JPS61220600A - Ultrasonic wave sensor - Google Patents

Ultrasonic wave sensor

Info

Publication number
JPS61220600A
JPS61220600A JP6133785A JP6133785A JPS61220600A JP S61220600 A JPS61220600 A JP S61220600A JP 6133785 A JP6133785 A JP 6133785A JP 6133785 A JP6133785 A JP 6133785A JP S61220600 A JPS61220600 A JP S61220600A
Authority
JP
Japan
Prior art keywords
polymer film
silicon
signal input
electrode
input electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6133785A
Other languages
Japanese (ja)
Inventor
Toshihide Kuriyama
敏秀 栗山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP6133785A priority Critical patent/JPS61220600A/en
Publication of JPS61220600A publication Critical patent/JPS61220600A/en
Pending legal-status Critical Current

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  • Transducers For Ultrasonic Waves (AREA)

Abstract

PURPOSE:To obtain easily an arraying by providing a signal input electrode facing an electrode which is so processed that a metal is evaporated on a high polymer film on the recessed part of an N-typed silicon substrate and providing a signal terminal on a P-typed silicon that pierces the N-typed silicon substrate. CONSTITUTION:A signal input electrode 4 is provided on the base of a recessed part that is provided on an N-typed silicon 1 through an insulator 3. A diaphragm that a metallic electrode 6 is evaporated on a high polymer film 5 is installed as to cover the recessed part of the silicon 1. The signal electrode 4 and a signal terminal 7 are connected to a P<+> typed silicon 2 that is provided to pierce the N-typed silicon 1. Thus, an easy assembling and the arraying are obtained.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、超音波セン→ノーに関し、竹にコンデンサタ
イプの超音波センサに関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an ultrasonic sensor and relates to a bamboo capacitor type ultrasonic sensor.

(従来技術とその間消点) −Sに、超音波センサの一種としてコンデンサタイプの
超音波センサが知られている。これは主に測距センサと
して用いられるセンサで、ρい金属電極が表面に設けら
れた高分子フィルムとこの高分子フィルムと一定の空間
を隔てて設はされた゛(2)極により形成される。
(Prior art and vanishing point) -S, a capacitor type ultrasonic sensor is known as a type of ultrasonic sensor. This sensor is mainly used as a distance measurement sensor, and is formed by a polymer film with a metal electrode on its surface and a (2) pole placed a certain distance apart from the polymer film. .

従来、上記のコンデンサタイプの超音波センサは主に測
距用に使用され、このセンサの表面から送り出される超
音波が正面の物体にはねかえってセンサに戻るまでの遅
廷時間を測ることイこより、計算式 %式% からセンサと対東物体との距離を求めることができる。
Conventionally, the capacitor type ultrasonic sensor mentioned above is mainly used for distance measurement, and it is useful to measure the delay time until the ultrasonic wave sent out from the surface of the sensor bounces off an object in front and returns to the sensor. The distance between the sensor and the object to the east can be calculated from the calculation formula %.

この測距用超音波センサとして、ポラロイド社の自動4
B<点カメラにb+・用されているコンデンザ型超音波
センサがよく知られている。このポラロイド社製の超音
波センサは同心円状に溝が掘られたアルミ円板の表面に
、薄い金属電極が表面に゛設けられた高分子フィルムが
押しつけられた構造を持つ。高分子フィルムの表面とア
ルミの裏面はそれぞれ電極として働き、容易に外部と電
気的ζこ接続される。このように、コンデンサ型超音波
センサは構造が簡単であるという特徴を持っている。
As this distance measuring ultrasonic sensor, Polaroid's automatic 4
A condenser type ultrasonic sensor used in a B< point camera is well known. This ultrasonic sensor manufactured by Polaroid has a structure in which a polymer film with thin metal electrodes is pressed onto the surface of an aluminum disk with concentric grooves. The front surface of the polymer film and the back surface of the aluminum each serve as electrodes and are easily electrically connected to the outside. In this way, the capacitor type ultrasonic sensor is characterized by a simple structure.

しかしながら、コンデンサ型超音波センサを複数個アレ
イ状に配置し、それぞれのセンサから送り出される超音
波の相対的な位相を変化させ超音波を走査する超音波イ
メージングを行う場合、従来のコンデンサ型超音波セン
サを使用するのは困難であった。すなわち、超音波走査
用センサアレイにおいてはアレイを構成するそれぞれの
超音波センサの幅は使用する超音波の波長程度に小さく
する必要がある。たとえば、周波数100 kHzの超
音波の空気中での波長は約34間であり、従来のコンデ
ンサ型超音波センサを波長程度の大きさにしてアレイ状
に並べるのは組立て工程が大幅に増加するという欠点が
生じた。
However, when performing ultrasonic imaging in which multiple capacitor-type ultrasonic sensors are arranged in an array and the relative phase of the ultrasonic waves sent out from each sensor is changed to scan the ultrasonic waves, conventional capacitor-type ultrasonic The sensor was difficult to use. That is, in an ultrasonic scanning sensor array, the width of each ultrasonic sensor forming the array must be made as small as the wavelength of the ultrasonic waves used. For example, the wavelength of ultrasonic waves with a frequency of 100 kHz in air is approximately 34 mm, and it is said that making conventional capacitor-type ultrasonic sensors as large as the wavelength and arranging them in an array would require a significant increase in the assembly process. A shortcoming occurred.

(発明の目的) 本発明の目的は、このような従来の欠点を除去し、セン
サのアレイ化に適したコンデンサ型超音波センサを提供
することにある。
(Object of the Invention) An object of the present invention is to eliminate such conventional drawbacks and provide a capacitor-type ultrasonic sensor suitable for sensor array formation.

(発明の構成) 本発明によれば、薄い金属電極が表面に設けられた高分
子フィルム及びこれと一定の空間を隔てて設置された信
号入力電極からなり、上記電極間に加えられる交流電圧
によりこの高分子フィルムが振動し超音波を発生すると
ともに、超音波がこの高分子フィルムに入射した場合上
記電極間の容量が変化して超音波を検出するセンサにお
いて、上記信号入力電極がn型シリコン基板の一方の而
に形成された凹部に設けられかつ上記薄い金属電極が表
面に設けられた高分子フィルムが前記凹部をおおうよう
に設けられるとともに、この信号入力電極が上記n型シ
リコン基板を貫通するv型層によりもう一方の面に取り
出されていることを特徴と1名超音波センサが得られる
(Structure of the Invention) According to the present invention, a thin metal electrode is composed of a polymer film on the surface of which is provided, and a signal input electrode is installed at a certain distance from the polymer film, and an alternating current voltage applied between the electrodes is used. This polymer film vibrates and generates ultrasonic waves, and when the ultrasonic waves are incident on this polymer film, the capacitance between the electrodes changes and the ultrasonic waves are detected.In the sensor, the signal input electrode is made of n-type silicon. A polymer film is provided in a recess formed on one side of the substrate and has the thin metal electrode on its surface, and is provided to cover the recess, and this signal input electrode penetrates the n-type silicon substrate. A one-person ultrasonic sensor is obtained, characterized in that the V-shaped layer is taken out on the other side.

(実施例) 以下本発明について実施例を示す図面を参照して説明す
る。第1図は本発明の一実施例を示す断面図で同図にお
いて、1はn型シリコン基板、2はP+型シリコン、3
は絶縁体、4は信号入力電極、5はポリエステル等の高
分子フィルム、6は金などの金属電極、7は信号端子、
8はアース端子、9はn+型シリコンである。信号入力
電極4は、n型シリコンウヱハを裏面から異方性エッチ
された領域に絶縁体3をはさんで設けられている。一般
にシリコンを酸化シ11コン(Sin、)膜や窒化シリ
コン膜をマスクとして用い水酸化カリウム(KOH)溶
液やヒドラジン溶液で異方性エッチを行った場合、エツ
チング領域の寸法精度は等方性エッチに比・べ高く特性
のそろったアレイを得ることができた。さらに、信号入
力電極4は、l)+型シリコン2を介してシリコン表面
の信号端子7と接続される。
(Example) The present invention will be described below with reference to drawings showing examples. FIG. 1 is a sectional view showing one embodiment of the present invention. In the same figure, 1 is an n-type silicon substrate, 2 is a P+ type silicon substrate, and 3 is a cross-sectional view showing an embodiment of the present invention.
is an insulator, 4 is a signal input electrode, 5 is a polymer film such as polyester, 6 is a metal electrode such as gold, 7 is a signal terminal,
8 is a ground terminal, and 9 is n+ type silicon. The signal input electrode 4 is provided in a region anisotropically etched from the back side of an n-type silicon wafer with an insulator 3 interposed therebetween. Generally, when silicon is anisotropically etched with a potassium hydroxide (KOH) solution or hydrazine solution using a silicon oxide (Sin) film or a silicon nitride film as a mask, the dimensional accuracy of the etched area is less than that of isotropic etching. We were able to obtain an array with higher uniformity of characteristics compared to the conventional method. Further, the signal input electrode 4 is connected to the signal terminal 7 on the silicon surface via the l)+ type silicon 2.

この〆型シリコンは、シリコン表面に所定の形状のアル
ミ(A7)を厚さ約5μm設けた後、シリコン裏面を光
照射により熱することによりアルミがシリコン中を進む
現象(アンソニー(T、R,A、nthony)。
This type of silicon is produced by forming aluminum (A7) with a thickness of approximately 5 μm in a predetermined shape on the surface of the silicon, and then heating the back surface of the silicon with light irradiation, which causes the aluminum to move through the silicon (Anthony (T, R, A, nthony).

クライン(H,E、CI tne) ;ジャーナル オ
ブ アプライド フィツクス(J、Appl、phys
、)、vo147゜no、6.p、2316.(197
6))を利用して容易に形成することができる。
Klein (H, E, CI tne); Journal of Applied Fixtures (J, Appl, phys.
), vo147゜no, 6. p, 2316. (197
6)) can be easily formed.

(発明の効果) 100μm〜500μmの厚さのシリコン基板1の上下
の面がこのような方法で電気的に接続されるため、コン
デンサ型超音波センサの一方の電極である信号入力電極
4は、シリコン表面に設けられた信号端子7によりシリ
コン表面に取り出され、シリコンの裏面には金属電極6
が設けられた高分子フィルム5を形成するだけでよく、
組立ても簡単になった。アレイ化した場合、それぞれの
信号端子は絶縁体3とメ型シリコン2、n型シリコン1
によるP−n接合により電気的に分離されている。
(Effect of the invention) Since the upper and lower surfaces of the silicon substrate 1 having a thickness of 100 μm to 500 μm are electrically connected in this way, the signal input electrode 4, which is one electrode of the capacitor type ultrasonic sensor, It is taken out to the silicon surface by a signal terminal 7 provided on the silicon surface, and a metal electrode 6 is provided on the back surface of the silicon.
It is only necessary to form a polymer film 5 provided with
It was also easy to assemble. When arrayed, each signal terminal has an insulator 3, me-type silicon 2, and n-type silicon 1.
They are electrically isolated by a P-n junction.

n+型シリコン9とアース端子8はn型シリコン1のア
ース用である。第2図は第1図の平面図で、シリコン表
面に信号端子7とアース端子8が設けられている様子を
示す。同図からシリコン表面の大部分の領域が、さらl
こたとえば超音波センサの駆動回路や受信号回路などの
哨気回路を形成するのに使えることが分る。
The n+ type silicon 9 and the ground terminal 8 are for grounding the n type silicon 1. FIG. 2 is a plan view of FIG. 1, showing how signal terminals 7 and ground terminals 8 are provided on the silicon surface. From the same figure, most of the silicon surface area is
For example, it can be used to form air sentry circuits such as drive circuits and reception signal circuits for ultrasonic sensors.

第3図は、本発明による実施例である第1図に示した超
音波センサをアレイ化した場合の断面図である。シリコ
ンウェハ内に複数のコンデンサ型超音波センサがアレイ
状に形成されており、これらはシリコンIC製造技術に
おけるフォトリソグラフィー技術を用いることにより精
度よく製作することができた。
FIG. 3 is a sectional view of an array of the ultrasonic sensors shown in FIG. 1, which is an embodiment of the present invention. A plurality of capacitor-type ultrasonic sensors are formed in an array within a silicon wafer, and these can be manufactured with high precision by using photolithography technology in silicon IC manufacturing technology.

本発明は、−次元のアレイの他、シリコン面内に2次元
的に超音波センサを配置することも可能である。
In addition to a -dimensional array, the present invention also allows ultrasonic sensors to be arranged two-dimensionally within a silicon plane.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明による一実施例の断面図、第2図は第1
図の平面図、第3図は本発明によるコンデンサ型超音波
センサをアレイ状に並べた一実施例の断面図である。 図において、1はn型シリコン、2はP+mシリコン、
3は絶縁体、4は信号入力電極、5は高分子フィルム、
6に金属電極、7は信号端子、8はアース端子、9はn
+、シリコンを示す。 代理人ヅr理士内 jT   晋5.。
FIG. 1 is a cross-sectional view of one embodiment of the present invention, and FIG.
The plan view and FIG. 3 are cross-sectional views of an embodiment in which capacitor-type ultrasonic sensors according to the present invention are arranged in an array. In the figure, 1 is n-type silicon, 2 is P+m silicon,
3 is an insulator, 4 is a signal input electrode, 5 is a polymer film,
6 is a metal electrode, 7 is a signal terminal, 8 is a ground terminal, 9 is n
+ indicates silicon. Agent: Mr. Susumu 5. .

Claims (1)

【特許請求の範囲】[Claims] 薄い金属電極が表面に設けられた高分子フィルム及びこ
れと一定の空間を隔てて設置された信号入力電極からな
り、上記電極間に加えられる交流電圧によりこの高分子
フィルムが振動し超音波を発生するとともに、超音波が
この高分子フィルムに入射した場合上記電極間の容量が
変化して超音波を検出する超音波センサにおいて、上記
信号入力電極がn型シリコン基板の一方の面に形成され
た凹部に設けられかつ上記薄い金属電極が表面に設けら
れた高分子フィルムが前記凹部をおおうように設けられ
るとともに、この信号入力電極が上記n型シリコン基板
を貫通するP^+型層によりもう一方の面に取り出され
ていることを特徴とする超音波センサ。
It consists of a polymer film with a thin metal electrode on its surface and a signal input electrode placed a certain distance away from the polymer film, and an alternating current voltage applied between the electrodes causes this polymer film to vibrate and generate ultrasonic waves. In addition, in an ultrasonic sensor that detects ultrasonic waves by changing the capacitance between the electrodes when ultrasonic waves are incident on the polymer film, the signal input electrode is formed on one surface of an n-type silicon substrate. A polymer film is provided in the recess and has the thin metal electrode on its surface, and is provided to cover the recess, and the signal input electrode is connected to the other side by a P^+ type layer penetrating the n-type silicon substrate. An ultrasonic sensor characterized by being taken out on the surface of.
JP6133785A 1985-03-26 1985-03-26 Ultrasonic wave sensor Pending JPS61220600A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6133785A JPS61220600A (en) 1985-03-26 1985-03-26 Ultrasonic wave sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6133785A JPS61220600A (en) 1985-03-26 1985-03-26 Ultrasonic wave sensor

Publications (1)

Publication Number Publication Date
JPS61220600A true JPS61220600A (en) 1986-09-30

Family

ID=13168217

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6133785A Pending JPS61220600A (en) 1985-03-26 1985-03-26 Ultrasonic wave sensor

Country Status (1)

Country Link
JP (1) JPS61220600A (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63237699A (en) * 1987-03-26 1988-10-04 Agency Of Ind Science & Technol Ultrasonic transducer
JPS6472700A (en) * 1987-09-14 1989-03-17 Agency Ind Science Techn Ultrasonic transducer and its manufacture
JPH01312485A (en) * 1988-06-13 1989-12-18 Agency Of Ind Science & Technol Electrostatic capacitor type ultrasonic wave transducer
JPH0252599A (en) * 1988-08-16 1990-02-22 Agency Of Ind Science & Technol Ultrasonic transducer and its manufacture
WO2000005001A1 (en) * 1998-07-23 2000-02-03 The Secretary Of State For Defence Method of manufacturing a capacitive ultrasound transducer
US6495388B1 (en) * 1997-07-18 2002-12-17 Kavlico Corporation Surface micro-machined sensor with pedestal
JP2006220637A (en) * 2004-07-27 2006-08-24 Matsushita Electric Works Ltd Sensor system
JP2006220638A (en) * 2004-07-27 2006-08-24 Matsushita Electric Works Ltd Sensor system
JP2006220636A (en) * 2004-07-27 2006-08-24 Matsushita Electric Works Ltd Sonic wave sensor
JP2015128271A (en) * 2013-12-28 2015-07-09 キヤノン株式会社 Electrostatic capacity type transducer and manufacturing method of the same

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0547160B2 (en) * 1987-03-26 1993-07-15 Kogyo Gijutsuin
JPS63237699A (en) * 1987-03-26 1988-10-04 Agency Of Ind Science & Technol Ultrasonic transducer
JPS6472700A (en) * 1987-09-14 1989-03-17 Agency Ind Science Techn Ultrasonic transducer and its manufacture
JPH0552120B2 (en) * 1987-09-14 1993-08-04 Kogyo Gijutsuin
JPH01312485A (en) * 1988-06-13 1989-12-18 Agency Of Ind Science & Technol Electrostatic capacitor type ultrasonic wave transducer
JPH0252599A (en) * 1988-08-16 1990-02-22 Agency Of Ind Science & Technol Ultrasonic transducer and its manufacture
US6495388B1 (en) * 1997-07-18 2002-12-17 Kavlico Corporation Surface micro-machined sensor with pedestal
WO2000005001A1 (en) * 1998-07-23 2000-02-03 The Secretary Of State For Defence Method of manufacturing a capacitive ultrasound transducer
JP2002521890A (en) * 1998-07-23 2002-07-16 イギリス国 Method of manufacturing a capacitive ultrasonic transducer
JP2006220637A (en) * 2004-07-27 2006-08-24 Matsushita Electric Works Ltd Sensor system
JP2006220638A (en) * 2004-07-27 2006-08-24 Matsushita Electric Works Ltd Sensor system
JP2006220636A (en) * 2004-07-27 2006-08-24 Matsushita Electric Works Ltd Sonic wave sensor
US8254209B2 (en) 2004-07-27 2012-08-28 Panasonic Corporation Acoustic wave sensor
JP2015128271A (en) * 2013-12-28 2015-07-09 キヤノン株式会社 Electrostatic capacity type transducer and manufacturing method of the same

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