JPS6191174U - - Google Patents

Info

Publication number
JPS6191174U
JPS6191174U JP17510984U JP17510984U JPS6191174U JP S6191174 U JPS6191174 U JP S6191174U JP 17510984 U JP17510984 U JP 17510984U JP 17510984 U JP17510984 U JP 17510984U JP S6191174 U JPS6191174 U JP S6191174U
Authority
JP
Japan
Prior art keywords
contact
probe
contacts
blade
rotation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17510984U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP17510984U priority Critical patent/JPS6191174U/ja
Publication of JPS6191174U publication Critical patent/JPS6191174U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP17510984U 1984-11-20 1984-11-20 Pending JPS6191174U (US20020095090A1-20020718-M00002.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17510984U JPS6191174U (US20020095090A1-20020718-M00002.png) 1984-11-20 1984-11-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17510984U JPS6191174U (US20020095090A1-20020718-M00002.png) 1984-11-20 1984-11-20

Publications (1)

Publication Number Publication Date
JPS6191174U true JPS6191174U (US20020095090A1-20020718-M00002.png) 1986-06-13

Family

ID=30732713

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17510984U Pending JPS6191174U (US20020095090A1-20020718-M00002.png) 1984-11-20 1984-11-20

Country Status (1)

Country Link
JP (1) JPS6191174U (US20020095090A1-20020718-M00002.png)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6279183U (US20020095090A1-20020718-M00002.png) * 1985-11-05 1987-05-20
JP2009014480A (ja) * 2007-07-04 2009-01-22 Koyo Technos:Kk 検査冶具
WO2012073701A1 (ja) * 2010-11-29 2012-06-07 株式会社精研 接触検査用治具

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6279183U (US20020095090A1-20020718-M00002.png) * 1985-11-05 1987-05-20
JP2009014480A (ja) * 2007-07-04 2009-01-22 Koyo Technos:Kk 検査冶具
WO2012073701A1 (ja) * 2010-11-29 2012-06-07 株式会社精研 接触検査用治具
JP2012117845A (ja) * 2010-11-29 2012-06-21 Seiken Co Ltd 接触検査用治具
CN103238077A (zh) * 2010-11-29 2013-08-07 株式会社精研 接触检查用工具

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