JPS6143584Y2 - - Google Patents

Info

Publication number
JPS6143584Y2
JPS6143584Y2 JP14280981U JP14280981U JPS6143584Y2 JP S6143584 Y2 JPS6143584 Y2 JP S6143584Y2 JP 14280981 U JP14280981 U JP 14280981U JP 14280981 U JP14280981 U JP 14280981U JP S6143584 Y2 JPS6143584 Y2 JP S6143584Y2
Authority
JP
Japan
Prior art keywords
gauge
inspected
pin
holes
parts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP14280981U
Other languages
Japanese (ja)
Other versions
JPS5848373U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14280981U priority Critical patent/JPS5848373U/en
Publication of JPS5848373U publication Critical patent/JPS5848373U/en
Application granted granted Critical
Publication of JPS6143584Y2 publication Critical patent/JPS6143584Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Sorting Of Articles (AREA)

Description

【考案の詳細な説明】 この考案は形状が比較的単純な部品の寸法検査
装置に関するものである。
[Detailed Description of the Invention] This invention relates to a dimensional inspection device for parts having relatively simple shapes.

従来、形状が円錐台形、球形などの比較的単純
な小部品の寸法検査を行つて、良品、不良品を選
別する場合、検査精度を高くすることは当然であ
るが、選別作業を高度に能率化するとともに自動
化することが要求されている。
Conventionally, when inspecting the dimensions of small parts with relatively simple shapes such as truncated cones and spheres to sort out good and defective parts, it is natural to improve inspection accuracy, but it is also important to make the sorting work highly efficient. There is a need for automation as well as automation.

この考案は前記要求を満足させるためになされ
たもので、ゲージ孔が形成された多数のゲージブ
ロツクを搬送装置によつて間欠搬送させ、ゲージ
孔に被検査部品を順次供給して、その嵌合状態を
判別装置で検出し、許容寸法内の被検査部品を自
動的に効率良く選別できる部品の寸法検査装置の
提供を目的とするものである。
This invention was made to satisfy the above requirements, and involves intermittently transporting a large number of gauge blocks with gauge holes formed therein using a conveying device, sequentially feeding parts to be inspected into the gauge holes, and checking their fit. It is an object of the present invention to provide a component dimension inspection device that detects the condition with a discrimination device and can automatically and efficiently select components to be inspected that are within allowable dimensions.

以下、この考案を図面に示す一実施例に基づい
て説明する。
This invention will be explained below based on an embodiment shown in the drawings.

第1図はこの考案をテーパ状の被検査部品の寸
法検査に適用したもので、図中符号1は搬送装置
である。この搬送装置1は駆動源2によつてベル
ト3を間欠搬送させるようになつており、ベルト
3には定ピツチでゲージブロツク4が多数設けら
れている。
FIG. 1 shows an application of this invention to the dimensional inspection of a tapered part to be inspected, and reference numeral 1 in the figure is a conveying device. This conveying device 1 is configured to intermittently convey a belt 3 by a drive source 2, and the belt 3 is provided with a large number of gauge blocks 4 at regular pitches.

このゲージブロツク4は、第2図に示すように
上ゲージ板5と下ゲージ板6とを重ね合せて一体
化したもので、上下ゲージ板5,6には許容最大
径未満の外径を持つ被検査部品(以下ピンと略
す)7を通過させる上ゲージ孔5aと、許容最小
径未満の外径を持つピン7を通過させ、かつ上ゲ
ージ孔5aと同軸線を有する下ゲージ孔6aが設
けられている。この両ゲージ孔5a,6aは1個
のゲージブロツク4に1組または2組以上設けら
れる。
This gauge block 4 is made by overlapping and integrating an upper gauge plate 5 and a lower gauge plate 6, as shown in FIG. An upper gauge hole 5a through which the inspected part (hereinafter referred to as pin) 7 passes, and a lower gauge hole 6a through which the pin 7 having an outer diameter smaller than the allowable minimum diameter passes, and which is coaxial with the upper gauge hole 5a are provided. ing. One or more sets of both gauge holes 5a, 6a are provided in one gauge block 4.

そして、搬送装置1の搬送方向の上流(第1図
において左側)には、ベルト3に支持されたゲー
ジブロツク4に整列状態のピン7を、搬送装置1
の間欠搬送に連動して供給するための部品供給装
置8が設けられている。この部品供給装置8は、
ピン7を整列供給部9から外径の小さい方を下方
にして、パイプ10を介してシヤツタ11に送り
込み、シヤツタ11の開閉によつてピン7を上ゲ
ージ孔5aに順次供給するもので、第1シヤツタ
板11aおよび第2シヤツタ板11bが搬送装置
1と連動操作せしめられるようになつている。
The pins 7 aligned with the gauge block 4 supported by the belt 3 are placed upstream of the conveying device 1 in the conveying direction (on the left side in FIG. 1).
A component supply device 8 is provided for supplying parts in conjunction with intermittent conveyance. This parts supply device 8 is
The pins 7 are fed into the shutter 11 through the pipe 10 with the side with the smaller outer diameter facing downward from the alignment supply section 9, and the pins 7 are sequentially fed into the upper gauge hole 5a by opening and closing the shutter 11. The first shutter plate 11a and the second shutter plate 11b are operated in conjunction with the conveying device 1.

この部品供給装置8から搬送方向に離れた位置
には、ゲージブロツク4にピン7が嵌合支持され
ているかどうかを確認するための供給確認装置1
2が設けられている。この供給確認装置12は、
光学素子、近接スイツチなどのようにピン7に無
接触状態で両ゲージ孔5a,6aにピン7が嵌合
支持されているかどうかを検査し、嵌合支持され
ていない状態が連続(例えば5回以上連続)した
場合に、警報を発生し必要に応じて搬送装置1を
停止させるものである。
At a position away from the component supply device 8 in the conveyance direction, a supply confirmation device 1 is provided for confirming whether the pin 7 is fitted and supported on the gauge block 4.
2 is provided. This supply confirmation device 12 is
Inspect whether the pin 7 is fitted and supported in both gauge holes 5a and 6a without contacting the pin 7, such as an optical element or a proximity switch, and if the pin 7 is not fitted and supported continuously (for example, 5 times). (Continuously), an alarm is generated and the transport device 1 is stopped as necessary.

また、供給確認装置12から搬送方向に離れた
位置には、両ゲージ孔5a,6aに支持されたピ
ン7の高さを検出して、ピン7の外径寸法の良否
を判別し、判別信号を出力する判別装置13が設
けられている。この判別装置13には、第3図に
示すように、シリンダ14内にばね15によつて
下方へ付勢されて両ゲージ孔5a,6a内のピン
7の上端面位置を検出する棒状の検出片16が設
けられるとともに、この検出片16の上端部にエ
アシリンダ機構などの操作手段によつて検出片1
6を常時上方へ引き上げておく操作片17が設け
られ、この操作片17の付近にはその位置を検出
してピン7の外径寸法の良否信号を出力する光学
センサ18A,18B,18Cが設けられる。ま
た、この判別装置13の下方には検出片16など
で落とされた外径が許容寸法未満のピン7を集め
る小寸法品収集トレー19が設けられており、こ
の小寸法収集トレー19は必要に応じて部品供給
装置8の下方まで延長される。
In addition, at a position away from the supply confirmation device 12 in the conveying direction, the height of the pin 7 supported by both gauge holes 5a and 6a is detected, and the outer diameter of the pin 7 is judged to be good or bad, and a judgment signal is sent. A discriminating device 13 is provided that outputs the following. As shown in FIG. 3, this discrimination device 13 includes a rod-shaped detector that is biased downward by a spring 15 in a cylinder 14 and detects the upper end surface position of the pin 7 in both gauge holes 5a, 6a. A piece 16 is provided at the upper end of the detection piece 16, and the detection piece 1 is operated by an operating means such as an air cylinder mechanism.
An operating piece 17 is provided to keep the pin 6 upward at all times, and optical sensors 18A, 18B, and 18C are provided near the operating piece 17 to detect the position and output a pass/fail signal regarding the outer diameter of the pin 7. It will be done. Further, a small-sized item collection tray 19 is provided below this discrimination device 13 to collect pins 7 dropped by the detection piece 16 and the like and whose outer diameter is less than the allowable size. Accordingly, it is extended below the component supply device 8.

また、判別装置13から搬送方向に離れた位置
には、判別装置13の寸法不良信号に連動して操
作せしめられる不良品排出装置20が設けられ、
この不良品排出装置20には、両上ゲージ孔5
a,6aに下方から挿入して外径が許容寸法を超
えるピン7を排除するピン突出片21が設けら
れ、このピン突出片21の操作は判別装置13の
寸法不良信号発生から1ピツチ搬送分遅れてエア
シリンダ機構などによつて行われる。この不良品
排出装置20のピン突出片21の上方にはピン7
を強制的に吹き飛ばすブロア22が設けられ、不
良品排出装置20の下方には落とされたピン7を
集める大寸法法品収集トレー19が設けられてい
る。
Further, a defective product discharge device 20 is provided at a position away from the discrimination device 13 in the conveying direction, and is operated in conjunction with a dimensional defect signal from the discrimination device 13.
This defective product discharge device 20 includes both upper gauge holes 5.
A pin protruding piece 21 is provided to insert the pin 7 from below into the pins a and 6a and remove the pin 7 whose outer diameter exceeds the allowable dimension. This is carried out after a delay using an air cylinder mechanism or the like. A pin 7 is provided above the pin projecting piece 21 of this defective product ejecting device 20.
A blower 22 for forcibly blowing away the pins 7 is provided, and a large size product collection tray 19 is provided below the defective product discharge device 20 to collect the dropped pins 7.

さらに、不良品排出装置20から搬送方向に離
れたベルト3の反転部付近には、寸法が適正であ
るピン7を取り出す良品収集装置24が設けられ
る。この良品収集装置24には、ベルト3の反転
部においてゲージブロツク4の上に被せてピン7
が下向きになるまで支持する押付ベルト25と、
この押付ベルト25をベルト3の反転部形状に合
わせた円弧状にかつ走行自在に支持する多数のロ
ーラ26,……と、押付ベルト25の下方に配さ
れゲージブロツク4から落下するピン7を回収す
る良品収集トレー27とが設けられている。ま
た、この良品収集装置24には両ゲージ孔5a,
6aからピン7を分離し易くするために前述した
ブロア22あるいはピン突出片21などが適宜に
設けられる。
Furthermore, near the reversing portion of the belt 3 that is away from the defective product discharging device 20 in the conveying direction, a non-defective product collecting device 24 is provided for taking out pins 7 having appropriate dimensions. This good product collecting device 24 includes a pin 7 that is placed over the gauge block 4 at the inverted portion of the belt 3.
a pressing belt 25 that supports until it faces downward;
A large number of rollers 26 supporting this pressing belt 25 in an arc shape matching the shape of the inverted portion of the belt 3 so that it can run freely, and collecting the pins 7 that fall from the gauge block 4 arranged below the pressing belt 25. A good product collection tray 27 is provided. In addition, this non-defective product collecting device 24 includes both gauge holes 5a,
In order to facilitate separation of the pin 7 from the pin 6a, the above-mentioned blower 22 or pin projecting piece 21 is provided as appropriate.

なお、第1図において符号28で示すものは位
置決め装置でベルト3の側部などに形成された孔
または溝などを検出して間欠搬送のピツチのずれ
の有無を判別するものである。
In FIG. 1, the reference numeral 28 is a positioning device that detects holes or grooves formed on the sides of the belt 3 to determine whether there is a pitch shift during intermittent conveyance.

また、ベルト3とゲージブロツク4との関係に
ついて補足すると、両ゲージ孔5a,6aがベル
ト3で閉塞されないように、両ゲージ孔5a,6
aに対応した部分に貫通孔を形成するか、あるい
は間隔を形成するなどの配慮がなされる。
Further, to supplement the relationship between the belt 3 and the gauge block 4, both the gauge holes 5a and 6a are
Considerations are made such as forming a through hole in a portion corresponding to a or forming a gap.

このように構成された部品の寸法検査装置にお
いては、寸法検査と選別作業とが同時にかつ自動
的に行われる。すなわち、搬送装置1を運転し
て、ゲージブロツク4を第1図矢印イの方向に順
次間欠搬送させ、整列供給装置9のパイプ10か
らピン7を供給すると、ゲージブロツク4がパイ
プ10の直下で一時停止したタイミングで第2シ
ヤツタ板11bを開らいて、第1第2シヤツタ板
11a,11b間のピン7を上ゲージ孔5aに供
給する。上ゲージ孔5aに供給されたピン7の外
径寸法が、両ゲージ孔5a,6aより小さい場合
は、第2図Aで示すようにピン7が両ゲージ板
5,6を通過し小寸法品収集トレー19に集めら
れ、ピン7の外径寸法が両ゲージ孔5a,6aの
いずれかより大きい場合は、順次搬送方向に送ら
れる。また、第2シヤツタ板11bはピン7を落
とした後閉じられ、次いで第1シヤツタ板11a
が開らいて第2シヤツタ板上に次のピン7を供給
して再び閉じられ、これらの操作がパイプ10の
直下にゲージブロツク4が送られてくる毎に繰り
返される。
In the component dimension inspection apparatus configured in this manner, dimension inspection and sorting work are performed simultaneously and automatically. That is, when the conveying device 1 is operated to intermittently convey the gauge blocks 4 in the direction of arrow A in FIG. At the timing of the temporary stop, the second shutter plate 11b is opened and the pin 7 between the first and second shutter plates 11a and 11b is supplied to the upper gauge hole 5a. If the outer diameter of the pin 7 supplied to the upper gauge hole 5a is smaller than both gauge holes 5a and 6a, the pin 7 passes through both gauge plates 5 and 6 as shown in FIG. The pins are collected in the collecting tray 19, and if the outer diameter of the pin 7 is larger than either of the gauge holes 5a and 6a, they are sent in the conveying direction one by one. Further, the second shutter plate 11b is closed after dropping the pin 7, and then the first shutter plate 11a is closed.
is opened, supplies the next pin 7 onto the second shutter plate, and is closed again, and these operations are repeated each time a gauge block 4 is fed directly below the pipe 10.

次いで、供給確認装置12においては、ゲージ
ブロツク4が通過する毎に、両ゲージ孔5a,6
a内にピン7が嵌合されているかどうかを検出
し、嵌合支持されていない状態が連続した場合に
は前述のように警報などの処理がなされる。通常
の場合、上流の部品供給装置9から順次ピン7が
供給され、かつ両ゲージ孔5a,6aを通り抜け
る不良品、すなわち外径が許容寸法末満であるピ
ン7が連続することはまれであり、ゲージブロツ
ク4にピン7がない状態が連続した場合には、部
品供給が円滑に行われていないものと判断され、
搬送装置1を停止して点検するなどの処理がなさ
れる。
Next, in the supply confirmation device 12, each time the gauge block 4 passes, both gauge holes 5a and 6 are opened.
It is detected whether or not the pin 7 is fitted into the pin a, and if the pin 7 remains unfitted and not supported, a process such as an alarm is issued as described above. Normally, the pins 7 are supplied one after another from the upstream parts supply device 9, and it is rare that there are consecutive defective products that pass through both gauge holes 5a and 6a, that is, pins 7 whose outer diameter is less than the allowable limit. If the pin 7 is not present in the gauge block 4 continuously, it is determined that parts supply is not being carried out smoothly.
Processes such as stopping and inspecting the transport device 1 are performed.

次いで、判別装置13では、両ゲージ孔5a,
6a内のピン7の高さを測定する操作が行われ
る。第2図および第3図に示すように、外径寸法
の差によつて両ゲージ孔5a,6aに支持される
ピン7の位置がばらつくので、搬送装置1の間欠
搬送に連動させて操作片17を開放して検出片1
6をばね15の付勢力で下方に突出させると、ピ
ン7の外径が許容寸法未満である場合は第3図A
のように検出片16が両ゲージ孔5a,6a内に
挿入された状態まで下降し、ピン7の外径が許容
寸法内である場合は第3図Bのように、またピン
7の外径が許容寸法を超える場合は第3図Cのよ
うに、それぞれピン7の上端面に検出片16が支
持されて操作片17の高さが変化する。この操作
片17の位置を光学センサ18A,18B,18
Cで検出して、光学センサ18A,18Cが操作
片17を検出した場合、判別装置13から寸法不
良信号が出力されることになる。検出片16を下
方に突出させた後、次のピン7の搬送操作に先立
つて検出片16をエアシリンダ機構などによつて
引き上げる操作が行われる。なお、これらの作用
の中でばね15の付勢力で検出片16を突出させ
るようにしているから、ピン7の加工の際にエツ
ジなどに付着した「ばり」などの抵抗力に抗し
て、許容寸法内のピン7を正確に下ゲージ孔6a
に嵌合させるまで修正する作用が生ずるが、必要
以上にピン7を両ゲージ孔5a,6aに押しこむ
ことはない。
Next, in the discrimination device 13, both gauge holes 5a,
An operation is performed to measure the height of pin 7 within 6a. As shown in FIGS. 2 and 3, the position of the pin 7 supported by both gauge holes 5a, 6a varies due to the difference in outer diameter, so the operation lever is 17 and detecting piece 1.
6 is projected downward by the biasing force of the spring 15. If the outer diameter of the pin 7 is less than the allowable dimension, the
If the detection piece 16 is lowered to the state where it is inserted into both gauge holes 5a and 6a as shown in FIG. If it exceeds the allowable dimension, the detection piece 16 is supported on the upper end surface of each pin 7, and the height of the operation piece 17 changes, as shown in FIG. 3C. The position of this operation piece 17 is determined by optical sensors 18A, 18B, 18.
When the optical sensors 18A and 18C detect the operating piece 17, the discrimination device 13 outputs a dimensional defect signal. After the detection piece 16 is projected downward, the detection piece 16 is pulled up by an air cylinder mechanism or the like prior to the next conveyance operation of the pin 7. In addition, since the detection piece 16 is made to protrude by the biasing force of the spring 15 during these actions, it resists the resistance force such as "burrs" attached to the edges etc. during the machining of the pin 7. Accurately insert the pin 7 within the allowable dimensions into the lower gauge hole 6a.
Although the pin 7 is corrected until it is fitted, the pin 7 is not pushed into the gauge holes 5a, 6a more than necessary.

次いで、判別装置13から寸法不良信号が出力
された場合、その下流の不良品排出装置20に寸
法不良と判定されたピン7が搬送されて停止した
タイミングに合わせて、エアシリンダ機構によつ
てピン突出片21が上方に突出して、上ゲージ孔
5aに支持されているピン7を排除し、さらにエ
アブロア22によつてベルト3上から吹き飛ばさ
れてピン7が大寸法収集トレー23に集められ
る。なお、この一実施例にあつては外径が許容寸
法未満であるピン7を前段の光学センサ18Cで
検出した場合にもピン突出片21が操作される。
また、ピン突出片21は瞬時に元の位置に下降し
て次の搬送作用に備えられる。そして、ピン突出
片21によつてゲージブロツク4から排出せしめ
られたピン7は、ブロア22によつてベルト3の
上面から大寸法収集トレー23に落とされる。し
たがつて不良品排出装置20以降のゲージブロツ
ク4には適正寸法のピン7だけが残されて良品収
集装置24に送り出されることになる。
Next, when a dimensional defect signal is output from the discrimination device 13, the pin 7 determined to be dimensional defective is conveyed to the downstream defective product discharging device 20 and stopped, and at the same time, the pin is removed by an air cylinder mechanism. The protruding piece 21 protrudes upward to remove the pin 7 supported in the upper gauge hole 5a, and is further blown off from above the belt 3 by the air blower 22, so that the pin 7 is collected in the large size collection tray 23. In this embodiment, the pin projecting piece 21 is also operated when the optical sensor 18C at the front stage detects a pin 7 whose outer diameter is less than the allowable size.
Further, the pin projecting piece 21 instantly descends to its original position and is ready for the next conveyance operation. The pins 7 ejected from the gauge block 4 by the pin projecting piece 21 are then dropped from the upper surface of the belt 3 onto the large size collection tray 23 by the blower 22. Therefore, only pins 7 of appropriate dimensions are left in the gauge block 4 after the defective product discharge device 20 and sent to the non-defective product collection device 24.

次いで、良品収集装置24においては、順次送
られてくるゲージブロツク4の表面に押付ベルト
25を接触させて、ピン7の飛び出しを防止しな
がら下方に導き、ゲージブロツク4の上ゲージ孔
5aが下方に向く位置付近で接触状態を解除し
て、自重によつてピン7を良品収集トレー27に
落下させる。この際に、押付ベルト25はゲージ
ブロツク4との接触によつて排送装置1の間欠搬
送に対応して順次移動しながら外径が許容範囲内
であるピン7を良品収集トレー27に順次導く作
用を行う。
Next, in the non-defective product collecting device 24, the pressing belt 25 is brought into contact with the surface of the gauge blocks 4 that are sent in sequence, and the pins 7 are guided downward while preventing the pins 7 from popping out, so that the upper gauge holes 5a of the gauge blocks 4 are directed downward. The contact state is released near the position facing the pin 7, and the pin 7 is caused to fall into the good product collection tray 27 by its own weight. At this time, the pressing belt 25 sequentially moves in response to the intermittent conveyance of the discharging device 1 through contact with the gauge block 4, and sequentially guides the pins 7 whose outer diameters are within the allowable range to the good product collection tray 27. perform an action.

このようにしてゲージブロツク4に順次供給さ
れたピン7は、第2図に示す両ゲージ孔5a,6
aとの嵌合状態によつて、各トレー19,23,
27にそれぞれ選別収集され、部品供給装置8か
らピン7が供給されるたびに前述の従用が繰り返
えされることになる。
The pins 7 sequentially supplied to the gauge block 4 in this way are connected to both the gauge holes 5a and 6 shown in FIG.
Each tray 19, 23,
The pins 7 are sorted and collected at 27, and the above-mentioned use is repeated every time the pins 7 are supplied from the component supply device 8.

以上説明したように、この考案は許容寸法の上
限および下限に合わせて形成された上下ゲージ孔
を有するゲージブロツクを搬送装置によつて間欠
的に搬送し、被検査部品をゲージブロツクのゲー
ジ孔に順次供給して嵌合させた状態とし、寸法許
容範囲外で寸法の小さなものを自然落下させて除
去した後、ゲージ孔に上方から検出片を挿入し
て、このときの被検査部品の高さを判別装置で判
別し、この判別結果により、ゲージ孔に支持され
ている被検査部品のうち、寸法不良品をゲージ孔
にピン突出片を下方から挿入することにより排出
するとともに、ゲージ孔に残されている寸法不良
品を最後に取り出すようにしているものであるか
ら、部品の寸法検査を連続して自動的に効率的に
行なうことができるとともに、寸法許容範囲外で
寸法の小さなものおよび寸法の大きなもの、寸法
許容範囲内の良品を自動的に選別分類することが
できる。
As explained above, this device intermittently transports a gauge block having upper and lower gauge holes formed according to the upper and lower limits of allowable dimensions using a conveying device, and inserts the parts to be inspected into the gauge holes of the gauge block. After supplying the parts one by one and making them fit, remove the small ones that are outside the dimensional tolerance by letting them fall naturally, then insert the detection piece into the gauge hole from above and measure the height of the part to be inspected at this time. Based on the results of this discrimination, among the parts to be inspected supported in the gauge hole, those with defective dimensions are ejected by inserting a protruding pin into the gauge hole from below, and the parts remaining in the gauge hole are ejected. Since the parts with defective dimensions are taken out last, it is possible to carry out continuous and automatic dimensional inspection of parts efficiently, and also to remove parts with small dimensions and those that are outside the dimensional tolerance range. It is possible to automatically sort and classify large items and non-defective items within the dimensional tolerance range.

【図面の簡単な説明】[Brief explanation of drawings]

図面はこの考案の一実施例を示すもので、第1
図は全体構成を説明する側面図、第2図A,B,
Cはゲージブロツクと被検査部品との嵌合状態の
説明図、第3図は判別装置の判別状態の説明図で
ある。 1……搬送装置、4……ゲージブロツク、5…
…上ゲージ板、5a……上ゲージ孔、6……下ゲ
ージ板、6a……下ゲージ孔、7……被検査部品
(ピン)、8……部品供給装置、13……判別装
置、16……検出片、20……不良品排出装置、
21……ピン突出片、24……良品収集装置。
The drawing shows one embodiment of this invention.
The figure is a side view explaining the overall configuration, Figure 2 A, B,
C is an explanatory diagram of the fitted state of the gauge block and the part to be inspected, and FIG. 3 is an explanatory diagram of the discriminating state of the discriminating device. 1... Conveyance device, 4... Gauge block, 5...
...Upper gauge plate, 5a...Upper gauge hole, 6...Lower gauge plate, 6a...Lower gauge hole, 7...Parts to be inspected (pin), 8...Parts supply device, 13...Discrimination device, 16 ...detection piece, 20 ... defective product ejection device,
21... Pin projecting piece, 24... Good product collection device.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被検査部品7の外径の最大許容寸法に等しいゲ
ージ孔5aを有する上ゲージ板5と、前記被検査
部品7の外径の最小許容寸法に等しいゲージ孔6
aを有する下ゲージ板6とを上下にかつ双方のゲ
ージ孔が同軸状になるように組み合わせてなるゲ
ージブロツク4と、多数のゲージブロツクを支持
して定ピツチで間欠搬送させる搬送装置1と、ゲ
ージブロツクに整列状態の被検査部品を搬送装置
に連動して供給する部品供給装置8と、この部品
供給装置から搬送方向に離れゲージ孔に上方から
検出片16を挿入して被検査部品が前記ゲージ孔
の一つに支持されているかあるいは支持されてい
なかの区別により被検査部品の高さを判別し寸法
良否信号を出力する判別装置13と、この判別装
置から搬送方向に離れ判別装置の寸法良否信号に
連動してゲージ孔にピン突出片21を挿入する不
良品排出装置20と、この不良品排出装置から搬
送方向に離れ寸法が適正な被検査部品を取り出す
良品収集装置24とを備えた部品の寸法検査装
置。
an upper gauge plate 5 having a gauge hole 5a equal to the maximum allowable outer diameter of the component to be inspected 7; and a gauge hole 6 having a gauge hole 6 equal to the minimum allowable outer diameter of the inspected component 7.
a gauge block 4 which is formed by combining a lower gauge plate 6 having a vertical axis and a lower gauge plate 6 vertically so that both gauge holes are coaxial; a conveying device 1 that supports a large number of gauge blocks and conveys them intermittently at a fixed pitch; A component supply device 8 supplies the parts to be inspected aligned to the gauge block in conjunction with a conveyance device, and a detection piece 16 is inserted from above into the gauge hole away from the component supply device in the conveyance direction so that the parts to be inspected are A determination device 13 that determines the height of the inspected part by determining whether it is supported or not supported by one of the gauge holes and outputs a dimensional pass/fail signal, and a determination device 13 that determines the height of the component to be inspected by determining whether it is supported by one of the gauge holes or not, and outputs a dimensional pass/fail signal; It is equipped with a defective product discharging device 20 that inserts a pin projecting piece 21 into a gauge hole in response to a pass/fail signal, and a non-defective product collecting device 24 that takes out inspected components that are spaced apart in the transport direction from the defective product discharging device and have appropriate dimensions. Parts dimension inspection device.
JP14280981U 1981-09-26 1981-09-26 Parts dimension inspection equipment Granted JPS5848373U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14280981U JPS5848373U (en) 1981-09-26 1981-09-26 Parts dimension inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14280981U JPS5848373U (en) 1981-09-26 1981-09-26 Parts dimension inspection equipment

Publications (2)

Publication Number Publication Date
JPS5848373U JPS5848373U (en) 1983-04-01
JPS6143584Y2 true JPS6143584Y2 (en) 1986-12-09

Family

ID=29935822

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14280981U Granted JPS5848373U (en) 1981-09-26 1981-09-26 Parts dimension inspection equipment

Country Status (1)

Country Link
JP (1) JPS5848373U (en)

Also Published As

Publication number Publication date
JPS5848373U (en) 1983-04-01

Similar Documents

Publication Publication Date Title
US6959108B1 (en) Image based defect detection system
US6781344B1 (en) Battery tester and sorting apparatus
US6787724B2 (en) Sorting machine
US5823356A (en) Apparatus and method for insepcting threaded members
US10118201B2 (en) Inspection and sorting machine
KR20060111590A (en) Fastener inspection system
KR102236975B1 (en) Pin detecive Device
KR20110028240A (en) Device and method for checking container closures
JPH0654226B2 (en) Automatic visual inspection machine for chip parts
WO2000003211A1 (en) Weight sorter
JP2012187513A (en) Article sorting device
KR20190041058A (en) Vision selector
US5542520A (en) Coin testing apparatus
JPS6143584Y2 (en)
JPH05281152A (en) Article inspecting apparatus
JPH06167323A (en) Inspecting apparatus for part and inspecting method using the apparatus
US3357557A (en) Radiant energy method and apparatus of determining physical characteristics
JPS63163259A (en) Automatic defect inspecting device for tablet or the like
CN109059707B (en) Automatic detection system for buckles
JP4708060B2 (en) Quality inspection system
JP3125203U (en) Continuous inspection system for scratches on roller edges transferred by parts feeder
JPH02131178A (en) Sorting device for ring work
KR200337386Y1 (en) Coin inspection system
CN211488628U (en) Aperture check out test set
JPH0449114A (en) Carrier device for streak material