JPS6181648A - Quartz glass jig for conveying wafer boat - Google Patents

Quartz glass jig for conveying wafer boat

Info

Publication number
JPS6181648A
JPS6181648A JP18188684A JP18188684A JPS6181648A JP S6181648 A JPS6181648 A JP S6181648A JP 18188684 A JP18188684 A JP 18188684A JP 18188684 A JP18188684 A JP 18188684A JP S6181648 A JPS6181648 A JP S6181648A
Authority
JP
Japan
Prior art keywords
wafer boat
quartz glass
wafer
jig
per
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18188684A
Other languages
Japanese (ja)
Inventor
Makoto Kumakura
熊倉 眞
Yasusane Sasaki
佐々木 泰実
Masayuki Saito
正行 斎藤
Shigeru Abe
茂 安部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coorstek KK
Original Assignee
Toshiba Ceramics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Ceramics Co Ltd filed Critical Toshiba Ceramics Co Ltd
Priority to JP18188684A priority Critical patent/JPS6181648A/en
Publication of JPS6181648A publication Critical patent/JPS6181648A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67754Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a batch of workpieces

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Glass Compositions (AREA)

Abstract

PURPOSE:To prevent a wafer boat from being bent or curved, by composing the wafer boat of quartz glass which contains 5,000 or more approximately spherical air bubbles having a diameter of 10-50mum per 1cm<3>, and has an OH radical content of 150ppm or less. CONSTITUTION:A generally tubular conveying jig body 1 is provided at the tip thereof with a notch which is curved and straight in the vertical section, for forming wafer boat holding portion 2. The wafer boat holding portion is formed of translucent quartz glass having an OH radical content of 150ppm or less and containing 5,000 or more approximately spherical air bubbles having a diameter of 10-50mum, per 1cm<3>. A semiconductor wafer is placed on the wafer boat 2 to be conveyed and put in or taken out of a furnace core tube.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は半導体ウェハをa還したウェハボートを炉芯管
へ出し入れする際に用いるソフトランディング方式の石
英ガラス製ウェハボート搬送治具の改良に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an improvement in a soft landing type quartz glass wafer boat transport jig used for loading and unloading a wafer boat containing semiconductor wafers into and out of a furnace core tube.

[発明の技術的前景とその問題点] 半導体ウェハをa置したウェハボートを炉芯管へ出し入
れする際には管状又は棒状の耐熱材料の一端部に切欠部
を設けてウェハボート保持部を形成したウェハボート搬
送治具が用いられる。従来、この種のウェハボート搬送
治具は純度的な観点から石英ガラス材質のものが主体で
ある。
[Technical background of the invention and its problems] When a wafer boat with semiconductor wafers placed thereon is taken in and out of the furnace core tube, a notch is provided at one end of a tubular or rod-shaped heat-resistant material to form a wafer boat holding part. A wafer boat transport jig is used. Conventionally, this type of wafer boat transport jig has mainly been made of quartz glass from the viewpoint of purity.

ところが1石英ガラス製の搬送治具では使用時に一端の
ウェハボート保持部を高温の炉内に挿入し、他端を室温
で固定支持した状態で搬送治具内に温度勾配が発生する
と、この温度勾配によって搬送治具内に熱的応力が発生
し、それが残留応力として材質の機械的強度を低下させ
る。このため、従来の石英ガラス製ウェハボート搬送治
具は折れたり1曲がったりする欠点があった。この折れ
や曲がりは、特に曲げモーメントが騒も大きくなる部分
で発生し易い。
However, when using a transport jig made of quartz glass, when one end of the wafer boat holder is inserted into a high-temperature furnace and the other end is fixedly supported at room temperature, if a temperature gradient occurs within the transport jig, this temperature The gradient generates thermal stress within the conveying jig, which acts as residual stress and reduces the mechanical strength of the material. For this reason, conventional wafer boat transport jigs made of quartz glass have the drawback of being broken or bent. This folding or bending is particularly likely to occur in areas where the bending moment is large.

このような欠点を解消するために石英ガラス製ウェハボ
ート搬送治具全体を厚くすることが考えられるが、この
ようにすると搬送治具の自重で熱変形が起り易くなる。
In order to eliminate these drawbacks, it is conceivable to make the entire quartz glass wafer boat transport jig thicker, but if this is done, thermal deformation is likely to occur due to the own weight of the transport jig.

[発明の目的] 本発明は上記事情に鑑みてなされたものであり、機械的
強度の大きな石英ガラス製つェl\ポートm送治具を提
供しようとするものである。
[Object of the Invention] The present invention has been made in view of the above circumstances, and it is an object of the present invention to provide a quartz glass glass/port feed jig with high mechanical strength.

〔発明の概要〕[Summary of the invention]

大発明の石英ガラス製ウェハボート搬送治具は、少なく
ともウェハポード保持部を構成する石英ガラスが直径1
0〜50pmのほぼ球形の気泡を1cm’当り5000
債以上含有し、かつOH基含有率がl 50 PpII
以下であることを特徴とするものである。
The great invention of the quartz glass wafer boat transport jig is such that at least the quartz glass constituting the wafer port holding part has a diameter of 1
5000 approximately spherical bubbles of 0 to 50 pm per cm
PpII, and the OH group content is l 50 PpII.
It is characterized by the following.

このような石英ガラス製ウェハボート搬送治具によれば
、ウェハボー ト保持部を構成する石英ガラスが適当な
気泡を含有し、軽量となるので。
According to such a wafer boat transfer jig made of quartz glass, the quartz glass constituting the wafer boat holding section contains appropriate air bubbles, making it lightweight.

ウェハボート保持部を肉厚にすることができ、機械的強
度が高くなる。また、適度な含有率でO,H基を有し1
石英ガラスの分子構造が安定しており、かつ気泡がほぼ
球形であるので、高温下で方向による粘性のバラツキが
ほとんどなく、自重による熱変形が減少して相対的に強
度が高くなる。
The wafer boat holding portion can be made thicker, and its mechanical strength is increased. In addition, it has O and H groups at a moderate content rate, and 1
Since the molecular structure of quartz glass is stable and the bubbles are almost spherical, there is almost no variation in viscosity depending on direction at high temperatures, thermal deformation due to its own weight is reduced, and the strength is relatively high.

また、気泡の存在により赤外線等が直接透過することな
く散乱屈折されるので、WI熱性が向上し。
Furthermore, due to the presence of air bubbles, infrared rays and the like are scattered and refracted without being directly transmitted, so WI thermal properties are improved.

炉芯管内の温度制御が容易となる。Temperature control inside the furnace core tube becomes easier.

本発明において、少なくともウェハボート保持部を構成
する石英ガラスについて1気泡の形状。
In the present invention, at least the quartz glass constituting the wafer boat holder has a shape of one bubble.

個数及びOH基の含有率を上記のように規定したのは、
以下のような理由による。すなわち、気泡の直径が10
gm未満であると、軽量化の効果が少なく、一方50p
mを起えると、強度が低下する。また、気泡の形状が球
形から大きくはずれると、方゛向により粘性にバラツキ
が生じる。また。
The number and content of OH groups were defined as above because
This is due to the following reasons. That is, the diameter of the bubble is 10
If it is less than gm, the effect of weight reduction will be small; on the other hand, if it is less than 50p
When m is raised, the strength decreases. Furthermore, if the shape of the bubble deviates significantly from a spherical shape, the viscosity will vary depending on the direction. Also.

気泡の個数が1cm’当り5000個未満であると、軽
量化の効果が少ない、更に、OH基の含有率が150p
p■を超えると、石英ガラスの分子構造が不安定となり
1強度が低下する。
If the number of bubbles is less than 5000 per cm', the weight reduction effect will be small, and furthermore, the content of OH groups will be 150p.
When p■ is exceeded, the molecular structure of quartz glass becomes unstable and the strength decreases.

〔発明の実施例] 以下、本発明の実施例を図面を参照して説明する。[Embodiments of the invention] Embodiments of the present invention will be described below with reference to the drawings.

第1図は本発明に係る石英ガラス製ウェハボート搬送治
具のウェハボート保持部近傍を一部断面で示す側面図、
第2図は平面図である。
FIG. 1 is a partially cross-sectional side view showing the vicinity of the wafer boat holding part of the quartz glass wafer boat transfer jig according to the present invention;
FIG. 2 is a plan view.

第1図及び:i42図において、搬送治具本体lは全体
が管状であり、その先端部に縦断面形状が円弧状及び直
線状をなす切欠部を設けてウェハボート保持部2が形成
されている。このウェハボート保持部2は直径lO〜5
0amのほぼ球形の気泡を1cm’当り500()個以
上含有し、かつOH基含有率が150 ppm以下の半
透明石英ガラスで形成されている。
In Fig. 1 and Fig. i42, the transfer jig main body l has a tubular shape as a whole, and the wafer boat holding part 2 is formed by providing a notch with a vertical cross-sectional shape of an arc and a straight line at the tip thereof. There is. This wafer boat holding part 2 has a diameter of lO~5
It is made of translucent quartz glass containing 500 () or more approximately spherical bubbles of 0 am per cm' and an OH group content of 150 ppm or less.

上記石英ガラス製つェハポート搬送治其の搬送治具本体
lの基端部は従来のものと同様であり。
The base end of the conveying jig main body l of the quartz glass wafer port conveying jig is the same as that of the conventional one.

図示しない搬送装置の所定の位置に固定される。It is fixed at a predetermined position on a transport device (not shown).

また、ウェハボート保持部?上に半導体ウェハボートを
aせて搬送し、炉芯管へ出し入れを行なう。
Also, the wafer boat holding part? A semiconductor wafer boat is placed on top of the wafer and transported, and the wafer is taken in and out of the furnace core tube.

しかして上記石英ガラス製つェハポート搬送治銭によれ
ば、炉芯管に出し入れを行なっても従来のものと比較し
てウェハボート保持部2の折れや曲がりがなく、シかも
ウェハボート保持部2の先端のたわみを減少することが
できる。
However, according to the quartz glass wafer port transfer coin, the wafer boat holder 2 does not bend or bend even when the wafer boat holder 2 is inserted into and taken out from the furnace core tube compared to the conventional one. The deflection of the tip can be reduced.

また、第3図に示すように支持部材3に41251七固
定支持端から先端までの長さが70mmのも芙ガラス試
料4を支持し、1350℃で1時間力α熱した場合の自
重によるたわみ量を3@の石英ガラスについて試料の肉
厚を変化させて測定した。
In addition, as shown in Fig. 3, the deflection due to its own weight when a glass sample 4 with a length of 70 mm from the 41251 fixed support end to the tip was supported on the support member 3 and heated at 1350°C for 1 hour with a force α. The amount was measured for 3@ quartz glass by changing the wall thickness of the sample.

この結果を第4図に示す、なお、第4図中■(比較例L
)は製管方向に長く引き延ばされ、短軸が10〜504
mの気泡をlea’当り5ooo個以上含有し、OH基
含有率が約120pp■の不透明石英ガラス、同図中■
(比較例2)は気泡をほとんど含まず、OH基含有率が
約200 ppm以下の透明石英ガラス、同図中m(実
施例)は直径lO〜50ルmのほぼ球形の気泡を1cm
’当り5000個以上含有し、かつOH基含有率が約1
10ppmの半透明石英ガラスについての結果をそれぞ
れ示すものである。
The results are shown in Figure 4.
) is elongated in the pipe manufacturing direction, and the short axis is 10 to 504
Opaque quartz glass containing at least 500 m bubbles per lea' and an OH group content of approximately 120 pp■, in the same figure.
(Comparative Example 2) is a transparent quartz glass that contains almost no bubbles and has an OH group content of about 200 ppm or less.
5,000 or more per ', and the OH group content is about 1
The results are shown for 10 ppm translucent quartz glass.

第4図から明らかなように、比較例1の石英ガラスは含
まれる気泡の形状が球形から大きくはずれているので、
たわみ量が大きい、また、比較例2の石英ガラスは気泡
をほとんど含まず、OH基の含有率も150pp■を超
えているので、やはりたわみ量が大きい、これに対して
実施例の石英ガラスは比較例のものに比へてたわみ醍が
小さくなっている。
As is clear from FIG. 4, the shape of the bubbles contained in the quartz glass of Comparative Example 1 deviates greatly from the spherical shape.
In addition, the silica glass of Comparative Example 2 has a large amount of deflection, as it contains almost no air bubbles and the content of OH groups exceeds 150 pp. The deflection strength is smaller than that of the comparative example.

なお、本発明の石英ガラス製ウェハボート搬送冶具にお
いて、曲げモーメントはウェハ保持部の縦断面形状が円
弧状及び直線状をなす切欠部の円弧と直線の境界Aの近
傍で最も大きくなり、先端で最小となるから、第5図及
び:iSS図に示すように、前記Aの近傍を肉厚にし、
先端に向かって肉薄になるようにしてもよい。
In addition, in the quartz glass wafer boat transfer jig of the present invention, the bending moment is greatest near the boundary A between the circular arc and the straight line of the notch where the vertical cross-sectional shape of the wafer holding part is circular and straight; Therefore, as shown in Figure 5 and iSS diagram, the area near A is made thicker.
The wall may become thinner toward the tip.

また、搬送治具本体は上記実施例のように管状のものに
限らず、棒状のものでもよい。
Further, the main body of the conveyance jig is not limited to the tubular shape as in the above embodiment, but may be rod-shaped.

更に、搬送治具本体もウェハ保持部と同じ材質としても
よい。
Furthermore, the main body of the transport jig may also be made of the same material as the wafer holder.

[発明の効果] 、 以上詳述した如く本発明の石英ガラス製ウェハボート搬
送治具によれば、ウェハボート保持部の折れや曲がりを
なくし、しかもウェハボート保持部の先端のたわみを減
少することができる等顕著な効果を奏するものである。
[Effects of the Invention] As detailed above, according to the quartz glass wafer boat transfer jig of the present invention, bending and bending of the wafer boat holder can be eliminated, and the deflection of the tip of the wafer boat holder can be reduced. This has remarkable effects, such as the ability to

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明における石英ガラス製つニノ\ポート搬
送治具のウェハボート保持部近傍を一部断面で示す側面
図、第2図は同搬送治具の乎面図、第3図はたわみ量の
試験方法を示す説明図。 第4図は実施例及び比較例1.2の石英ガラスについて
の試料の肉厚とたわみ量との関係を示す線図、第5図は
本発明の他の実施例における石英ガラス製ウェハボート
搬送治具のウェハボート保持部近傍を一部断面で示す側
面図、第6図は同搬送治具の平面図である。 l・・・搬送治具本体、2・・・ウェハボート保持部。 3・・・支持部材24・・・石英ガラス試料。 出願人代理人 弁理士 鈴 江 武 彦手続補正書 昭和  J30・1ρ・31日 特許庁長官  宇  賀   道  部 殿1、事件の
表示 特願昭59−181886号 2、発明の名称 石英ガラス製ウェハボート搬送治具 3、補正をする者 事件との関係   特許出願人 東芝セラミックス株式会社 4、代理人 6、補正の対象 図   面 7、補正の内容
FIG. 1 is a side view partially showing the vicinity of the wafer boat holding part of the quartz glass port transfer jig in the present invention, FIG. 2 is a top view of the same transfer jig, and FIG. 3 is a deflection view. An explanatory diagram showing a method of testing quantity. FIG. 4 is a diagram showing the relationship between sample wall thickness and deflection amount for the quartz glasses of Examples and Comparative Examples 1.2, and FIG. 5 is a diagram showing the relationship between the sample wall thickness and the amount of deflection for the quartz glasses of Example and Comparative Example 1.2, and FIG. 5 is the quartz glass wafer boat transportation in another example of the present invention. FIG. 6 is a side view partially showing the vicinity of the wafer boat holding part of the jig in cross section, and FIG. 6 is a plan view of the same transfer jig. l... Transfer jig main body, 2... Wafer boat holding section. 3... Support member 24... Quartz glass sample. Applicant's representative Patent attorney Takehiko Suzue Procedural amendments Showa J30/1/31 Director General of the Patent Office Michibe Uga 1, Indication of case Patent application No. 181886/1986 2, Title of invention: Quartz glass wafer boat Transportation jig 3, relationship with the person making the amendment Patent applicant Toshiba Ceramics Co., Ltd. 4, attorney 6, drawings subject to amendment 7, content of amendment

Claims (1)

【特許請求の範囲】[Claims] 一端が固定され、他端に半導体ウェハを載置したウェハ
ボートを保持するウェハボート保持部を形成した石英ガ
ラス製ウェハボート搬送治具において、少なくとも前記
ウェハボート保持部を構成する石英ガラスが直径10〜
50μmのほぼ球形の気泡を1cm^3当り5000個
以上含有し、かつOH基含有率が150ppm以下であ
ることを特徴とする石英ガラス製ウェハボート搬送治具
In a quartz glass wafer boat transfer jig in which one end is fixed and the other end forms a wafer boat holder for holding a wafer boat on which a semiconductor wafer is mounted, the quartz glass constituting the wafer boat holder has a diameter of at least 10 mm. ~
A wafer boat transport jig made of quartz glass, characterized in that it contains 5000 or more approximately spherical bubbles of 50 μm per cm^3, and has an OH group content of 150 ppm or less.
JP18188684A 1984-08-31 1984-08-31 Quartz glass jig for conveying wafer boat Pending JPS6181648A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18188684A JPS6181648A (en) 1984-08-31 1984-08-31 Quartz glass jig for conveying wafer boat

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18188684A JPS6181648A (en) 1984-08-31 1984-08-31 Quartz glass jig for conveying wafer boat

Publications (1)

Publication Number Publication Date
JPS6181648A true JPS6181648A (en) 1986-04-25

Family

ID=16108592

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18188684A Pending JPS6181648A (en) 1984-08-31 1984-08-31 Quartz glass jig for conveying wafer boat

Country Status (1)

Country Link
JP (1) JPS6181648A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01197381A (en) * 1988-02-03 1989-08-09 Mitsubishi Metal Corp Quartz crucible for pulling-up silicon single crystal
JPH0774121A (en) * 1994-03-28 1995-03-17 Shinetsu Quartz Prod Co Ltd Quartz glass furnace core tube
JPH0774122A (en) * 1994-03-28 1995-03-17 Shinetsu Quartz Prod Co Ltd Quartz glass core tube
WO2020129174A1 (en) * 2018-12-19 2020-06-25 東ソー・クォーツ株式会社 Opaque quartz glass and production method therefor

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01197381A (en) * 1988-02-03 1989-08-09 Mitsubishi Metal Corp Quartz crucible for pulling-up silicon single crystal
JPH0774121A (en) * 1994-03-28 1995-03-17 Shinetsu Quartz Prod Co Ltd Quartz glass furnace core tube
JPH0774122A (en) * 1994-03-28 1995-03-17 Shinetsu Quartz Prod Co Ltd Quartz glass core tube
WO2020129174A1 (en) * 2018-12-19 2020-06-25 東ソー・クォーツ株式会社 Opaque quartz glass and production method therefor
JPWO2020129174A1 (en) * 2018-12-19 2021-02-15 東ソー・クォーツ株式会社 Opaque quartz glass and its manufacturing method

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