JPS6135531A - Ic handler for measuring variety of product - Google Patents

Abstract

PURPOSE:To easily set up the facilities within a short period for a variety of products by exchanging work guide and rail by rotating a turret. CONSTITUTION:A press mechanism 3 for pressurizing IC2 to a socket 5 is provided at the end portion bending at a right angle of the fixing center axis. Meanwhile, the turret 13 is pivotably supported to such fixing center axis through a bearing. The member of turret 13 which supports a work guide 6 and a rail 7 is provided with a through hole so that the end part of press mechanism 8 passes therethrough. There press mechanism 8 holds the IC with work guide and rail and pushes it toward the socket through such hole. Use of turret makes easier the exchange of word guide and rail which has been considered difficult, on the occasion of exchanging parts f measuring part.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an IC handler for low-volume, high-mix inspection, which allows parts replacement work corresponding to the change of types of ICs to be tested to be easily and quickly performed.

[Conventional technology]

Figure 2 is a side view of the main parts of a general IC handler, where 1 is the preheating insertion part, 2 is the IC to be inspected, 3 is the heat press for preheating the IC, and 4g and 4b are the directions for changing the sliding direction of the IC. A conversion mechanism, 5 a socket connected to the IC testing machine, 6 a work guide that holds and guides the back of the IC package (the side opposite to the pin bending direction) to prevent the IC from coming off the rail; 7 is the rail, 8 is the measurement part and IC
9 is a measuring section; 10 is a sorting and extracting section that sorts inspected ICs into multiple types based on the test results; 11 is an IC moving perpendicular to the IC sliding direction;
A classification shuttle 12 places the ICs on different unloaders depending on their types, and 12 is an unloader that receives and takes the ICs that have been inspected and classified.

The reason why the IC runway is curved as shown in the diagram is to limit the installation area of the IC handler, and the reason why the runway is curved is to reduce the installation area of the IC handler. However, it is relatively common for the IC pin to move toward the outside of the curve at this measuring section. This is to allow easy access to socket 5 (performance port), which must be maintained regularly.

Figure 3 is a schematic diagram of the measuring section viewed from above, and figure (a) is a width of 3
In the case of 00m1 l IC, figure (b) is 'l'ffl
For an IC of 400 m i 1, the width in Figure (C) is 600 m
The case of a ml IC is shown, and it can be seen that the work guide 6 and rail 7 must be replaced with appropriate ones depending on the width of the IC package. Note that plastic packages and glass packages generally have different thicknesses even if they have the same width, so it is necessary to replace the work guide. In addition, just as in the case of railways, three rails can handle narrow gauge and wide gauge vehicles, IC handlers can also handle two types of vehicles with special rails, etc. For these types, it is necessary to replace the rails, work guides, etc. In order to replace each part associated with changing the type of RC to be inspected, not only replacement parts but also replacement tools must be prepared for each part of the IC handler.

The structure of the IC handler shown in Figure 2 is convenient for reducing the installation space and for maintenance and replacement of sockets or performance ports at the measurement section, but conversely, the structure of the IC handler is convenient for the measurement section located inside the curved IC runway. work guides and rails,
This is inconvenient when replacing the IC to be tested in response to a change in type.

Moreover, it is mainly the measuring section that requires replacement of parts, and it usually takes about one hour even for an experienced person to replace the parts and make adjustments after replacement. Of course, if a dedicated handler is prepared for each product type, the time problem can be solved, but this is extremely uneconomical and impractical in the case of low-volume, multi-product inspection.

[Problem that the invention seeks to solve]

The present invention solves the problem of the conventional IC handler described above, namely, that it takes a lot of man-hours to replace parts of the handler when changing the type during low-volume, high-mix inspection, and allows for easy type change in a short time. The purpose of the present invention is to provide an IC handler for multi-product inspection that is compatible with the following.

[Means for solving problems]

When changing the type of IC to be measured, the IC socket is among the parts that need to be replaced in the measurement section, but this is not a problem since it is extremely easily accessible and easy to replace as described above.

Conventionally, when changing IC types, it took time to replace them because it was troublesome to replace the work guides and rails, which had different dimensions for each type, and were used to pressurize and insert the IC into the socket in the measurement section. , these replacement parts
[It was attached to a turret head like the one used in JL, etc., so that when replacing parts, all you had to do was rotate the turret head. Note that the press mechanism for pushing the IC into the socket through these parts can be simply placed in the same position as in the conventional case.

〔Example〕

FIG. 1(a) is a side view of the turret, which forms the basis of the present invention, and FIG. 1(b) is a plan view thereof. Reference numeral 13 indicates the turret, and other symbols are the same as in FIG. 2. In this embodiment, the press mechanism 8 for press-fitting the IC 2 into the socket 5 is attached to the end bent at right angles to the fixed central axis, as shown in FIGS. 1(a) and 1(b). The turret 13 is rotatably supported on this fixed central shaft via a bearing. The members of the turret 13 that support the work guide 6 and the rails 7 are subjected to a press v! in the radial direction. A through hole is provided through which the tip of the At 18 can pass, and the press mechanism 8 passes through this hole, holds the IC between the work guide and the rail, and pushes it toward the socket. This figure shows that using a turret makes it extremely easy to replace work guides and rails, which were traditionally difficult to replace because they were located inside the curve of the curved IC runway, when replacing parts of the measuring section. In the case shown in Figure 0, which you can clearly see, the IC press-fit position is for a plastic package with a width of 300 ml, and in order around the left are 400 ml for I, 300 ml for glass ceramic package, and 600 ml for glass ceramic package.
It is for m1l. In this embodiment, the turret has four support arms, but the number can be increased to about six if necessary.

〔Effect of the invention〕

As described above, according to the present invention, it is possible to easily replace parts when changing IC types, and to obtain an RC handler for multi-product inspection that allows parts to be replaced in a short time even by non-skilled personnel. ′

[Brief explanation of the drawing]

FIG. 1(a) is a side view of the vicinity of the turret according to the present invention;
Figure (b) is a plan view, Figure 2 is a side view of the main parts of a general IC handler, and Figures 3 (a), (b), and (C) are three types of work guides and rails with different dimensions. FIG. 1-・Preheating insertion part, 2-=IC13-71 top press, 4a, 4b-・Direction changing mechanism, 5-・-・
Socket, 6- Work guide, 7--Rail, 8--Press mechanism, 9--Measuring section,
10.--Classification take-out unit, 11.--Classification shuttle, 12.--Unloader, 13.--Turret.

Claims (1)

[Claims] Preheating insertion part, direction change mechanism, measurement part, direction change mechanism,
In an IC handler for multi-product inspection, which consists of various parts arranged in the order of the sorting and extraction part, when the measuring part pressurizes and inserts the IC into the socket connected to the testing machine, each IC handler has different widths. A work guide or rail that requires a different size is supported on the end of a support arm of a turret having a plurality of support arms rotatable in a horizontal plane,
An IC handler for multi-product inspection, characterized in that work guides and rails can be replaced by rotating a turret in response to changing the type of IC to be tested.