その透過光が受光素子7aにて感知されて電気信号に変
換される。変換電気信号はバンドパスフィルター7bに
て発光ダイオード変調装置6Cの変SIM周波数を中心
とする一定の周波数帯域のみの成分が通過され、光透過
不測定器7Cにて光の透過率が測定されて、更に付、?
?量換算器7dにて後述する方法に基づき、光透過不測
定器7Cで測定された光透過率がパウダーイ」着量(脱
落量)に換算されるようになっている。
Then, the infrared light emitted from the infrared light emitting diode 6b is projected onto the adhesive transparent tape 10 that is generally fed on the tape holding plate 9.
The transmitted light is sensed by the light receiving element 7a and converted into an electrical signal. The converted electrical signal is passed through a bandpass filter 7b in which only components in a certain frequency band centered around the variable SIM frequency of the light emitting diode modulator 6C are passed, and the light transmittance is measured by a light transmission measurement device 7C. ,Additionally,?
? The amount converter 7d converts the light transmittance measured by the light transmittance measuring device 7C into the amount of powder deposited (falling off amount) based on a method described later.

次にパウダーの脱落量を測定する具体的手順について説
明する。まず粘着透明テープ10が粘着透明テープ巻戻
しリール1から粘着透明テープ巻取りリール2に搬送さ
れ、この搬送中途でテープ圧着ロール3の押圧力により
、成形加工された被検査材5が粘着透明テープ10に接
着し、被検査材5から脱落した粉末が粘着透明テープ1
0に付着する。
Next, a specific procedure for measuring the amount of powder falling off will be explained. First, the adhesive transparent tape 10 is conveyed from the adhesive transparent tape unwinding reel 1 to the adhesive transparent tape take-up reel 2, and during this conveyance, the molded inspected material 5 is transferred to the adhesive transparent tape by the pressing force of the tape pressure roll 3. The powder adhering to the adhesive transparent tape 10 and falling off from the inspected material 5 is
Attach to 0.

粘着透明テープlOは粉末が付着した部分がテープ保持
板9−ヒにイ1装置するまで搬送され、変調赤外光が、
粘着透明テープ10(粉末が付着している部分)に投射
される。そして、粘着透明テープlOを6過した光を光
電素子7aは感知し、光電変換(多バンドパスフィルタ
ー7bが変調周波数に対応した信号成分のみを透過させ
る。次にバンドパスフィルター7bの通過光量に基づき
、粉末が付着していないテープの通過光量を予め設定し
てある光透過不測定器7cは光透過率を下記(1)式に
て求める。
The adhesive transparent tape 10 is conveyed until the part to which the powder has adhered is placed on the tape holding plate 9-1, and the modulated infrared light is emitted.
It is projected onto the adhesive transparent tape 10 (the part to which the powder is attached). Then, the photoelectric element 7a senses the light that has passed through the adhesive transparent tape 1O, and performs photoelectric conversion (the multi-bandpass filter 7b transmits only the signal component corresponding to the modulation frequency.Then, the amount of light passing through the bandpass filter 7b is changed to Based on this, the light transmittance meter 7c, which has previously set the amount of light passing through the tape to which no powder is attached, calculates the light transmittance using the following equation (1).

X100     ・・・(+1 史に付着量(9算器7dは上記(1)式にて求めた光1
過率に基づき、以1ζに述べる方法にてパウダー脱落量
に換算す【)。
X100 ... (+1) Adhesion amount (9 calculator 7d is the light 1 calculated using the above formula (1)
Based on the pass rate, convert it into the amount of powder falling off using the method described in 1ζ below [).

第2図は鉄・亜鉛合金メッキにおける、バ・リダー付着
情着1明テープ尤1h渦率(横+11ド単位%)とパウ
ダー脱落量の平方根値(ti(軸:眼位y/ H(H/
 cm )との関係を示すグラフで、bす、同−l!を
頬の表面処理板については、予め第2図の如き樟?デー
タを付着量換算器7dに設定しておけば、該検量データ
に光透過率を照合することによりパウダー税落量に換算
できる。
Figure 2 shows the square root value of powder shedding amount (ti (axis: eye position y/H (H /
cm) is a graph showing the relationship between bs, same-l! For the surface treatment plate on the cheek, use a camphor tree like the one shown in Figure 2 in advance. If the data is set in the adhesion amount converter 7d, it can be converted to the amount of powder deposit by comparing the light transmittance with the calibration data.

次にバンドパスフィルター7hの作用について説明する
。、第3図は赤外光光源をパルス駆動し、適当な周波数
で変調した場合の信号周波数スペクトルを示すグラフで
あり、横軸が周波数、縦軸が出力(スペクトル量)を示
している。また図中+a+は赤外発光ダイオード6b、
(blは赤外光受光部7の受光素子7a、fclはバン
ドパスフィルター7b夫々におけるスペクトル周波数を
表している。本発明では赤外光を照射し、受光周波数帯
域が赤外域とする受光素子7aにて該赤外光を受光する
ので、赤外光以外の光の影響はない。また赤外発光ダイ
オード6bの変1!it周波数に対応した信号成分のみ
をバンドパスフィルター7bでフィルターリングするの
で、太陽光に由来する直流成分、蛍光灯の低周波ノイズ
成分〔第3図(ア)、(イ)、(つ)〕を除去できる。
Next, the action of the bandpass filter 7h will be explained. , FIG. 3 is a graph showing a signal frequency spectrum when an infrared light source is pulse-driven and modulated at an appropriate frequency, where the horizontal axis shows the frequency and the vertical axis shows the output (spectral amount). In addition, +a+ in the figure is an infrared light emitting diode 6b,
(bl represents the spectral frequency of the light receiving element 7a of the infrared light receiving section 7, and fcl represents the spectral frequency of the band pass filter 7b.In the present invention, the light receiving element 7a emits infrared light and has a light receiving frequency band in the infrared region. Since the infrared light is received by the infrared light, there is no influence of light other than infrared light.Furthermore, only the signal component corresponding to the variable 1!it frequency of the infrared light emitting diode 6b is filtered by the bandpass filter 7b. , direct current components originating from sunlight, and low-frequency noise components from fluorescent lamps [Figure 3 (A), (B), and (T)] can be removed.

よって環境光の妨害を受けずに、パウダーが付着した粘
着透明テープ10の光透過率を正確に検出できる。従っ
て本発明ではバンドパスフィルター7bにて透過光をフ
ィルターリングすることにより、種々の環境光下におい
ても特別の遮光材を設けることなく正確な光透過率の測
定が可能である。
Therefore, the light transmittance of the adhesive transparent tape 10 to which the powder is attached can be accurately detected without being interfered with by environmental light. Therefore, in the present invention, by filtering the transmitted light with the bandpass filter 7b, it is possible to accurately measure the light transmittance even under various environmental lights without providing a special light shielding material.

次に粘着透明テープ10に照射する赤外光の波長につい
て説明する。第4図は光透過率の波長依存性を示すグラ
フであり、横軸が透過光波長(+@位nm) 、縦軸が
光透過率(単位%)を示している。
Next, the wavelength of the infrared light irradiated onto the adhesive transparent tape 10 will be explained. FIG. 4 is a graph showing the wavelength dependence of light transmittance, where the horizontal axis shows the transmitted light wavelength (+@ nm) and the vertical axis shows the light transmittance (unit: %).

また図中グラフ(alは空気に対する未使用透明テープ
の光透過率、fblは空気に対するパウダー付着テープ
の光透過率、(e)は未使用透明テープに対するパウダ
ー付着テープの光透過率を夫々表している。
In addition, the graph in the figure (al represents the light transmittance of the unused transparent tape to the air, fbl represents the light transmittance of the powder-adhesive tape to the air, and (e) represents the light transmittance of the powder-adhesive tape to the unused transparent tape, respectively. There is.

第4図から理解される如く、波長が700nm以上の赤
外域、 700nm以下の可視域に拘わらず、グラフF
C+の光透過率は略一定であるので赤外光を投光用光線
として使用しても、可視光と同様に光透過率の測定は可
能である。
As can be understood from Figure 4, graph F
Since the light transmittance of C+ is approximately constant, even if infrared light is used as a light beam for projection, the light transmittance can be measured in the same way as visible light.

第5図は太陽直射光の分光スペクトルの波長(横軸二単
位nm)と強度(縦軸:単位p w/c++t−nm)
との関係を表すグラフであり、第5図から理解される如
く、分光スペクトルは500nm付近に極大を持も、波
長が長くなるに従って強度が減少する。
Figure 5 shows the wavelength (horizontal axis: unit: nm) and intensity (vertical axis: unit: p w/c++t-nm) of the spectrum of direct sunlight.
As understood from FIG. 5, the spectrum has a maximum near 500 nm, but the intensity decreases as the wavelength becomes longer.

ここで測定の際の妨害光として大陽光を考えた場合、そ
の強度が大きいことは誤差要因になる可能性があるので
、波長400〜700nmの可視光域の光は用いない方
がよい。
If sunlight is considered as interference light during measurement, its high intensity may cause an error, so it is better not to use light in the visible light range with a wavelength of 400 to 700 nm.

一方、逆に波長が長くなると(2500r+m以上)太
陽光の強度が減少するが、粘着透明テープ自体が光の大
部分を吸収する現象が起こり、正確な測定が行なえない
。従って照射する赤外光の波長は700〜2500nm
にする。以上、上述したことが赤外光波長の数値限定の
理由である。
On the other hand, as the wavelength becomes longer (2500 r+m or more), the intensity of sunlight decreases, but a phenomenon occurs in which the adhesive transparent tape itself absorbs most of the light, making accurate measurement impossible. Therefore, the wavelength of the infrared light to be irradiated is 700 to 2500 nm.
Make it. The above-mentioned reasons are the reasons for limiting the numerical value of the infrared light wavelength.

〔効果〕〔effect〕

3種の環境光(太陽光、蛍光灯、白熱灯)下において、
従来の分光光度計及び本発明装置夫々を用いた場合の光
透過率(夫々20回測定)の平均値と標準偏差とを下記
表1に示す。ただし従来の分光光度針では、遮光材を用
いた場合、用いない場合夫々について測定結果を示す。
Under three types of environmental light (sunlight, fluorescent light, incandescent light),
The average value and standard deviation of the light transmittance (measured 20 times each) when using the conventional spectrophotometer and the device of the present invention are shown in Table 1 below. However, with conventional spectrophotometric needles, measurement results are shown for cases in which a light shielding material is used and cases in which a light shielding material is not used.

表   1 本発明装置ではどの環境光下においても、遮光材を用い
た分光光度計の場合と略同等の光透過率の平均値が得ら
れる。つまり本発明装置では環境光の影響を受けずに正
確な光透過率を測定できる。
Table 1 The device of the present invention can obtain an average value of light transmittance that is approximately the same as that of a spectrophotometer using a light shielding material under any environmental light. In other words, the device of the present invention can accurately measure light transmittance without being affected by environmental light.

また測定精度の基準となる標準偏差は実用的に十分使用
可能な2%以内である。
Further, the standard deviation serving as a reference for measurement accuracy is within 2%, which is sufficient for practical use.

次に本発明装置を用いて被検査試料1(]Mあたりに要
する測定時間を、従来の手作業時間に比較して下記表2
に示す。
Next, using the device of the present invention, the measurement time required per 1 (M) sample to be inspected is compared with the conventional manual labor time as shown in Table 2 below.
Shown below.

(以下余白) 表   2 上記表2から理解される如く、本発明装置を用いると従
来の手作業の176の時間で測定が可能であり、また複
数回かける場合(5rZiJがけでは]/9以下に時間
短縮可能)はどそのリノXJLが著しい。
(Leaving space below) Table 2 As can be seen from Table 2 above, when using the device of the present invention, it is possible to perform measurements in 176 hours compared to conventional manual work, and when the measurement is performed multiple times (with 5rZiJ), the measurement time is less than /9. Reno XJL is remarkable.

また試作された本発明装置の全質量は4.0 kgであ
り、持ち運び可能である。
The total mass of the prototype device of the present invention is 4.0 kg, making it portable.

以上詳述した如く本発明により装置が小型であって、種
々の環境光下においても遮光材なしで試料テープの測定
部位を確認しながら自動的に測定でき、その測定値に基
づき表面処理板のパウダリング程度を生産現場で従来よ
りも容易に評価することが可能である。
As described in detail above, the device according to the present invention is compact, and can automatically measure while confirming the measurement area of the sample tape without using a light shielding material even under various environmental light conditions. It is possible to evaluate the degree of powdering at the production site more easily than before.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る評価装置の模式図、第2図は光透
過率とパウダー脱落量との関係を示すグラフ、第3図は
他号周波数スペクトルを示すグラフ、第4図は波長と光
透過率との関係を示すグラフ、第5図は太陽直射光の分
光スペクトルの波長と強度との関係を示すグラフ、第6
図は従来の評価装置の模式図である。 l・・・粘着透明テープ巻戻しリール 2・・・粘着透明テープ巻取りリール 3・・・テープ圧着ロール 5・・・被検査材6・・・
赤外光投光部 6a・・・レンズ 6h・・・赤外発光
ダイオード 7・・・赤外光受光部 7a・・・受光素
子9・・・テープ保持板 1o・・・粘着透明テープ特
 許 出願人  住友金属工業株式会社代理人 弁哩士
  河  野  登  夫光透過早(Z) 算 211m 26リブヒー攻1 算 3 区 茸4図       羞52 葺 6 図
Fig. 1 is a schematic diagram of the evaluation device according to the present invention, Fig. 2 is a graph showing the relationship between light transmittance and amount of powder falling off, Fig. 3 is a graph showing the frequency spectrum of another patent, and Fig. 4 is a graph showing the relationship between the wavelength and the amount of powder falling off. A graph showing the relationship between light transmittance and Figure 5 is a graph showing the relationship between the wavelength and intensity of the spectrum of direct sunlight.
The figure is a schematic diagram of a conventional evaluation device. l... Adhesive transparent tape unwinding reel 2... Adhesive transparent tape take-up reel 3... Tape pressure bonding roll 5... Material to be inspected 6...
Infrared light emitter 6a... Lens 6h... Infrared light emitting diode 7... Infrared light receiver 7a... Light receiving element 9... Tape holding plate 1o... Adhesive transparent tape patent Applicant Sumitomo Metal Industries Co., Ltd. Agent Noboru Kono Light transmission speed (Z) Calculation 211m 26 Ribhi attack 1 Calculation 3 Kutake mushroom 4 diagram Photo 52 Fuki 6 diagram

Claims (1)

【特許請求の範囲】 1、成形加工を施した表面処理板に粘着力を有する透明
テープを接着押圧後、該透明テープをはがし、表明被膜
粉が付着した該透明テープに光を透過させ、その光透過
率を測定することにより、表面処理板の成形加工の際の
表面被膜粉状脱落の状態を評価する方法において、発光
強度を一定周期にて変じる変調を施した赤外光を透過し
て、該赤外光透過率を測定することを特徴とする表面処
理板の評価方法。 2、前記赤外光の波長が700〜2500nmである特
許請求の範囲第1項記載の表面処理板の評価方法。 3、表面処理板の成形加工の際の表面被膜粉状脱落の状
態を評価する装置において、粘着力を有する透明テープ
を供給するリールと、前記透明テープを巻取るリールと
、前記リール間において成形加工してある試験材料に前
記透明テープを押圧して接着する押圧機と、発光強度を
一定周期にて変じる変調を施した赤外光を前記透明テー
プに前記押圧機下流側で照射する投光部と、前記赤外光
の前記透明テープに対する透過率を測定する測定器と、
該測定器の測定値に基づき粉状脱落状態を評価する評価
装置とを具備することを特徴とする表面処理板の評価装
置。 4、前記赤外光の波長が700〜2500nmである特
許請求の範囲第3項記載の表面処理板の評価装置。
[Claims] 1. After adhesively pressing a transparent tape with adhesive force onto a surface-treated plate that has been subjected to a molding process, the transparent tape is peeled off, and light is transmitted through the transparent tape to which the surface coating powder has adhered. In the method of evaluating the state of surface coating powder flakes during the molding process of surface-treated plates by measuring light transmittance, infrared light whose emission intensity is modulated at a constant period is transmitted. and measuring the infrared light transmittance. 2. The method for evaluating a surface treated plate according to claim 1, wherein the wavelength of the infrared light is 700 to 2500 nm. 3. In an apparatus for evaluating the state of surface coating powder falling off during molding of a surface-treated board, a reel supplies a transparent tape with adhesive strength, a reel winds up the transparent tape, and a molding process is performed between the reels. A press machine that presses and adheres the transparent tape to the processed test material, and a projection that irradiates the transparent tape with infrared light whose emission intensity is modulated at a constant cycle on the downstream side of the press machine. a light section; a measuring device that measures the transmittance of the infrared light to the transparent tape;
1. An evaluation device for a surface-treated board, comprising: an evaluation device for evaluating the state of powder falling off based on the measured value of the measuring device. 4. The evaluation device for a surface treated plate according to claim 3, wherein the wavelength of the infrared light is 700 to 2500 nm.
JP60240318A 1985-10-25 1985-10-25 Method and apparatus for evaluating surface-treated plate Pending JPS62100646A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60240318A JPS62100646A (en) 1985-10-25 1985-10-25 Method and apparatus for evaluating surface-treated plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60240318A JPS62100646A (en) 1985-10-25 1985-10-25 Method and apparatus for evaluating surface-treated plate

Publications (1)

Publication Number Publication Date
JPS62100646A true JPS62100646A (en) 1987-05-11

Family

ID=17057681

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60240318A Pending JPS62100646A (en) 1985-10-25 1985-10-25 Method and apparatus for evaluating surface-treated plate

Country Status (1)

Country Link
JP (1) JPS62100646A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016532076A (en) * 2013-09-18 2016-10-13 ティッセンクルップ スチール ヨーロッパ アクチェンゲゼルシャフトThyssenKrupp Steel Europe AG Method and apparatus for determining the wear characteristics of a coated flat product
JP2017501412A (en) * 2013-12-20 2017-01-12 ティッセンクルップ スチール ヨーロッパ アクチェンゲゼルシャフトThyssenKrupp Steel Europe AG Method and apparatus for determining the wearability of a coated flat product by bending it

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016532076A (en) * 2013-09-18 2016-10-13 ティッセンクルップ スチール ヨーロッパ アクチェンゲゼルシャフトThyssenKrupp Steel Europe AG Method and apparatus for determining the wear characteristics of a coated flat product
US10024775B2 (en) 2013-09-18 2018-07-17 Thyssenkrupp Steel Europe Ag Method and device for determining the abrasion properties of a coated flat product
JP2017501412A (en) * 2013-12-20 2017-01-12 ティッセンクルップ スチール ヨーロッパ アクチェンゲゼルシャフトThyssenKrupp Steel Europe AG Method and apparatus for determining the wearability of a coated flat product by bending it
US10458890B2 (en) 2013-12-20 2019-10-29 Thyssenkrupp Steel Europe Ag Method and device for determining the wear properties of coated flat products by means of bending

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