JPS61190805U - - Google Patents
Info
- Publication number
- JPS61190805U JPS61190805U JP7603485U JP7603485U JPS61190805U JP S61190805 U JPS61190805 U JP S61190805U JP 7603485 U JP7603485 U JP 7603485U JP 7603485 U JP7603485 U JP 7603485U JP S61190805 U JPS61190805 U JP S61190805U
- Authority
- JP
- Japan
- Prior art keywords
- film thickness
- electric
- probe rod
- thickness meter
- detection unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims 3
- 239000011247 coating layer Substances 0.000 claims 1
- 239000010410 layer Substances 0.000 claims 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7603485U JPS61190805U (en18) | 1985-05-22 | 1985-05-22 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7603485U JPS61190805U (en18) | 1985-05-22 | 1985-05-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61190805U true JPS61190805U (en18) | 1986-11-27 |
Family
ID=30617801
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7603485U Pending JPS61190805U (en18) | 1985-05-22 | 1985-05-22 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61190805U (en18) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100381095B1 (ko) * | 1998-10-10 | 2003-07-16 | 주식회사 포스코 | 자기 유도방식에 의한 아연도금량 두께 측정방법 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5146618A (ja) * | 1974-10-21 | 1976-04-21 | Hitachi Ltd | Denshiseigyoshikinenryofunshasochino kasokuhoseisochi |
| JPS5575608A (en) * | 1978-12-02 | 1980-06-07 | Ricoh Co Ltd | Film thickness measuring unit |
-
1985
- 1985-05-22 JP JP7603485U patent/JPS61190805U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5146618A (ja) * | 1974-10-21 | 1976-04-21 | Hitachi Ltd | Denshiseigyoshikinenryofunshasochino kasokuhoseisochi |
| JPS5575608A (en) * | 1978-12-02 | 1980-06-07 | Ricoh Co Ltd | Film thickness measuring unit |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100381095B1 (ko) * | 1998-10-10 | 2003-07-16 | 주식회사 포스코 | 자기 유도방식에 의한 아연도금량 두께 측정방법 |