JPS6138759U - Sample temperature control probe - Google Patents

Sample temperature control probe

Info

Publication number
JPS6138759U
JPS6138759U JP12391784U JP12391784U JPS6138759U JP S6138759 U JPS6138759 U JP S6138759U JP 12391784 U JP12391784 U JP 12391784U JP 12391784 U JP12391784 U JP 12391784U JP S6138759 U JPS6138759 U JP S6138759U
Authority
JP
Japan
Prior art keywords
temperature control
sample
control probe
sample temperature
stand
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12391784U
Other languages
Japanese (ja)
Inventor
耕三 飯田
岩夫 佃
Original Assignee
三菱重工業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 三菱重工業株式会社 filed Critical 三菱重工業株式会社
Priority to JP12391784U priority Critical patent/JPS6138759U/en
Publication of JPS6138759U publication Critical patent/JPS6138759U/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案の一実施例である試料温度調節プローブ
の内部構造を示す部分断面図、第２図は真空中での測定
を行う場合の分析機器の構成を示す概略図、第３図は従
来の試料温度調節プローブ１の内部構造を示す部分断面
図である。 １・・・分析計本体、２・・・試料室、４ａ，４ｂ・・
・真空排気装置、５・・・挿入口、１０・・・試料温度
調節プローブ、１３・・・冷却パイプ、１４・・・熱電
対、１７．・・・試料、２２・・・ヒータブロック、２
３・・・差込みプラグ、２４・・・差込みソケット、２
５・・・熱電対挿入穴。Figure 1 is a partial sectional view showing the internal structure of a sample temperature control probe that is an embodiment of the present invention, Figure 2 is a schematic diagram showing the configuration of an analytical instrument when performing measurements in vacuum, and Figure 3. 1 is a partial cross-sectional view showing the internal structure of a conventional sample temperature control probe 1. FIG. 1... Analyzer body, 2... Sample chamber, 4a, 4b...
- Vacuum exhaust device, 5... Insertion port, 10... Sample temperature adjustment probe, 13... Cooling pipe, 14... Thermocouple, 17. ...Sample, 22...Heater block, 2
3...Plug-in plug, 24...Plug-in socket, 2
5...Thermocouple insertion hole.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 頂部に試料を戴置する試料台を有し、上記試料台を真空
中の分析計本体に挿入して前記試料を加熱または冷却す
る試料温度調節プロー７において、前記試料台を内部に
熱電対挿入穴を設けた差し込み式のヒータブロックとし
たことを特徴とする試料温度調節プローブ。In a sample temperature control probe 7 that has a sample stand on the top for placing a sample and heats or cools the sample by inserting the sample stand into the analyzer body in vacuum, a thermocouple is inserted into the sample stand. A sample temperature control probe characterized by a plug-in heater block with a hole.
JP12391784U 1984-08-13 1984-08-13 Sample temperature control probe Pending JPS6138759U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12391784U JPS6138759U (en) 1984-08-13 1984-08-13 Sample temperature control probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12391784U JPS6138759U (en) 1984-08-13 1984-08-13 Sample temperature control probe

Publications (1)

Publication Number Publication Date
JPS6138759U true JPS6138759U (en) 1986-03-11

Family

ID=30682648

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12391784U Pending JPS6138759U (en) 1984-08-13 1984-08-13 Sample temperature control probe

Country Status (1)

Country Link
JP (1) JPS6138759U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005221363A (en) * 2004-02-05 2005-08-18 Rigaku Corp Sample support device for x-ray analysis, and x-ray analyzer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005221363A (en) * 2004-02-05 2005-08-18 Rigaku Corp Sample support device for x-ray analysis, and x-ray analyzer

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