JPS617544A - Pick-up tube of electrostatic focus and electrostatic deflection type - Google Patents

Abstract

PURPOSE:To enable an S-S type pick-up tube with a small amount of few lead wires to be manufactured simply, byhforming a pattern electrode for deflection and a pattern electrode for focus together with a collimation electrode on the inside wall surface of a bulb while arranging the pattern electrodes for deflection and focus alternately in the circumferential direction. CONSTITUTION:Pattern electrodes have a region A which is substantially the electrode for focus and deflection in the tube-axial direction Z while being divided into the deflection electrodes H+, V+, H-, V- and the focusing electrode G5 having DC voltage different therefrom in the circumferentially developing direction theta. A collimation electrode G4 to be connected to a mesh electrode is arranged on the target side. In the region A, the focusing electrode G5 is formed between the neighboring two of the deflection electrodes H+, V+, H-, V-. The width in the circumferential direction of the electrode groupe changes reciprocally and continuously along the tube-axial direction so that the focusing electrode G5 may be large on the side of an electron gun and the deflection electrode may be large on the target side.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to an electrostatic focusing/electrostatic deflection type image pickup tube that uses an electrostatic field to focus and deflect an electron beam.

[Background of the invention]

Conventionally, in vidicon-type image pickup tubes, electric fields and magnetic fields are used to focus and deflect electrons/beams, and four types of electron optical systems (electron guns) can be considered by combining these two fields. Namely, magnetic field focusing/magnetic deflection (M-M) type, magnetic field focusing/electrostatic deflection (M-S) type, electrostatic focusing/magnetic deflection (S-M) type, and electrostatic focusing/electrostatic deflection ( SS) form.

The S-8 type does not require electromagnets that limit beam focusing and deflection, making the device smaller and lighter.

It can be said to be an ideal electron optical system in terms of low power consumption.

However, in the conventional S-8 type electron optical system, not only are the electron beam characteristics (particularly the spot characteristics of the focused beam and the spot characteristics during deflection) inferior, but also the number of electrodes for the electrostatic lens and electrostatic deflection is poor. This has caused problems in manufacturing, such as assembling them and taking out the lead wires.

FIGS. 1 and 2 show an electron optical system used in a conventional S-8 type image pickup tube. FIG. 1 uses a parallel plate-shaped electrostatic lens. Two sets of electrode groups 10, 2 are used to focus and deflect the electron beam 6 in each of the y and x directions with respect to the tube axis 2.
0 is set.

A mesh electrode 5 is provided between these electrode groups 10 and 20 to shield the electric field coupling of each VpX system.

For example, in the electrode group 1o, the electrostatic voltage v
1 is applied to the flat plate electrodes 13 and 14, and the deflection signal voltage +Vd is applied to the static voltage v2.

-Vd superimposed V 2 + V d e V 2
'V d is applied. As a result, the electron beam emitted from object point 0 is linearly focused and deflected in the y direction.

The same applies to the electrode group 20, and the electron beam is focused and deflected in the X direction.

Figure 2 uses a cylindrical electrostatic lens 3o,
The electrodes 31, 32, 33° 34 arranged in the middle are divided into four (or eight) parts in the circumferential direction, and a deflection signal voltage ±Vd is applied between the opposing counter electrodes 31, 33 and 32° 34.
is applied. As a result, the beam 6 emitted from the object point ○ becomes U P F (UniPotential Fo
The light is focused and deflected by a cusing-shaped lens.

The conventional S-8 type shown in Figures 1 and 2 requires non-rotationally symmetrical electrodes such as parallel plate electrodes and cylindrical split electrodes, so it is very difficult to actually assemble these with high precision. Ta.

[Purpose of the invention]

An object of the present invention is to provide an S-8 type image pickup tube that is easy to manufacture.

[Summary of the invention]

If an S-8 type electron optical system is constructed using conductive plate electrodes, it will be difficult to manufacture and the assembly accuracy will be poor, as explained in FIGS. 1 and 2. In response, the M-8 type image pickup tube has been commercialized, in which a conductive film is formed on the inner wall surface of a cylindrical vacuum insulated bulb by vapor deposition, etc., and a zigzag-shaped electrostatic deflection electrode is formed by chemical etching or laser processing. be done.

An example of this is shown in FIG. Inside the bulb 8 are an electron gun 70 that emits electrons, and a zigzag pattern electrode 40 formed on the inner wall surface of the bulb. a fourth forming a collimation lens;
A grid G4.16 conductive target Tg is arranged and a focusing coil 9 is provided on the outside of the bulb. The feature of this M-8 type image pickup tube is that since the rotationally non-symmetrical deflection electrode group is formed on the inner wall surface of the bulb, it can be manufactured relatively easily and with high precision. FIG. 4 shows a developed view of the pattern electrode 4°. H+, H- for horizontal deflection.

Pairs of electrodes V, V- are provided for vertical deflection, and a deflection signal voltage is applied superimposed on the electrostatic voltage.

The S-8 type image pickup tube according to the present invention is intended to obtain an electrode group that is easy to manufacture by adding an electrostatic lens electrode to a patterned electrode group formed on the inner wall surface of the bulb.

[Embodiments of the invention]

Embodiments of the present invention will be described below with reference to the drawings.

FIG. 5 shows an example of a developed diagram of a pattern electrode used in the image pickup tube of the present invention. The patterned electrode of this example has a region A that is a substantial focusing and deflecting electrode in the tube axis direction 2,
It is divided into deflection electrodes H+, V+, H, and V- in the circumferential development direction θ, and a focusing electrode G5 having a DC voltage different from these electrodes. A collimation electrode G4 connected to the mesh electrode is installed on the target side.

In region A, a focusing electrode G6 is formed between two adjacent deflection electrodes H+ -V+ and H-V-. The circumferential width of the electrode group changes reciprocally and continuously along the tube axis direction such that the focusing electrode G5 is large on the electron gun side and the deflection electrode is large on the target side.

In this embodiment, when no deflection voltage is applied, the electrode H
The same DC voltage v3 is applied to +, V+, H-, and V-, and a DC voltage v5 different from v3 is applied to the focusing electrode G5.
ntial Focusing) type electron lens is formed.

Looking at the cross section of the tube at a certain position in the tube axis direction in area A, the deflection electrodes H+, V+, H, V- and the focusing electrode G5 are present alternately in the θ direction on the inner wall surface. This will form an astigmatic lens system.

This astigmatism lens effect is unnecessary because it degrades the focusing characteristics of the electron beam.

However, in this example, when viewed at a certain θ position, the deflection electrode and the focusing electrode are alternately replaced along the tube axis direction Z, and this effect averages out the astigmatic lens effect in the Z direction. , it is possible to keep it small. In this way, in this embodiment, a thick lens system with substantially small astigmatism can be formed.

FIG. 6 shows another embodiment of the present invention, and shows a developed view of the patterned electrode in the circumferential direction. The pattern electrode of this example has three regions B, C, and D from the target side along the tube axis direction Z.
It can be divided into In region B, the deflection electrode H+=V, H,
V- and a collimation electrode G4 are formed, and in the region, deflection electrodes H,, V+, H, V- and a focusing electrode G6 are formed.
is formed. In the middle region C, a deflection electrode H+.

Only V+, It, and V- are formed. In this embodiment, regions B, C, and D substantially increase the thickness U P F
(Uni Potsntial Focusing)
form an electronic lens.

FIG. 7 shows another embodiment of the present invention, and shows a developed view of the patterned electrode in the circumferential direction. The patterned electrode of this example is divided into two regions E and F from the target side along the tube axis direction Z. In this embodiment, the intermediate region C in the embodiment shown in FIG. 6 is eliminated, and the focusing electrode G5 and collimation electrode G4 are connected. In this example, regions E and F substantially form a thick-walled UPF type lens,
Furthermore, since G5 and 04 have the same potential, there is an advantage that the number of electrode lead wires can be reduced.

〔Effect of the invention〕

According to the present invention, a deflection nozzle (turn electrode, a focus pattern electrode, and a collimation electrode) are formed on the inner wall surface of the bulb, and the deflection and focus pattern electrodes are arranged circumferentially in a certain area in the tube axis direction. Since they are arranged alternately, it is possible to easily manufacture an N5-8 type image pickup tube with fewer lead wires.

[Brief explanation of the drawing]

Figures 1 and 2 are cross-sectional views showing the electron lens section of a conventional S-8 type image pickup tube, Figure 3 is a cross-sectional view of a conventional M-3 type image pickup tube, and Figure 4 is a cross-sectional view of the conventional M-3 type image pickup tube. FIG. 5 is a developed view showing a turn electrode, and FIG. 5 is a developed view showing an example of a patterned electrode used in the image pickup tube of the present invention. FIGS. 6 and 7 are developed views showing other examples of patterned electrodes according to the present invention. Yes, H, H-... horizontal deflection pattern electrode, Vat■-
... Pattern electrode for vertical deflection, G5 ... Pattern electrode for focus, G4 ... Collimation electrode, No.
1 Fig. 2 Fig. 3θ Fig. 3 No. 4 RoL No. 5 Kuchi-Kaya 〆 Fig.

Claims (1)

[Scope of Claims] 1. Four deflection electrodes formed on the inner wall surface of the insulating tube so as to be separated from each other along the circumferential direction thereof, and the deflection electrode between the deflection electrodes on the inner wall surface. 4 or 8 focusing electrodes formed separately from the electrodes, and a collimation electrode connected to a mesh electrode installed on the target side and formed separately from the deflection electrode on the inner wall surface, An electrostatic focusing electrostatic deflection type imaging tube, characterized in that the circumferential widths of the deflection electrode and the focusing electrode are changed reciprocally along the tube axis direction. 2. The electrostatic focusing electrostatic deflection type imaging tube according to claim 1, wherein the deflection electrode and the focusing electrode are formed over an area excluding the collimation electrode. 3. The inner wall surface of the insulating tube includes, along the tube axis direction from the target side to the electron gun side, a first region where the collimation electrode and the deflection electrode are formed, and a first region where only the deflection electrode is formed. The electrostatic focusing electrostatic deflection type image pickup tube according to claim 1, characterized in that the electrostatic focusing electrostatic deflection type image pickup tube comprises a second area where the focusing electrode and the deflecting electrode are formed. 4. Connect the collimation electrode and the focusing electrode to the second
2. The electrostatic focusing electrostatic deflection type image pickup tube according to claim 1, wherein the focusing electrode and the deflecting electrode are connected to each other in a region of the inner wall surface and are formed over the entire region of the inner wall surface.