JPS6155603A - High-durability infrared reflecting mirror - Google Patents

High-durability infrared reflecting mirror

Info

Publication number
JPS6155603A
JPS6155603A JP17675684A JP17675684A JPS6155603A JP S6155603 A JPS6155603 A JP S6155603A JP 17675684 A JP17675684 A JP 17675684A JP 17675684 A JP17675684 A JP 17675684A JP S6155603 A JPS6155603 A JP S6155603A
Authority
JP
Japan
Prior art keywords
film
reflecting mirror
thickness
layer
tin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17675684A
Other languages
Japanese (ja)
Other versions
JPH0685004B2 (en
Inventor
Tetsuo Kuwabara
鉄夫 桑原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP59176756A priority Critical patent/JPH0685004B2/en
Publication of JPS6155603A publication Critical patent/JPS6155603A/en
Publication of JPH0685004B2 publication Critical patent/JPH0685004B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Optical Elements Other Than Lenses (AREA)
  • Optical Filters (AREA)

Abstract

PURPOSE:To obtain substantial durability and good optical performance by forming the film of the 1st layer consisting of Cr, Ti, Co or Ni on a substrate and forming the film of the 2nd layer consisting of TiN thereon. CONSTITUTION:The film 2 of the 1st layer consisting of one among Cr, Ti, Co and Ni or the mixture composed thereof is formed on the substrate 1 and the film 3 of the 2nd layer consisting of TiN is disposed thereon. These films are preferably so formed that the thickness d1 of the film 2 and the thickness d2 of the film 3 have the relation 1<=(d1/d2)<=10. Good reflectivity of about 90% is obtd. by forming a reflecting mirror consisting of Ti, etc. to the material of the film 2 in the above-mentioned manner. The film 3 consisting of TiN has excellent chameical stability and wear resistance and makes the mirror usable under severe conditions. The internal stress over the entire part of the film is made small and the decrease in the surface accuracy of the reflecting mirror is prevented by setting the thickness ratio of the films 2, 3 in the above-mentioned manner. The IR reflecting mirror having the excellent durability in the wear resistance, chemical stability, etc. and good optical characteristic is thus obtd.

Description

【発明の詳細な説明】 [技術分野] 本発明は赤外線波長領域における反射鏡に関する。[Detailed description of the invention] [Technical field] The present invention relates to a reflector in the infrared wavelength region.

[従来技術] 従来、赤外線領域における反射鏡としてはガラス等の基
板上にアルミニウム、金、銀または銅等の金属のFJ 
Mを付したものが用いられている。しかしながら、これ
らの金属膜反射鏡はいづれも耐摩耗性が低く、また金膜
反射鏡を除いては化学的安定性が低いという欠点がある
[Prior art] Conventionally, as a reflector in the infrared region, an FJ made of metal such as aluminum, gold, silver or copper is used on a substrate such as glass.
Those marked with M are used. However, all of these metal film reflectors have low abrasion resistance and, with the exception of gold film reflectors, have low chemical stability.

そこで、この欠点を補うため金属膜上に赤外線領域で透
明なMgF2やSfO等の保護膜を付与することが行な
われている。しかして、この様な保護膜の付与にあって
は、薄い膜では不十分であり、かなり厚い膜を付与しな
いと#摩耗性及び化学的安定性等のの耐久性が十分とは
ならない。このため、比較的厚い膜を付与せざるを得な
いが、保護膜の膜厚が大きくなると分光反射率の低下の
みならず膜の内部応力が大きくなり基板を変形せしめ面
精度等の光学的性能が低下するという問題があった。
Therefore, in order to compensate for this drawback, a protective film made of MgF2, SfO, etc., which is transparent in the infrared region, is provided on the metal film. However, when applying such a protective film, a thin film is insufficient, and unless a fairly thick film is applied, durability such as abrasion resistance and chemical stability will not be sufficient. For this reason, a relatively thick film must be applied, but as the thickness of the protective film increases, not only does the spectral reflectance decrease, but also the internal stress of the film increases, deforming the substrate and affecting optical performance such as surface accuracy. There was a problem that the value decreased.

[発明の目的] 本発明は、上記の如き従来技術に鑑み、十分な耐久性と
良好な光学的性能を有する赤外反射鏡を提供することを
目的とする。
[Object of the Invention] In view of the prior art as described above, an object of the present invention is to provide an infrared reflecting mirror having sufficient durability and good optical performance.

〔発明の要旨コ 本発明によれば、以上の様な目的は、基板上にCr、T
i、Co及びNiのうちの1つ又はこれらの混合体から
なる第1i目の膜が形成されており、該第2層目の膜の
上にTiNからなる第2層目の膜が形成されていること
を特徴とする、高耐久性赤外反射鏡により達成される。
[Summary of the Invention] According to the present invention, the above-mentioned purpose is to
A first i-th film made of one of i, Co, and Ni or a mixture thereof is formed, and a second-layer film made of TiN is formed on the second-layer film. This is achieved using a highly durable infrared reflector that is characterized by

[発明の実施例] 以下、添付図面を参照しながら本発明の具体的実施例を
説明する。
[Embodiments of the Invention] Specific embodiments of the present invention will be described below with reference to the accompanying drawings.

第1図は本発明による高耐久性赤外反射鏡の概略断面図
である1図において、lはガラス基板であり、2は第1
層目の■儲であり、3は第2層目のTiNII!f!で
ある0本実施例においては、第1層目の膜の材質として
はTiが用いられた。第1層目の膜2の膜厚は0.81
Lmであり、第2層目のnλの膜厚は0.3牌mであっ
た。
FIG. 1 is a schematic cross-sectional view of a highly durable infrared reflecting mirror according to the present invention. In FIG. 1, l is a glass substrate, and 2 is a first
It is the second layer ■profit, and 3 is the second layer TiNII! f! In this example, Ti was used as the material for the first layer film. The thickness of the first layer film 2 is 0.81
Lm, and the film thickness of the second layer nλ was 0.3 m.

土肥第1層目の膜形成は通常の真空蒸着法により行なわ
れ、真空度lXl0−8Torrに排気した後、基板温
度約300″0に保った状態で電子銃蒸発源により金属
Tiを膜厚0.8ルm蒸着した3第2層目は、窒素ガス
を反応ガスとして4×10−’Torrまで導入し、プ
ラズマ放電により活性化された状態で金属Tfを電子銃
蒸発源により蒸発させイオンブレーティングすることに
よりTiN膜を膜厚0.3ルm形成した。
The film formation for the first layer of Doi is carried out by the usual vacuum evaporation method. After evacuating to a vacuum level of 1X10-8 Torr, metal Ti is deposited to a thickness of 0 using an electron gun evaporation source while the substrate temperature is maintained at about 300"0. For the second layer, which was deposited at 8 lumen, nitrogen gas was introduced as a reaction gas to 4 x 10-'Torr, and metal Tf was evaporated by an electron gun evaporation source while activated by plasma discharge. A TiN film with a thickness of 0.3 m was formed by rating.

第2図は本実施例反射鏡の分光特性のグラフである。こ
れにより、本実施例反射鏡が赤外線領域において90%
程度の良好な反射率を示し、長波長になるほど反射率が
高くなることが分る。
FIG. 2 is a graph of the spectral characteristics of the reflecting mirror of this example. As a result, the reflector of this embodiment has a 90% efficiency in the infrared region.
It can be seen that the reflectance is fairly good, and the longer the wavelength, the higher the reflectance.

同様にして、第1層目の膜の材質としてTi以外のCr
、Co、Ni等の金属及びTiを含むこれら金属の混合
体を用い、その膜厚を0 、8 pmとし、第2層目の
TiN膜の膜厚を0.3ルmとして反射鏡を作成したと
ころ、いづれも第2図と同様な分光特性を示し、赤外線
領域において90%程度の良好な反射率を得ることがで
きた。
Similarly, the material of the first layer film is Cr other than Ti.
A reflecting mirror was created using metals such as , Co, Ni, and a mixture of these metals including Ti, with a film thickness of 0.8 pm, and a second layer TiN film thickness of 0.3 m. As a result, all of them showed the same spectral characteristics as shown in FIG. 2, and a good reflectance of about 90% in the infrared region could be obtained.

vJ2層目のTiN11口3は化学的安定性及び#摩耗
性が優れているため、本発明反射鏡は過酷な条件下にお
いても使用することができる。
Since the TiN11 port 3 of the second layer of VJ has excellent chemical stability and wear resistance, the reflective mirror of the present invention can be used even under severe conditions.

本発明の反射鏡においては、第1層目の金属膜には真空
蒸着法により形成した場合引っ張り応力が存在し、一方
第2層目のTiN1lにはイオンブレーティングまたは
スパッタリングにより形成した場合圧縮応力が存在する
ので、第1層目の膜の膜厚と第2層目の膜のm厚とを適
宜設定することにより膜全体としての内部応力を小さく
することができ、これにより反射鏡の面精度低下を防止
する効果がある。このためには、TiN膜の内部応力が
金属膜の内部応力の数倍の大きさがあることを考慮し、
本発明の反射鏡においては、第1層目の膜の膜厚と第2
層目の膜の膜厚との間には工≦(dt /d2 )≦l
O の関係があるのが好ましい。
In the reflective mirror of the present invention, the first layer of metal film has tensile stress when formed by vacuum evaporation, while the second layer of TiN1l has compressive stress when formed by ion blasting or sputtering. Therefore, by appropriately setting the film thickness of the first layer film and the m thickness of the second layer film, it is possible to reduce the internal stress of the film as a whole. This has the effect of preventing a decrease in accuracy. For this purpose, it is necessary to take into account that the internal stress of the TiN film is several times larger than the internal stress of the metal film.
In the reflective mirror of the present invention, the film thickness of the first layer and the second layer are
The difference between the film thickness of the layer and the film thickness is ≦(dt/d2)≦l
It is preferable that there is a relationship of O.

[発明の効果] 以上の様な本発明によれば、耐摩耗性及び化学的安定性
等の耐久性が良好で且つ光学的性能の良好な赤外反射鏡
が提供される。
[Effects of the Invention] According to the present invention as described above, an infrared reflecting mirror having good durability such as abrasion resistance and chemical stability and good optical performance is provided.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の赤外反射鏡の断面図であり。 第2図はその分光特性のグラフである。 1・・・基板   2・・・第1層目の膜3・・・第2
!J目のTiN膜
FIG. 1 is a sectional view of an infrared reflecting mirror of the present invention. FIG. 2 is a graph of its spectral characteristics. 1... Substrate 2... First layer film 3... Second
! J-th TiN film

Claims (2)

【特許請求の範囲】[Claims] (1)基板上にCr、Ti、Co及びNiのうちの1つ
又はこれらの混合体からなる第1層目の膜が形成されて
おり、該第2層目の膜の上にTiNからなる第2層目の
膜が形成されていることを特徴とする、高耐久性赤外反
射鏡。
(1) A first layer film made of one of Cr, Ti, Co, and Ni or a mixture thereof is formed on the substrate, and a first layer film made of TiN is formed on the second layer film. A highly durable infrared reflecting mirror characterized by having a second layer film formed thereon.
(2)第1層目の膜の膜厚d_1と第2層目の膜の膜厚
d_2との間に1≦(d_1/d_2)≦10の関係が
ある、第1項の高耐久性赤外反射鏡。
(2) Highly durable red according to item 1, where there is a relationship of 1≦(d_1/d_2)≦10 between the film thickness d_1 of the first layer film and the film thickness d_2 of the second layer film. External reflector.
JP59176756A 1984-08-27 1984-08-27 High durability infrared reflector Expired - Lifetime JPH0685004B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59176756A JPH0685004B2 (en) 1984-08-27 1984-08-27 High durability infrared reflector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59176756A JPH0685004B2 (en) 1984-08-27 1984-08-27 High durability infrared reflector

Publications (2)

Publication Number Publication Date
JPS6155603A true JPS6155603A (en) 1986-03-20
JPH0685004B2 JPH0685004B2 (en) 1994-10-26

Family

ID=16019260

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59176756A Expired - Lifetime JPH0685004B2 (en) 1984-08-27 1984-08-27 High durability infrared reflector

Country Status (1)

Country Link
JP (1) JPH0685004B2 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62240904A (en) * 1986-04-14 1987-10-21 Hitachi Terekomu Technol:Kk Light condensing device
US5085926A (en) * 1989-02-27 1992-02-04 Central Glass Company, Limited Neat reflecting glass with multilayer coating
WO1992005951A1 (en) * 1990-09-27 1992-04-16 Diamonex, Incorporated Abrasion wear resistant coated substrate product
WO1992006843A1 (en) * 1990-10-18 1992-04-30 Diamonex, Incorporated Abrasion wear resistant polymeric substrate product
FR2679064A1 (en) * 1991-07-10 1993-01-15 Philips Electronique Lab Neutron device including a multilayer mirror
US5527596A (en) * 1990-09-27 1996-06-18 Diamonex, Incorporated Abrasion wear resistant coated substrate product
US5637353A (en) * 1990-09-27 1997-06-10 Monsanto Company Abrasion wear resistant coated substrate product
US6707610B1 (en) * 2002-09-20 2004-03-16 Huper Optik International Pte Ltd Reducing the susceptibility of titanium nitride optical layers to crack

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54123043A (en) * 1978-01-18 1979-09-25 Heat Mirror Ass Longgwave infrared ray reflector

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54123043A (en) * 1978-01-18 1979-09-25 Heat Mirror Ass Longgwave infrared ray reflector

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62240904A (en) * 1986-04-14 1987-10-21 Hitachi Terekomu Technol:Kk Light condensing device
US5085926A (en) * 1989-02-27 1992-02-04 Central Glass Company, Limited Neat reflecting glass with multilayer coating
US5635245A (en) * 1990-09-27 1997-06-03 Monsanto Company Process of making abrasion wear resistant coated substrate product
WO1992005951A1 (en) * 1990-09-27 1992-04-16 Diamonex, Incorporated Abrasion wear resistant coated substrate product
US5135808A (en) * 1990-09-27 1992-08-04 Diamonex, Incorporated Abrasion wear resistant coated substrate product
US5844225A (en) * 1990-09-27 1998-12-01 Monsanto Company Abrasion wear resistant coated substrate product
US5637353A (en) * 1990-09-27 1997-06-10 Monsanto Company Abrasion wear resistant coated substrate product
US5527596A (en) * 1990-09-27 1996-06-18 Diamonex, Incorporated Abrasion wear resistant coated substrate product
US5190807A (en) * 1990-10-18 1993-03-02 Diamonex, Incorporated Abrasion wear resistant polymeric substrate product
WO1992006843A1 (en) * 1990-10-18 1992-04-30 Diamonex, Incorporated Abrasion wear resistant polymeric substrate product
FR2679064A1 (en) * 1991-07-10 1993-01-15 Philips Electronique Lab Neutron device including a multilayer mirror
US6707610B1 (en) * 2002-09-20 2004-03-16 Huper Optik International Pte Ltd Reducing the susceptibility of titanium nitride optical layers to crack
WO2004027465A1 (en) 2002-09-20 2004-04-01 Southwall Technologies, Inc. Reducing the susceptibility of titanium nitride optical layers to crack
EP1546771A1 (en) * 2002-09-20 2005-06-29 Huper Optik International Pte. Ltd. Reducing the susceptibility of titanium nitride optical layers to crack
JP2006500624A (en) * 2002-09-20 2006-01-05 サウスウォール・テクノロジーズ・インコーポレイテッド Reducing the vulnerability of titanium nitride to cracking
EP1546771A4 (en) * 2002-09-20 2009-11-11 Huper Optik Internat Pte Ltd Reducing the susceptibility of titanium nitride optical layers to crack
JP4794857B2 (en) * 2002-09-20 2011-10-19 ヒューパー オプティク インターナショナル プライベート リミテッド Reducing the vulnerability of titanium nitride to cracking

Also Published As

Publication number Publication date
JPH0685004B2 (en) 1994-10-26

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