JPS6196380U - - Google Patents

Info

Publication number
JPS6196380U
JPS6196380U JP18170184U JP18170184U JPS6196380U JP S6196380 U JPS6196380 U JP S6196380U JP 18170184 U JP18170184 U JP 18170184U JP 18170184 U JP18170184 U JP 18170184U JP S6196380 U JPS6196380 U JP S6196380U
Authority
JP
Japan
Prior art keywords
semiconductor device
test station
contact section
handler
transferred
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18170184U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18170184U priority Critical patent/JPS6196380U/ja
Publication of JPS6196380U publication Critical patent/JPS6196380U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例を示す構成図である
。 1〜4はコンタクト部、5及び6はリレー、7
及び8はテストステーシヨン、9はテストシステ
ムの制御部、10,11はデバイス送り機構であ
る。
FIG. 1 is a block diagram showing an embodiment of the present invention. 1 to 4 are contact parts, 5 and 6 are relays, 7
and 8 is a test station, 9 is a control unit of the test system, and 10 and 11 are device feeding mechanisms.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体デバイスと該デバイスの特性を測定する
テストステーシヨンとを電気的に接続するコンタ
クト部を備えたデバイス送り機構を2系統以上並
列に設置し、かつ各系統のコンタクト部を選択し
てこれをテストステーシヨンに切替接続する切替
機構を設けたことを特徴とする半導体素子用ハン
ドラー。
Two or more systems of device feeding mechanisms each having a contact section that electrically connects a semiconductor device and a test station for measuring the characteristics of the device are installed in parallel, and the contact section of each system is selected and transferred to the test station. A handler for a semiconductor device, characterized in that it is provided with a switching mechanism for switching connection to the semiconductor device.
JP18170184U 1984-11-30 1984-11-30 Pending JPS6196380U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18170184U JPS6196380U (en) 1984-11-30 1984-11-30

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18170184U JPS6196380U (en) 1984-11-30 1984-11-30

Publications (1)

Publication Number Publication Date
JPS6196380U true JPS6196380U (en) 1986-06-20

Family

ID=30739242

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18170184U Pending JPS6196380U (en) 1984-11-30 1984-11-30

Country Status (1)

Country Link
JP (1) JPS6196380U (en)

Similar Documents

Publication Publication Date Title
JPS6196380U (en)
JPS586279U (en) Switch inspection device
JPH01113445U (en)
JPS5866481U (en) Onboard fire alarm system
JPS62100732U (en)
JPS6161474U (en)
JPS62104390U (en)
JPS59189169U (en) circuit test equipment test plug
JPS6437673U (en)
JPS59188400U (en) Inert gas supply control device
JPS60192572U (en) In-vehicle video receiving device
JPS63160015U (en)
JPS6072739U (en) power seat device
JPH033859U (en)
JPS61128739U (en)
JPH0344737U (en)
JPS61112281U (en)
JPS5887427U (en) Uninterruptible power system
JPS62196438U (en)
JPS61130562U (en)
JPS6223369U (en)
JPS62105631U (en)
JPS61189236U (en)
JPH02126144U (en)
JPS63122272U (en)