JPS6119260A - 伝送チヤネルの位相ジツタを測定する方法 - Google Patents

伝送チヤネルの位相ジツタを測定する方法

Info

Publication number
JPS6119260A
JPS6119260A JP60079468A JP7946885A JPS6119260A JP S6119260 A JPS6119260 A JP S6119260A JP 60079468 A JP60079468 A JP 60079468A JP 7946885 A JP7946885 A JP 7946885A JP S6119260 A JPS6119260 A JP S6119260A
Authority
JP
Japan
Prior art keywords
phase
signal
value
transmission channel
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60079468A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0225304B2 (https=
Inventor
ドミニク・ゴダール
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS6119260A publication Critical patent/JPS6119260A/ja
Publication of JPH0225304B2 publication Critical patent/JPH0225304B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Digital Transmission Methods That Use Modulated Carrier Waves (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Dc Digital Transmission (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)
JP60079468A 1984-06-29 1985-04-16 伝送チヤネルの位相ジツタを測定する方法 Granted JPS6119260A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP84430026.9 1984-06-29
EP84430026A EP0166839B1 (fr) 1984-06-29 1984-06-29 Procédé et dispositif de mesure de la gigue de phase d'un canal de transmission

Publications (2)

Publication Number Publication Date
JPS6119260A true JPS6119260A (ja) 1986-01-28
JPH0225304B2 JPH0225304B2 (https=) 1990-06-01

Family

ID=8192954

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60079468A Granted JPS6119260A (ja) 1984-06-29 1985-04-16 伝送チヤネルの位相ジツタを測定する方法

Country Status (5)

Country Link
US (1) US4654861A (https=)
EP (1) EP0166839B1 (https=)
JP (1) JPS6119260A (https=)
CA (1) CA1227246A (https=)
DE (1) DE3478250D1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6795496B1 (en) 1999-02-08 2004-09-21 Advantest Corporation Jitter measuring device and method

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8511585D0 (en) * 1985-05-08 1985-06-12 Hewlett Packard Ltd Jitter measurement method
FR2615626B1 (fr) * 1987-05-21 1989-07-28 Alcatel Espace Procede d'evaluation numerique de la frequence et de la phase de signaux et dispositifs de mise en oeuvre d'un tel procede
IT1210836B (it) * 1987-06-26 1989-09-29 Sip Strumento per la misura del rumore di fase di segnali analogici
US4896271A (en) * 1987-08-05 1990-01-23 Tektronix, Inc. Method and apparatus for measuring jitter in a periodic signal
DE3833486C1 (https=) * 1988-10-01 1989-08-03 Wandel & Goltermann Gmbh & Co, 7412 Eningen, De
US5001724A (en) * 1989-01-13 1991-03-19 Hewlett-Packard Company Method and apparatus for measuring phase accuracy and amplitude profile of a continuous-phase-modulated signal
FR2676821B1 (fr) * 1991-05-21 1994-09-09 Merlin Gerin Dispositif de controle et de mesure d'isolement pour reseau electrique a neutre isole.
US5402443A (en) * 1992-12-15 1995-03-28 National Semiconductor Corp. Device and method for measuring the jitter of a recovered clock signal
US6195414B1 (en) * 1997-04-17 2001-02-27 Telecom Analysis Systems Digital facility simulator with CODEC emulation
US6621860B1 (en) * 1999-02-08 2003-09-16 Advantest Corp Apparatus for and method of measuring a jitter
US6735538B1 (en) * 2000-03-29 2004-05-11 Advantest Corporation Apparatus and method for measuring quality measure of phase noise waveform
KR100861884B1 (ko) * 2000-06-20 2008-10-09 코닌클리케 필립스 일렉트로닉스 엔.브이. 정현파 코딩 방법 및 장치
US6525523B1 (en) * 2000-11-24 2003-02-25 Advantest Corporation Jitter measurement apparatus and its method
US7263150B2 (en) * 2001-03-20 2007-08-28 Advantest Corp. Probability estimating apparatus and method for peak-to-peak clock skews
US7203229B1 (en) * 2001-06-14 2007-04-10 Advantest Corporation Apparatus for and method of measuring jitter
US6990418B2 (en) * 2002-12-19 2006-01-24 International Business Machines Corporation Method and systems for optimizing high-speed signal transmission
US7136773B2 (en) * 2003-12-16 2006-11-14 Advantest Corporation Testing apparatus and testing method
JP5143341B2 (ja) * 2004-02-18 2013-02-13 株式会社アドバンテスト ジッタ測定装置、ジッタ測定方法およびプログラム
US7778315B2 (en) * 2004-04-14 2010-08-17 Tektronix, Inc. Measuring instantaneous signal dependent nonlinear distortion in response to varying frequency sinusoidal test signal
US7903776B2 (en) * 2006-09-26 2011-03-08 Advantest Corporation Jitter measurement apparatus, jitter calculator, jitter measurement method, program, recording medium, communication system and test apparatus
US8447570B2 (en) * 2008-05-21 2013-05-21 Infineon Technologies Ag Predictive sensor readout
US8005642B2 (en) * 2008-06-26 2011-08-23 Infineon Technologies Ag Predictive angular sensor readout
US9157950B2 (en) * 2011-04-18 2015-10-13 International Business Machines Corporation Loop parameter sensor using repetitive phase errors
US9354266B2 (en) 2012-06-07 2016-05-31 Globalfoundries Inc. Universal jitter meter and phase noise measurement
US12379408B2 (en) * 2022-06-02 2025-08-05 Microchip Technology Incorporated Device and methods for phase noise measurement

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3546588A (en) * 1968-09-17 1970-12-08 Bell Telephone Labor Inc Phase hit monitor-counter
US3711773A (en) * 1970-07-09 1973-01-16 Hekimian Laboratories Inc Phase jitter meter
US3737766A (en) * 1971-12-06 1973-06-05 Telecommunications Technology Testing technique for phase jitter in communication systems

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6795496B1 (en) 1999-02-08 2004-09-21 Advantest Corporation Jitter measuring device and method

Also Published As

Publication number Publication date
DE3478250D1 (en) 1989-06-22
US4654861A (en) 1987-03-31
EP0166839A1 (fr) 1986-01-08
JPH0225304B2 (https=) 1990-06-01
EP0166839B1 (fr) 1989-05-17
CA1227246A (en) 1987-09-22

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