JPS614115A - Electric contact material - Google Patents

Electric contact material

Info

Publication number
JPS614115A
JPS614115A JP12367184A JP12367184A JPS614115A JP S614115 A JPS614115 A JP S614115A JP 12367184 A JP12367184 A JP 12367184A JP 12367184 A JP12367184 A JP 12367184A JP S614115 A JPS614115 A JP S614115A
Authority
JP
Japan
Prior art keywords
contact
contact material
metal
electrical
electric contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12367184A
Other languages
Japanese (ja)
Inventor
志賀 章二
晃 松田
宣行 柴田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Furukawa Electric Co Ltd
Original Assignee
Furukawa Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Furukawa Electric Co Ltd filed Critical Furukawa Electric Co Ltd
Priority to JP12367184A priority Critical patent/JPS614115A/en
Publication of JPS614115A publication Critical patent/JPS614115A/en
Pending legal-status Critical Current

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  • Conductive Materials (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、電気・電子機器とその部品に用いられる貴金
属を被覆した電気接点材に代りうる安価で高性能の電気
接点材に関するしのである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to an inexpensive and high-performance electrical contact material that can replace noble metal-coated electrical contact materials used in electrical and electronic equipment and their parts. .

〔従来の技術〕[Conventional technology]

一般に電気・電子機器とその部品のスイッチ、リレー、
コネクター、ICソケット等の電気接続部には、Au 
、Pd 、Pt 、Agなどの貴金属やその合金、例え
ばAU−Ag、ALI −AQ−Pd −Ge lAg
7Pd 、Pd−Ir 、A。
Generally, electrical/electronic equipment and its parts switches, relays,
Electrical connections such as connectors and IC sockets are made of Au.
, Pd, Pt, Ag and their alloys, such as AU-Ag, ALI-AQ-Pd-GelAg
7Pd, Pd-Ir, A.

Cd O,Ag WC,AQ  Ni 等(7)合金が
、電気回路条件や使用条件によって選択使用されている
。例えばアーク放電損耗を伴う大電流から中電流の開閉
用途では、高融点と高温度が要求され、一方微細電流の
開閉や接続では、接触抵抗とその安定性を得るために導
電性と耐食性が要求されており、これ等を満足させるた
めに導電性基体上に上記貴金属を被着して電気接点材を
形成している。
(7) Alloys such as Cd O, Ag WC, and AQ Ni are selected and used depending on the electric circuit conditions and usage conditions. For example, high to medium current switching applications that involve arc discharge wear and tear require high melting points and high temperatures, while microcurrent switching and connections require conductivity and corrosion resistance to achieve contact resistance and stability. In order to satisfy these requirements, the above-mentioned noble metal is deposited on a conductive substrate to form an electrical contact material.

近年エレクトロニクスの発展に伴い、微弱電流の接続や
0N−OFF信号を、入力させるキースイッチなどの用
途が拡大しでおり、負金属、特にAuの要求が拡大して
いる。Auは上記微弱電流の開閉や、接続に有効である
ことが知られているが、高価な貴金属であるため、経済
的負担となっている。そのため可及的に薄膜化したり、
局在化して使用することが望まれでいる。
In recent years, with the development of electronics, applications such as key switches for connecting weak currents and inputting ON-OFF signals have expanded, and the demand for negative metals, particularly Au, has expanded. Although Au is known to be effective in switching and connecting the weak current, it is an expensive precious metal and therefore poses an economic burden. Therefore, by making the film as thin as possible,
It is desired to use it in a localized manner.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかしながら簿膜化は不可避的ピンホールや機械的損耗
によりCuなどの基体卑金属の露出腐食を起し、電気接
続性を劣化する。また局在化は接点部の可及的小型化に
より、周辺に露出する卑金属基体の腐食生成物がAu表
面にクリープし、接触不良を起す原因となる。史にはA
llと基体卑金属との熱拡散す電気接続性の劣化の原因
となっている。A I+に代え(比較的安価な貴金属で
あるA(lやPdの使用ら考えられるが、これらはポリ
マーや硫化などの絶縁性皮膜を発生し易く、接触抵抗を
若しく不安定なものとする欠点がある。
However, the film formation causes exposure corrosion of base metals such as Cu due to unavoidable pinholes and mechanical wear, which deteriorates electrical connectivity. In addition, localization is caused by miniaturization of the contact portion as much as possible, and corrosion products of the base metal substrate exposed around the Au surface creep, causing poor contact. A for history
This is a cause of deterioration of electrical connectivity due to heat diffusion between the base metal and the base metal. Instead of A I+ (relatively inexpensive noble metals A(l) and Pd may be used, but these tend to form insulating films such as polymers and sulfides, making the contact resistance low and unstable. There are drawbacks.

最近前記ON −OF F信号やデジタル信号の入力用
に接触抵抗の安定した安価な導電ゴムが用いられるよう
になった。これは接触抵抗の高低よりも安定性が求めら
れCいるためである。
Recently, inexpensive conductive rubber with stable contact resistance has come to be used for inputting the ON-OF signals and digital signals. This is because stability is required rather than the level of contact resistance.

しかしながら金同志の接触抵抗が数1rLΩCあるのに
対し、導電ゴムでは100Ωオーダーの甚しく大きな接
触抵抗となる。このため接触抵抗が低く、All被覆接
点材に代りうる安価な接点材−の開発が強く望まれてい
る。
However, while the contact resistance between gold and gold is several rLΩC, the contact resistance of conductive rubber is extremely large, on the order of 100Ω. Therefore, there is a strong desire to develop an inexpensive contact material that has low contact resistance and can replace All-coated contact materials.

〔問題点を解決するための手段〕 本発明はこれに鑑み種々検討の結果、メタルシリサイド
を利用することにより、貴金属を被覆した電気接点材に
代りつる安価で高性能の電気接点材を開発したもので、
導電性基体上の少なくとも接点部にメタルシリサイドを
被着したことを特徴とするものである。
[Means for Solving the Problems] In view of this, the present invention has developed an inexpensive and high-performance electrical contact material that can replace noble metal-coated electrical contact materials by using metal silicide, as a result of various studies. Something,
It is characterized in that metal silicide is deposited on at least the contact portions on the conductive substrate.

即ち本発明はCu 、 Cu合金、Fe合金、Ni合金
等の導電性基体上の少なくとも接点部又は全面にPdz
Si、PtSi、N15iz、Co51z、WSiz、
Mo5iz、 Ta5iz、Nb5iz、1−iSiz。
That is, the present invention provides Pdz on at least the contact portion or the entire surface of a conductive substrate such as Cu, Cu alloy, Fe alloy, Ni alloy, etc.
Si, PtSi, N15iz, Co51z, WSiz,
Mo5iz, Ta5iz, Nb5iz, 1-iSiz.

Zr5iz、l−1fsiz、VSiz等のメタルシリ
サイドを被着したものである。これ等メタルシリサイド
の被着は、スパッタリングや蒸着などのPVD法、気相
化学反応を応用したCVD法にJ、り容易に行なうこと
かできる。また金属とシリコンを同時にスパッタするか
、又は金属とシリコンを二層に被着してから、加熱拡散
してメタルシリナイドを形成することもできる。更にメ
タルシリサイド粉末を焼結し、これを基板上にろう付は
等により被着することもできる。
It is coated with metal silicide such as Zr5iz, l-1fsiz, VSiz, etc. The metal silicide can be easily deposited using a PVD method such as sputtering or vapor deposition, or a CVD method applying a gas phase chemical reaction. Alternatively, metal and silicon can be sputtered simultaneously, or metal and silicon can be deposited in two layers and then heated and diffused to form metal silinide. Furthermore, it is also possible to sinter the metal silicide powder and apply it onto the substrate by brazing or the like.

〔作 用〕[For production]

上記メタルシリサイドは1200〜2300℃の高融点
を有し、化学的に安定で、硬質ぐあり、しかも高い導電
性を有し、これを導電t!1基体上°の少なくとも接点
部に被着することにより、貴金属を被覆した接点材に代
りうる接触抵抗の小さい、安定した電気接続性を有する
電気接点材を得ることができる。即ちメタルシリサイド
の固有抵抗は10〜100μΩ・α程麿ぐ、All  
2.4μΩ・αやグラファイト(aIIllh向)ノ1
00〜200μΩ・1に対抗できるもので、微弱電流キ
ースイッチやコネクターの一部に使用されCいる導電ゴ
ムの10〜103μΩ・0よりもはるかに小さい。
The above-mentioned metal silicide has a high melting point of 1200 to 2300°C, is chemically stable, hard, and has high conductivity. By coating at least the contact portion on one substrate, it is possible to obtain an electrical contact material having low contact resistance and stable electrical connectivity that can replace a contact material coated with a noble metal. In other words, the specific resistance of metal silicide increases by about 10 to 100 μΩ・α.
2.4μΩ・α or graphite (for aIIllh) No. 1
00 to 200 μΩ・1, which is much smaller than the 10 to 103 μΩ・0 of conductive rubber used in some weak current key switches and connectors.

例えばTi Si zはTiの55μ0・cmよりも小
さい10〜20μΩ・αであり、メタルシリサイドは金
属に匹敵する導電性を有し、かつ熱的、化学的に安定で
金属よりも硬く、耐摩耗性も優れてい′る。更にメタル
シリサイドは貴金属に比較し、はるかに安く電気接点材
のコス1−を低減づることができる。
For example, TiSi z is 10 to 20 μΩ・α, which is smaller than the 55μ0・cm of Ti, and metal silicide has electrical conductivity comparable to that of metal, is thermally and chemically stable, is harder than metal, and is wear resistant. It also has excellent characteristics. Furthermore, metal silicide is much cheaper than noble metals and can reduce the cost of electrical contact materials.

〔実施例〕〔Example〕

(1)Cu−9,3%Ni−2,5%3n合金基板上に
、スパッタリング法により厚さ約0.2μのPdzSi
とpt3iを被着させて本発明接点材を形成した。これ
にういてA!+プルーブ(先端半径2.5#+II+>
を用いて荷m ’ 1.70 g、電流1001rLA
の条件で接触抵抗を測定した。これ等の結果を電気メツ
キ法により厚さ0.5μのAUとPdをメッキした従来
の接点材と比較して第1表に示す。
(1) PdzSi with a thickness of about 0.2μ was deposited on a Cu-9,3%Ni-2,5%3N alloy substrate by sputtering.
and pt3i were deposited to form a contact material of the present invention. A for this! + Probe (tip radius 2.5#+II+>
using a load m' of 1.70 g and a current of 1001 rLA
Contact resistance was measured under these conditions. These results are shown in Table 1 in comparison with a conventional contact material plated with AU and Pd to a thickness of 0.5 μm by electroplating.

第1表 【 【 (2)粉末焼結法によりWSizとNb5izチツプ(
1111,5111#l、長さ1.5M、厚さ0,3.
)を形成し、これをリードリレー用の Fe −42%
N1合金基板にろう付けにより取イq【プC1不発明接
点材を形成した。これにづい℃ぞの1個を可動接点とし
、これを挾んで2個の固定接点をセットしてリレーを組
立でた。これについ(電圧30V、電流1A、振動数1
1−l zの条件で接点寿命試験を行ない、溶着しく動
作不良どなるまでの振動回数を測定した。これ等の結果
を電気メツキ法により厚さ2.5μのA LlとRhを
メッキした従来接点材の場合と比較し′(第2表に示す
Table 1 [ (2) WSiz and Nb5iz chips (
1111, 5111#l, length 1.5M, thickness 0,3.
) and convert it into Fe -42% for reed relays.
A C1 non-inventive contact material was formed on an N1 alloy substrate by brazing. Based on this, I made one movable contact at each °C and set two fixed contacts between them to assemble the relay. Regarding this (voltage 30V, current 1A, frequency 1
A contact life test was conducted under the conditions of 1-lz, and the number of vibrations until welding or malfunction occurred was measured. These results were compared with those of a conventional contact material plated with A Ll and Rh to a thickness of 2.5 μm by electroplating (see Table 2).

第2表 −上記実施例から明らかなように、本発明接点材は従来
の接点材と比較し、接触抵抗が小さく、接点寿命を著し
く向上できることが判る。
Table 2 - As is clear from the above examples, the contact material of the present invention has lower contact resistance than conventional contact materials, and it can be seen that the contact life can be significantly improved.

このように本発明によれば、貴金属を被覆した従来の接
点材より電気接続性が優れ、かつ安価な電気接点祠を提
供し得るもので、工業上顕著な効果を奏するbのCある
As described above, according to the present invention, it is possible to provide an electrical contact hole which has superior electrical connectivity and is inexpensive compared to the conventional contact material coated with a noble metal, and has C of b, which has an industrially significant effect.

Claims (1)

【特許請求の範囲】[Claims] 導電性基体上の少なくとも接点部にメタルシリサイドを
被着したことを特徴とする電気接点材。
An electrical contact material characterized in that metal silicide is deposited on at least a contact portion on a conductive substrate.
JP12367184A 1984-06-18 1984-06-18 Electric contact material Pending JPS614115A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12367184A JPS614115A (en) 1984-06-18 1984-06-18 Electric contact material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12367184A JPS614115A (en) 1984-06-18 1984-06-18 Electric contact material

Publications (1)

Publication Number Publication Date
JPS614115A true JPS614115A (en) 1986-01-10

Family

ID=14866410

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12367184A Pending JPS614115A (en) 1984-06-18 1984-06-18 Electric contact material

Country Status (1)

Country Link
JP (1) JPS614115A (en)

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