JPS61259449A - 二重収束質量分析装置 - Google Patents

二重収束質量分析装置

Info

Publication number
JPS61259449A
JPS61259449A JP10085185A JP10085185A JPS61259449A JP S61259449 A JPS61259449 A JP S61259449A JP 10085185 A JP10085185 A JP 10085185A JP 10085185 A JP10085185 A JP 10085185A JP S61259449 A JPS61259449 A JP S61259449A
Authority
JP
Japan
Prior art keywords
ion beam
magnetic field
electrostatic lens
quadrupole electrostatic
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP10085185A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0357574B2 (cg-RX-API-DMAC10.html
Inventor
Hisashi Matsuda
松田 久
Morio Ishihara
石原 盛男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP10085185A priority Critical patent/JPS61259449A/ja
Publication of JPS61259449A publication Critical patent/JPS61259449A/ja
Publication of JPH0357574B2 publication Critical patent/JPH0357574B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • H01J49/32Static spectrometers using double focusing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP10085185A 1985-05-13 1985-05-13 二重収束質量分析装置 Granted JPS61259449A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10085185A JPS61259449A (ja) 1985-05-13 1985-05-13 二重収束質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10085185A JPS61259449A (ja) 1985-05-13 1985-05-13 二重収束質量分析装置

Publications (2)

Publication Number Publication Date
JPS61259449A true JPS61259449A (ja) 1986-11-17
JPH0357574B2 JPH0357574B2 (cg-RX-API-DMAC10.html) 1991-09-02

Family

ID=14284819

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10085185A Granted JPS61259449A (ja) 1985-05-13 1985-05-13 二重収束質量分析装置

Country Status (1)

Country Link
JP (1) JPS61259449A (cg-RX-API-DMAC10.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02270256A (ja) * 1989-04-11 1990-11-05 Jeol Ltd 同時検出型質量分析装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS568981A (en) * 1979-07-03 1981-01-29 Hitachi Ltd Selection system for balancing connected network

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS568981A (en) * 1979-07-03 1981-01-29 Hitachi Ltd Selection system for balancing connected network

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02270256A (ja) * 1989-04-11 1990-11-05 Jeol Ltd 同時検出型質量分析装置

Also Published As

Publication number Publication date
JPH0357574B2 (cg-RX-API-DMAC10.html) 1991-09-02

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term