JPS612295B2 - - Google Patents

Info

Publication number
JPS612295B2
JPS612295B2 JP13721881A JP13721881A JPS612295B2 JP S612295 B2 JPS612295 B2 JP S612295B2 JP 13721881 A JP13721881 A JP 13721881A JP 13721881 A JP13721881 A JP 13721881A JP S612295 B2 JPS612295 B2 JP S612295B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13721881A
Other languages
Japanese (ja)
Other versions
JPS5839025A (ja
Inventor
Iwao Matsushima
Hiroyuki Toyoda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Home Electronics Ltd
Original Assignee
NEC Home Electronics Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Home Electronics Ltd filed Critical NEC Home Electronics Ltd
Priority to JP13721881A priority Critical patent/JPS5839025A/ja
Publication of JPS5839025A publication Critical patent/JPS5839025A/ja
Publication of JPS612295B2 publication Critical patent/JPS612295B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP13721881A 1981-08-31 1981-08-31 半導体装置の特性測定方法 Granted JPS5839025A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13721881A JPS5839025A (ja) 1981-08-31 1981-08-31 半導体装置の特性測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13721881A JPS5839025A (ja) 1981-08-31 1981-08-31 半導体装置の特性測定方法

Publications (2)

Publication Number Publication Date
JPS5839025A JPS5839025A (ja) 1983-03-07
JPS612295B2 true JPS612295B2 (enrdf_load_stackoverflow) 1986-01-23

Family

ID=15193539

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13721881A Granted JPS5839025A (ja) 1981-08-31 1981-08-31 半導体装置の特性測定方法

Country Status (1)

Country Link
JP (1) JPS5839025A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6239022A (ja) * 1985-08-14 1987-02-20 Toshiba Corp プロ−ブテスト方法
JP5826110B2 (ja) * 2012-05-15 2015-12-02 三菱電機株式会社 太陽電池セル特性評価装置

Also Published As

Publication number Publication date
JPS5839025A (ja) 1983-03-07

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