JPS6179899U - - Google Patents

Info

Publication number
JPS6179899U
JPS6179899U JP16507684U JP16507684U JPS6179899U JP S6179899 U JPS6179899 U JP S6179899U JP 16507684 U JP16507684 U JP 16507684U JP 16507684 U JP16507684 U JP 16507684U JP S6179899 U JPS6179899 U JP S6179899U
Authority
JP
Japan
Prior art keywords
holding circuit
memory device
semiconductor memory
circuit
junction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16507684U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16507684U priority Critical patent/JPS6179899U/ja
Publication of JPS6179899U publication Critical patent/JPS6179899U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Techniques For Improving Reliability Of Storages (AREA)
  • Power Sources (AREA)
  • Static Random-Access Memory (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図面はこの考案に係わる半導体記憶装置の記憶
保持回路の一実施例を示す回路図である。 11…半導体記憶装置、12…スイツチングダ
イオード、14…電池。
The drawing is a circuit diagram showing an embodiment of a memory holding circuit of a semiconductor memory device according to the invention. 11...Semiconductor storage device, 12...Switching diode, 14...Battery.

Claims (1)

【実用新案登録請求の範囲】 (1) 半導体記憶装置と記憶保持用バツクアツプ
電池との間に順方向漏洩電流が多いPN接合回路
を設け、この漏洩電流によつて前記半導体記憶装
置を記憶保持状態に保つ構成としたことを特徴と
する半導体記憶装置保持回路。 (2) 前記PN接合回路はスイツチングダイオー
ドからなることを特徴とする実用新案登録請求の
範囲第1項記載の半導体記憶装置の記憶保持回路
。 (3) 前記PN接合回路はダイオード接続された
トランジスタからなることを特徴とする実用新案
登録請求の範囲第1項記載の半導体記憶装置の記
憶保持回路。
[Claims for Utility Model Registration] (1) A PN junction circuit with a large forward leakage current is provided between a semiconductor memory device and a backup battery for memory retention, and this leakage current causes the semiconductor memory device to enter a memory retention state. 1. A semiconductor memory device holding circuit, characterized in that the semiconductor storage device holding circuit is configured such that the holding circuit maintains the holding circuit. (2) A memory holding circuit for a semiconductor memory device according to claim 1, wherein the PN junction circuit comprises a switching diode. (3) A memory holding circuit for a semiconductor memory device according to claim 1, wherein the PN junction circuit is composed of a diode-connected transistor.
JP16507684U 1984-10-31 1984-10-31 Pending JPS6179899U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16507684U JPS6179899U (en) 1984-10-31 1984-10-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16507684U JPS6179899U (en) 1984-10-31 1984-10-31

Publications (1)

Publication Number Publication Date
JPS6179899U true JPS6179899U (en) 1986-05-28

Family

ID=30722939

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16507684U Pending JPS6179899U (en) 1984-10-31 1984-10-31

Country Status (1)

Country Link
JP (1) JPS6179899U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5819614U (en) * 1981-07-29 1983-02-07 セイコーエプソン株式会社 Spring bar structure for watches

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5819614U (en) * 1981-07-29 1983-02-07 セイコーエプソン株式会社 Spring bar structure for watches

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