JPS61254262A - Dehydration apparatus - Google Patents

Dehydration apparatus

Info

Publication number
JPS61254262A
JPS61254262A JP9233585A JP9233585A JPS61254262A JP S61254262 A JPS61254262 A JP S61254262A JP 9233585 A JP9233585 A JP 9233585A JP 9233585 A JP9233585 A JP 9233585A JP S61254262 A JPS61254262 A JP S61254262A
Authority
JP
Japan
Prior art keywords
substrate
frame body
rotary
dehydration
substrates
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9233585A
Other languages
Japanese (ja)
Inventor
Hiroko Kuriyama
栗山 宏子
Noriaki Matsuura
松浦 範彰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP9233585A priority Critical patent/JPS61254262A/en
Publication of JPS61254262A publication Critical patent/JPS61254262A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To enhance the dehydration capacity of a substrate, by efficiently contacting a substrate such as a semiconductive substrate with a gas stream at the time of rotation in such a state that said substrate is supported so as to be inclined with respect to a rotary surface. CONSTITUTION:A substrate cassette 3 is attached to a rotary frame body 5 so that semiconductive substrates 4 cross the rotary surface of the rotary frame body 5. Therefore, when the rotary frame body 5 is rotated, the drying gas supplied from the blow-off port 2 of the drying gas supply pipe 1 extending to the interior of the frame body 5 along the rotary shaft of said frame body is directly contacted with the lower side main surface of each semiconductive substrate 4 and formed into a gas stream by the rotation of the substrates 4 and this gas stream is also contacted with the substrates 4 to further enhance dehydration effect.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、半導体基板等の基板の脱水装置に関するもの
である。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a dehydrating apparatus for substrates such as semiconductor substrates.

従来の技術 第3図に従来の(半導体)基板のための遠心脱水装置を
示した。図中11は乾燥ガス供給管、12は同ガスの吹
き出し口、13は半導体基板等の基板を支持する基板カ
セット、14は被処理用の半導体基板、15は回転枠体
である。供給管11は回転枠体15の回転軸に沿って回
転枠体15内に延び、吹き出し口12が所定の間隔で設
けられている。基板カセット13は、基板14を回転枠
体15の回転面と平行に支持するように取付けられてい
る。
Prior Art FIG. 3 shows a conventional centrifugal dehydration apparatus for (semiconductor) substrates. In the figure, 11 is a dry gas supply pipe, 12 is a gas outlet, 13 is a substrate cassette that supports a substrate such as a semiconductor substrate, 14 is a semiconductor substrate to be processed, and 15 is a rotating frame. The supply pipe 11 extends into the rotating frame 15 along the rotation axis of the rotating frame 15, and has air outlets 12 provided at predetermined intervals. The substrate cassette 13 is attached to support the substrate 14 in parallel to the rotating surface of the rotating frame 15.

基板の脱水は、回転方向に平行に面装置された基板の高
速回転による遠心力だけでは不充分である。そこで、第
3図に示すように、回転枠体15内のガスを排気すると
同時に、吹き出し口12から半導体基板14への乾燥ガ
スの吹き付け、或いは乾燥ガスの吸引を行なって、半導
体基板14の回転による遠心力に加えて半導体基板14
と乾燥ガスの接触によっても脱水されるように構成され
ている。
Centrifugal force generated by high-speed rotation of a substrate parallel to the direction of rotation is insufficient for dehydrating the substrate. Therefore, as shown in FIG. 3, at the same time as exhausting the gas in the rotating frame 15, dry gas is blown onto the semiconductor substrate 14 from the air outlet 12, or the dry gas is sucked, thereby causing the semiconductor substrate 14 to rotate. In addition to the centrifugal force caused by the semiconductor substrate 14
The structure is such that water can also be dehydrated by contact with drying gas.

本発明が解決しようとする問題点 脱水装置の性能向上として、脱水が基板全体に対して均
一に行なわれること、すなわち基板上の水分の脱水均一
性及び脱水時間の短縮化が上げられる。ここで、前述の
ような基板に作用する遠心力及び基板と乾燥ガスの接触
による脱水効果だけではまだまだ不充分で、脱水作用の
不均一性に起因する素子不良の発生はまぬがれない。
Problems to be Solved by the Invention In order to improve the performance of the dehydration device, dehydration can be performed uniformly over the entire substrate, that is, the uniformity of dehydration of moisture on the substrate and the reduction of dehydration time can be raised. Here, the dehydration effect due to the centrifugal force acting on the substrate and the contact between the substrate and the drying gas as described above is still insufficient, and element defects due to non-uniform dehydration cannot be avoided.

問題点を解決するための手段 上記に示したような問題を解決するために、本発明は、
基板を回転面に対して傾斜させて支持する支持部を具え
たものであり、回転によって生じるガス流が直接基板に
当たるようにし、さらに、このガス流によって槽内の排
気がより効率よくなされるようにした。
Means for Solving the Problems In order to solve the problems as shown above, the present invention provides the following:
It is equipped with a support part that supports the substrate at an angle with respect to the rotating surface, so that the gas flow generated by rotation directly hits the substrate, and furthermore, this gas flow can be used to more efficiently exhaust the inside of the tank. I made it.

作  用 本発明によると、基板が自体の高速回転によって生じる
ガス流とも接触するようになるため、これによる脱水効
果と、さらに効率のよい排気がなされることによって−
[52水効果が向上する。すなわち、基板上の水分がよ
り短時間に且つ均一に除去されるので、従来の脱水装置
では避けることができなかった基板上の水分の不均一性
に起因する素子不良の発生が低減される。
Function According to the present invention, since the substrate comes into contact with the gas flow generated by the high-speed rotation of the substrate itself, this dehydration effect and more efficient exhaust are achieved.
[52 Water effect is improved. That is, since moisture on the substrate is removed more uniformly in a shorter time, the occurrence of device defects due to non-uniformity of moisture on the substrate, which could not be avoided with conventional dehydration equipment, is reduced.

実  施  例 以下添付図面に示した本願発明の実施例について詳述す
る。
Embodiments Hereinafter, embodiments of the present invention shown in the attached drawings will be described in detail.

第1図及び第2図は、本発明における基板脱水装置の一
実施例の断面図を示したものである。図において、1は
乾燥ガス供給管、2は乾燥ガスの吹き出し口、3は半導
体基板等の基板を支持する基板力ヒット(支持部)、4
は半導体基板、5は基板カセット3が取付けられた回転
枠体、矢印は回転枠体5の回転方向である。
FIGS. 1 and 2 are cross-sectional views of an embodiment of the substrate dehydrating apparatus according to the present invention. In the figure, 1 is a drying gas supply pipe, 2 is a drying gas outlet, 3 is a substrate force hit (supporting part) that supports a substrate such as a semiconductor substrate, and 4 is a drying gas supply pipe.
is a semiconductor substrate, 5 is a rotating frame body to which a substrate cassette 3 is attached, and the arrow is the rotation direction of the rotating frame body 5.

供給管1は回転枠体5の回転軸に沿って回転枠体5内に
延び、吹き出し口2が所定の間隔で設けられている。
The supply pipe 1 extends into the rotating frame 5 along the rotation axis of the rotating frame 5, and has air outlets 2 provided at predetermined intervals.

基板カセット3は、半導体基板4を回転枠体5の回転面
(@転軸に対して垂直な面)に対してクロスする方向に
支持するように取付(プられている。
The substrate cassette 3 is attached (pull) so as to support the semiconductor substrate 4 in a direction that crosses the rotating surface of the rotating frame 5 (a surface perpendicular to the rotating axis).

従って、回転枠体5が回転すると、半導体基板4はガス
流を生じさせると同時にこのガス流に対して主面が直接
接触する。なお、半導体基板4の主面は下側である。
Therefore, when the rotating frame 5 rotates, the semiconductor substrate 4 generates a gas flow, and at the same time, its principal surface comes into direct contact with the gas flow. Note that the main surface of the semiconductor substrate 4 is the lower side.

発明の効果 以上のように本発明は、基板の主面に直接乾燥ガスと基
板の回転によって生じるガス流が接触するため、基板に
おける脱水効果がさらに増大して、基板上の水分の脱水
均一性が向上する。従って、基板上の水分の脱水不均一
性が原因で発生する素子不良の低減が図れる。
Effects of the Invention As described above, in the present invention, since the main surface of the substrate is directly contacted with the drying gas and the gas flow generated by the rotation of the substrate, the dehydration effect on the substrate is further increased, and the dehydration uniformity of moisture on the substrate is improved. will improve. Therefore, it is possible to reduce device defects caused by non-uniform dehydration of moisture on the substrate.

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図は、本発明における基板脱水装置の実
施例の断面図、第3図は、従来の脱水装置の断面図であ
る。 1・・・乾燥ガス供給管 2・・・乾燥ガスの吹き出し
口 3・・・基板カセット 4・・・半導体基板 5・
・・回転枠体 特許出願人  松下電子工業株式会社 第1図 第2図
1 and 2 are cross-sectional views of an embodiment of the substrate dehydrating apparatus according to the present invention, and FIG. 3 is a cross-sectional view of a conventional dehydrating apparatus. 1...Dry gas supply pipe 2...Dry gas outlet 3...Substrate cassette 4...Semiconductor substrate 5.
... Rotating frame patent applicant Matsushita Electronics Co., Ltd. Figure 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] 基板を支持する支持部を、基板が回転面に対して傾斜し
て支持されるように回転枠体内に設けたことを特徴とす
る脱水装置。
A dewatering device characterized in that a support portion for supporting a substrate is provided within a rotating frame so that the substrate is supported at an angle with respect to a rotating surface.
JP9233585A 1985-05-01 1985-05-01 Dehydration apparatus Pending JPS61254262A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9233585A JPS61254262A (en) 1985-05-01 1985-05-01 Dehydration apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9233585A JPS61254262A (en) 1985-05-01 1985-05-01 Dehydration apparatus

Publications (1)

Publication Number Publication Date
JPS61254262A true JPS61254262A (en) 1986-11-12

Family

ID=14051519

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9233585A Pending JPS61254262A (en) 1985-05-01 1985-05-01 Dehydration apparatus

Country Status (1)

Country Link
JP (1) JPS61254262A (en)

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