JPS6182205U - - Google Patents
Info
- Publication number
- JPS6182205U JPS6182205U JP16771184U JP16771184U JPS6182205U JP S6182205 U JPS6182205 U JP S6182205U JP 16771184 U JP16771184 U JP 16771184U JP 16771184 U JP16771184 U JP 16771184U JP S6182205 U JPS6182205 U JP S6182205U
- Authority
- JP
- Japan
- Prior art keywords
- slit
- thin film
- film base
- gauge
- attached
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000010409 thin film Substances 0.000 claims description 3
- 238000012544 monitoring process Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 5
- 238000005336 cracking Methods 0.000 description 1
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
第１図は本考案のひずみゲージ図、第２図は本
考案のひずみゲージ（ロゼツトゲージとクラツク
ゲージ）を対象物に取付た図、第３図は本考案の
ひずみゲージを（ロゼツトゲージのみ）対象物に
取付た図、第４図は従来の試験片とひずみゲージ
の配置図、第５図は亀裂パネルと符号の説明図で
ある。
符号の説明、１……薄膜状基盤、２ａ，２ｂ，
２ｃ…２ｍ……３軸ロゼツトゲージ、３……クラ
ツクゲージ、４……ゲージ中心点、５……スリツ
ト。
Figure 1 is a diagram of the strain gauge of the present invention, Figure 2 is a diagram of the strain gauge of the present invention (rosette gauge and crack gauge) attached to an object, and Figure 3 is a diagram of the strain gauge of the present invention (rosette gauge only) attached to an object. The installed view, Figure 4 is a layout diagram of conventional test pieces and strain gauges, and Figure 5 is an explanatory diagram of crack panels and symbols. Explanation of symbols, 1...Thin film base, 2a, 2b,
2c...2m...3-axis rosette gauge, 3...cracking gauge, 4...gauge center point, 5...slit.
Claims (1)
リツトの末端を中心とする薄膜状基盤の円周上に
分散して貼り付けられた複数枚の３軸ロゼツトゲ
ージとより構成されることを特徴とする亀裂監視
用ひずみゲージ。 It is characterized by being composed of a thin film base having a slit in the center, and a plurality of triaxial rosette gauges distributed and attached on the circumference of the thin film base centered at the end of the slit. Strain gauge for crack monitoring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16771184U JPH0431530Y2 (en) | 1984-11-02 | 1984-11-02 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16771184U JPH0431530Y2 (en) | 1984-11-02 | 1984-11-02 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6182205U true JPS6182205U (en) | 1986-05-31 |
| JPH0431530Y2 JPH0431530Y2 (en) | 1992-07-29 |
Family
ID=30725500
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16771184U Expired JPH0431530Y2 (en) | 1984-11-02 | 1984-11-02 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0431530Y2 (en) |
-
1984
- 1984-11-02 JP JP16771184U patent/JPH0431530Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0431530Y2 (en) | 1992-07-29 |