JPS6182647A - 質量分析計 - Google Patents

質量分析計

Info

Publication number
JPS6182647A
JPS6182647A JP59204597A JP20459784A JPS6182647A JP S6182647 A JPS6182647 A JP S6182647A JP 59204597 A JP59204597 A JP 59204597A JP 20459784 A JP20459784 A JP 20459784A JP S6182647 A JPS6182647 A JP S6182647A
Authority
JP
Japan
Prior art keywords
connector
sample introduction
connectors
ion source
mass spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59204597A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0550808B2 (enrdf_load_html_response
Inventor
Kozo Shimazu
島津　光三
Hiroto Itoi
弘人 糸井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP59204597A priority Critical patent/JPS6182647A/ja
Publication of JPS6182647A publication Critical patent/JPS6182647A/ja
Publication of JPH0550808B2 publication Critical patent/JPH0550808B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP59204597A 1984-09-28 1984-09-28 質量分析計 Granted JPS6182647A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59204597A JPS6182647A (ja) 1984-09-28 1984-09-28 質量分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59204597A JPS6182647A (ja) 1984-09-28 1984-09-28 質量分析計

Publications (2)

Publication Number Publication Date
JPS6182647A true JPS6182647A (ja) 1986-04-26
JPH0550808B2 JPH0550808B2 (enrdf_load_html_response) 1993-07-30

Family

ID=16493097

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59204597A Granted JPS6182647A (ja) 1984-09-28 1984-09-28 質量分析計

Country Status (1)

Country Link
JP (1) JPS6182647A (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000052735A1 (en) * 1999-03-05 2000-09-08 Bruker Daltronics, Inc. Ionization chamber for atmospheric pressure ionization mass spectrometry

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000052735A1 (en) * 1999-03-05 2000-09-08 Bruker Daltronics, Inc. Ionization chamber for atmospheric pressure ionization mass spectrometry
US6410914B1 (en) 1999-03-05 2002-06-25 Bruker Daltonics Inc. Ionization chamber for atmospheric pressure ionization mass spectrometry

Also Published As

Publication number Publication date
JPH0550808B2 (enrdf_load_html_response) 1993-07-30

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