JPS6129150B2 - - Google Patents
Info
- Publication number
- JPS6129150B2 JPS6129150B2 JP55039408A JP3940880A JPS6129150B2 JP S6129150 B2 JPS6129150 B2 JP S6129150B2 JP 55039408 A JP55039408 A JP 55039408A JP 3940880 A JP3940880 A JP 3940880A JP S6129150 B2 JPS6129150 B2 JP S6129150B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- terminal
- collector
- epitaxial layer
- load resistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 claims description 10
- 239000000758 substrate Substances 0.000 claims description 8
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 239000012535 impurity Substances 0.000 claims description 2
- 229910052796 boron Inorganic materials 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
- 230000010354 integration Effects 0.000 description 4
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- -1 boron ions Chemical class 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 229910052785 arsenic Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 150000004767 nitrides Chemical class 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/07—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common
- H01L27/0744—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common without components of the field effect type
- H01L27/075—Bipolar transistors in combination with diodes, or capacitors, or resistors, e.g. lateral bipolar transistor, and vertical bipolar transistor and resistor
- H01L27/0755—Vertical bipolar transistor in combination with diodes, or capacitors, or resistors
- H01L27/0761—Vertical bipolar transistor in combination with diodes only
- H01L27/0766—Vertical bipolar transistor in combination with diodes only with Schottky diodes only
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Static Random-Access Memory (AREA)
- Bipolar Transistors (AREA)
- Semiconductor Memories (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3940880A JPS56135961A (en) | 1980-03-27 | 1980-03-27 | Semiconductor memory device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3940880A JPS56135961A (en) | 1980-03-27 | 1980-03-27 | Semiconductor memory device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56135961A JPS56135961A (en) | 1981-10-23 |
JPS6129150B2 true JPS6129150B2 (ar) | 1986-07-04 |
Family
ID=12552158
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3940880A Granted JPS56135961A (en) | 1980-03-27 | 1980-03-27 | Semiconductor memory device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56135961A (ar) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0245809U (ar) * | 1988-09-27 | 1990-03-29 |
-
1980
- 1980-03-27 JP JP3940880A patent/JPS56135961A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0245809U (ar) * | 1988-09-27 | 1990-03-29 |
Also Published As
Publication number | Publication date |
---|---|
JPS56135961A (en) | 1981-10-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US4370798A (en) | Interlevel insulator for integrated circuit with implanted resistor element in second-level polycrystalline silicon | |
US4152627A (en) | Low power write-once, read-only memory array | |
JPS58212164A (ja) | バイポ−ラメモリセル | |
US6326674B1 (en) | Integrated injection logic devices including injection regions and tub or sink regions | |
EP0080730B1 (en) | Semiconductor device with wiring layers and method of manufacturing the same | |
US4433471A (en) | Method for the formation of high density memory cells using ion implantation techniques | |
JPS6057707B2 (ja) | 記憶回路 | |
US4376984A (en) | Programmable read-only memory device | |
JPH06105765B2 (ja) | 半導体romアレイを作成するプロセス | |
US4400712A (en) | Static bipolar random access memory | |
EP0043007B1 (en) | Saturation-limited bipolar transistor circuit structure and method of making | |
EP0186421A1 (en) | ECL memory cells | |
JPS6156627B2 (ar) | ||
US4228451A (en) | High resistivity semiconductor resistor device | |
US4329703A (en) | Lateral PNP transistor | |
JPS61113270A (ja) | モノリシックトランジスタ論理回路 | |
JPS6231832B2 (ar) | ||
JPS6129150B2 (ar) | ||
US5016075A (en) | Semiconductor memory device | |
JPS6037621B2 (ja) | 半導体記憶装置 | |
JPS6241424B2 (ar) | ||
Vora et al. | A 2 micron high performance bipolar 64K ECL static RAM technology with 200 square microns contactless memory cell | |
JPH0128507B2 (ar) | ||
JPS59149045A (ja) | 半導体装置の製造方法 | |
JPS63119255A (ja) | 低ド−ズエミッタ垂直フュ−ズ |