JPS6145897B2 - - Google Patents

Info

Publication number
JPS6145897B2
JPS6145897B2 JP54056154A JP5615479A JPS6145897B2 JP S6145897 B2 JPS6145897 B2 JP S6145897B2 JP 54056154 A JP54056154 A JP 54056154A JP 5615479 A JP5615479 A JP 5615479A JP S6145897 B2 JPS6145897 B2 JP S6145897B2
Authority
JP
Japan
Prior art keywords
flip
array
group
signal lines
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54056154A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55147832A (en
Inventor
Yoshihiro Kasuya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP5615479A priority Critical patent/JPS55147832A/ja
Publication of JPS55147832A publication Critical patent/JPS55147832A/ja
Publication of JPS6145897B2 publication Critical patent/JPS6145897B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Logic Circuits (AREA)
JP5615479A 1979-05-08 1979-05-08 Logical integrated circuit easy to check Granted JPS55147832A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5615479A JPS55147832A (en) 1979-05-08 1979-05-08 Logical integrated circuit easy to check

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5615479A JPS55147832A (en) 1979-05-08 1979-05-08 Logical integrated circuit easy to check

Publications (2)

Publication Number Publication Date
JPS55147832A JPS55147832A (en) 1980-11-18
JPS6145897B2 true JPS6145897B2 (OSRAM) 1986-10-11

Family

ID=13019169

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5615479A Granted JPS55147832A (en) 1979-05-08 1979-05-08 Logical integrated circuit easy to check

Country Status (1)

Country Link
JP (1) JPS55147832A (OSRAM)

Also Published As

Publication number Publication date
JPS55147832A (en) 1980-11-18

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