JPS6130741A - 光フアイバの後方散乱光異常パタ−ン検出方法およびその装置 - Google Patents

光フアイバの後方散乱光異常パタ−ン検出方法およびその装置

Info

Publication number
JPS6130741A
JPS6130741A JP15343684A JP15343684A JPS6130741A JP S6130741 A JPS6130741 A JP S6130741A JP 15343684 A JP15343684 A JP 15343684A JP 15343684 A JP15343684 A JP 15343684A JP S6130741 A JPS6130741 A JP S6130741A
Authority
JP
Japan
Prior art keywords
curve
optical fiber
backscattered light
points
smoothing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15343684A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0544975B2 (enrdf_load_stackoverflow
Inventor
Hisao Maki
久雄 牧
Hideji Furuya
古家　秀司
Tsuneo Horiguchi
常雄 堀口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Sumitomo Electric Industries Ltd
Original Assignee
Nippon Telegraph and Telephone Corp
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp, Sumitomo Electric Industries Ltd filed Critical Nippon Telegraph and Telephone Corp
Priority to JP15343684A priority Critical patent/JPS6130741A/ja
Publication of JPS6130741A publication Critical patent/JPS6130741A/ja
Publication of JPH0544975B2 publication Critical patent/JPH0544975B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3145—Details of the optoelectronics or data analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Light Guides In General And Applications Therefor (AREA)
JP15343684A 1984-07-24 1984-07-24 光フアイバの後方散乱光異常パタ−ン検出方法およびその装置 Granted JPS6130741A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15343684A JPS6130741A (ja) 1984-07-24 1984-07-24 光フアイバの後方散乱光異常パタ−ン検出方法およびその装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15343684A JPS6130741A (ja) 1984-07-24 1984-07-24 光フアイバの後方散乱光異常パタ−ン検出方法およびその装置

Publications (2)

Publication Number Publication Date
JPS6130741A true JPS6130741A (ja) 1986-02-13
JPH0544975B2 JPH0544975B2 (enrdf_load_stackoverflow) 1993-07-07

Family

ID=15562478

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15343684A Granted JPS6130741A (ja) 1984-07-24 1984-07-24 光フアイバの後方散乱光異常パタ−ン検出方法およびその装置

Country Status (1)

Country Link
JP (1) JPS6130741A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0422836A (ja) * 1990-05-18 1992-01-27 Kokusai Denshin Denwa Co Ltd <Kdd> 電気的パルスエコーによる光海底ケーブルの障害点測定方法
JP2011158330A (ja) * 2010-01-29 2011-08-18 Nippon Telegr & Teleph Corp <Ntt> 光線路測定装置及び光線路測定方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0422836A (ja) * 1990-05-18 1992-01-27 Kokusai Denshin Denwa Co Ltd <Kdd> 電気的パルスエコーによる光海底ケーブルの障害点測定方法
JP2011158330A (ja) * 2010-01-29 2011-08-18 Nippon Telegr & Teleph Corp <Ntt> 光線路測定装置及び光線路測定方法

Also Published As

Publication number Publication date
JPH0544975B2 (enrdf_load_stackoverflow) 1993-07-07

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