JPS6148341A - X-ray tomographic apparatus - Google Patents

X-ray tomographic apparatus

Info

Publication number
JPS6148341A
JPS6148341A JP59171802A JP17180284A JPS6148341A JP S6148341 A JPS6148341 A JP S6148341A JP 59171802 A JP59171802 A JP 59171802A JP 17180284 A JP17180284 A JP 17180284A JP S6148341 A JPS6148341 A JP S6148341A
Authority
JP
Japan
Prior art keywords
ray
sensor array
dimensional
inspected
ray sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59171802A
Other languages
Japanese (ja)
Inventor
博司 筒井
末喜 馬場
大森 康以知
理 山本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP59171802A priority Critical patent/JPS6148341A/en
Publication of JPS6148341A publication Critical patent/JPS6148341A/en
Pending legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 産業上の利用分野 本発明はX線センサアレイを用いたX線断層撮影装置に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to an X-ray tomography apparatus using an X-ray sensor array.

従来例の構成とその問題点 従来から)5J診断に用いられるX線断層撮影、いわゆ
るブツキー撮影は、ある特定平面を中心に、X線発生器
とX線フィルムを相互に移動しながら撮影し、被検査体
中の特定平面の像のみをX線フィルム上に像として写し
、他の部分を全くぼかしてしまう撮影方法である。この
方法は、特定平面上での像の”ぼけ″を積極的に利用す
る方法であり、X線フィルム面上に面情報を得る方法で
ある。
Conventional configuration and its problems Traditionally) X-ray tomography used for 5J diagnosis, so-called Butsky imaging, takes images while moving an X-ray generator and an X-ray film relative to each other around a specific plane. This is a photographing method in which only the image of a specific plane in the object to be inspected is transferred onto the X-ray film, and the other parts are completely blurred. This method actively utilizes the "blur" of an image on a specific plane, and is a method for obtaining surface information on the X-ray film surface.

ゆえにX線センサが面センサである場合にはX線断層撮
影を容易に行なうことができるが、X線センサが一次元
X線センサアレイの場合には、上記と同じ原理を用いて
X線断層撮影を行なうことができない。
Therefore, if the X-ray sensor is a surface sensor, X-ray tomography can be easily performed, but if the X-ray sensor is a one-dimensional X-ray sensor array, X-ray tomography can be performed using the same principle as above. Unable to take pictures.

発明の目的 本発明は一次元X線センサアレイを用いてX線断層撮影
ができるX線断層撮影装置を提供することを目的とする
OBJECTS OF THE INVENTION An object of the present invention is to provide an X-ray tomography apparatus capable of performing X-ray tomography using a one-dimensional X-ray sensor array.

発明の構成 上記目的を達成するために、本発明のXt9断層装置は
、ファンビームX線を発生するXt9発生器と、−次元
X線センサアレイを備え、−次元X線センサアレイに平
行でファンビームX線の照射平面内に存在する回転軸を
中心に、X線発生器と一次元XIセンサアレイを回転し
、かつ回転軸が被検査体内部を通過するように回転軸と
被検査体を相対移動させることにより、回転141+1
+が被検査体内部を通過した平面の断層像を得るように
したものである。
Structure of the Invention In order to achieve the above object, the Xt9 tomography apparatus of the present invention includes an Xt9 generator that generates fan beam X-rays, and a -dimensional X-ray sensor array, and a The X-ray generator and one-dimensional XI sensor array are rotated around a rotation axis that lies within the irradiation plane of the X-ray beam, and the rotation axis and the object to be inspected are aligned so that the rotation axis passes through the inside of the object to be inspected. By relatively moving, rotation 141+1
This is to obtain a tomographic image of a plane in which + passes through the inside of the object to be inspected.

実施例の説明 以下、本発明の実施例を図面に基いて説明する。Description of examples Embodiments of the present invention will be described below with reference to the drawings.

第1図は本発明の一実施例におけるX線断層撮影装置の
構成図である。X線発生器1から発生するファンビーム
2は一次元X線センサアレイ3により検出される。X線
発生器1と一次元X線センサアレイ3はアーム4により
互いに固定され、回転軸5を中心に相対的に円弧状に回
転運動する。X線照射および回転運動は、Xインコント
ローラ9により、X線制御器7および回転運動制御器6
を通して制御される。回転運動中に被検査体13を回転
軸5を横切るように移動させ、その時の一次元センサア
レイ3からのデータを、データ伝送部8、メインコント
ローラ9を通して、演算処理部1Qにより画像処理をし
だ後・・−トコビー11またはディスプレイ12により
、回転軸が被検査体を横切った平面の断層像を見ること
ができる。
FIG. 1 is a configuration diagram of an X-ray tomography apparatus according to an embodiment of the present invention. A fan beam 2 generated from an X-ray generator 1 is detected by a one-dimensional X-ray sensor array 3. The X-ray generator 1 and the one-dimensional X-ray sensor array 3 are fixed to each other by an arm 4, and rotate relative to each other in an arc shape around a rotation axis 5. X-ray irradiation and rotational movement are controlled by the X-in controller 9, which controls the X-ray controller 7 and the rotational movement controller 6.
controlled through. The object to be inspected 13 is moved across the rotation axis 5 during the rotational movement, and the data from the one-dimensional sensor array 3 at that time is transmitted through the data transmission section 8 and the main controller 9 and subjected to image processing by the arithmetic processing section 1Q. Afterwards...-The tocobee 11 or the display 12 allows viewing of a tomographic image of a plane in which the axis of rotation crosses the subject.

第2図は、断層撮影を行なうための原理図であり、回転
軸方向に見た図である。X線発生器21、ファンビーム
X線22、−次元X線センサアレイ23の関係を回転軸
25を中心に矢印に示すように円弧状に回転させ、それ
ぞれ21’、22’、23’の位置との間を運動させる
と、被検査体24を透過するX線像において、回転軸2
5近傍の投影像は常に一次元X線七ンサに受像されるが
、残りの部分は全てぼけることになる。すなわち回転軸
25を中心に回転させ、−次元X線センサアレイ23の
各々のセンサにより検出されるXi透過像出力を積分す
れば、ぼけだ像すなわち雑信号成分の上に、回転軸25
近傍の投影像が重畳された信号が得られる。
FIG. 2 is a principle diagram for performing tomography, and is a view seen in the direction of the rotation axis. The relationship between the X-ray generator 21, the fan beam X-ray 22, and the -dimensional X-ray sensor array 23 is rotated in an arc around the rotation axis 25 as shown by the arrow, and the positions 21', 22', and 23' are respectively set. When the axis of rotation 2 is moved between the
Projected images in the vicinity of 5 are always received by the one-dimensional X-ray scanner, but the remaining portions are all blurred. That is, if the Xi transmission image output detected by each sensor of the -dimensional X-ray sensor array 23 is rotated around the rotation axis 25 and integrated, the rotation axis 25 will appear on the blurred image, that is, the noise signal component.
A signal in which neighboring projection images are superimposed is obtained.

第2図に示す原理を立体的に示した斜視図が第3図であ
る。第2図と同じ考え方により、X線発生器21を21
′の位置に、−次元X線センサアレイ23を23′の位
置に、回転軸25を中心に円弧状に回転させ、−次元X
線センサアレイからの信号の積分値を得れば、その積分
値は雑信号に重畳した値ではあるが、被検査体24内の
回転軸25の近傍の透過像である。このような方法によ
り、−次元X線センサアレイを用いて、被検査体内部の
一次元情報を得ることができる。
FIG. 3 is a perspective view showing the principle shown in FIG. 2 in three dimensions. Using the same concept as in Figure 2, the X-ray generator 21 is
', the -dimensional X-ray sensor array 23 is rotated in an arc around the rotation axis 25 to the position 23', and the -dimensional
When the integral value of the signal from the line sensor array is obtained, the integral value is a value superimposed on the noise signal, but it is a transmitted image of the vicinity of the rotation axis 25 within the inspected object 24. With such a method, one-dimensional information inside the object to be inspected can be obtained using a -dimensional X-ray sensor array.

第4図に二次元断層像を得るため原理図を示す。FIG. 4 shows a diagram of the principle for obtaining two-dimensional tomographic images.

第4図aは第2図と原理的に全く同様の方法であり、X
線発生器21と一次元X線センサアレイ23を矢印の方
向に円弧状に回転し、−次元X線センサアレイの出力を
積分すれば被検査体24内の回転軸25近傍の透過像が
得られる。次に第4図すに示すように、被検査体内で回
転中心軸が25から26の位置に移動するように被検査
体を矢印方向に移動させた後、X線発生器21と一次元
X線センサアレイ23をそれぞれ2イ、23′の位置に
円弧状に回転し、−次元X線センサアレイの出力を積分
すれば回転軸26の近傍の透過像が得られる。このよう
にして、回転運動のくり返しを行ないつつ、被検査体を
移動させてゆけば、回転軸が被検査体を横切ってできる
平面の二次元断層透過像を得ることができる。被検査体
の移動は、回転運動の往および復ごと、または往復ごと
に一定距離移動させるか、まだは一定速度で移動させな
がら回転運動を行なわせればよい。
FIG. 4a is a method that is completely similar in principle to FIG. 2, and
By rotating the ray generator 21 and the one-dimensional X-ray sensor array 23 in an arc shape in the direction of the arrow and integrating the output of the -dimensional X-ray sensor array, a transmitted image of the area near the rotation axis 25 inside the object 24 to be inspected can be obtained. It will be done. Next, as shown in FIG. By rotating the ray sensor array 23 in an arc shape to positions 2a and 23', respectively, and integrating the output of the -dimensional X-ray sensor array, a transmitted image in the vicinity of the rotation axis 26 can be obtained. By moving the object to be inspected while repeating rotational movements in this manner, it is possible to obtain a two-dimensional tomographic image of a plane in which the axis of rotation crosses the object to be inspected. The object to be inspected may be moved by moving it a certain distance each time the rotational movement is forward and backward, or each time it is reciprocated, or by performing the rotational movement while moving at a constant speed.

ここで得られる二次元1ffT層透過像には、断層平面
の透過像が、周囲の゛′ボケ′″による雑信号成分に重
畳しているが、この°°ボケn Kよる雑信号成分は、
被検査体をファンビームX線が横切る体積を透過するX
線の平均値であるために、非常に低周波な空間周波数成
分しか含まれておらず、二次元断層透過像が有する空間
周波数成分領域とは非常に異なっている。ゆえに得られ
た画像の詳細は、二次元断層透過像として診断に十分使
用できるものである。
In the two-dimensional 1ffT layer transmission image obtained here, the transmission image of the tomographic plane is superimposed on the noise signal component due to the surrounding "blur", but the noise signal component due to this °°blur n K is
X transmitted through the volume where the fan beam X-ray traverses the inspected object
Since it is a line average value, it contains only very low spatial frequency components, and is very different from the spatial frequency component region of a two-dimensional tomographic transmission image. Therefore, the details of the obtained image can be sufficiently used for diagnosis as a two-dimensional tomographic transmission image.

この方法で得られる二次元断層透過像の画質にオイて、
空間分解能はファンビームX線のビームtp >よび−
次元X線センサアレイの各素子の太きさおよび被検査体
の移動量による。被検査体を透過するX線の散乱を少な
くするためK、ファンビームX線の幅ば/JSさい方が
良い。まだ、各素子の大きさも小さい方がよく、そのた
めに七ンッの選択に対しては、高密度アレイ化が可能な
(1)螢光体子フォトダイオードアレイ、あるいは(2
)半樽体検出器アレイが適している。高密度アレイ化を
従来の螢光板+】【線フィルムの空間分解能である3ラ
インベア/rnjnに対応して、センサ密度を6個/個
程度にし、ファンビームX線幅をセンサの大きさに合わ
せて細くすれば、従来の磁光板+X線フィルムを使用し
た断層撮影より良い画質を得ることができる。すなわち
、従来の螢光板+X線フィルムを使用した断層撮影には
、X線の面積勝射を行なうため、被検査体からの散乱線
による画質劣化が大きいが、ファンビームX線を使用す
れば、1、     散乱X線の影響を大きく低下でき
るからである。
Due to the quality of the two-dimensional tomographic images obtained by this method,
The spatial resolution is the fan beam X-ray beam tp > and -
It depends on the thickness of each element of the dimensional X-ray sensor array and the amount of movement of the object to be inspected. In order to reduce the scattering of the X-rays that pass through the object to be inspected, it is better to use a fan beam X-ray with a width of K or JS. However, the smaller the size of each element, the better, and for this reason, for the selection of 7.5 mm, there are two options: (1) phosphor photodiode array, which can be arrayed at high density, or (2)
) A half-barrel detector array is suitable. High-density array compared to conventional fluorescent plate By making it thinner, it is possible to obtain better image quality than conventional tomography using a magnetic plate and X-ray film. In other words, in conventional tomography using a fluorescent plate and X-ray film, the image quality deteriorates significantly due to scattered radiation from the object being inspected because the X-rays are focused on the area, but if fan beam X-rays are used, 1. This is because the influence of scattered X-rays can be greatly reduced.

また本発明の断層撮影の、実動方法として、X線発生器
と一次元X線センサアレイを互いに向い合うように保ち
ながら、回転運動ではなく一つの軸を中心に互いに相対
的な位置関係を保ちながら平行運動をさせることにより
、上述の方法で得られる効果と同様の効果を得ることも
可能である。
In addition, as a practical method of tomography according to the present invention, the X-ray generator and the one-dimensional X-ray sensor array are kept facing each other, and the relative positional relationship between them is controlled around one axis rather than rotationally. It is also possible to obtain the same effect as that obtained by the above method by performing parallel movement while maintaining the same.

発明の効果 以上のように本発明によれば、−次元X線センサアレイ
を用いて、従来のX線フィルムによる断層撮影(ブツキ
ー撮影)ができ、従来の断層撮影に比べ、X線散乱によ
る悪影響の少ない断層撮影が可能である。また、本発明
によれば、−次元X線センサアレイによりX線強度を電
気信号に変換し画像処理を行なうため、X線フィルムで
は得られない各種処理をほどこした画像を得ることがで
きる。また、得られる断層面を縦方向に重ねることによ
り、三次元断層情報を得ることも可能である0
Effects of the Invention As described above, according to the present invention, it is possible to perform tomography (Butsky imaging) using conventional X-ray film using a -dimensional X-ray sensor array, and compared to conventional tomography, there is no adverse effect due to X-ray scattering. It is possible to perform tomography with less turbulence. Furthermore, according to the present invention, since the -dimensional X-ray sensor array converts X-ray intensity into electrical signals and performs image processing, it is possible to obtain images that have been subjected to various types of processing that cannot be obtained with X-ray film. It is also possible to obtain three-dimensional tomographic information by overlapping the obtained tomographic planes in the vertical direction.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のX線断層撮影装置の構成図、第2図は
断層撮影を行なうだめの原理図、第3図は第2図の斜視
図、第4図は二次元断層像を得るだめの原理図である。 1.21・・・・・・X線発生器、2,22・・・・・
・ファンビームX、IJ、3.23・・・・・・−次元
X線センサアレイ、5,26・・・・・・回転軸、13
.24・・印・被検査体O 代理人の氏名 弁理士 中 尾 敏 男 ほか1名第1
Fig. 1 is a configuration diagram of the X-ray tomography apparatus of the present invention, Fig. 2 is a diagram of the principle of how to perform tomography, Fig. 3 is a perspective view of Fig. 2, and Fig. 4 is a two-dimensional tomographic image obtained. This is a diagram of the principle of failure. 1.21...X-ray generator, 2,22...
・Fan beam
.. 24...Seal/Subject O Name of agent: Patent attorney Toshio Nakao and 1 other person No. 1
figure

Claims (1)

【特許請求の範囲】[Claims] ファンビームX線を発生するX線発生器と、ファンビー
ムX線を検出するX線センサアレイを備え、上記X線セ
ンサアレイと平行で、かつ前記ファンビームX線内に存
在する回転軸を中心に、前記X線発生器と前記X線セン
サアレイを回転させ、その回転軸が被検査体内部を横切
るように被検査体と前記X線発生器および前記X線セン
サアレイを相対的に移動させることにより、回転軸が通
過した被検査体内部平面の断層像を得ることを特徴とす
るX線断層撮影装置。
an X-ray generator that generates fan beam X-rays; and an X-ray sensor array that detects the fan beam X-rays; the rotation axis is parallel to the X-ray sensor array and is located within the fan beam X-rays; The X-ray generator and the X-ray sensor array are rotated, and the object to be inspected, the X-ray generator, and the X-ray sensor array are moved relative to each other so that the axis of rotation crosses the inside of the object to be inspected. An X-ray tomography apparatus characterized by obtaining a tomographic image of an internal plane of an object to be inspected through which a rotation axis passes.
JP59171802A 1984-08-17 1984-08-17 X-ray tomographic apparatus Pending JPS6148341A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59171802A JPS6148341A (en) 1984-08-17 1984-08-17 X-ray tomographic apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59171802A JPS6148341A (en) 1984-08-17 1984-08-17 X-ray tomographic apparatus

Publications (1)

Publication Number Publication Date
JPS6148341A true JPS6148341A (en) 1986-03-10

Family

ID=15929982

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59171802A Pending JPS6148341A (en) 1984-08-17 1984-08-17 X-ray tomographic apparatus

Country Status (1)

Country Link
JP (1) JPS6148341A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5029286A (en) * 1973-07-20 1975-03-25
JPS5633905B2 (en) * 1977-03-24 1981-08-06

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5029286A (en) * 1973-07-20 1975-03-25
JPS5633905B2 (en) * 1977-03-24 1981-08-06

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