JPS6179273U - - Google Patents
Info
- Publication number
- JPS6179273U JPS6179273U JP16335284U JP16335284U JPS6179273U JP S6179273 U JPS6179273 U JP S6179273U JP 16335284 U JP16335284 U JP 16335284U JP 16335284 U JP16335284 U JP 16335284U JP S6179273 U JPS6179273 U JP S6179273U
- Authority
- JP
- Japan
- Prior art keywords
- sharp needles
- tip
- utility
- contact
- pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16335284U JPS6179273U (ru) | 1984-10-29 | 1984-10-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16335284U JPS6179273U (ru) | 1984-10-29 | 1984-10-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6179273U true JPS6179273U (ru) | 1986-05-27 |
Family
ID=30721212
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16335284U Pending JPS6179273U (ru) | 1984-10-29 | 1984-10-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6179273U (ru) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010038612A (ja) * | 2008-08-01 | 2010-02-18 | Hioki Ee Corp | コンタクトプローブ |
| WO2017141706A1 (ja) * | 2016-02-15 | 2017-08-24 | 日本発條株式会社 | 検査用導電性接触子、および半導体検査装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5383075A (en) * | 1976-12-27 | 1978-07-22 | Teradyne Inc | Testing pin |
| JPS5694272A (en) * | 1979-12-26 | 1981-07-30 | Teledyne Ind | Test pin |
-
1984
- 1984-10-29 JP JP16335284U patent/JPS6179273U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5383075A (en) * | 1976-12-27 | 1978-07-22 | Teradyne Inc | Testing pin |
| JPS5694272A (en) * | 1979-12-26 | 1981-07-30 | Teledyne Ind | Test pin |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010038612A (ja) * | 2008-08-01 | 2010-02-18 | Hioki Ee Corp | コンタクトプローブ |
| WO2017141706A1 (ja) * | 2016-02-15 | 2017-08-24 | 日本発條株式会社 | 検査用導電性接触子、および半導体検査装置 |
| JP6243584B1 (ja) * | 2016-02-15 | 2017-12-06 | 日本発條株式会社 | 検査用導電性接触子、および半導体検査装置 |
| US10274517B2 (en) | 2016-02-15 | 2019-04-30 | Nhk Spring Co., Ltd. | Conductive probe for inspection and semiconductor inspection device |