JPS6146474U - circuit tester - Google Patents

circuit tester

Info

Publication number
JPS6146474U
JPS6146474U JP13174184U JP13174184U JPS6146474U JP S6146474 U JPS6146474 U JP S6146474U JP 13174184 U JP13174184 U JP 13174184U JP 13174184 U JP13174184 U JP 13174184U JP S6146474 U JPS6146474 U JP S6146474U
Authority
JP
Japan
Prior art keywords
frequency
measurement
impedance
surgit
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13174184U
Other languages
Japanese (ja)
Inventor
節哉 奥
Original Assignee
関西日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 関西日本電気株式会社 filed Critical 関西日本電気株式会社
Priority to JP13174184U priority Critical patent/JPS6146474U/en
Publication of JPS6146474U publication Critical patent/JPS6146474U/en
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案に係るサーキットテスタのブロック図、
第2図は容量及びインダクタンスのインピーダンス測定
時あ周波数特性図、及び第3図は従来のインサーキット
テスタの測定装置の要部フロック図である。 20・・・・・・サーキットテスタ、21・・・・・・
可変周波電源、22・・・・・・第1インピーダンス手
段、23・・・・・・第2インピーダンス手段、24・
・・・・・第1測子、25・・・・・・第2測子、26
・・・・・・被測定用回路素子、27・・・・・・演算
増幅器、28・・・・・・共振周波測定器、29・・・
・・・測定制御回路。
Figure 1 is a block diagram of the circuit tester according to the present invention.
FIG. 2 is a frequency characteristic diagram during impedance measurement of capacitance and inductance, and FIG. 3 is a block diagram of the main parts of a conventional in-circuit tester measuring device. 20...Circuit tester, 21...
variable frequency power supply, 22...first impedance means, 23...second impedance means, 24.
...1st gage, 25...2nd girder, 26
...Circuit element to be measured, 27...Operation amplifier, 28...Resonance frequency measuring device, 29...
...Measurement control circuit.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 測定電圧を供給する可変周波電源、一端を互に結合した
第1及び第2インピーダンス手段、このインピーダンス
手段の各他端に接続した第1及び第2測子、及び出力電
圧を生成する演算増幅器を具備し、前記測千間に被測定
用回路素子を接続し未知インピーダンスのLCRを測定
するものにおいて、前記電源はその上限周波数をlMH
z以上に設定すると共に前記電源の周波数を可変しつつ
測定系の共振点を検出する共振周波測定器を付設して成
り、前記回路素子の未知インピーダンスを、前記共振周
波測定器で共振周波数を検出した後、この検出された共
振点から離れた周波数の測定電圧により測定することを
特徴としたサーギットテスタ。
A variable frequency power source for supplying a measurement voltage, first and second impedance means having one ends coupled to each other, first and second probes connected to each other end of the impedance means, and an operational amplifier for generating an output voltage. and for measuring an LCR of unknown impedance by connecting a circuit element to be measured between the measuring points, the power supply has an upper limit frequency of lMH.
z or more, and a resonant frequency measuring device is attached to detect the resonance point of the measurement system while varying the frequency of the power supply, and the unknown impedance of the circuit element is detected by the resonant frequency measuring device. The surgit tester is characterized in that the surgit tester performs measurement using a measurement voltage at a frequency far from the detected resonance point.
JP13174184U 1984-08-29 1984-08-29 circuit tester Pending JPS6146474U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13174184U JPS6146474U (en) 1984-08-29 1984-08-29 circuit tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13174184U JPS6146474U (en) 1984-08-29 1984-08-29 circuit tester

Publications (1)

Publication Number Publication Date
JPS6146474U true JPS6146474U (en) 1986-03-28

Family

ID=30690315

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13174184U Pending JPS6146474U (en) 1984-08-29 1984-08-29 circuit tester

Country Status (1)

Country Link
JP (1) JPS6146474U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102998531A (en) * 2011-09-12 2013-03-27 日本电产理德株式会社 Impedance measurement apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102998531A (en) * 2011-09-12 2013-03-27 日本电产理德株式会社 Impedance measurement apparatus

Similar Documents

Publication Publication Date Title
JPS6146474U (en) circuit tester
US4837501A (en) Apparatus for measuring differential impedances
JPS62165572U (en)
JPS58153369U (en) Measuring device using bridge
JPS601430Y2 (en) electric circuit
JPS61140985U (en)
JPH0641180Y2 (en) Amplifier electrical characteristics measuring device
JPS6488144A (en) Humidity measuring instrument
JPS61140984U (en)
JPS6262979U (en)
JPS60134148U (en) Hardened concrete cell structure measuring device
JPS60231178A (en) Impedance measuring appratus
JPS5920166U (en) Current-voltage conversion circuit of circuit constant measuring instrument
SU1384930A1 (en) Eddy-current thickness gauge for measuring dielectric coatings in electrically-conducting base
SU1539704A1 (en) Device for measuring frequency of natural oscillations of electrodynamic or magnetoelectric transducer
JPS59154678U (en) semiconductor measuring instruments
JPS63148863U (en)
JPS61205083U (en)
JPS58175416U (en) measuring device
JPS6146480U (en) Partial discharge measuring device
JPS6329776U (en)
JPS6321874U (en)
JPS6197772U (en)
JPS58158380U (en) Ultrasonic moving object detector
JPS6098072U (en) Internal resistance measuring device