JPS6135531A - Ic handler for measuring variety of product - Google Patents
Ic handler for measuring variety of productInfo
- Publication number
- JPS6135531A JPS6135531A JP15557984A JP15557984A JPS6135531A JP S6135531 A JPS6135531 A JP S6135531A JP 15557984 A JP15557984 A JP 15557984A JP 15557984 A JP15557984 A JP 15557984A JP S6135531 A JPS6135531 A JP S6135531A
- Authority
- JP
- Japan
- Prior art keywords
- turret
- handler
- rail
- socket
- work guide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は検査対象ICの品種切換えに対応する部品交換
作業を容易に短時間で行えるようにした少量多品種検査
用ICハンドラに関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an IC handler for low-volume, high-mix inspection, which allows parts replacement work corresponding to the change of types of ICs to be tested to be easily and quickly performed.
第2図は、一般的なICハンドラの要部側面図で、1は
予熱挿入部、2は検査対象IC,3はIC予熱用のヒー
トプレス、4g、4bはICの滑走方向を転換させる方
向転換機構、5はIC試験機に接続されているソケット
、6はICがレールから外れないようにICのパッケー
ジの背中(ピン折曲げの向きとは逆の側)を押さえてガ
イドするワークガイド、7はレール、8は測定部でIC
をソケットに押し込むプレス機構、9は測定部、10は
検査結果に基いて検査済みICを複数種類に分類する分
類取出部、11はIC滑走方向とは直角に移動してIC
を夫々の種類に応じて異なるアンローダに載せる分類シ
ャトル、12は検査と分類が済んだICを受は取るアン
ローダである。Figure 2 is a side view of the main parts of a general IC handler, where 1 is the preheating insertion part, 2 is the IC to be inspected, 3 is the heat press for preheating the IC, and 4g and 4b are the directions for changing the sliding direction of the IC. A conversion mechanism, 5 a socket connected to the IC testing machine, 6 a work guide that holds and guides the back of the IC package (the side opposite to the pin bending direction) to prevent the IC from coming off the rail; 7 is the rail, 8 is the measurement part and IC
9 is a measuring section; 10 is a sorting and extracting section that sorts inspected ICs into multiple types based on the test results; 11 is an IC moving perpendicular to the IC sliding direction;
A classification shuttle 12 places the ICs on different unloaders depending on their types, and 12 is an unloader that receives and takes the ICs that have been inspected and classified.
ICの滑走路が図示の如く湾曲している理由は、ICハ
ンドラの据付面積を抑制するためであり、また滑走路の
湾曲個所(滑走路が湾曲するのは方向転換機構部に於い
てであるが、両転楔機構部に挟まれた短い測定部は全体
としては湾曲個所となる)に測定部を設け、この測定部
でICのピンが湾曲の外側へ向かっているのは、比較的
頻繁に保守しなければならないソケット5 (パフォー
マンスポード)に容易にアクセスできるようにするため
である。The reason why the IC runway is curved as shown in the diagram is to limit the installation area of the IC handler, and the reason why the runway is curved is to reduce the installation area of the IC handler. However, it is relatively common for the IC pin to move toward the outside of the curve at this measuring section. This is to allow easy access to socket 5 (performance port), which must be maintained regularly.
第3図は測定部を上から見た概略図で、図(a)は幅3
00m1 lのICの場合、図(b)は’l’ffl
400 m i 1のICの場合、図(C)は幅600
m1lのICの場合を示し、ICパッケージの幅に応じ
てワークガイド6やレール7をそれぞれ適当なものに交
換しなければならないことが判る。なお、一般にプラス
チックパッケージとガラスパッケージとでは同じ幅でも
厚さが異なるので、ワークガイドを交換する必要がある
。なお、鉄道の場合に3本のレールで狭軌用車両と広軌
用車両に対応できるのと同様に、ICハンドラの場合も
、特別なレールなどにより2品種に対応することは出来
るがそれ以上の数の品種に対しては、どうしてもレール
やワークガイド等の交換を要する。検査対象rcの品種
切換えに伴う各部品の交換は、ICハンドラの各部にわ
たり、交換用の部品だけでなく交換用工具等も準備して
おかなければならない。Figure 3 is a schematic diagram of the measuring section viewed from above, and figure (a) is a width of 3
In the case of 00m1 l IC, figure (b) is 'l'ffl
For an IC of 400 m i 1, the width in Figure (C) is 600 m
The case of a ml IC is shown, and it can be seen that the work guide 6 and rail 7 must be replaced with appropriate ones depending on the width of the IC package. Note that plastic packages and glass packages generally have different thicknesses even if they have the same width, so it is necessary to replace the work guide. In addition, just as in the case of railways, three rails can handle narrow gauge and wide gauge vehicles, IC handlers can also handle two types of vehicles with special rails, etc. For these types, it is necessary to replace the rails, work guides, etc. In order to replace each part associated with changing the type of RC to be inspected, not only replacement parts but also replacement tools must be prepared for each part of the IC handler.
第2図に示したICハンドラの構造は、据付面積抑制や
測定部でのソケットあるいはパフォーマンスポードの保
守や交換には好都合であるが、逆に、湾曲したIC滑走
路の内側に位置する測定部のワークガイドやレールを、
検査対象ICの品種切換えに対応して交換するためには
不便である。The structure of the IC handler shown in Figure 2 is convenient for reducing the installation space and for maintenance and replacement of sockets or performance ports at the measurement section, but conversely, the structure of the IC handler is convenient for the measurement section located inside the curved IC runway. work guides and rails,
This is inconvenient when replacing the IC to be tested in response to a change in type.
しかも、部品交換を要するのは主として測定部であって
、部品の交換、交換後の調整には熟練者でも通常約1時
間必要であった。勿論、品種毎に専用ハンドラを準備す
れば、時間的の問題は解決できるが、少量多品種検査の
場合には極めて不経済で、実用的ではない。Moreover, it is mainly the measuring section that requires replacement of parts, and it usually takes about one hour even for an experienced person to replace the parts and make adjustments after replacement. Of course, if a dedicated handler is prepared for each product type, the time problem can be solved, but this is extremely uneconomical and impractical in the case of low-volume, multi-product inspection.
本発明は、上記、従来のICハンドラの問題点、すなわ
ち、少量多品種検査の際の品種切換え時に、ハンドラの
部品交換に多くの工数を要するという欠点を解消し、短
時間で容易に品種切換えに対応できるようにした多品種
検査用ICハンドラを提供することを目的とする。The present invention solves the problem of the conventional IC handler described above, namely, that it takes a lot of man-hours to replace parts of the handler when changing the type during low-volume, high-mix inspection, and allows for easy type change in a short time. The purpose of the present invention is to provide an IC handler for multi-product inspection that is compatible with the following.
測定対象IC品種の切換えに際し、測定部で交換を要す
る部品の中には、IC用ソケットもあるが、これは前述
のように極めて容易にアクセス可能で交換も簡単である
から問題ない。When changing the type of IC to be measured, the IC socket is among the parts that need to be replaced in the measurement section, but this is not a problem since it is extremely easily accessible and easy to replace as described above.
従来IC品種切換えの際、交換作業に手間取っていたの
は、測定部でソケットにICを加圧挿入するのに用いる
品種毎に寸法の異なるワークガイドやレールの交換が面
倒だった為であるから、これらの交換部品をターレッI
[Jlなどで用いられているようなターレットヘッドに
取り付けておいて、部品交換時には単にターレットヘッ
ドを回転させるだけで済むようにした。なお、これらの
部品を介してICをソケットに押し込むプレス機構は従
来の場合と同様な位置に1セント配置しておくだけで差
支えない。Conventionally, when changing IC types, it took time to replace them because it was troublesome to replace the work guides and rails, which had different dimensions for each type, and were used to pressurize and insert the IC into the socket in the measurement section. , these replacement parts
[It was attached to a turret head like the one used in JL, etc., so that when replacing parts, all you had to do was rotate the turret head. Note that the press mechanism for pushing the IC into the socket through these parts can be simply placed in the same position as in the conventional case.
第1図(a)は本発明の根幹をなす上記ターレツトの側
面図、同図(b)はその平面図を示し、13はターレツ
ト、その他の符号は第2図の場合と同様である。本実施
例では、ソケット5へIC2を圧入するためのプレス機
構8は第1図(a)、(b)に示すように、固定中心軸
の直角に曲がった端部に取付けられており、一方ターレ
ソト13は此の固定中心軸にベアリングを介して回転自
在に支承されている。ターレット13の、ワークガイド
6やレール7を支持する部材には、半径方向に、プレス
v!At18の先端部が通過できるような貫通孔が設け
てあり、プレス機構8は此の孔を通して、ワークガイド
とレールでICを挟んでソケットの方へ押し出す。ター
レットを用いれば、測定部の部品交換に際し、従来、湾
曲したIC滑走路の湾曲内側に位置するために、作業が
困難だったワークガイドやレールの交換が非常に容易に
なることは、この図から良く判るであろう0図示の場合
に、IC圧入位置に在るのは幅300m1lのプラスチ
ックパッケージ用で、左廻りに順次400m i I用
、300m1lガラスセラミツクパツケージ用、600
m1l用である。 本実施例では、ターレットは4本の
支持腕を有しているが、必要ならば6本程度に増加させ
ることもできる。FIG. 1(a) is a side view of the turret, which forms the basis of the present invention, and FIG. 1(b) is a plan view thereof. Reference numeral 13 indicates the turret, and other symbols are the same as in FIG. 2. In this embodiment, the press mechanism 8 for press-fitting the IC 2 into the socket 5 is attached to the end bent at right angles to the fixed central axis, as shown in FIGS. 1(a) and 1(b). The turret 13 is rotatably supported on this fixed central shaft via a bearing. The members of the turret 13 that support the work guide 6 and the rails 7 are subjected to a press v! in the radial direction. A through hole is provided through which the tip of the At 18 can pass, and the press mechanism 8 passes through this hole, holds the IC between the work guide and the rail, and pushes it toward the socket. This figure shows that using a turret makes it extremely easy to replace work guides and rails, which were traditionally difficult to replace because they were located inside the curve of the curved IC runway, when replacing parts of the measuring section. In the case shown in Figure 0, which you can clearly see, the IC press-fit position is for a plastic package with a width of 300 ml, and in order around the left are 400 ml for I, 300 ml for glass ceramic package, and 600 ml for glass ceramic package.
It is for m1l. In this embodiment, the turret has four support arms, but the number can be increased to about six if necessary.
以上説明したように本発明によれば、IC品種切換え時
の部品交換が簡単容易となって、熟練者でなくても短時
間に部品交換可能な多品種検査用rcハンドラが得られ
る。 ′As described above, according to the present invention, it is possible to easily replace parts when changing IC types, and to obtain an RC handler for multi-product inspection that allows parts to be replaced in a short time even by non-skilled personnel. ′
第1図(a)は本発明に係るターレット近傍の側面図、
図(b)はその平面図、第2図は一般的なICハンドラ
の要部側面図、第3図(a)、(b)、(C)はそれぞ
れ寸法の異なる3種類のワークガイドとレールを示す平
面図である。
1−・予熱挿入部、 2−= I C13−七一トプレ
ス、 4a、4b−・方向転換機構、 5−・−・
ソケット、 6− ワークガイド、 7−・−レー
ル、 8−・プレス機構、 9・−・−・測定部、
10・−分類取出部、 11・−・分類シャトル
、12・・−・アンローダ、13−−−一ターレツト。FIG. 1(a) is a side view of the vicinity of the turret according to the present invention;
Figure (b) is a plan view, Figure 2 is a side view of the main parts of a general IC handler, and Figures 3 (a), (b), and (C) are three types of work guides and rails with different dimensions. FIG. 1-・Preheating insertion part, 2-=IC13-71 top press, 4a, 4b-・Direction changing mechanism, 5-・-・
Socket, 6- Work guide, 7--Rail, 8--Press mechanism, 9--Measuring section,
10.--Classification take-out unit, 11.--Classification shuttle, 12.--Unloader, 13.--Turret.
Claims (1)
分類取出部の順に配置された各部よりなる多品種検査用
ICハンドラにおいて、測定部で試験機に接続されてい
るソケットへICを加圧挿入する動作に際し、幅の異な
るICの品種に対して夫々別寸法のものを必要とするワ
ークガイド、レールを、水平面内で回転可能な複数本の
支持腕を有するターレツトの支持腕の端部に支承させ、
検査対象ICの品種切換えに対応するワークガイド、レ
ールの交換を、ターレツトを回転することにより行うよ
うにしたことを特徴とする多品種検査用ICハンドラ。Preheating insertion part, direction change mechanism, measurement part, direction change mechanism,
In an IC handler for multi-product inspection, which consists of various parts arranged in the order of the sorting and extraction part, when the measuring part pressurizes and inserts the IC into the socket connected to the testing machine, each IC handler has different widths. A work guide or rail that requires a different size is supported on the end of a support arm of a turret having a plurality of support arms rotatable in a horizontal plane,
An IC handler for multi-product inspection, characterized in that work guides and rails can be replaced by rotating a turret in response to changing the type of IC to be tested.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15557984A JPS6135531A (en) | 1984-07-27 | 1984-07-27 | Ic handler for measuring variety of product |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15557984A JPS6135531A (en) | 1984-07-27 | 1984-07-27 | Ic handler for measuring variety of product |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6135531A true JPS6135531A (en) | 1986-02-20 |
Family
ID=15609128
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15557984A Pending JPS6135531A (en) | 1984-07-27 | 1984-07-27 | Ic handler for measuring variety of product |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6135531A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2014067676A1 (en) * | 2012-11-05 | 2014-05-08 | Ismeca Semiconductor Holding Sa | An assembly for testing the performance of a component |
-
1984
- 1984-07-27 JP JP15557984A patent/JPS6135531A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2014067676A1 (en) * | 2012-11-05 | 2014-05-08 | Ismeca Semiconductor Holding Sa | An assembly for testing the performance of a component |
US9140629B2 (en) | 2012-11-05 | 2015-09-22 | Ismeca Semiconductor Holding Sa | Assembly for testing the performance of a component |
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