JPS6199045U - - Google Patents
Info
- Publication number
- JPS6199045U JPS6199045U JP18456284U JP18456284U JPS6199045U JP S6199045 U JPS6199045 U JP S6199045U JP 18456284 U JP18456284 U JP 18456284U JP 18456284 U JP18456284 U JP 18456284U JP S6199045 U JPS6199045 U JP S6199045U
- Authority
- JP
- Japan
- Prior art keywords
- base member
- sample
- fixed
- support member
- sample support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000012777 electrically insulating material Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Description
図は本考案の一実施例を示す断面図である。
２……基体部材、６……ゴニオメータ・ヘツド
、１０，１２……試料固定用チヤツク、１４……
試料、２０，２２……電極、２４，２６……内部
リード、２８，３０……外部リード。
The figure is a sectional view showing an embodiment of the present invention. 2... Base member, 6... Goniometer head, 10, 12... Sample fixing chuck, 14...
Sample, 20, 22... Electrode, 24, 26... Internal lead, 28, 30... External lead.
Claims (1)
気的絶縁材料にてなる基体部材と、この基体部材
に固定され試料を所定位置に支持する試料支持部
材と、この試料支持部材に固定された試料に接触
させることができ、前記基体部材に支持された一
対の電極端子とを備えた回折測定用荷電試料台。 A base member made of an electrically insulating material that can be fixed to the goniometer head for diffraction measurement, a sample support member fixed to this base member and supporting the sample in a predetermined position, and a sample fixed to this sample support member brought into contact with the base member. and a pair of electrode terminals supported by the base member.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984184562U JPH0637315Y2 (en) | 1984-12-04 | 1984-12-04 | Charged sample table for diffraction measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984184562U JPH0637315Y2 (en) | 1984-12-04 | 1984-12-04 | Charged sample table for diffraction measurement |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6199045U true JPS6199045U (en) | 1986-06-25 |
| JPH0637315Y2 JPH0637315Y2 (en) | 1994-09-28 |
Family
ID=30742048
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1984184562U Expired - Lifetime JPH0637315Y2 (en) | 1984-12-04 | 1984-12-04 | Charged sample table for diffraction measurement |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0637315Y2 (en) |
-
1984
- 1984-12-04 JP JP1984184562U patent/JPH0637315Y2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0637315Y2 (en) | 1994-09-28 |