JPS6182246A - Self-diagnosis controlling system in case of rise of system - Google Patents

Abstract

PURPOSE:To shorten a system rise time by checking whether a memory test skip instruction exists or not, in a memory test period, discontinuing its memory test, when it has become significant, and shifting the processing to an IPL. CONSTITUTION:When a power source of a system is turned on, an operating test of a principal LSI and its initializing are executed, and if it is normal, a memory test is executed. When executing the memory test, 16k bytes are one block, data is written (Write) to an effective memory size, its data is read out (Read), and this Read/Write data is compared. In this case, a key input for detecting a memory error and a memory test skip is checked at every 16k bytes. When checking the key input,, an interruption, etc. are used, whether the key input exists or not is checked by reading the contents of a specified flag (register area 23), and when the key input is detected, the memory test is discontinued, and the processing is shifted to an IPL.

Description

DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a self-diagnosis control method at the time of system startup.

[Technical background of the invention and its details]

In recent years, due to advances in semiconductor technology, LS for controlling peripheral devices, which are microprocessors and their peripheral families, has increased.
I can now be done cheaply. These ready-made LSIs
The components can be combined without adding an external logic circuit, and by organically combining them using their software instructions, a relatively high-performance microcomputer system can be constructed.

By the way, in the above-mentioned system, when performing self-diagnosis of the system immediately after turning on the power, it is necessary to read/write data for all memories supplied as resources.
Normal operation was confirmed by comparing the data. After this self-diagnosis is completed, the system starts up the Poot Nut Trump loader and starts up the system.

On the other hand, as the memory size used by recent 16-bit personal computer software increases, the size of the system memory structure tends to increase. Therefore, there is a drawback that the waiting time from turning on the power to starting the Pootstrap loader is very long.

[Purpose of the invention]

The present invention has been made in view of the above-mentioned drawbacks, and is designed to shorten the system startup time by having a configuration in which the memory test at system startup can be skipped under user control. The purpose is to provide a self-diagnosis control method.

[Summary of the invention]

In order to achieve the above object, the present invention has a configuration in which the memory test at the time of system startup can be skipped at the user's discretion. For this reason, a flag (which may be set in the memory space by software or set in a specific register by a switch or the like by hardware) is added to the system to instruct skipping of the memory test, and The user sets the instruction data using a switch or the like. Furthermore, during the memory test period, a processing program added to the system constantly scans the above flag to check for the presence or absence of a memory test skip instruction, and when it becomes significant, the memory test is interrupted and processing is performed to the IPI. It is intended to transfer the

This makes it possible to reduce the time required to start up the system.

[Embodiments of the invention]

Embodiments of the present invention will be described in detail below using one drawing. FIG. 1 is a block diagram showing an embodiment of the present invention.

In the figure, numeral 1 denotes a microprocessor (μCPU) serving as the control center of the system, to which various hardware resources are connected. As a hardware resource, here, in particular, the memory unit (main 1 display unit) (CRT)
3. Key number 4 is shown. Kamisha display unit 3. Key? -Do unit 4 is a keyboard/CRT
It is connected to the microprocessor 1 via a peripheral control device 5 serving as an interface.

FIG. 2 shows the memory test z. RA, M module 21.
ROM T3I0822. Register area 23 is mapped. RA, M module 2 (() stores various program data, ROM-BIO822,
The key is -do.

Physical input/output control programs for input/output devices such as display units are stored. Also, this ROM BIO8
22 also stores a test routine shown as a flowchart in FIG.

It is assumed that a certain bit of the register area 23 is allocated for the purpose of specifying the memory level.

FIG. 3 is a flowchart showing the operation of the embodiment of the present invention, and specifically shows the flow of a part of the test routine provided as the ROM BIO 822.

Hereinafter, the operation of the embodiment of the present invention will be explained in detail. First, when the system is powered on, the main LSIs used in the system are tested and initialized. If this is normal, an operation test of the keyed interface indicated as peripheral control device 5 is performed.

- At this time, if an abnormality is detected, a message to that effect is displayed on the display unit 3. Furthermore, if normal, a memory test is executed.

For the memory test, write data up to the effective memory size (Write) and read the data (Read) using 16 bytes as one bronch.
Compare rite 7'-night. At this time, a key manual check is performed to detect memory errors and memory test skips every 16 bytes. When an error occurs,
The subsequent processing is canceled, and the memory space up to where the memory error occurred is set as the new memory size, and ■p L (finit
ialprogram I, oad).

The key person here uses interrupts, etc. That is, key input is effectively accepted even during a memory test, and the presence or absence of key input is determined by reading the contents of the specific flag (register area 23). Here, when a key human power is detected, the memory test) k is interrupted and the IP
Processing is transferred to L. The key input is iJEU= for any key, not just a specific key, and can be skipped at any time during the test period.

In addition, in the embodiment of the present invention, the memory test nuki knob flag i
Although the - key was used as a means to turn on the switch, it is also possible to set a specific register on the hardware using a switch or the like and use this as the skip flag. +
It is 1.

〔Effect of the invention〕

As described above, according to the present invention, it is possible to skip the memory test at the time of system start-up according to the user's judgment, thus contributing to a reduction in the time required for system start-up. The present invention can obtain particularly remarkable effects when used in a system in which the power is frequently turned on again.

[Brief explanation of the drawing]

FIG. 1 is a block diagram showing an embodiment of the present invention, the second figure is a diagram showing a memory map of the memory unit in FIG. 1,
FIG. 3 is a flow chart showing the operation of the present invention. 1... Microprocessor (μCPU), consideration... memory unit, 3... display unit, 4... key date unit, 5... peripheral control device, 2...
RAM module, 22...ROM BIO8,...? J...Register area. Fig. 1 Fig. 20 Fig. 30

Claims (1)

[Claims] Read/Write data to memory when power is turned on
In an information processing system in which a memory test is performed by performing ``e'' and comparing the data, and the system is started by activating an IPL, the above-mentioned memory test can be skipped when instructed via a data input means to the system such as a keyboard. A temporary storage means is provided, and the temporary storage means is constantly scanned during the memory test period to check for the presence or absence of a memory test skip instruction, and when it becomes significant, the memory test is interrupted and processing is shifted to IPL. A self-diagnosis control method at the time of system start-up, which is characterized by: