JPS61218909A - Photoelectric object detecting device - Google Patents

Photoelectric object detecting device

Info

Publication number
JPS61218909A
JPS61218909A JP6000485A JP6000485A JPS61218909A JP S61218909 A JPS61218909 A JP S61218909A JP 6000485 A JP6000485 A JP 6000485A JP 6000485 A JP6000485 A JP 6000485A JP S61218909 A JPS61218909 A JP S61218909A
Authority
JP
Japan
Prior art keywords
light
psd
face
detected
light receiving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6000485A
Other languages
Japanese (ja)
Inventor
Motoo Igari
素生 井狩
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP6000485A priority Critical patent/JPS61218909A/en
Publication of JPS61218909A publication Critical patent/JPS61218909A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Abstract

PURPOSE:To reduce an error of distance measurement by slanting the light receiving face of a light spot position detecting element not face the photodetecting lens of a condensing device rightly, and at the same time, providing a trapping device of light reflected by the light receiving face of the light spot position detecting element on the inner face of a housing. CONSTITUTION:The light receiving face of a semiconductor position detecting element 4 (PSD) belonging to PIN type photodiode is slanted not to face the light receiving lens of a condensing device 3, and at the same time, a trapping device 8 of light reflected by the photodetecting face of PSD 4 is provided on the inner face of a housing 7. Thus, light reflected by the light receiving face of PSD 4 does not enter the photodetecting lens of the condensing device 3. Accordingly, light reflected by PSD 4 is not received again by PSD 4, and returning of light reflected by PSD 4 to PSD 4 is prevented by the trapping device 8. Thus, an error of distance measurement is reduced, and object detection can be made at high accuracy.

Description

【発明の詳細な説明】 〔技術分野〕 本発明は、三角測量方式にて被検知物体を検出する光電
式物体検知装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field] The present invention relates to a photoelectric object detection device that detects a detected object using a triangulation method.

〔背景技術〕[Background technology]

従来、三角測量方式にて被検知物体を検出するこの種の
光電式物体検知装置は、第2図および第3図に示すよう
に、被検知物体閃に対して光ビーム(P)を投光する投
光手段TI)と、投光手段itlの側方に所定間隔1゜
をもって配設され、被検知物体(3)Kよる光ビーム(
P)の反射光(8)を集光する集光手段(3)と、集光
手段(3)の集光面ば配設され集光スポットの移動によ
り相反する2種の検知信号を出力するラインイメージセ
ンサ(4)と、両検知信号のレベル比に基いて被検知物
体を判別する判別手段(5)とで構成されておシ、投光
手段(lけ投光タイミンクを設定する同期信号を発生す
る発振回路−と、ドライブ回路(11)と、発光タイオ
ード、レーザーダイオードなどの投光素子α乃と、光ビ
ーム(P)を形成するコンデンサレンズよシなる投光用
光学系Hとで形成されている。受光手段(2)は投光手
段(1)から所定間隔J0をもって並置され、投・受光
手段(11(21け被検知物体(3)に対して三角測量
的に配置されている。この受光手段(2)は被検知物体
(3)による反射光を集光するための凸レンズよりなる
集光手段(3)と、集光手段(3)の集光面に配設され
集光スポット(S)の移動により相反する2種の検知信
号を出力するラインイメージセンサ(4)とで構成され
ておシ、このラインイメージセンサ(4)は、凸レンズ
よシなる集光手段(3)の集光面内に配設され、集光ス
ポット(S)の一方向の移動に際してその移動量に応じ
て増加す金弟1の検知信号IAを出力するとともに移動
量に応じて減少する1g2の検知信号■、を出力する。
Conventionally, this type of photoelectric object detection device, which detects objects to be detected using a triangulation method, projects a light beam (P) toward the flash of the object to be detected, as shown in Figures 2 and 3. A light projecting means TI) and a light beam (
A condensing means (3) for condensing the reflected light (8) of P) and a condensing surface of the condensing means (3) are arranged and output two kinds of conflicting detection signals by movement of the condensed spot. It is composed of a line image sensor (4), a discrimination means (5) for discriminating the object to be detected based on the level ratio of both detection signals, and a light projection means (1), a synchronization signal for setting the light projection timing. An oscillation circuit that generates a light beam (P), a drive circuit (11), a light projecting element α such as a light emitting diode or a laser diode, and a light projecting optical system H such as a condenser lens that forms a light beam (P). The light-receiving means (2) is arranged in parallel with the light-emitting means (1) at a predetermined distance J0, and the light-emitting/light-receiving means (11) is arranged in a triangular manner with respect to the 21 detected objects (3). This light receiving means (2) includes a condensing means (3) consisting of a convex lens for condensing the light reflected by the object to be detected (3), and a condensing means (3) arranged on the condensing surface of the condensing means (3). It is composed of a line image sensor (4) that outputs two types of contradictory detection signals by the movement of a light spot (S), and this line image sensor (4) has a condensing means (3 ) is arranged in the light focusing plane of the light spot (S), and outputs a detection signal IA of Kintetsu 1 which increases in accordance with the amount of movement when the focused spot (S) moves in one direction, and 1g2 which decreases in accordance with the amount of movement. Outputs the detection signal ■.

このラインイメージセンサ(4)は、例えばPIN型ホ
トタイオードr/c属する半導体装置検知素子(以下P
SD(4)と称する)Vcて形成され、とのPSD(4
)は第4図(a)K示すように、平板状シリ:+ン(3
0の表面にP層(31a)、裏面にN層(31b)、中
間に1層(31c)を形成したものであシ、集光スポッ
ト(S)の位置に対応した信号電流IA、 I。
This line image sensor (4) is, for example, a semiconductor device detection element (hereinafter P
SD(4)) is formed by Vc, and PSD(4) is formed with
) is shown in Figure 4(a)K, as shown in Figure 4(a)K.
0, a P layer (31a) is formed on the front surface, an N layer (31b) is formed on the back surface, and one layer (31c) is formed in the middle.

が出力されるようになっている。この信号電流lAは集
光スポットφ)の一方向の移動に際してその移動量に比
例して増加する信号であり、信号電流IBは移動量に比
例して減少する信号である。もちろん、信号電流IA、
I、が光量に比例する午とは言うまでもない。第4図(
b)は上床、のP S D (4)の等価回路を示すも
ので、図中(Pi)は電流源、(D。
is now output. This signal current IA is a signal that increases in proportion to the amount of movement of the focused spot φ when it moves in one direction, and the signal current IB is a signal that decreases in proportion to the amount of movement. Of course, the signal current IA,
It goes without saying that I is proportional to the amount of light. Figure 4 (
b) shows the equivalent circuit of PSD (4) on the upper floor, in which (Pi) is a current source and (D.

)は理想的タイオード、(Go)は接合容量、(Rt)
は並列抵抗、(Ro)は電極間抵抗である。なお、PS
D(4)に代えて、距離Jが変化した場合における集光
スポット(S)の移動に応じて相反する信号電流IA%
IBが得られるものであれば何でも良いことは言うまで
もない。判別手段(sla P S D(41出力に基
いて被検知物体(3)が所定の検知エリア内忙存在する
かどうかを判別して出力回路(6)および動作表示回路
(7)を制御するようになっている。この判別手段(5
)は、P S D (4)6−らの信号電流IA % 
”Bを信号電圧vA%VBに増巾変換する受光回路(2
1a)(21b)と、対数増巾回路(22a)(22b
)と、対数増巾回路(22a)出力!nvAから対数増
巾回路(22b)出力inv、を減算する減算回路−と
、減算回路−出力JnV、/VBと検知エリア設定用ボ
リウム(24a)Kて設定された動作レベルVsとを比
較して減算回路@出カーgnVム/VB  が動作レベ
ルVs以下のときHL/ベルを出力する比較回路(24
1と、対数増巾回路(22b)出力−gnVBと基準し
ベルvSI を比較して投光、受光レベルが正常動作レ
ベル以上かどうかを比較判別する比較回路−と、比較回
路(241(ハ)出力の論理積をとるアンド回路□□□
と、投光素子(11からの光ビーム(P)の投光タイミ
ング(発振回路(1(llからの出力される同期信号)
に同期してアンド回路−出力をサンプリングすることK
より、被検知物体(3)が検知エリア内に存在するかど
うかを確実に判別するようにした信号処理回路Qηとで
形成され、信号処理回路同出力にて負荷制御用のリレー
、負荷制御用の半導体スイッチ素子などよりなる出力回
路Q砂および動作表示回路弼を制御するようになってい
机なお、受光回路(21a)(21b )はパルス光信
号のみを通し直流光信号をカットしたり、特定の周波数
のみを通すバンドパスフィルタ回路を含むものである。
) is the ideal diode, (Go) is the junction capacitance, (Rt)
is the parallel resistance, and (Ro) is the interelectrode resistance. In addition, P.S.
In place of D(4), contradictory signal current IA% according to the movement of the focused spot (S) when the distance J changes
Needless to say, anything that can get IB is good. Discrimination means (slaPSD) determines whether the detected object (3) is present within a predetermined detection area based on the output of 41 and controls the output circuit (6) and the operation display circuit (7). This determination method (5
) is the signal current IA% of P S D (4) 6- et al.
A light receiving circuit (2) that amplifies and converts B to signal voltage vA%VB
1a) (21b) and logarithmic amplification circuits (22a) (22b)
) and logarithmic amplification circuit (22a) output! A subtraction circuit that subtracts the output inv of the logarithmic amplification circuit (22b) from nvA is compared with the operation level Vs set by the subtraction circuit output JnV, /VB and the detection area setting volume (24a) K. Subtraction circuit @ Comparison circuit (24
1, the output of the logarithmic amplification circuit (22b) - a comparison circuit that compares the output of the logarithmic amplification circuit (22b) with gnVB and the signal vSI to determine whether the light emission and light reception levels are above the normal operating level, and the comparison circuit (241 (c)). AND circuit that takes the logical AND of outputs □□□
and the emission timing of the light beam (P) from the light emission element (11) (the synchronization signal output from the oscillation circuit (1 (ll))
sampling the output of the AND circuit in synchronization with K
It is formed with a signal processing circuit Qη that reliably determines whether or not the detected object (3) exists within the detection area, and the output of the signal processing circuit is connected to a relay for load control, The light receiving circuit (21a) (21b) passes only the pulsed optical signal and cuts the DC optical signal, It includes a bandpass filter circuit that passes only the frequencies of .

いま、被検知物体(3)が第5図(a)に示すように光
電式物体検知装置(至)から距離J、、42%ノ、の位
置に存在する場合において、集光面内に配設されたPS
D(4)に対する集光スポット(S)の位置はそれぞれ
第5図(b)のようになり、被検知物体閃の位置が光ビ
ーム(P)の投光方向に変化すると、集光ビーム(S)
が矢印M方向に移動してPSD(41から出力される信
号電流IA、 IB  は集光スポット(S)の位置に
対応した位置信号となる。判別手段(5)では、受光回
路(21a)(21b)Kてこの信号電流IA、IBに
比例した信号電圧vA%VBを形成し、対数増巾回路(
22a)(22b)にて対数増巾した電圧−gnVA、
ノnVBを減算回路−にて減算することにより、減算回
路(ハ)から信号電圧V、 、VB  のレベル比の対
数値4 n Vム/vB が出力されることになる。こ
の減算回路@出力JnV人/VBは被検知物体(3)ま
での距lidに応じて変化する。したがって、比較回路
−の検知エリア設定ポリウム(24a)にて動作レベル
Vsを適当に設定すること罠より、正確な検知エリアが
容易に設定でき、減算回路@出力JnVA/VB  が
動作レベルv8以下となったとき比較回路(至)出力が
Hレベルとなる。このとき、投光、受光レベルが正常動
作範囲であって、対数項中回路(22b)出力ff1n
VBが基準レベルVs1以上であれば比較回路(至)出
力もHレベルとなシ、アンド回路(社)出力がHレベル
となり信号処理回路Qηを介して出力回路に)および動
作表示回路に)が作動されるようKなっている。而して
この従来例においては判別手段(6)はPSD[4)か
ら出力される信号電流工え% Iiを増巾じた信号のレ
ベル比の対数値を演算してその演算値が所定の検知範囲
か否かによって被検知物体(3)が検知エリア内にある
かどうかを判別して出力回路(6)を作動させているの
で、被検知物体(3)の光反射率に関係なく検知エリア
を設定でき、投、受光用光学系(l場(31の汚れや光
軸のずれの影響を受けることがないよう罠なっている。
Now, when the object to be detected (3) is located at a distance of J, 42% from the photoelectric object detection device (to) as shown in Fig. 5(a), PS set up
The positions of the focused spots (S) relative to D(4) are as shown in FIG. S)
moves in the direction of arrow M, and the signal currents IA, IB output from the PSD (41) become position signals corresponding to the position of the condensed spot (S). 21b) A signal voltage vA%VB proportional to the signal currents IA and IB of the K lever is formed, and a logarithmic amplification circuit (
22a) Logarithmically amplified voltage in (22b) -gnVA,
By subtracting nonnVB in the subtraction circuit (c), the logarithm value of the level ratio of the signal voltages V, , VB is outputted from the subtraction circuit (c). This subtraction circuit @output JnV person/VB changes depending on the distance lid to the detected object (3). Therefore, an accurate detection area can be easily set by appropriately setting the operating level Vs using the detection area setting polyimum (24a) of the comparison circuit, and the subtracting circuit @output JnVA/VB will be lower than the operating level V8. When this happens, the output of the comparison circuit (to) becomes H level. At this time, the light emission and light reception levels are within the normal operating range, and the logarithmic term middle circuit (22b) output ff1n
If VB is equal to or higher than the reference level Vs1, the output of the comparison circuit (to) also goes to H level, and the AND circuit output goes to H level (to the output circuit via the signal processing circuit Qη) and to the operation display circuit). K is set to be activated. In this conventional example, the discriminating means (6) calculates the logarithm of the level ratio of the signal amplified by the signal current correction % Ii output from the PSD [4], and determines whether the calculated value is a predetermined value. Since the output circuit (6) is activated by determining whether the object to be detected (3) is within the detection area or not, it can be detected regardless of the light reflectance of the object to be detected (3). The area can be set, and the projection and reception optical system (L field 31) is designed to avoid being affected by dirt or deviation of the optical axis.

第6図は小型のハウジンジ(7)に光学系を収納した例
を示している。ところでこのような光電式物体検知装置
において集光手段(3)の受光レンズとPSD(4)の
受光面とが正対(受光レンズとPSDT41とが平行)
しているので、PSD(4)上に結像された光がPSD
(41の受光面で反射され、更に受光レンズの後面で反
射されて再びPSD(41にて受光され、測距誤差の原
因になるという問題があった。特に1精度の高い物体検
知を行なう場合には大きな問題となっていた。
FIG. 6 shows an example in which the optical system is housed in a small housing (7). By the way, in such a photoelectric object detection device, the light-receiving lens of the condensing means (3) and the light-receiving surface of the PSD (4) face each other directly (the light-receiving lens and the PSDT 41 are parallel).
Therefore, the light imaged on PSD (4)
(There was a problem that the light was reflected by the light receiving surface of 41, further reflected by the rear surface of the light receiving lens, and received again by PSD (41), causing distance measurement errors.Especially when performing object detection with high accuracy of 1) had become a big problem.

〔発明の目的〕[Purpose of the invention]

本発明は上記の点に鑑みて為されたものであり、その目
的とするところは、測距誤差が少く、高精度で物体検知
を行なうことができる光電式物体検知装置を提供するこ
とにある。
The present invention has been made in view of the above points, and its purpose is to provide a photoelectric object detection device that has little distance measurement error and is capable of detecting objects with high precision. .

〔発明の開示〕[Disclosure of the invention]

(実施例) 第1図は本発明一実施例を示すもので、前記従来例と同
様の光電式物体検知装置において、PSD(4)の受光
面を集光手段(3)の受光レンズと正対しないように傾
斜させるとともに%PSD(41の受光面による反射光
のトラップ手段(8)をハウジンジ(7)内面に設けた
ものである。但し、実施例にあっては、トラップ手段(
8)は炭素を含む樹脂、カメラのしゃ光用モルトプレー
ンなどの光吸収体をハウジンジ(7)の内面に貼着して
形成しているが、黒色あるいはつや消し黒色のような低
反射率、塗装を施しても良く、また、ハウジンジ(7)
の内面にナシ地加工、のこ刃状加工を施して乱反射面を
形成することKよシトラップ手段(8)を形成しても良
い。さらに、ハウジンジ(7)自体を炭素を含む黒色樹
脂にて底形しても良いことは言うまでもない。
(Embodiment) Fig. 1 shows an embodiment of the present invention, in which the light receiving surface of the PSD (4) is aligned with the light receiving lens of the condensing means (3) in a photoelectric object detection device similar to the conventional example. The trap means (8) for the light reflected by the light receiving surface of %PSD (41) is provided on the inner surface of the housing (7).
8) is formed by pasting a light absorbing material such as carbon-containing resin or malt plane for camera light-shielding on the inner surface of the housing (7), but it is not possible to paint it with low reflectivity such as black or matte black, or paint. may also be applied to the housing (7).
The trap means (8) may be formed by forming a diffused reflection surface by applying pear-shaped processing or sawtooth processing to the inner surface of the member. Furthermore, it goes without saying that the bottom of the housing (7) itself may be made of black resin containing carbon.

いま、実施例にあっては、PSD(4)の受光面にて反
射された反射光が集光手段(3)の受光レンズに入射し
ないようにP S D [4)を傾斜させているので、
PSD(41にて反射された反射光が再びPSDT41
にて受光されることがなく、シかも、PSD(4)によ
る反射光がトラップ手段(81KてPSD(4)に戻ら
ないようにしているので、PSD(41にて不要光が受
光されることがなく、測距誤差が少なくなって高精度で
物体検知が行なえることになる。なお、小型化に@して
PSD(4)をあまシ傾斜できない場、合には、PSD
(4)による反射光の一部が受光レシズに入射するよう
にしても良い。
In the embodiment, the PSD [4] is tilted so that the reflected light from the light-receiving surface of the PSD (4) does not enter the light-receiving lens of the condensing means (3). ,
The reflected light reflected at PSD (41) is returned to PSDT41.
However, since the reflected light from the PSD (4) is prevented from returning to the PSD (4) by the trap means (81K), unnecessary light may be received by the PSD (41). This reduces distance measurement errors and enables highly accurate object detection.In addition, if the PSD (4) cannot be tilted slightly due to miniaturization, the PSD
A part of the reflected light in (4) may be made to enter the light receiving lens.

〔発明の効果〕〔Effect of the invention〕

本発明は上述のように、被検知物体に対して光ビームを
投光する投光手段と、投光手段の側方に所定間隔をもっ
て配設され、被検知物体による光ビームの反射光を集光
する集光手段と、集光手段の集光面に配設され集光スポ
ットの移動により相反する2種の検知信号を出力するラ
インイメージセンサと、両検知信号のレベル比に基いて
被検知物体を判別する判別手段とよりなる光電式物体検
知装置において、ラインイメージセンサの受光面を集光
手段の受光レンズと正対しないように傾斜させるととも
に、ラインイメージセンサの受光面による反射光のトラ
ップ手段をハウジンジ内面に設けたものであり、ライン
イメージセンサの受光面による反射光が再びラインイメ
ージセンサにて受光されることがないので測距誤差が少
くなって高精度で物体検知を行なうことができるという
効果がある。
As described above, the present invention includes a light projecting means for projecting a light beam onto an object to be detected, and a light projecting means disposed at a predetermined interval on the side of the light projecting means to collect light reflected from the light beam by the object to be detected. A condensing means that emits light; a line image sensor that is disposed on the condensing surface of the condensing means and outputs two types of contradictory detection signals as the condensed spot moves; In a photoelectric object detection device comprising a discrimination means for discriminating an object, the light receiving surface of the line image sensor is tilted so as not to directly face the light receiving lens of the condensing means, and reflected light is trapped by the light receiving surface of the line image sensor. The means is provided on the inner surface of the housing, and since the light reflected by the light receiving surface of the line image sensor is not received by the line image sensor again, distance measurement errors are reduced and objects can be detected with high precision. There is an effect that it can be done.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明一実施例の要部概略構成図、第2図は本
発明に係る光電式物体検知装置の要部概略構成図、第3
図は同上のブロック回路図、第4図(a)け同上の要部
断面図、第4図(b) Fi同上の要部等価回路図、第
5図は同上の動作説明図、第6図は従来例の要部概略構
成図である。 (1)は投光手段、(3)は集光手段、(4)はライン
イメージセンサ、(5)は判別手段、(7) iltハ
ウジンジ、(8)はトラップ手段である。 代理人 弁理士  石 1)長 七 第1図 第4図 (’)          (b) 第5図 第6図 手続補正書(自発) 昭和60年5り!3日 昭和60年特許願第60004号 2、発明の名称 光電式物体検知装置 3、補正をする者 事件との関係  特許出願人 住 所 大阪府門真市大字門真1048番地名称(58
3)松下電工株式会社 代表者  藤 井 貞 夫 4、代理人 郵便番号 530 住 所 大阪市北区梅田1丁目12番17号5、補正命
令の日付 自  発 6、補正により増加する発明の数 なし1)本願の特許
請求の範囲を以下のように訂正致します。 [(1)被検知物体に対して光ビームを投光する投光手
段と、投光手段の側方に所定間隔をもって配設され、被
検知物体による光ビームの夏射光を集光する集光手段と
、集光手段の集光面に配設され集光スポットの移動によ
り相反する2種の検知信号を出力する光F必11灸遇j
1子−と、両検知信号のレベル比に基いて被検知物体を
判別する判別手段とよりなる光電式物体検知装置におい
て、該位11央五り1子−の受光面を集光手段の受光レ
ンズと正対しないように傾斜させるとともに、光Juえ
1−1此1五の受光面による反射光のトラップ手段をハ
ウノング内面に設けたことを特徴とする光電式%式% 9行目、11行目、13行目、14行目および第11頁
5行目乃至6行目の[ラインイメーノセンサ」を「光点
位置検出素子」と訂正致します。
FIG. 1 is a schematic diagram of the main part of an embodiment of the present invention, FIG. 2 is a schematic diagram of the main part of a photoelectric object detection device according to the present invention, and FIG.
The figure is a block circuit diagram of the same as above, FIG. 4(a) is a sectional view of the main part of the same as above, FIG. 4(b) is an equivalent circuit diagram of the main part of same as above, FIG. 1 is a schematic configuration diagram of main parts of a conventional example. (1) is a light projecting means, (3) is a condensing means, (4) is a line image sensor, (5) is a discrimination means, (7) is an ilt housing, and (8) is a trap means. Agent Patent Attorney Ishi 1) Chief 7 Figure 1 Figure 4 (') (b) Figure 5 Figure 6 Procedural Amendment (Voluntary) 1985 5ri! 3rd, 1985 Patent Application No. 60004 2, Name of the invention Photoelectric object detection device 3, Relationship with the case of the person making the amendment Patent applicant address Address 1048 Kadoma, Kadoma City, Osaka Prefecture Name (58
3) Matsushita Electric Works Co., Ltd. Representative: Sadao Fujii 4, Agent postal code: 530 Address: 1-12-17-5 Umeda, Kita-ku, Osaka City Date of amendment order: 6 Number of inventions increased by amendment: None 1) The scope of claims of this application will be amended as follows. [(1) A light projecting means for projecting a light beam onto the object to be detected, and a condenser arranged at a predetermined interval on the side of the light projecting means to collect the summer light of the light beam from the object to be detected. and a light beam disposed on the condensing surface of the condensing means and outputting two types of contradictory detection signals by movement of the condensing spot.
In a photoelectric object detection device comprising a detector and a discrimination means for discriminating the object to be detected based on the level ratio of both detection signals, the light receiving surface of the center five and one detector is used as the light receiving surface of the light collecting means. The photoelectric type % type % is characterized by being tilted so as not to directly face the lens, and having means for trapping reflected light by the light receiving surface of the light receiving surface provided on the inner surface of the lens.Line 9, 11 In lines 13, 14, and 5th to 6th lines on page 11, we have corrected ``line image sensor'' to ``light spot position detection element.''

Claims (1)

【特許請求の範囲】[Claims] (1)被検知物体に対して光ビームを投光する投光手段
と、投光手段の側方に所定間隔をもつて配設され、被検
知物体による光ビームの反射光を集光する集光手段と、
集光手段の集光面に配設され集光スポットの移動により
相反する2種の検知信号を出力するラインイメージセン
サと、両検知信号のレベル比に基いて被検知物体を判別
する判別手段とよりなる光電式物体検知装置において、
ラインイメージセンサの受光面を集光手段の受光レンズ
と正対しないように傾斜させるとともに、ラインイメー
ジセンサの受光面による反射光のトラップ手段をハウジ
ンジ内面に設けたことを特徴とする光電式物体検知装置
(1) A light projecting means for projecting a light beam onto an object to be detected, and a condenser arranged at a predetermined interval on the side of the light projecting means to collect light reflected from the light beam by the object to be detected. optical means;
A line image sensor disposed on a light collecting surface of the light collecting means and outputting two types of contradictory detection signals by movement of a focused spot; and a discrimination means for discriminating a detected object based on a level ratio of both detection signals. In a photoelectric object detection device consisting of
Photoelectric object detection characterized in that the light-receiving surface of the line image sensor is tilted so as not to directly face the light-receiving lens of the condensing means, and a means for trapping light reflected by the light-receiving surface of the line image sensor is provided on the inner surface of the housing. Device.
JP6000485A 1985-03-25 1985-03-25 Photoelectric object detecting device Pending JPS61218909A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6000485A JPS61218909A (en) 1985-03-25 1985-03-25 Photoelectric object detecting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6000485A JPS61218909A (en) 1985-03-25 1985-03-25 Photoelectric object detecting device

Publications (1)

Publication Number Publication Date
JPS61218909A true JPS61218909A (en) 1986-09-29

Family

ID=13129512

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6000485A Pending JPS61218909A (en) 1985-03-25 1985-03-25 Photoelectric object detecting device

Country Status (1)

Country Link
JP (1) JPS61218909A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63142712U (en) * 1987-03-12 1988-09-20
JPS63185517U (en) * 1987-05-20 1988-11-29
JPH0293316A (en) * 1988-09-30 1990-04-04 Anritsu Corp Optical displacement measuring apparatus
JP2008298686A (en) * 2007-06-01 2008-12-11 Sanyo Electric Co Ltd Beam irradiation device and laser radar
DE102009051708B4 (en) * 2008-11-05 2015-04-09 Okuma Corporation linear encoder

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63142712U (en) * 1987-03-12 1988-09-20
JPS63185517U (en) * 1987-05-20 1988-11-29
JPH0293316A (en) * 1988-09-30 1990-04-04 Anritsu Corp Optical displacement measuring apparatus
JP2008298686A (en) * 2007-06-01 2008-12-11 Sanyo Electric Co Ltd Beam irradiation device and laser radar
DE102009051708B4 (en) * 2008-11-05 2015-04-09 Okuma Corporation linear encoder

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