JPS6131423B2 - - Google Patents
Info
- Publication number
- JPS6131423B2 JPS6131423B2 JP55120141A JP12014180A JPS6131423B2 JP S6131423 B2 JPS6131423 B2 JP S6131423B2 JP 55120141 A JP55120141 A JP 55120141A JP 12014180 A JP12014180 A JP 12014180A JP S6131423 B2 JPS6131423 B2 JP S6131423B2
- Authority
- JP
- Japan
- Prior art keywords
- coil
- coils
- probe
- gear
- gears
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 25
- 239000000523 sample Substances 0.000 claims description 18
- 238000012360 testing method Methods 0.000 claims description 6
- 230000007547 defect Effects 0.000 description 22
- 239000002131 composite material Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000011158 quantitative evaluation Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
【発明の詳細な説明】
本発明はプローブ形コイルを用いる渦流探傷法
に使用するプローブに関し、特に検出すべき欠陥
の方向に関係なくその定量的評価を可能とするプ
ローブに関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a probe used in an eddy current flaw detection method using a probe-shaped coil, and particularly to a probe that enables quantitative evaluation of a defect to be detected regardless of its direction.
プローブ形コイルを用いる渦流探傷法は被検材
とプローブ形コイルとを相対移動せしめることに
よつて被検材を探傷走査し、コイルと被検材との
電磁的結合状態の局部的変動点を欠陥として検出
する方法である。 In the eddy current flaw detection method using a probe-shaped coil, the test material is scanned by moving the test material and the probe-shaped coil relative to each other, and local fluctuation points in the electromagnetic coupling state between the coil and the test material are detected. This is a method of detecting it as a defect.
さて、このコイルとしては一般に矩形のコイル
が多用されている。これは矩形コイルの場合、特
定方向の欠陥の検出能が高い為であり、第5図に
示す矩形コイルRC及び第6図に示す円形コイル
CC(等面積とする)の夫々と欠陥Fとの電磁的
結合に着目すると、前者の方が、コイルの有効磁
場発生範囲(その囲繞面積に略々比例する)内に
おいて欠陥が占める割合が高く、またこの割合が
高い程コイルインピーダンスの変化が大きく、そ
れだけ検出能が高くなるという現象から理由づけ
られるところである。 Now, as this coil, generally a rectangular coil is often used. This is because the rectangular coil has a high ability to detect defects in a specific direction.The rectangular coil RC shown in Figure 5 and the circular coil shown in Figure 6
Focusing on the electromagnetic coupling between CC (equal area) and defect F, the former has a higher proportion of defects within the effective magnetic field generation range of the coil (approximately proportional to its surrounding area). This is also explained by the phenomenon that the higher this ratio, the greater the change in coil impedance, and the higher the detection ability.
ところが矩形コイルの場合、その発生磁界がコ
イル軸中心に対し等方的な磁界とはならず、従つ
て同一欠陥に対してもコイルの走査角度によつて
その出力が異なることになる。即ちコイルの走査
方向又はコイルと被検物の相対移動方向によつて
出力が支配される処となる。従つて欠陥の方向が
一定している場合はともかく、種々の方向の欠陥
が混在する場合はコイルの出力信号に基づいて欠
陥の定量的評価(深さ等)を行い得ないという不
都合がある。 However, in the case of a rectangular coil, the generated magnetic field is not isotropic with respect to the center of the coil axis, and therefore, even for the same defect, the output will differ depending on the scanning angle of the coil. That is, the output is controlled by the scanning direction of the coil or the relative movement direction between the coil and the object to be inspected. Therefore, even if the direction of the defect is constant, if there are defects in various directions, there is a problem in that it is not possible to quantitatively evaluate the defect (depth, etc.) based on the output signal of the coil.
そこで矩形コイルをその中心回りに回転させつ
つ走査して指向性の悪影響を解決せんとする方法
が提案されているが、回転体から信号を取出すた
めの機構としてスリツプリング、回転トランス等
を必要とし、このためにコイルを含む検出ヘツド
が複雑化、且つ大型化するという難点があり、ま
た回転部の精度維持のための保守が煩わしいとい
う問題もある。 Therefore, a method has been proposed in which a rectangular coil is rotated around its center while scanning to solve the adverse effect of directivity, but this method requires a slip ring, a rotating transformer, etc. as a mechanism to extract signals from the rotating body. Therefore, there is a problem that the detection head including the coil becomes complicated and large, and there is also the problem that maintenance to maintain the precision of the rotating part is troublesome.
本発明は斯かる事情に鑑みてなされたものであ
つて、単に直線走査を行うのみで欠陥の定量的評
価を可能とする渦流探傷用プローブを提供するこ
とを目的とする。 The present invention has been made in view of the above circumstances, and it is an object of the present invention to provide an eddy current flaw detection probe that enables quantitative evaluation of defects simply by performing linear scanning.
本発明に係る渦流探傷用プローブは、被検物の
探傷面に平行な矩形の検出コイルを複数備えてお
り、複数の検出コイルは探傷面に垂直な軸回りに
回動可能に設けてあり、その走査方向に対して各
別の角度をなす如く回動位置が固定される構成と
してあることを特徴とする。なおここにおいて矩
形とは広義の矩形、即ち正方形も含むものとす
る。 The eddy current flaw detection probe according to the present invention includes a plurality of rectangular detection coils parallel to the flaw detection surface of the test object, and the plurality of detection coils are rotatably provided around an axis perpendicular to the flaw detection surface, It is characterized in that the rotational positions are fixed so as to form different angles with respect to the scanning direction. Note that the term "rectangle" as used herein includes a rectangle in a broad sense, that is, a square.
まず本発明のプローブによる探傷にて種々の方
向の欠陥の定量的評価が可能であるとする原理に
ついて説明する。 First, the principle by which defects in various directions can be quantitatively evaluated by flaw detection using the probe of the present invention will be explained.
第1図は本発明のプローブのある時点における
平面レイアウトを示す模式図である。コイル(即
ち検出コイルと見做すべきもの)11〜17は
夫々に全体として平面視で矩形をなしており、更
に詳述すると10mm×10mmの平面寸法を有するコイ
ルユニツトを一方向に3個連設して10mm×30mmの
矩形状に配したものである。各コイルは同一円周
上に15゜ずつ離隔させて扇形に配設している。即
ち各コイルは短辺の一方をこの円の中心側に、ま
た他方を遠心側に位置せしめ、コイル中心間ピツ
チが15゜となるようにして7つのコイルを11,
12…17の順に放射状に配列してあり、各コイ
ルはコイル11の巻終りをコイル12の巻初め
に、コイル12の巻終りをコイル13の巻初めに
…というようにして各コイル出力を合成するよう
に直列接続し、コイル11の巻初め及びコイル1
7の巻終りをブリツジに接続した構成にしてあ
る。そしてこのプローブは中間のコイル14の長
手方向を走査方向(白抜矢符にて示す)とするよ
うに使用される。 FIG. 1 is a schematic diagram showing the planar layout of the probe of the present invention at a certain point in time. The coils (that is, those to be regarded as detection coils) 11 to 17 each have a rectangular shape in plan view, and more specifically, three coil units having a planar dimension of 10 mm x 10 mm are arranged in a row in one direction. They are arranged in a rectangular shape of 10 mm x 30 mm. The coils are arranged in a fan shape on the same circumference, spaced apart by 15 degrees. That is, one short side of each coil is placed on the center side of this circle, and the other side is placed on the distal side, and the seven coils are arranged so that the pitch between the coil centers is 15 degrees.
The coils are arranged radially in the order of 12...17, and each coil output is synthesized by placing the end of coil 11 at the beginning of coil 12, the end of coil 12 at the beginning of coil 13, etc. Connect in series so that the beginning of winding of coil 11 and coil 1
The end of volume 7 is connected to the bridge. This probe is used so that the longitudinal direction of the intermediate coil 14 is the scanning direction (indicated by an open arrow).
第2図は上述のコイル11〜17単独の出力特
性の実測結果を示している。コイルは相互誘導コ
イルの検出コイル(ピツクアツプコイル)として
使用し、また人工欠陥のサイズを深さ10mm、巾
0.3mm、長さ100mmとした場合においてコイルの走
査方向と人工欠陥Fの長手方向とのなす角度θと
規格化出力を求めたものである。これによれば前
述した如きコイルの検出能の指向性が明瞭である
が、本発明のプローブによつて探傷を行う場合は
斯かる指向性が打消される。これは走査方向に対
する各コイルの長手方向の角度が区々に異なるた
めであつて、あるコイルについて出力が低い値と
なる角度の欠陥については他のコイルの出力がこ
れを補うように作用する為である。 FIG. 2 shows actual measurement results of the output characteristics of the above-mentioned coils 11 to 17 alone. The coil is used as a detection coil (pickup coil) of the mutual induction coil, and the size of the artificial defect is 10mm deep and 10mm wide.
The angle θ between the scanning direction of the coil and the longitudinal direction of the artificial defect F and the normalized output are calculated when the length is 0.3 mm and the length is 100 mm. According to this, the directivity of the detection ability of the coil as described above is clear, but when flaw detection is performed using the probe of the present invention, such directivity is canceled out. This is because the angle in the longitudinal direction of each coil with respect to the scanning direction differs from one another, and if there is a defect in the angle that causes the output of a certain coil to be a low value, the output of other coils acts to compensate for this. It is.
第3図は第1図に示したプローブの走査方向と
欠陥Fの長手方向とのなす角度をαとして、全コ
イルによる複合的規格化出力を2点鎖線で示した
ものである。図中,…を付した実線は各コ
イル11,12…17の単独の出力を示すもので
あつて、各出力はそのレイアウトから明らかな如
く15゜の位相差を有しており、複合出力は各コイ
ル出力の包路線で示される特性となる。従つて本
発明による場合は欠陥の方向に拘わらず安定した
値の出力が得られることになる。なお第3図に示
す複合出力は0゜(又は180゜)の近傍でやや低
い値となつているが、これは第1図に示すプロー
ブでは、走査方向に対するコイルの長手方向角度
が最大のもの(コイル11,17)で45゜である
ためであり、更に60゜、75゜、90゜のものを付加
することにより全角度に亘つて平坦な複合出力特
性を得ることが可能になることは勿論である。 FIG. 3 shows the composite normalized output of all the coils using a chain double-dashed line, where α is the angle between the scanning direction of the probe shown in FIG. 1 and the longitudinal direction of the defect F. In the figure, the solid lines marked with ... indicate the individual outputs of each coil 11, 12...17, and as is clear from the layout, each output has a phase difference of 15 degrees, and the composite output is The characteristics are shown by the envelope line of each coil output. Therefore, according to the present invention, a stable output value can be obtained regardless of the direction of the defect. Note that the composite output shown in Figure 3 has a slightly low value near 0° (or 180°), but this is because the probe shown in Figure 1 has a maximum longitudinal angle of the coil with respect to the scanning direction. (Coils 11, 17) are 45 degrees, and by adding coils of 60 degrees, 75 degrees, and 90 degrees, it is possible to obtain a flat composite output characteristic over all angles. Of course.
なお上記実施例では各コイルを直列接続するこ
ととしたが各コイルを各別のブリツジに接続し、
各ブリツジの不平衡電流を合成する如き方法によ
つて複合処理することとしてもよい。 In the above example, each coil was connected in series, but each coil was connected to a separate bridge,
Composite processing may be performed by combining the unbalanced currents of each bridge.
第4図は本発明に係るプローブの構造を示す模
式的平面図である。このプローブは複数の検出コ
イルの相対的角度関係を、換言すれば走査方向に
対するコイル角度を変更可能としたものである。
図示しない支持部材の下端において、更に下方に
位置する被検物の探傷面に臨ませるべく取付けら
れている底無状のケース30内には下記のモー
タ、歯車群及びコイル等が配設されており、各コ
イルは被検物と適宜の間隔を隔てて対向するよう
に収納されている。 FIG. 4 is a schematic plan view showing the structure of the probe according to the present invention. This probe is capable of changing the relative angular relationship between a plurality of detection coils, in other words, the coil angle with respect to the scanning direction.
The following motor, gear group, coil, etc. are arranged in a bottomless case 30 that is installed at the lower end of a support member (not shown) so as to face the flaw detection surface of the test object located further below. Each coil is housed so as to face the object to be inspected at an appropriate distance.
31はモータ32の出力軸に直結された歯車で
あつて回転軸(モータ出力軸)を鉛直にしてあ
る。33,34は同仕様の歯車であつて相互に噛
合し、また歯車33が歯車31と噛合し、歯車3
3の回転軸中心と歯車31及び34の各回転軸中
心とを夫々に結ぶ線は直交するように各歯車を位
置せしめてある。これらの歯車33,34の回転
軸夫々には、より小径であつて同仕様の歯車3
5,36が夫々同軸的に装着されている。 31 is a gear directly connected to the output shaft of the motor 32, and the rotating shaft (motor output shaft) is vertical. 33 and 34 are gears of the same specification and mesh with each other, gear 33 meshes with gear 31, and gear 3
The gears are positioned so that the lines connecting the center of the rotation axis of No. 3 and the center of each rotation axis of the gears 31 and 34 are orthogonal to each other. Each of the rotating shafts of these gears 33 and 34 has a smaller diameter gear 3 with the same specifications.
5 and 36 are coaxially attached to each other.
歯車31,33の回転軸中心を結び線分の歯車
33側の延長上にその回転軸中心を位置せしめる
ようにして歯車37が取付けられており、この歯
車37は歯車35と噛合するようにしている。一
方、上記線分と平行であつて歯車34,36の回
転軸を通る直線上には歯車37と同仕様の歯車3
8を、歯車36と噛合するように取付けてある。 A gear 37 is mounted so that the center of the rotation axis is located on the extension of the line segment on the gear 33 side connecting the centers of the rotation axes of the gears 31 and 33, and this gear 37 meshes with the gear 35. There is. On the other hand, on a straight line that is parallel to the line segment and passes through the rotation axes of gears 34 and 36, there is a gear 3 having the same specifications as gear 37.
8 is attached so as to mesh with the gear 36.
そしてこのような歯車37,38の下面には
夫々コイル24,22が取付けられている。また
歯車37,38の中間にはコイル23を取付けて
ある。このコイル23は他のコイルとは異なりケ
ース30に固定的に取付けてある。 Coils 24 and 22 are attached to the lower surfaces of these gears 37 and 38, respectively. Further, a coil 23 is attached between the gears 37 and 38. This coil 23, unlike the other coils, is fixedly attached to the case 30.
同仕様の歯車39,40は前記歯車33,34
と噛合するように配設され、この歯車39,40
夫々の下面にはコイル25,21が夫々取付けら
れている。そしてコイル21〜25の中心又は歯
車37〜70の回転中心は同一円周上に、且つ15
〜20゜程度の適当な等しい角度ずつ離隔して位置
し、各歯車を連動回転させてもコイル中心の相対
的位置関係は変動せず、また図示の如く、初期的
状態では各コイル21〜25の長手方向が平行と
なるようにしてある。更に歯車33,34の歯数
をN3、歯車35,36の歯数をN5、歯車37,
38の歯数をN7、歯車39,40の歯数をN9と
すると、
2N5/N7=N3/N9 …(1)
の関係を満足するように各歯数を定めている。こ
のプローブは白抜矢符で示す走査方向を中央の固
定したコイル23の長手方向と一致させて使用す
るが、この走査方向に対する他のコイルの長手方
向の角度βはモータ32を適当量回転させて各歯
車を所定方向へ回転させることによつて任意に変
更させ得、しかも(1)式の如く歯数を定めておくこ
とにより、第5図に2点鎖線で示すように外側の
コイル21,25の角度を内側のコイル22,2
4の角度βの2倍、即ち2βに自動的に設定する
ことができる。従つてこのプローブによる場合は
欠陥性状に応じてこの角度βを適宜変更して探傷
できる。例えば走査方向と直交する方向の欠陥だ
けが検出対象である場合はβ=0゜、種々の方向
の欠陥を検出対象とする場合β=30〜45゜とする
ようにして使用するのが総合的検出感度を高める
上で、また欠陥の方向による影響を回避する上で
望ましい。 Gears 39 and 40 with the same specifications are the gears 33 and 34.
These gears 39, 40 are arranged so as to mesh with each other.
Coils 25 and 21 are attached to the lower surface of each. The centers of the coils 21 to 25 or the rotation centers of the gears 37 to 70 are on the same circumference, and 15
Even if the gears are rotated in conjunction with each other, the relative positional relationship of the coil centers will not change, and as shown in the figure, in the initial state, each coil 21 to 25 The longitudinal directions of the two are parallel to each other. Further, the number of teeth of gears 33 and 34 is N 3 , the number of teeth of gears 35 and 36 is N 5 , gear 37,
When the number of teeth on gear 38 is N 7 and the number of teeth on gears 39 and 40 is N 9 , the number of teeth is determined to satisfy the following relationship: 2N 5 /N 7 = N 3 /N 9 (1) . This probe is used by aligning the scanning direction indicated by the white arrow with the longitudinal direction of the central fixed coil 23, but the angle β of the longitudinal direction of the other coils with respect to this scanning direction is determined by rotating the motor 32 by an appropriate amount. By rotating each gear in a predetermined direction, the number of teeth can be changed arbitrarily, and by determining the number of teeth as shown in equation (1), the outer coil 21 can be changed as shown by the two-dot chain line in FIG. , 25 angle to the inner coil 22, 2
The angle β can be automatically set to twice the angle β of 4, that is, 2β. Therefore, when using this probe, flaw detection can be performed by changing the angle β as appropriate depending on the nature of the defect. For example, if the target is only defects perpendicular to the scanning direction, β = 0°, and if defects in various directions are to be detected, β = 30 to 45°. This is desirable in terms of increasing detection sensitivity and avoiding the influence of the direction of the defect.
以上のように本発明による場合はコイル種々の
指向性の問題点を解決してプローブを謂わば無指
向性になし得るから走査方向と欠陥の方向とに関
係なく欠陥の深さの評価を行うことができる。そ
して被検物に応じてコイルの角度を設定すること
ができるので、最良の感度を得ることができる。
更に従来の如くコイルを回転させる必要がない
(第4図に示す本発明プローブは検査時に回転の
必要はない)ので検出ヘツドの構造は複雑化せ
ず、保守の煩わしさもない等、本発明は優れた効
果を奏する。 As described above, in the case of the present invention, the various directivity problems of the coil can be solved and the probe can be made non-directional, so the depth of the defect can be evaluated regardless of the scanning direction and the direction of the defect. be able to. Since the angle of the coil can be set according to the object being tested, the best sensitivity can be obtained.
Furthermore, since there is no need to rotate the coil as in the conventional case (the probe of the present invention shown in Fig. 4 does not require rotation during inspection), the structure of the detection head is not complicated and maintenance is not troublesome. It has excellent effects.
第1図は本発明の原理説明のための模式図、第
2図はコイル単独の出力特性図、第3図は複合出
力特性図、第4図は本発明の係るプローブの模式
的平面図、第5図、第6図は指向性の説明図であ
る。
11,12…17、21,22…コイル、3
1,33,34…39,40…歯車。
FIG. 1 is a schematic diagram for explaining the principle of the present invention, FIG. 2 is an output characteristic diagram of the coil alone, FIG. 3 is a composite output characteristic diagram, and FIG. 4 is a schematic plan view of the probe according to the present invention. FIG. 5 and FIG. 6 are explanatory diagrams of directivity. 11, 12...17, 21, 22...Coil, 3
1, 33, 34...39, 40...gear.
Claims (1)
複数備えており、複数の検出コイルは探傷面に垂
直な軸回りに回動可能に設けてあり、その走査方
向に対して各別の角度をなす如く回動位置が固定
される構成としてあることを特徴とする渦流探傷
用プローブ。1. It is equipped with multiple rectangular detection coils parallel to the flaw detection surface of the test object, and the multiple detection coils are provided so as to be rotatable around an axis perpendicular to the flaw detection surface. An eddy current flaw detection probe characterized in that the rotational position is fixed so as to form an angle.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55120141A JPS5744851A (en) | 1980-08-29 | 1980-08-29 | Eddy current type flaw detecting method and probe thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55120141A JPS5744851A (en) | 1980-08-29 | 1980-08-29 | Eddy current type flaw detecting method and probe thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5744851A JPS5744851A (en) | 1982-03-13 |
JPS6131423B2 true JPS6131423B2 (en) | 1986-07-19 |
Family
ID=14778974
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55120141A Granted JPS5744851A (en) | 1980-08-29 | 1980-08-29 | Eddy current type flaw detecting method and probe thereof |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5744851A (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61290220A (en) * | 1985-06-18 | 1986-12-20 | 大元 聖司 | Screw pin |
JP2769534B2 (en) * | 1992-05-19 | 1998-06-25 | 株式会社システムハイテック | Array structure of magnetic sensors in thin steel strip magnetic testing equipment |
JP5978661B2 (en) * | 2012-03-08 | 2016-08-24 | Jfeスチール株式会社 | Electromagnetic flaw detection probe |
-
1980
- 1980-08-29 JP JP55120141A patent/JPS5744851A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5744851A (en) | 1982-03-13 |
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