JPS6130221Y2 - - Google Patents

Info

Publication number
JPS6130221Y2
JPS6130221Y2 JP18690381U JP18690381U JPS6130221Y2 JP S6130221 Y2 JPS6130221 Y2 JP S6130221Y2 JP 18690381 U JP18690381 U JP 18690381U JP 18690381 U JP18690381 U JP 18690381U JP S6130221 Y2 JPS6130221 Y2 JP S6130221Y2
Authority
JP
Japan
Prior art keywords
holder
diode
bearing hole
inspection jig
ball bearing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP18690381U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5891177U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18690381U priority Critical patent/JPS5891177U/ja
Publication of JPS5891177U publication Critical patent/JPS5891177U/ja
Application granted granted Critical
Publication of JPS6130221Y2 publication Critical patent/JPS6130221Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP18690381U 1981-12-15 1981-12-15 半導体装置の検査治具 Granted JPS5891177U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18690381U JPS5891177U (ja) 1981-12-15 1981-12-15 半導体装置の検査治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18690381U JPS5891177U (ja) 1981-12-15 1981-12-15 半導体装置の検査治具

Publications (2)

Publication Number Publication Date
JPS5891177U JPS5891177U (ja) 1983-06-20
JPS6130221Y2 true JPS6130221Y2 (enrdf_load_html_response) 1986-09-04

Family

ID=29989253

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18690381U Granted JPS5891177U (ja) 1981-12-15 1981-12-15 半導体装置の検査治具

Country Status (1)

Country Link
JP (1) JPS5891177U (enrdf_load_html_response)

Also Published As

Publication number Publication date
JPS5891177U (ja) 1983-06-20

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