JPS6172850U - - Google Patents
Info
- Publication number
- JPS6172850U JPS6172850U JP15745384U JP15745384U JPS6172850U JP S6172850 U JPS6172850 U JP S6172850U JP 15745384 U JP15745384 U JP 15745384U JP 15745384 U JP15745384 U JP 15745384U JP S6172850 U JPS6172850 U JP S6172850U
- Authority
- JP
- Japan
- Prior art keywords
- silicon
- dioxide layer
- silicon dioxide
- phenomenon
- charge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15745384U JPH037951Y2 (en:Method) | 1984-10-18 | 1984-10-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15745384U JPH037951Y2 (en:Method) | 1984-10-18 | 1984-10-18 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6172850U true JPS6172850U (en:Method) | 1986-05-17 |
| JPH037951Y2 JPH037951Y2 (en:Method) | 1991-02-27 |
Family
ID=30715446
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15745384U Expired JPH037951Y2 (en:Method) | 1984-10-18 | 1984-10-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH037951Y2 (en:Method) |
-
1984
- 1984-10-18 JP JP15745384U patent/JPH037951Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPH037951Y2 (en:Method) | 1991-02-27 |