JPS6146111A - Inspecting system of relay - Google Patents

Inspecting system of relay

Info

Publication number
JPS6146111A
JPS6146111A JP59165055A JP16505584A JPS6146111A JP S6146111 A JPS6146111 A JP S6146111A JP 59165055 A JP59165055 A JP 59165055A JP 16505584 A JP16505584 A JP 16505584A JP S6146111 A JPS6146111 A JP S6146111A
Authority
JP
Japan
Prior art keywords
circuit
inspection
filter
output
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59165055A
Other languages
Japanese (ja)
Other versions
JPH0572166B2 (en
Inventor
宮野 正
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meidensha Electric Manufacturing Co Ltd
Original Assignee
Meidensha Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meidensha Electric Manufacturing Co Ltd filed Critical Meidensha Electric Manufacturing Co Ltd
Priority to JP59165055A priority Critical patent/JPS6146111A/en
Publication of JPS6146111A publication Critical patent/JPS6146111A/en
Publication of JPH0572166B2 publication Critical patent/JPH0572166B2/ja
Granted legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は静止化オフセットモー形継電器の点検方式に関
する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a method for inspecting stationary offset motor relays.

従来の技術 オフセットモー形継電器は、距離測定、方向判別、脱調
検出、界磁喪失検出等に使用され、第2図に示すような
動作インピーダンス特性を持つ。
A conventional offset Maw type relay is used for distance measurement, direction determination, step-out detection, field loss detection, etc., and has operating impedance characteristics as shown in FIG.

同図において、動作領域Aは界磁喪失継電器の特性を示
し、θlが一90度固定、オフセット値X1とリーチ整
定値X2が各々単独に整定される。動作領域Bは領域へ
のオフセット値をX3.jj−チをX4 Vc変えた場
合を示し、動作領域Cはθlを02に置き換えてオフセ
ット値Xs 、  リーチX6にした距離継電器特性を
示す。
In the figure, operating region A shows the characteristics of a field loss relay, in which θl is fixed at 90 degrees, and offset value X1 and reach setting value X2 are each independently set. For operating region B, the offset value to the region is set to X3. The case where the jj-ch is changed by X4 Vc is shown, and the operating region C shows the distance relay characteristics where θl is replaced with 02, the offset value is Xs, and the reach is set to X6.

こ°うした特性の継電器において、その静止化に伴って
点検回路を具備するものが普及している。
Among relays with such characteristics, those equipped with a check circuit are becoming popular as relays become stationary.

第3図は従来の点検機能付き界磁喪失継電器のブロック
図を示す。保護対象からの検出入力INI 。
FIG. 3 shows a block diagram of a conventional field loss relay with inspection function. Detection input INI from protected target.

IN2の一方が比較基準で他方が比較入力とされ、これ
ら人力INs 、  IN2は夫々フィルタ1,2t−
通して波形処理される。ここで、フィルタ1,2は、バ
ンドパスフィルタやローパスフィルタ”g ラK )を
移相器等にされ、保護機能によって使用する回路要素は
異なる。フィルタ1,2を経た信号は加減算回路3,4
で互いに加算、減算が行なわれかつ演算結果として矩形
波を得る整形回路を通される。
One of IN2 is used as a comparison reference and the other is used as a comparison input, and these manual INs and IN2 are used as filters 1 and 2t-, respectively.
The waveform is processed through the Here, the filters 1 and 2 are band-pass filters or low-pass filters (gRAK) as phase shifters, etc., and the circuit elements used differ depending on the protection function. 4
Then, the signals are added and subtracted from each other and passed through a shaping circuit that obtains a rectangular wave as the calculation result.

両回路3,4の出力はアンド回路5で論理積が取られ、
この出力は位相比較器6で整定位相との位相差が判定さ
れ、さらにはタイマを介して保護出力OUTが取り出さ
れる。位相比較器6は、アンド回路5の出力が1周期の
1/2時間でハイレベル(回路3,4の出力が共に同相
側)のときハイレベル出力を得、アンド回路5の出力が
常にローレベル(回路3,4の出力が逆相側)のときロ
ーレベル出力を得るように構成され、一般的にアンド回
路5の出力が1周期の1/4の時間でハイレベルのとき
が動作臨界となっており、その時間以上ハイレベルのと
きに動作するようにしている。
The outputs of both circuits 3 and 4 are ANDed by an AND circuit 5,
The phase difference between this output and the settling phase is determined by a phase comparator 6, and furthermore, a protection output OUT is taken out via a timer. The phase comparator 6 obtains a high level output when the output of the AND circuit 5 is at a high level for 1/2 time of one cycle (the outputs of circuits 3 and 4 are both on the same phase side), and the output of the AND circuit 5 is always low. It is configured to obtain a low level output when the output of the AND circuit 5 is at a high level for 1/4 of one period (the outputs of circuits 3 and 4 are on the opposite phase side), and the operation criticality is generally reached when the output of the AND circuit 5 is at a high level for 1/4 of one cycle. It is designed to operate when the level is high for more than that time.

点検回路7は、常時は補助リレー7Aを復帰させて入力
IN+ 、  IN2を夫々フィルタ1,2に印加させ
、二相の発振出力(点検信号)φ1.φ2をフィルタ1
,2への入力をしゃ断しておく。そして、点検時に補助
リレー7 A 19作させ、入力IN1.  IN2に
代えて発振出力φl、φ2をフィルタ1.2に印加させ
て回路1〜6の動作をチェックする。例えば、回路1〜
6の動作インピーダンス特性が第2図の領域Aとすれば
、発振出力φ1.φ2は領域Aの内側に相当する位相と
大鎗さを持った信号とする。
The inspection circuit 7 normally returns the auxiliary relay 7A to apply inputs IN+ and IN2 to the filters 1 and 2, respectively, and outputs two-phase oscillation outputs (inspection signals) φ1. Filter 1 for φ2
, 2 is cut off. Then, during inspection, auxiliary relay 7A19 is activated and input IN1. The operation of circuits 1 to 6 is checked by applying oscillation outputs φl and φ2 to filter 1.2 instead of IN2. For example, circuit 1~
If the operating impedance characteristic of φ1.6 is in region A in FIG. φ2 is a signal having a phase and sharpness corresponding to the inside of region A.

発明が解決しようとする問題点 従来の点検方式では、点検回路7としては対象継電器に
応じた点検信号を得るよ5回路構成される必要があって
継電器側々に異なる設計のものを必要とする。また、同
じ種類の継電器であってもその仕様、特性の変更に点検
回路側の変更も必要とし設計上や運用上に問題がある。
Problems to be Solved by the Invention In the conventional inspection system, the inspection circuit 7 needs to be composed of five circuits to obtain inspection signals depending on the target relay, and each relay requires a different design. . Furthermore, even if the relays are of the same type, changing the specifications and characteristics requires changing the inspection circuit, which poses problems in terms of design and operation.

例えば、オフセット設定値、リーチ設定値を保眼対象に
よって変更すると、第2図の特性人からBに変更される
ときに点検回路γの出力φ1.φ2の大きさ、位相を変
更する手間を要す。
For example, when the offset set value and reach set value are changed depending on the eye-keeping target, when the characteristic person in FIG. 2 is changed to B, the output φ1 of the inspection circuit γ. It takes effort to change the size and phase of φ2.

また、従来方式では、入力信号や点検信号は補助リレー
の機械接点を使用してしゃ断、投入するため、該接点の
接触不良の可能性から信頼性に問題がある。
In addition, in the conventional system, input signals and inspection signals are cut off and turned on using mechanical contacts of an auxiliary relay, so there is a problem in reliability due to the possibility of poor contact of the contacts.

問題点を解決するための手段と作用 本発明はフィルタと加減算回路以降の保護演算回路とを
個別に点検することを特像とし、フィルタにはダイオー
ドを介して点検時に入力信号よりも十分に高いレベルの
点検信号を印加してその入力を該点検信号に強制し、保
護演算回路にはダイオードを介して点検時にフィルタ出
力よりも十分に高いレベルでかつ前記点検信号を共通に
して印加してその入力を点検信号に強制し、フィルタの
出力は点検時にレベル比較回路で検出して該フィルタの
動作チェックをし、保護演算回路の動作はその保護出力
の発生でチェックすることを特徴とする。
Means and Effects for Solving Problems The present invention is characterized by individually inspecting the filter and the protection arithmetic circuit after the addition/subtraction circuit, and the filter has a diode connected to the filter so that the input signal is sufficiently higher than the input signal at the time of inspection. Apply a level inspection signal to force the input to the inspection signal, and apply the inspection signal in common to the protection calculation circuit at a level sufficiently higher than the filter output at the time of inspection through a diode. The filter is characterized in that the input is forced into a check signal, the output of the filter is detected by a level comparison circuit during inspection to check the operation of the filter, and the operation of the protection arithmetic circuit is checked by generation of the protection output.

実施例 第1図は本発明の一実施例を示す回路図であり、第3図
に示すものと同じものは同一符号で示す。
Embodiment FIG. 1 is a circuit diagram showing an embodiment of the present invention, and the same parts as shown in FIG. 3 are designated by the same reference numerals.

点検回路11は点検信号φ1t−ダイオード12.−1
3を介してフィルタ1,2に入力信号IN1. IN2
と共に印加し、さらに点検信号φ1をダイオード14を
介して加減算回路3,4のフィルタ1側入力に印加する
構成にされる。フィルタ1の出力は抵抗1st−介して
加減算回路3,4の入力にされると共にレベル比較器1
6の比較入力にされる。
The inspection circuit 11 has an inspection signal φ1t-diode 12. -1
Input signals IN1 . IN2
In addition, the inspection signal φ1 is applied to the filter 1 side inputs of the addition/subtraction circuits 3 and 4 via the diode 14. The output of the filter 1 is input to the adder/subtractor circuits 3 and 4 via the resistor 1st, and is also input to the level comparator 1.
6 is used as a comparison input.

フィルタ2の出力は加減算回路3,40入力とされると
共にレベル比較器17の比較入力にさ”れゐ。
The output of the filter 2 is input to the adder/subtractor circuits 3 and 40, and is also input to the comparison input of the level comparator 17.

レベル比較器16.17の出力はアンド回路IBの入力
にされ、このアンド回路1Bのゲート入力として点検回
路11の点検指令RDが与えられる。
The outputs of the level comparators 16 and 17 are input to an AND circuit IB, and the inspection command RD of the inspection circuit 11 is applied as a gate input to the AND circuit 1B.

この点検指令RDは論理インバーター9を介してアンド
回路IBの出力と共にオア回路200Å力にされ、オア
回路20の出力は位相比較器6の出力と共にアンド回路
21の入力にされて該アンド回路21の出力゛が保護出
力OUTにされる。
This inspection command RD is passed through the logic inverter 9 to the output of the AND circuit IB and output to the OR circuit 200A, and the output of the OR circuit 20 is input to the AND circuit 21 together with the output of the phase comparator 6. Output ゛ is made the protection output OUT.

ここで、点検回路11の点検指令RDは非点検時にロー
レベルにされてアンド回路18のゲートを閉じると共に
インバーター9を通してオア回路20にハイレベル出力
を得てアンド回路21のゲ−トを開〜・ておき、入力信
号IN!、  INzに対する位相比較器6からの保護
出力が得られるようにしている。また、点検回路11の
点検信号φ1は非点検時に入力信号IN1.  IN2
に較べて充分に負の電位にされてダイオード12,13
.14を非導通にして入力信号やフィルタ出力への作用
がしゃ断されている。
Here, the inspection command RD of the inspection circuit 11 is set to a low level during non-inspection to close the gate of the AND circuit 18, and a high level output is obtained to the OR circuit 20 through the inverter 9 to open the gate of the AND circuit 21.・Hold on, input signal IN! , INz from the phase comparator 6. In addition, the inspection signal φ1 of the inspection circuit 11 is input to the input signal IN1. IN2
The diodes 12 and 13 are at a sufficiently negative potential compared to
.. 14 is made non-conductive, and its effect on the input signal and filter output is cut off.

そして、点検時には指令RDがハイレベルにされてアン
ド回路18のゲートを開けておき、点検信号φ1は入力
信号INl、  lN2Oレベルに較べて充分に大きな
発振出力にしてフィルタ1,2及び加減算回路3,4へ
の入力を該点検信号の位相及びレベルに強制する。抵抗
15はダイオード14を通した点検信号がフィルタ1の
出力に電流を流すのを抑止すると共にフィルタ1の出力
に優先して加減算回路3,4に点検信号を印加させる。
Then, at the time of inspection, the command RD is set to high level to open the gate of the AND circuit 18, and the inspection signal φ1 is set to a sufficiently large oscillation output compared to the input signal INl, lN2O level to filters 1 and 2 and the addition/subtraction circuit 3. , 4 to the phase and level of the check signal. The resistor 15 prevents the check signal passed through the diode 14 from flowing a current to the output of the filter 1, and causes the check signal to be applied to the addition/subtraction circuits 3 and 4 in priority to the output of the filter 1.

従って、点検時にはフィルタ1,2の出力は点検信号φ
1に対するフィルタ出力になり加減算回路3,4の入力
も点検48号φlとフィルタ2の出力(φlK対するフ
ィルタ出力)になる。
Therefore, during inspection, the output of filters 1 and 2 is the inspection signal φ
1, and the inputs of the addition/subtraction circuits 3 and 4 also become the output of inspection No. 48 φl and the filter 2 (filter output for φlK).

レベル比較器16.17は、非点検時にはその出力がア
ンド回路18で抑止されており、点検時にはフィルタ1
,2の出力レベル(φtK対する出力レベル)が所定の
範囲内のときハイレベル出力を得、それよりも低レベル
又は高レベルのときはローレベル出力を得るいわゆるウ
ィンドコンパレータ動作をする。
The outputs of the level comparators 16 and 17 are suppressed by the AND circuit 18 during non-inspection, and the filter 1
, 2 (output level relative to φtK) is within a predetermined range, a high level output is obtained, and when the level is lower or higher than that, a low level output is obtained, so-called window comparator operation is performed.

従って、点検時にはフィルタ1,2の機能が共に正常で
あることをレベル比較器16.17とアンド回路18で
チェックし得、加減算回路3,4以降の位相比較器6ま
での保護演算回路の正常動作を点検信号φ、によって加
減算回路3.4に同相入力を与えることでアンド回路2
1の出力としてチェックすることができる。
Therefore, at the time of inspection, it is possible to check with the level comparators 16 and 17 and the AND circuit 18 whether the functions of filters 1 and 2 are both normal, and the protection calculation circuits from addition/subtraction circuits 3 and 4 to phase comparator 6 are normal. Check the operation of the AND circuit 2 by giving an in-phase input to the addition/subtraction circuit 3.4 using the signal φ.
It can be checked as the output of 1.

発明の効果 本発明によれば、点検回路の点検信号を入力信号に優先
してフィルタに入力し及び該フィルタ出力に優先して保
護演算回路に入力し、フィルタと保護演算回路を個別に
チェックするため、点検信号が1相分で済むし動作特性
のオフセットやリーチを変更した場合や異なる継電器に
も同じ点検信号で済む。また、点検信号の印加に機械接
点による切換えを不要にして信頼性の高い点検機能付き
継電器になる。
Effects of the Invention According to the present invention, the inspection signal of the inspection circuit is inputted into the filter with priority over the input signal, and inputted into the protection calculation circuit with priority over the output of the filter, and the filter and the protection calculation circuit are individually checked. Therefore, only one inspection signal is required for one phase, and the same inspection signal can be used even when the offset or reach of the operating characteristics is changed or for different relays. In addition, switching by mechanical contacts is not required to apply a check signal, resulting in a highly reliable relay with a check function.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示す回路図、第2図はオフ
セットモー形継電器の特性例を示す複素線図、第3図は
従来の点検機能付き継電器の回路図である。 1.2・・・フィルタ、3,4・・・加減算回路、6・
・・位相比較器、7.工1・・・点検回路、16.17
・・・レベル比較器。
FIG. 1 is a circuit diagram showing an embodiment of the present invention, FIG. 2 is a complex diagram showing an example of the characteristics of an offset Maw type relay, and FIG. 3 is a circuit diagram of a conventional relay with an inspection function. 1.2... Filter, 3, 4... Addition/subtraction circuit, 6.
...Phase comparator, 7. Engineering 1...Inspection circuit, 16.17
...Level comparator.

Claims (1)

【特許請求の範囲】[Claims] 複数の入力信号を夫々フィルタを通し、このフィルタ出
力を使って保護演算回路で保護演算する静止化オフセッ
トモー形継電器において、点検時に前記入力信号よりも
十分に高いレベルの点検信号をフィルタの入力として導
く第1のダイオード回路と、点検時に前記フィルタ出力
よりも十分に高いレベルで前記点検信号を前記保護演算
回路の入力として導く第2のダイオード回路と、点検時
に前記フィルタの出力レベルから該フィルタの動作チェ
ックをするレベル比較回路とを備え、フィルタと保護演
算回路の個別点検をすることを特徴とする継電器の点検
方式。
In a stationary offset mode type relay that passes multiple input signals through filters and uses the filter outputs to perform protection calculations in a protection calculation circuit, during inspection, a check signal with a level sufficiently higher than the input signal is used as input to the filter. a first diode circuit that guides the inspection signal as an input to the protection calculation circuit at a level sufficiently higher than the output of the filter during inspection; A relay inspection method characterized by being equipped with a level comparison circuit for checking operation and individually inspecting the filter and protection calculation circuit.
JP59165055A 1984-08-07 1984-08-07 Inspecting system of relay Granted JPS6146111A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59165055A JPS6146111A (en) 1984-08-07 1984-08-07 Inspecting system of relay

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59165055A JPS6146111A (en) 1984-08-07 1984-08-07 Inspecting system of relay

Publications (2)

Publication Number Publication Date
JPS6146111A true JPS6146111A (en) 1986-03-06
JPH0572166B2 JPH0572166B2 (en) 1993-10-08

Family

ID=15804983

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59165055A Granted JPS6146111A (en) 1984-08-07 1984-08-07 Inspecting system of relay

Country Status (1)

Country Link
JP (1) JPS6146111A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1077019C (en) * 1995-01-24 2002-01-02 东丽株式会社 Polyester product and process for producing the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57110019A (en) * 1980-12-24 1982-07-08 Hitachi Ltd Method of automatically inspecting digital protection relay unit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57110019A (en) * 1980-12-24 1982-07-08 Hitachi Ltd Method of automatically inspecting digital protection relay unit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1077019C (en) * 1995-01-24 2002-01-02 东丽株式会社 Polyester product and process for producing the same

Also Published As

Publication number Publication date
JPH0572166B2 (en) 1993-10-08

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