JPS614289A - 半導体レ−ザ雑音測定装置 - Google Patents

半導体レ−ザ雑音測定装置

Info

Publication number
JPS614289A
JPS614289A JP59124387A JP12438784A JPS614289A JP S614289 A JPS614289 A JP S614289A JP 59124387 A JP59124387 A JP 59124387A JP 12438784 A JP12438784 A JP 12438784A JP S614289 A JPS614289 A JP S614289A
Authority
JP
Japan
Prior art keywords
semiconductor laser
laser
current
noise
measuring device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59124387A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0554714B2 (enrdf_load_stackoverflow
Inventor
Masahiro Kume
雅博 粂
Yuichi Shimizu
裕一 清水
Masaru Wada
優 和田
Kunio Ito
国雄 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP59124387A priority Critical patent/JPS614289A/ja
Publication of JPS614289A publication Critical patent/JPS614289A/ja
Publication of JPH0554714B2 publication Critical patent/JPH0554714B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/0014—Measuring characteristics or properties thereof

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Lasers (AREA)
JP59124387A 1984-06-19 1984-06-19 半導体レ−ザ雑音測定装置 Granted JPS614289A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59124387A JPS614289A (ja) 1984-06-19 1984-06-19 半導体レ−ザ雑音測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59124387A JPS614289A (ja) 1984-06-19 1984-06-19 半導体レ−ザ雑音測定装置

Publications (2)

Publication Number Publication Date
JPS614289A true JPS614289A (ja) 1986-01-10
JPH0554714B2 JPH0554714B2 (enrdf_load_stackoverflow) 1993-08-13

Family

ID=14884147

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59124387A Granted JPS614289A (ja) 1984-06-19 1984-06-19 半導体レ−ザ雑音測定装置

Country Status (1)

Country Link
JP (1) JPS614289A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH0554714B2 (enrdf_load_stackoverflow) 1993-08-13

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term