JPS61203575U - - Google Patents
Info
- Publication number
- JPS61203575U JPS61203575U JP8707285U JP8707285U JPS61203575U JP S61203575 U JPS61203575 U JP S61203575U JP 8707285 U JP8707285 U JP 8707285U JP 8707285 U JP8707285 U JP 8707285U JP S61203575 U JPS61203575 U JP S61203575U
- Authority
- JP
- Japan
- Prior art keywords
- chip
- temperature
- current
- laser light
- semiconductor laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims 1
- 238000007689 inspection Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8707285U JPS61203575U (OSRAM) | 1985-06-10 | 1985-06-10 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8707285U JPS61203575U (OSRAM) | 1985-06-10 | 1985-06-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61203575U true JPS61203575U (OSRAM) | 1986-12-22 |
Family
ID=30638955
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8707285U Pending JPS61203575U (OSRAM) | 1985-06-10 | 1985-06-10 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61203575U (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11233872A (ja) * | 1998-02-09 | 1999-08-27 | Nippon Telegr & Teleph Corp <Ntt> | 半導体レ―ザの良否判別法 |
-
1985
- 1985-06-10 JP JP8707285U patent/JPS61203575U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11233872A (ja) * | 1998-02-09 | 1999-08-27 | Nippon Telegr & Teleph Corp <Ntt> | 半導体レ―ザの良否判別法 |
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