JPS6148647U - - Google Patents
Info
- Publication number
- JPS6148647U JPS6148647U JP13228784U JP13228784U JPS6148647U JP S6148647 U JPS6148647 U JP S6148647U JP 13228784 U JP13228784 U JP 13228784U JP 13228784 U JP13228784 U JP 13228784U JP S6148647 U JPS6148647 U JP S6148647U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- sample holder
- electron beam
- holding member
- bearing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010894 electron beam technology Methods 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984132287U JPH0310603Y2 (US07922777-20110412-C00004.png) | 1984-08-31 | 1984-08-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984132287U JPH0310603Y2 (US07922777-20110412-C00004.png) | 1984-08-31 | 1984-08-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6148647U true JPS6148647U (US07922777-20110412-C00004.png) | 1986-04-01 |
| JPH0310603Y2 JPH0310603Y2 (US07922777-20110412-C00004.png) | 1991-03-15 |
Family
ID=30690854
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1984132287U Expired JPH0310603Y2 (US07922777-20110412-C00004.png) | 1984-08-31 | 1984-08-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0310603Y2 (US07922777-20110412-C00004.png) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02181351A (ja) * | 1989-01-06 | 1990-07-16 | Hitachi Ltd | 電子顕微鏡用バルク試料ホールダ |
| JP2005522833A (ja) * | 2002-04-08 | 2005-07-28 | イー エイ フィシオネ インストルメンツ インコーポレーテッド | 試料保持装置 |
| EP2824448A1 (en) * | 2013-07-08 | 2015-01-14 | Bruker Nano GmbH | Sample holder for electron backscatter diffraction |
| EP3699948A1 (en) * | 2019-02-21 | 2020-08-26 | FEI Company | Sample holder for a charged particle microscope |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5024072A (US07922777-20110412-C00004.png) * | 1973-07-04 | 1975-03-14 | ||
| JPS52126744U (US07922777-20110412-C00004.png) * | 1976-03-24 | 1977-09-27 | ||
| JPS54140874A (en) * | 1978-04-24 | 1979-11-01 | Jeol Ltd | Sample holder |
-
1984
- 1984-08-31 JP JP1984132287U patent/JPH0310603Y2/ja not_active Expired
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5024072A (US07922777-20110412-C00004.png) * | 1973-07-04 | 1975-03-14 | ||
| JPS52126744U (US07922777-20110412-C00004.png) * | 1976-03-24 | 1977-09-27 | ||
| JPS54140874A (en) * | 1978-04-24 | 1979-11-01 | Jeol Ltd | Sample holder |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02181351A (ja) * | 1989-01-06 | 1990-07-16 | Hitachi Ltd | 電子顕微鏡用バルク試料ホールダ |
| JP2005522833A (ja) * | 2002-04-08 | 2005-07-28 | イー エイ フィシオネ インストルメンツ インコーポレーテッド | 試料保持装置 |
| EP2824448A1 (en) * | 2013-07-08 | 2015-01-14 | Bruker Nano GmbH | Sample holder for electron backscatter diffraction |
| EP3699948A1 (en) * | 2019-02-21 | 2020-08-26 | FEI Company | Sample holder for a charged particle microscope |
| CN111599662A (zh) * | 2019-02-21 | 2020-08-28 | Fei 公司 | 用于带电粒子显微镜的样品保持器 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0310603Y2 (US07922777-20110412-C00004.png) | 1991-03-15 |
