JPS6191969A - Non linear element - Google Patents

Non linear element

Info

Publication number
JPS6191969A
JPS6191969A JP21387984A JP21387984A JPS6191969A JP S6191969 A JPS6191969 A JP S6191969A JP 21387984 A JP21387984 A JP 21387984A JP 21387984 A JP21387984 A JP 21387984A JP S6191969 A JPS6191969 A JP S6191969A
Authority
JP
Japan
Prior art keywords
type
amorphous silicon
films
pin
nip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21387984A
Other languages
Japanese (ja)
Inventor
Takeshi Saito
毅 斉藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP21387984A priority Critical patent/JPS6191969A/en
Publication of JPS6191969A publication Critical patent/JPS6191969A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/861Diodes
    • H01L29/868PIN diodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Liquid Crystal Display Device Control (AREA)

Abstract

PURPOSE:To increase the threshold value by improving the normal and reverse symmetricalness of voltage-current characteristics by a method wherein two diodes made of pin or nip laminated film of the same amorphous silicon formed into the same type by patterning process are connected in series in the reverse direction. CONSTITUTION:P type (or N type) amorphous silicon films 23, i-type amorphous silicon films 24 and N type (or P type) amorphous silicon films 15 are successive ly laminated on two lower electrodes 21, 22 formed at adjoining position on a glass substrate 20. Next this three layer structure amorphous silicon films are formed into island type parts by etching process to be left only on the lower electrodes 21, 22. Besides, silicon nitride or silicon dioxide insulating films are formed into passivation films 26 and then a contact hole for leaving out electrodes is opened. Finally two pin (or nip) diodes may be connected with each other by upper electrodes 27 through the intermediary of the connecting hole.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は非晶質シリコンのpin又はnipミルダイオ
ードいた非線形素子に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a nonlinear element including an amorphous silicon pin or nip mill diode.

〔従来技術とその問題点〕[Prior art and its problems]

半導体バリスタのように電圧−電流特性が非直線的な変
化を示す非線形素子は、従来から過電圧抑制や雑音吸収
回路などに使われてきたが、最近になって大表示容量の
液晶ディスプレイを実現するtめの素子としても注目さ
れるようになってきた。このための非線形素子としては
数多くの素子が大面積にわたシ均一に形成できることが
必要で、種々の材料および素子構造のものが提案されて
いる。
Nonlinear elements such as semiconductor varistors, whose voltage-current characteristics change nonlinearly, have traditionally been used in overvoltage suppression and noise absorption circuits, but recently they have been used to realize large-capacity liquid crystal displays. It has also started to attract attention as a t-th element. As a nonlinear element for this purpose, it is necessary that a large number of elements can be formed uniformly over a large area, and various materials and element structures have been proposed.

さて非線形素子は例えば第3図に示すような正逆対称的
な電圧−電流特性を示す。このような非線形素子を液晶
ディスプレイに適合した場合、非線形素子は第4図の等
何回路に示すよう罠、信号線41、データ線42を介し
て液晶セル43と直列につながれる。この非線形素子4
4の閾値電圧Vthよシ大きな電圧■。nを信号線・デ
ータ線間に加えると、液晶セル43にはほぼ■。。−V
thの電圧がかかり、液晶がオンする。又、閾値電圧V
thよシ小さな電圧Voffを加えると、Voffは全
て非線形素子Kかかシ、液晶セル43に電圧はかがらず
液晶はオンしない。このよう罠外部から加える電圧の比
Von i Vo f fに対し、液晶セル43に実効
的にかかる電圧の比ははるかに大きくなシオンオフ比が
大きく改善される。この結果従来液晶ディスプレイのマ
ルチプレ、クス駆動においては、信号線数60本程度が
限界であったが、非線形素子を用いることで信号線数が
数百本程度まで可能となり大表示容量の液晶ディスプレ
イが実現できる。
Now, the nonlinear element exhibits symmetrical voltage-current characteristics as shown in FIG. 3, for example. When such a nonlinear element is applied to a liquid crystal display, the nonlinear element is connected in series with a liquid crystal cell 43 via a trap, a signal line 41, and a data line 42, as shown in the circuit shown in FIG. This nonlinear element 4
A voltage ■ larger than the threshold voltage Vth of 4. When n is added between the signal line and the data line, the liquid crystal cell 43 has approximately ■. . -V
A voltage of th is applied and the liquid crystal turns on. Also, the threshold voltage V
When a voltage Voff smaller than th is applied, all of Voff is applied to the nonlinear element K, so no voltage is applied to the liquid crystal cell 43 and the liquid crystal does not turn on. In this manner, the ratio of the voltage effectively applied to the liquid crystal cell 43 is much larger than the ratio of the voltage applied from outside the trap Von i Vo f f, and the on-off ratio is greatly improved. As a result, in the conventional multiplayer and box drive of liquid crystal displays, the number of signal lines was limited to about 60, but by using nonlinear elements, the number of signal lines can be increased to several hundred, making it possible to use liquid crystal displays with large display capacity. realizable.

このような非線形素子として、非晶質シリコンを用いた
n1pin又はpinip 5層積層型のバックツウパ
、り(back to back)ダイオードが既に提
案されている(特開昭57−130081)。それぞれ
の等何回路を第5図[a) 、 1b)VC示す。非晶
質シリコンを形成する際に1不純物ドーピングのガスを
切りかえるだけで第5図の点線で囲まれたバ。
As such a nonlinear element, an n1 pin or pinip five-layer stacked back-to-back diode using amorphous silicon has already been proposed (Japanese Patent Application Laid-Open No. 130081/1981). The respective equivalent circuits are shown in FIG. 5 [a), 1b) VC. When forming amorphous silicon, the area surrounded by the dotted line in Figure 5 can be obtained by simply changing the doping gas for one impurity.

クララバックダイオード51又は52が一度に形成でき
る。しかし、この素子は第3図とほぼ同様な非線形特性
を示すが、正逆特性の対称性が悪いという欠点がある。
Clara back diode 51 or 52 can be formed at one time. However, although this element exhibits nonlinear characteristics almost similar to those shown in FIG. 3, it has the disadvantage that the symmetry of the forward and reverse characteristics is poor.

その理由はi層への不純物の混入によ多素子構造の対称
性が失なわれているためである。非線形素子特性の対称
性が悪いと、液晶セルに加わる電圧は非対称とな〕、液
晶にかかる電圧には直流分が残る。このような条件下で
は、液晶の寿命は短く、実用にはならない。
The reason for this is that the symmetry of the multi-element structure is lost due to the incorporation of impurities into the i-layer. If the nonlinear element characteristics are poorly symmetrical, the voltage applied to the liquid crystal cell will be asymmetrical], and a DC component will remain in the voltage applied to the liquid crystal. Under such conditions, the lifespan of the liquid crystal is short and it is not of practical use.

電圧−電流特性の対称性を向上させた非線形素子として
、同じく非晶質シリコンを用いたpin又はnip 3
層積層型の2個のダイオードを並列に互いに逆方向に接
続した構成のものが提案されている(特開昭59−57
273)。この素子の等何回路隣接した位置にパターニ
ング形成されており、このためダイオード特性は全く同
一であり、非線形特性の対称性は著しく向上する。しか
しこの非線形素子はダイオードの層方向特性を利用して
いるため、非線形素子としての閾値電圧Vthが0.7
v程度と小さいという欠点がおる。閾値電圧Vthが小
さいと、液晶セルに印加される電圧のオンオフ比は、外
部から印加される電圧のオンオフ比とそれほど変わらな
くなシ、液晶ディスプレイの信号線数を大幅に増やすこ
とはできない。
As a nonlinear element with improved symmetry of voltage-current characteristics, PIN or NIP 3 also uses amorphous silicon.
A configuration in which two stacked diodes are connected in parallel in opposite directions has been proposed (Japanese Patent Laid-Open No. 59-57
273). An equal number of circuits of this element are patterned at adjacent positions, so that the diode characteristics are exactly the same, and the symmetry of the nonlinear characteristics is significantly improved. However, since this nonlinear element utilizes the layer direction characteristics of the diode, the threshold voltage Vth as a nonlinear element is 0.7.
It has the disadvantage of being small, about v. If the threshold voltage Vth is small, the on/off ratio of the voltage applied to the liquid crystal cell is not much different from the on/off ratio of the voltage applied from the outside, and the number of signal lines of the liquid crystal display cannot be significantly increased.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、以上のような欠点を有する従来の非晶
質シリコンからなる非線形素子の特性を改善し、竜王−
電流特性における正逆の対称性が良くかつ比較的大きな
閾値電圧を有する非晶質シリコンからなる非線形素子を
提供することにある。
The purpose of the present invention is to improve the characteristics of conventional nonlinear elements made of amorphous silicon, which have the above-mentioned drawbacks, and to
The object of the present invention is to provide a nonlinear element made of amorphous silicon that has good forward and reverse symmetry in current characteristics and a relatively large threshold voltage.

〔発明の構成〕[Structure of the invention]

本発明の非線形素子は、絶縁体基板上の隣接した位置に
同一の非晶質シ・リコンのpin積層膜又はnip積層
膜からなり同一形状にパターニング形成された2個のp
inダイオード又はnipミルダイオード列に互い罠逆
方向に接続したことから構成される。       ゛ 〔作用〕 第2図(al 、 (blは本発明罠よる非線形素子の
構成を示す等価回路図である。
The nonlinear element of the present invention consists of two pin laminated films or nip laminated films of the same amorphous silicon and patterned in the same shape at adjacent positions on an insulating substrate.
It consists of in diodes or nip mill diodes connected in opposite directions to each other. [Operation] FIG. 2 (al and bl are equivalent circuit diagrams showing the configuration of a nonlinear element according to the present invention.

本発明では上記構成で示したように、非線形素子として
、非晶質シリコンを用いたpin又はnlpa層積層型
の2個のダイオードを直列に互いに逆方向に接続した構
成のものを用いる。同図における2個の点線で囲まれた
pinダイオード11又はnipミルダイオード12#
i−のpin積層膜又はnip積層膜の隣接した位置に
同一形状でパターニング形成されており、非線形特性の
対称性は著しく向上する。しかもこれらの非線形素子は
ダイオードの逆方向特性を利用しているため、非線形素
子としての閾値電圧Vthを比較的大き−な値とするこ
とができ、要求される非線形素子特性の仕様に応じて閾
値電圧Vth * i v・程度”から10数V程度ま
で制御することが可能である。
In the present invention, as shown in the above structure, a structure in which two diodes of the PIN or NLPA layer stacked type using amorphous silicon are connected in series in opposite directions is used as the nonlinear element. PIN diode 11 or nip mill diode 12# surrounded by two dotted lines in the same figure
The same shape is patterned at adjacent positions of the i- pin laminated film or nip laminated film, and the symmetry of the nonlinear characteristics is significantly improved. Moreover, since these nonlinear elements utilize the reverse characteristics of diodes, the threshold voltage Vth as a nonlinear element can be set to a relatively large value, and the threshold value can be adjusted according to the specifications of the required nonlinear element characteristics. It is possible to control the voltage from about "Vth*iv." to about 10-odd volts.

〔実施例〕〔Example〕

以下、本発明の実施例について図面を参照して説明する
Embodiments of the present invention will be described below with reference to the drawings.

第1図は本発明の一実施例の構造を示す断面図である。FIG. 1 is a sectional view showing the structure of an embodiment of the present invention.

ガラス基板20の上の隣接する位置に形成された二つの
下部電極21および22の上に、プラズマ’CVD法に
よシ、p型(又はn型)非晶質シリコン膜23、i型非
晶質シリコン膜24、n型(又はp型)非晶質シリコン
膜25を順次積層する。つぎにこの3層構造の非晶質シ
リコン膜を下部電極21および22の上部にのみ残るよ
うに島状にエツチング形成する。プラズマCVD法によ
シ窒化シリコン又は二酸化シリコンからなる絶縁膜ヲハ
、シペーシ百ン膜26として形成したのち、電極取出し
用のコンタクトホールを開ける。最後にこのコンタクト
ホールを介して二つのpin (又はnip )ダイオ
ードを上部電極27により接続して本実施例が完成する
A p-type (or n-type) amorphous silicon film 23 and an i-type amorphous silicon film 23 are deposited on two lower electrodes 21 and 22 formed at adjacent positions on a glass substrate 20 by plasma CVD. A crystalline silicon film 24 and an n-type (or p-type) amorphous silicon film 25 are sequentially laminated. Next, this three-layered amorphous silicon film is etched to form an island shape so that it remains only above the lower electrodes 21 and 22. After forming an insulating film 26 made of silicon nitride or silicon dioxide by the plasma CVD method, a contact hole for taking out the electrode is made. Finally, the two pin (or nip) diodes are connected by the upper electrode 27 through this contact hole to complete this embodiment.

このようにして得られた本実施例の非線形特性は、第3
図に示すように、閾値tEVthが比較的大きく、また
正逆特性の対称性が非常に良い。閾値電圧Vthはi型
非晶質シリコン膜24の厚さを変えることで1v程度か
ら20数V程度まで変えることができる。例えばi型層
の厚さが10001OとtkVthti8V、zooo
Xoとa 20V となった。p型(又はn型)および
n型(又はp型)非晶質シリコン膜23.25はそれぞ
れ下部および上部電極21,22.27とのオーミ、り
接触をとるためのもので厚さは300Xはどあれば充分
である。
The nonlinear characteristics of this example obtained in this way are based on the third
As shown in the figure, the threshold value tEVth is relatively large, and the symmetry of the forward and reverse characteristics is very good. The threshold voltage Vth can be varied from about 1 V to about 20-odd V by changing the thickness of the i-type amorphous silicon film 24. For example, if the thickness of the i-type layer is 10001O and tkVthti8V, zoooo
Xo and a became 20V. The p-type (or n-type) and n-type (or p-type) amorphous silicon films 23.25 are for making ohmic contact with the lower and upper electrodes 21 and 22.27, respectively, and have a thickness of 300X. It is enough.

又、正逆特性の対称性は2個のダイオードの面積のパタ
ーニング精度に依存するが、例えば、接合面積が10μ
mXIQμmの上記非線形素子を形成したところ、正方
向Vthが8.OIVで逆方向Vthが同じ<8.OI
Vと良好な対称性を得ることができた。
Also, the symmetry of the forward and reverse characteristics depends on the patterning accuracy of the area of the two diodes, but for example, if the junction area is 10μ
When the above nonlinear element of mXIQμm was formed, the positive direction Vth was 8. OIV and reverse direction Vth are the same <8. OI
Good symmetry with V could be obtained.

液晶ディスプレイに組込む場合には、本実施例の非線形
素子44の下部11℃極21又は22のいずれか一方を
信号線41又はデータ線42に接続し、他の一方を液晶
セル43に接続する。この液晶ディスプレイで信号線数
500本のマルチプレックス駆動ができ、クロストーク
のない良好な画像が得られた。
When incorporated into a liquid crystal display, one of the lower 11° C. poles 21 and 22 of the nonlinear element 44 of this embodiment is connected to the signal line 41 or the data line 42, and the other one is connected to the liquid crystal cell 43. This liquid crystal display was capable of multiplex drive with 500 signal lines, and good images without crosstalk were obtained.

〔発明の効果〕〔Effect of the invention〕

以上、詳細説明したように、本発明によれば、非晶質シ
リコン膜を用いたpin又はnip3層俵層型のダイオ
ードを直列に互いに逆方向に接続した構成のものを用い
ることで【正逆の対称性のよい電圧−電流特性と、比較
的大きな閾値tFEとを有する非線形素子を得ることが
できる。
As described in detail above, according to the present invention, by using a structure in which pin or nip three-layer diodes using an amorphous silicon film are connected in series in opposite directions, It is possible to obtain a nonlinear element having voltage-current characteristics with good symmetry and a relatively large threshold value tFE.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例の構造を示す断明図、第2図
(al 、 (blは本発明による非線形素子の構成を
示す等価回路図、第3図は一実施例の電圧−電流特性図
、第4図は一実施例を用いた液晶ディスプレイの等価回
路図、第5図(al 、 (blおよび第6図は従来の
非線形素子の構成を示す等価回路図である。 11・・・・・・pinダイオード、12・・・・・・
nipミルダイオード0・・・・・・ガラス基板、21
,22・・・・・・下部電極、23・・・・・・p型(
又はn型)非晶質シリコン膜、24・・・・・・i型非
晶質シリコン膜、25・・・・・・n型(又は)p型非
晶質シリコン膜、26・・・・・・パッシベーション膜
、27・・・・・・上部電極、41・・・・・・信号線
、42・・・・・・データ線、43・・・・・・液晶セ
ル、44・・・・・・非線形素子、51・・・・・・p
inipダイオード、52・・・・・・n1pinダイ
オード、61・・・・・・pin又はnipミルダイオ
ー ド、′   、 代理人 弁理士  内 原   晋(1尊 2 閏 事 /l!T 半 31!T $4 図 ド→−区一 (&) 一+腎−−呻−−−−−J 察5 菌 序6 回
FIG. 1 is a schematic diagram showing the structure of an embodiment of the present invention, FIG. 2 is an equivalent circuit diagram showing the structure of a nonlinear element according to the present invention, and FIG. A current characteristic diagram, FIG. 4 is an equivalent circuit diagram of a liquid crystal display using one embodiment, FIG. 5 (al, (bl), and FIG. 6 are equivalent circuit diagrams showing the configuration of a conventional nonlinear element. 11. ...pin diode, 12...
nip mill diode 0...Glass substrate, 21
, 22...lower electrode, 23...p type (
or n-type) amorphous silicon film, 24... i-type amorphous silicon film, 25... n-type (or) p-type amorphous silicon film, 26... ... Passivation film, 27 ... Upper electrode, 41 ... Signal line, 42 ... Data line, 43 ... Liquid crystal cell, 44 ... ...Nonlinear element, 51...p
inip diode, 52...N1 pin diode, 61...pin or nip mill diode,', Agent Patent attorney Susumu Uchihara (1 son 2 Leap /l!T half 31!T $ 4 Diagram de→-ku 1 (&) 1+kidney--groan---J Sensei 5 Mycology 6 times

Claims (1)

【特許請求の範囲】[Claims]  絶縁体基板上の隣接した位置に同一の非晶質シリコン
のpin積層膜又はnip積層膜からなり同一形状にパ
ターニング形成された2個のpinダイオード又はni
pダイオードを直列に互いに逆方向に接続したことを特
徴とする非線形素子。
Two PIN diodes or NI made of the same amorphous silicon PIN laminated film or NIP laminated film and patterned in the same shape at adjacent positions on an insulating substrate
A nonlinear element characterized by p-diodes connected in series in opposite directions.
JP21387984A 1984-10-12 1984-10-12 Non linear element Pending JPS6191969A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21387984A JPS6191969A (en) 1984-10-12 1984-10-12 Non linear element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21387984A JPS6191969A (en) 1984-10-12 1984-10-12 Non linear element

Publications (1)

Publication Number Publication Date
JPS6191969A true JPS6191969A (en) 1986-05-10

Family

ID=16646522

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21387984A Pending JPS6191969A (en) 1984-10-12 1984-10-12 Non linear element

Country Status (1)

Country Link
JP (1) JPS6191969A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2023500610A (en) * 2019-10-24 2023-01-10 華為技術有限公司 Semiconductor switch device, manufacturing method thereof, and solid state phase shifter

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2023500610A (en) * 2019-10-24 2023-01-10 華為技術有限公司 Semiconductor switch device, manufacturing method thereof, and solid state phase shifter

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