JPS6123335A - 化合物半導体結晶の特性測定方法 - Google Patents

化合物半導体結晶の特性測定方法

Info

Publication number
JPS6123335A
JPS6123335A JP14516384A JP14516384A JPS6123335A JP S6123335 A JPS6123335 A JP S6123335A JP 14516384 A JP14516384 A JP 14516384A JP 14516384 A JP14516384 A JP 14516384A JP S6123335 A JPS6123335 A JP S6123335A
Authority
JP
Japan
Prior art keywords
crystal
sample
gallium arsenide
measured
face
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP14516384A
Other languages
English (en)
Japanese (ja)
Other versions
JPH033945B2 (https=
Inventor
Kuninori Kitahara
邦紀 北原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP14516384A priority Critical patent/JPS6123335A/ja
Publication of JPS6123335A publication Critical patent/JPS6123335A/ja
Publication of JPH033945B2 publication Critical patent/JPH033945B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP14516384A 1984-07-11 1984-07-11 化合物半導体結晶の特性測定方法 Granted JPS6123335A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14516384A JPS6123335A (ja) 1984-07-11 1984-07-11 化合物半導体結晶の特性測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14516384A JPS6123335A (ja) 1984-07-11 1984-07-11 化合物半導体結晶の特性測定方法

Publications (2)

Publication Number Publication Date
JPS6123335A true JPS6123335A (ja) 1986-01-31
JPH033945B2 JPH033945B2 (https=) 1991-01-21

Family

ID=15378882

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14516384A Granted JPS6123335A (ja) 1984-07-11 1984-07-11 化合物半導体結晶の特性測定方法

Country Status (1)

Country Link
JP (1) JPS6123335A (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09218174A (ja) * 1996-02-09 1997-08-19 Takenaka Komuten Co Ltd 光触媒膜の検査方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09218174A (ja) * 1996-02-09 1997-08-19 Takenaka Komuten Co Ltd 光触媒膜の検査方法

Also Published As

Publication number Publication date
JPH033945B2 (https=) 1991-01-21

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